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Giaconi N, Poggini L, Lupi M, Briganti M, Kumar A, Das TK, Sorrentino AL, Viglianisi C, Menichetti S, Naaman R, Sessoli R, Mannini M. Efficient Spin-Selective Electron Transport at Low Voltages of Thia-Bridged Triarylamine Hetero[4]helicenes Chemisorbed Monolayer. ACS NANO 2023; 17:15189-15198. [PMID: 37493644 PMCID: PMC10416567 DOI: 10.1021/acsnano.3c04878] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/31/2023] [Accepted: 07/20/2023] [Indexed: 07/27/2023]
Abstract
The Chirality Induced Spin Selectivity (CISS) effect describes the capability of chiral molecules to act as spin filters discriminating flowing electrons according to their spin state. Within molecular spintronics, efforts are focused on developing chiral-molecule-based technologies to control the injection and coherence of spin-polarized currents. Herein, for this purpose, we study spin selectivity properties of a monolayer of a thioalkyl derivative of a thia-bridged triarylamine hetero[4]helicene chemisorbed on a gold surface. A stacked device assembled by embedding a monolayer of these molecules between ferromagnetic and diamagnetic electrodes exhibits asymmetric magnetoresistance with inversion of the signal according to the handedness of molecules, in line with the presence of the CISS effect. In addition, magnetically conductive atomic force microscopy reveals efficient electron spin filtering even at unusually low potentials. Our results demonstrate that thia[4]heterohelicenes represent key candidates for the development of chiral spintronic devices.
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Affiliation(s)
- Niccolò Giaconi
- Department
of Chemistry “Ugo Schiff” (DICUS) & INSTM Research
Unit, University of Florence, Via della Lastruccia 3-13, Sesto Fiorentino 50019, Italy
| | - Lorenzo Poggini
- Istituto
di Chimica dei Composti Organo-Metallici (ICCOM-CNR), Via Madonna del Piano 10, Sesto Fiorentino 50019, Italy
| | - Michela Lupi
- Department
of Chemistry “Ugo Schiff” (DICUS) & INSTM Research
Unit, University of Florence, Via della Lastruccia 3-13, Sesto Fiorentino 50019, Italy
| | - Matteo Briganti
- Department
of Chemistry “Ugo Schiff” (DICUS) & INSTM Research
Unit, University of Florence, Via della Lastruccia 3-13, Sesto Fiorentino 50019, Italy
| | - Anil Kumar
- Department
of Chemical and Biological Physics, Weizmann
Institute of Science, Rehovot 76100, Israel
| | - Tapan K. Das
- Department
of Chemical and Biological Physics, Weizmann
Institute of Science, Rehovot 76100, Israel
| | - Andrea L. Sorrentino
- Department
of Chemistry “Ugo Schiff” (DICUS) & INSTM Research
Unit, University of Florence, Via della Lastruccia 3-13, Sesto Fiorentino 50019, Italy
| | - Caterina Viglianisi
- Department
of Chemistry “Ugo Schiff” (DICUS) & INSTM Research
Unit, University of Florence, Via della Lastruccia 3-13, Sesto Fiorentino 50019, Italy
| | - Stefano Menichetti
- Department
of Chemistry “Ugo Schiff” (DICUS) & INSTM Research
Unit, University of Florence, Via della Lastruccia 3-13, Sesto Fiorentino 50019, Italy
| | - Ron Naaman
- Department
of Chemical and Biological Physics, Weizmann
Institute of Science, Rehovot 76100, Israel
| | - Roberta Sessoli
- Department
of Chemistry “Ugo Schiff” (DICUS) & INSTM Research
Unit, University of Florence, Via della Lastruccia 3-13, Sesto Fiorentino 50019, Italy
| | - Matteo Mannini
- Department
of Chemistry “Ugo Schiff” (DICUS) & INSTM Research
Unit, University of Florence, Via della Lastruccia 3-13, Sesto Fiorentino 50019, Italy
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Berisha A, Combellas C, Kanoufi F, Médard J, Decorse P, Mangeney C, Kherbouche I, Seydou M, Maurel F, Pinson J. Alkyl-Modified Gold Surfaces: Characterization of the Au-C Bond. LANGMUIR : THE ACS JOURNAL OF SURFACES AND COLLOIDS 2018; 34:11264-11271. [PMID: 30173513 DOI: 10.1021/acs.langmuir.8b01584] [Citation(s) in RCA: 15] [Impact Index Per Article: 2.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/08/2023]
Abstract
The surface of gold can be modified with alkyl groups through a radical crossover reaction involving alkyliodides or bromides in the presence of a sterically hindered diazonium salt. In this paper, we characterize the Au-C(alkyl) bond by surface-enhanced Raman spectroscopy (SERS); the corresponding peak appears at 387 cm-1 close to the value obtained by theoretical modeling. The Au-C(alkyl) bond energy is also calculated, it reaches -36.9 kcal mol-1 similar to that of an Au-S-alkyl bond but also of an Au-C(aryl) bond. In agreement with the similar energies of Au-C(alkyl) and Au-S-(alkyl), we demonstrate experimentally that these groups can be exchanged on the surface of gold.
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Affiliation(s)
- Avni Berisha
- Sorbonne Paris Cité, Université Paris Diderot, ITODYS, UMR 7086 CNRS , 15 rue J-A de Baïf , 75013 Paris , France
- Chemistry Department of Natural Sciences Faculty , University of Prishtina , rr. "Nëna Tereze" nr. 5 , 10000 Prishtina , Kosovo
| | - Catherine Combellas
- Sorbonne Paris Cité, Université Paris Diderot, ITODYS, UMR 7086 CNRS , 15 rue J-A de Baïf , 75013 Paris , France
| | - Frédéric Kanoufi
- Sorbonne Paris Cité, Université Paris Diderot, ITODYS, UMR 7086 CNRS , 15 rue J-A de Baïf , 75013 Paris , France
| | - Jérôme Médard
- Sorbonne Paris Cité, Université Paris Diderot, ITODYS, UMR 7086 CNRS , 15 rue J-A de Baïf , 75013 Paris , France
| | - Philippe Decorse
- Sorbonne Paris Cité, Université Paris Diderot, ITODYS, UMR 7086 CNRS , 15 rue J-A de Baïf , 75013 Paris , France
| | - Claire Mangeney
- Sorbonne Paris Cité, Université Paris Descartes, Laboratoire de Chimie et Biochimie Pharmacologiques et Toxicologiques, UMR 8601 CNRS , 45 rue des Saints Pères , 75006 Paris , France
| | - Issam Kherbouche
- Sorbonne Paris Cité, Université Paris Descartes, Laboratoire de Chimie et Biochimie Pharmacologiques et Toxicologiques, UMR 8601 CNRS , 45 rue des Saints Pères , 75006 Paris , France
| | - Mahamadou Seydou
- Sorbonne Paris Cité, Université Paris Diderot, ITODYS, UMR 7086 CNRS , 15 rue J-A de Baïf , 75013 Paris , France
| | - François Maurel
- Sorbonne Paris Cité, Université Paris Diderot, ITODYS, UMR 7086 CNRS , 15 rue J-A de Baïf , 75013 Paris , France
| | - Jean Pinson
- Sorbonne Paris Cité, Université Paris Diderot, ITODYS, UMR 7086 CNRS , 15 rue J-A de Baïf , 75013 Paris , France
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Park H, Lee S, Kim HJ, Woo D, Park SJ, Kim K, Yoon E, Lee GD. Effects of H 2 and N 2 treatment for B 2H 6 dosing process on TiN surfaces during atomic layer deposition: an ab initio study. RSC Adv 2018; 8:21164-21173. [PMID: 35539938 PMCID: PMC9080878 DOI: 10.1039/c8ra02622j] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/26/2018] [Accepted: 05/27/2018] [Indexed: 11/21/2022] Open
Abstract
For the development of the future ultrahigh-scale integrated memory devices, a uniform tungsten (W) gate deposition process with good conformal film is essential for improving the conductivity of the W gate, resulting in the enhancement of device performance. As the memory devices are further scaled down, uniform W deposition becomes more difficult because of the experimental limitations of the sub-nanometer scale deposition even with atomic layer deposition (ALD) W processes. Even though it is known that the B2H6 dosing process plays a key role in the deposition of the ALD W layer with low resistivity and in the removal of residual fluorine (F) atoms, the roles of H2 and N2 treatments used in the ALD W process have not yet been reported. To understand the detailed ALD W process, we have investigated the effects of H2 and N2 treatment on TiN surfaces for the B2H6 dosing process using first-principles density functional theory (DFT) calculations. In our DFT calculated results, H2 treatment on the TiN surfaces causes the surfaces to become H-covered TiN surfaces, which results in lowering the reactivity of the B2H6 precursor since the overall reactions of the B2H6 on the H-covered TiN surfaces are energetically less favorable than the TiN surfaces. As a result, an effect of the H2 treatment is to decrease the reactivity of the B2H6 molecule on the TiN surface. However, N2 treatment on the Ti-terminated TiN (111) surface is more likely to make the TiN surface become an N-terminated TiN (111) surface, which results in making a lot of N-terminated TiN (111) surfaces, having a very reactive nature for B2H6 bond dissociation. As a result, the effect of N2 treatment serves as a catalyst to decompose B2H6. From the deep understanding of the effect of H2 and N2 during the B2H6 dosing process, the use of proper gas treatment is required for the improvement of the W nucleation layers. Our results showed the effects of H2 and N2 treatment on TiN surfaces, using density functional theory calculations. These imply that the understanding of gas treatment gives us insight into improving the W ALD process for future memory devices.![]()
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Affiliation(s)
- Hwanyeol Park
- Department of Materials Science and Engineering, Seoul National University Seoul 08826 Korea
| | - Sungwoo Lee
- Department of Materials Science and Engineering, Seoul National University Seoul 08826 Korea
| | - Ho Jun Kim
- Department of Mechanical Engineering, Dong-A University Busan 49315 South Korea
| | - Daekwang Woo
- Memory Thin Film Technology Team, Giheung Hwaseong Complex, Samsung Electronics 445-701 South Korea
| | - Se Jun Park
- Memory Thin Film Technology Team, Giheung Hwaseong Complex, Samsung Electronics 445-701 South Korea
| | - Kangsoo Kim
- Memory Thin Film Technology Team, Giheung Hwaseong Complex, Samsung Electronics 445-701 South Korea
| | - Euijoon Yoon
- Department of Materials Science and Engineering, Seoul National University Seoul 08826 Korea .,Research Institute of Advanced Materials and Inter-University Semiconductor Research Center, Seoul National University Seoul 08826 South Korea
| | - Gun-Do Lee
- Department of Materials Science and Engineering, Seoul National University Seoul 08826 Korea .,Research Institute of Advanced Materials and Inter-University Semiconductor Research Center, Seoul National University Seoul 08826 South Korea
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