Hierarchical spiral-scan trajectory for efficient scanning ion conductance microscopy

Scanning ion conductance microscope with a capacitance-compensated current source amplifier

A high-speed imaging method for a scanning ion conductance microscope (SICM) based on a current source amplifier that compensates for unavoidable capacitance is proposed. The capacitance is generated on a side wall of a nanopipette in the principle of the SICM. The electrical response time is deteriorated due to the capacitance, and the probe overshoots the setpoint of the detection of the sample surface. A capacitance compensation circuit was installed in a feedback circuit of the current source amplifier. The proposed capacitance compensation method is useful because it can shorten the imaging time by only installing the compensation circuit in the ion current detection circuit of an existing SICM. The maximum approaching speeds with and without capacitance compensation were found to be 1050 and 450 µm/s, respectively. The approaching speed with capacitance compensation was 2.3 times faster than that without capacitance compensation. A topographic image of the test sample was successfully obtained at an approaching speed of 1050 µm/s. The images of microvillus dynamics of COS-7 cells were obtained at ∼23.4 s/frame as an application of the developed technology.

Scanning Ion Conductance Microscopy

Scanning ion conductance microscopy (SICM) has emerged as a versatile tool for studies of interfaces in biology and materials science with notable utility in biophysical and electrochemical measurements. The heart of the SICM is a nanometer-scale electrolyte filled glass pipette that serves as a scanning probe. In the initial conception, manipulations of ion currents through the tip of the pipette and appropriate positioning hardware provided a route to recording micro- and nanoscopic mapping of the topography of surfaces. Subsequent advances in instrumentation, probe design, and methods significantly increased opportunities for SICM beyond recording topography. Hybridization of SICM with coincident characterization techniques such as optical microscopy and faradaic electrodes have brought SICM to the forefront as a tool for nanoscale chemical measurement for a wide range of applications. Modern approaches to SICM realize an important tool in analytical, bioanalytical, biophysical, and materials measurements, where significant opportunities remain for further exploration. In this review, we chronicle the development of SICM from the perspective of both the development of instrumentation and methods and the breadth of measurements performed.

Research on the Adaptive Sensitivity Scanning Method for Ion Conductance Microscopy with High Efficiency and Reliability

Scanning ion conductance microscopy (SICM) is a type of in situ measurement technology for noncontact detection of samples in electrolytes with nanoscale resolution and has been used increasingly in biomedical and electrochemical fields in recent years. However, there is an inherent contradiction in the technique that makes SICM's sensitivity and accuracy difficult to balance. Higher sensitivity allows for faster probe speeds and higher scanning reliability but leads to lower accuracy, and vice versa. To resolve this problem, an adaptive sensitivity scanning method is proposed here that is designed to increase SICM's imaging efficiency without reducing its scanning reliability and accuracy. In the proposed scanning method, the sensitivity is automatically switched via the bias voltage based on the probe-sample distance. When the probe is located far away from the sample, the probe then predetects the sample position rapidly with high sensitivity. When the sample has been sensed in the high-sensitivity phase, the probe then detects the sample with low sensitivity. The basic theory and the feasibility of the alterable sensitivity detection strategy is also studied using the finite element method (FEM) and by performing experiments in this work. Finally, through testing of the standard silicon and polydimethylsiloxane (PDMS) samples, the proposed method is shown to increase SICM imaging efficiency significantly by up to 5 times relative to the conventional hopping mode without sacrificing the scanning accuracy and reliability.

Noncontact Nanoscale Imaging of Cells

The reduction in ion current as a fine pipette approaches a cell surface allows the cell surface topography to be imaged, with nanoscale resolution, without contact with the delicate cell surface. A variety of different methods have been developed and refined to scan the topography of the dynamic cell surface at high resolution and speed. Measurement of cell topography can be complemented by performing local probing or mapping of the cell surface using the same pipette. This can be done by performing single-channel recording, applying force, delivering agonists, using pipettes fabricated to contain an electrochemical probe, or combining with fluorescence imaging. These methods in combination have great potential to image and map the surface of live cells at the nanoscale.