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For: Ţălu Ş, Matos RS, Pinto EP, Rezaee S, Mardani M. Stereometric and fractal analysis of sputtered Ag-Cu thin films. Surfaces and Interfaces 2020. [DOI: 10.1016/j.surfin.2020.100650] [Citation(s) in RCA: 8] [Impact Index Per Article: 1.6] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
Number Cited by Other Article(s)
1
Korpi AG, Rezaee S, Ahmadpourian A, Ţălu Ş, Jen TC. Advanced morphological characterization of DC sputtered copper thin films. MODERN PHYSICS LETTERS B 2024;38. [DOI: 10.1142/s0217984924500532] [Citation(s) in RCA: 1] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 12/06/2024]
2
Pandey RK, Yadav RP, Kumar T, Kumar A, Pathak S, Awasthi S, Singh UB, Pandey AC. Fractal characterizations of MeV ion treated CaF2 thin films. CHAOS (WOODBURY, N.Y.) 2023;33:033110. [PMID: 37003822 DOI: 10.1063/5.0135127] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/16/2022] [Accepted: 02/13/2023] [Indexed: 06/19/2023]
3
Shakoury R, Matos RS, da Fonseca Filho HD, Rezaee S, Arman A, Boochani A, Jurečka S, Zelati A, Mardani M, Ţălu Ş. Investigation of deposition temperature effect on spatial patterns of MgF2 thin films. Microsc Res Tech 2023;86:169-180. [PMID: 36260856 DOI: 10.1002/jemt.24246] [Citation(s) in RCA: 5] [Impact Index Per Article: 2.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/17/2022] [Revised: 09/12/2022] [Accepted: 10/06/2022] [Indexed: 01/20/2023]
4
Matos R, Ferreira N, Ţălu Ş, Ghaderi A, Solaymani S, Pires M, Sanches E, da Fonseca Filho H. Percolative, Multifractal, and Symmetry Properties of the Surface at Nanoscale of Cu-Ni Bimetallic Thin Films Deposited by RF-PECVD. Symmetry (Basel) 2022;14:2675. [DOI: 10.3390/sym14122675] [Citation(s) in RCA: 7] [Impact Index Per Article: 2.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/06/2024]  Open
5
Sadeghi M, Zelati A, Rezaee S, Luna C, Matos R, Pires M, Ferreira N, da Fonseca Filho H, Ahmadpourian A, Ţălu Ş. Evaluating the Topological Surface Properties of Cu/Cr Thin Films Using 3D Atomic Force Microscopy Topographical Maps. COATINGS 2022;12:1364. [DOI: 10.3390/coatings12091364] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 12/06/2024]
6
Rocha ALF, de Aguiar Nunes RZ, Matos RS, da Fonseca Filho HD, de Araújo Bezerra J, Lima AR, Guimarães FEG, Pamplona AMSR, Majolo C, de Souza MG, Campelo PH, Ţălu Ş, Bagnato VS, Inada NM, Sanches EA. Alternative Controlling Agent of Theobroma grandiflorum Pests: Nanoscale Surface and Fractal Analysis of Gelatin/PCL Loaded Particles Containing Lippia origanoides Essential Oil. NANOMATERIALS (BASEL, SWITZERLAND) 2022;12:2712. [PMID: 35957144 PMCID: PMC9370742 DOI: 10.3390/nano12152712] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 07/16/2022] [Revised: 08/05/2022] [Accepted: 08/05/2022] [Indexed: 06/15/2023]
7
Habibi M, Sadeghi M, Arman A, Sobola D, Luna C, Mirzaei S, Zelati A, da Fonseca Filho HD, Ţălu Ş. Corrosion resistance and surface microstructure of Mg3 N2 /SS thin films by plasma focus instrument. Microsc Res Tech 2022;85:2880-2893. [PMID: 35488428 DOI: 10.1002/jemt.24138] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/08/2021] [Revised: 03/24/2022] [Accepted: 04/17/2022] [Indexed: 02/05/2023]
8
de Oliveira LM, Matos RS, Ţălu Ş, Rocha ALF, de Aguiar Nunes RZ, Bezerra JDA, Campelo Felix PH, Inada NM, Sanches EA, da Fonseca Filho HD. Three-Dimensional Nanoscale Morphological Surface Analysis of Polymeric Particles Containing Allium sativum Essential Oil. MATERIALS 2022;15:ma15072635. [PMID: 35407970 PMCID: PMC9000302 DOI: 10.3390/ma15072635] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 02/16/2022] [Revised: 03/22/2022] [Accepted: 03/31/2022] [Indexed: 02/07/2023]
9
Fractal Analysis on Surface Topography of Thin Films: A Review. FRACTAL AND FRACTIONAL 2022. [DOI: 10.3390/fractalfract6030135] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/04/2023]
10
Das A, Matos RS, Pinto EP, Yadav RP, Ţălu Ş, Kumar S. 3D micromorphology-contact resistance-conductivity insights of quasi 2D Cd1-xPbxS thin films: Investigation based on stereometric and fractal analysis. MATERIALS CHEMISTRY AND PHYSICS 2022. [DOI: 10.1016/j.matchemphys.2021.125635] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
11
Matos RS, da Fonseca Filho HD, Das A, Kumar S, Chawla V, Ţălu Ş. Stereometric analysis of Ti1- x Alx N thin films deposited by direct current/radio frequency magnetron sputtering. Microsc Res Tech 2022;85:296-307. [PMID: 34390538 DOI: 10.1002/jemt.23905] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/09/2021] [Revised: 07/30/2021] [Accepted: 07/31/2021] [Indexed: 02/05/2023]
12
Correlation between Fractal Dimension and Areal Surface Parameters for Fracture Analysis after Bending-Torsion Fatigue. METALS 2021. [DOI: 10.3390/met11111790] [Citation(s) in RCA: 16] [Impact Index Per Article: 4.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/16/2022]
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