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Fritsch B, Wu M, Hutzler A, Zhou D, Spruit R, Vogl L, Will J, Garza HHP, März M, Jank MP, Spiecker E. Sub-Kelvin thermometry for evaluating the local temperature stability within in situ TEM gas cells. Ultramicroscopy 2022; 235:113494. [DOI: 10.1016/j.ultramic.2022.113494] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/16/2021] [Revised: 12/14/2021] [Accepted: 02/15/2022] [Indexed: 11/25/2022]
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2
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Zhu M, Hwang J. Scattering angle dependence of temperature susceptivity of electron scattering in scanning transmission electron microscopy. Ultramicroscopy 2021; 232:113419. [PMID: 34740029 DOI: 10.1016/j.ultramic.2021.113419] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/06/2021] [Revised: 09/21/2021] [Accepted: 10/16/2021] [Indexed: 11/24/2022]
Abstract
The sensitivity of electron scattering to sample temperature (T) as a function of the scattering angle in scanning transmission electron microscopy (STEM) is investigated. Thermal vibration of atoms in crystal lattice results in attenuated Bragg reflections and a diffuse background in electron diffraction patterns, which have direct implications on STEM images. The scattering intensities at higher angle are known to be dominated by thermal diffuse scattering (TDS) and the column intensity is expected to have a negative correlation with increasing T because of the disrupted channeling, but the T susceptivity of the scattering intensity at smaller angles is less known. Our experiment shows that the T dependency of annular averaged diffraction intensity inverts its sign two times outside the direct beam, and the T sensitivity varies significantly as a function of scattering angle. The intensity shows a positive correlation with increasing T at the low to intermediate angular ranges before it returns to the negative correlation at the higher angle range. A reasonable agreement is found between the experimental data and multislice simulation data. Absorptive model is used to provide theoretical insights into the observed trends. Similar inversions of T dependency of column intensities are also observed in experimental and simulated atomic-resolution STEM images. The findings provide an important implication to the precise quantification of local T at high spatial resolution by optimizing the collection angles in STEM.
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Affiliation(s)
- Menglin Zhu
- Department of Materials Science and Engineering, The Ohio State University, Columbus, OH 43210, USA
| | - Jinwoo Hwang
- Department of Materials Science and Engineering, The Ohio State University, Columbus, OH 43210, USA.
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3
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Fritsch B, Hutzler A, Wu M, Khadivianazar S, Vogl L, Jank MPM, März M, Spiecker E. Accessing local electron-beam induced temperature changes during in situ liquid-phase transmission electron microscopy. NANOSCALE ADVANCES 2021; 3:2466-2474. [PMID: 36134158 PMCID: PMC9419575 DOI: 10.1039/d0na01027h] [Citation(s) in RCA: 18] [Impact Index Per Article: 4.5] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/07/2020] [Accepted: 02/18/2021] [Indexed: 05/26/2023]
Abstract
A significant electron-beam induced heating effect is demonstrated for liquid-phase transmission electron microscopy at low electron flux densities using Au nanoparticles as local nanothermometers. The obtained results are in agreement with theoretical considerations. Furthermore, the impact of beam-induced heating on radiolysis chemistry is estimated and the consequences of the effect are discussed.
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Affiliation(s)
- Birk Fritsch
- Electron Devices (LEB), Department of Electrical, Electronic and Communication Engineering, Friedrich-Alexander University Erlangen-Nürnberg (FAU) Cauerstraße 6 91058 Erlangen Germany
| | - Andreas Hutzler
- Electron Devices (LEB), Department of Electrical, Electronic and Communication Engineering, Friedrich-Alexander University Erlangen-Nürnberg (FAU) Cauerstraße 6 91058 Erlangen Germany
| | - Mingjian Wu
- Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Interdisciplinary Center for Nanostructured Films (IZNF), Department of Materials Science and Engineering, Friedrich-Alexander University Erlangen-Nürnberg (FAU) Cauerstraße 3 91058 Erlangen Germany
| | - Saba Khadivianazar
- Electron Devices (LEB), Department of Electrical, Electronic and Communication Engineering, Friedrich-Alexander University Erlangen-Nürnberg (FAU) Cauerstraße 6 91058 Erlangen Germany
| | - Lilian Vogl
- Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Interdisciplinary Center for Nanostructured Films (IZNF), Department of Materials Science and Engineering, Friedrich-Alexander University Erlangen-Nürnberg (FAU) Cauerstraße 3 91058 Erlangen Germany
| | - Michael P M Jank
- Fraunhofer Institute for Integrated Systems and Device Technology IISB Schottkystraße 10 91058 Erlangen Germany
| | - Martin März
- Electron Devices (LEB), Department of Electrical, Electronic and Communication Engineering, Friedrich-Alexander University Erlangen-Nürnberg (FAU) Cauerstraße 6 91058 Erlangen Germany
- Fraunhofer Institute for Integrated Systems and Device Technology IISB Schottkystraße 10 91058 Erlangen Germany
| | - Erdmann Spiecker
- Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Interdisciplinary Center for Nanostructured Films (IZNF), Department of Materials Science and Engineering, Friedrich-Alexander University Erlangen-Nürnberg (FAU) Cauerstraße 3 91058 Erlangen Germany
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4
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Park J, Bae K, Kim TR, Perez C, Sood A, Asheghi M, Goodson KE, Park W. Direct Quantification of Heat Generation Due to Inelastic Scattering of Electrons Using a Nanocalorimeter. ADVANCED SCIENCE (WEINHEIM, BADEN-WURTTEMBERG, GERMANY) 2021; 8:2002876. [PMID: 33552867 PMCID: PMC7856892 DOI: 10.1002/advs.202002876] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 07/29/2020] [Revised: 10/28/2020] [Indexed: 06/12/2023]
Abstract
Transmission electron microscopy (TEM) is arguably the most important tool for atomic-scale material characterization. A significant portion of the energy of transmitted electrons is transferred to the material under study through inelastic scattering, causing inadvertent damage via ionization, radiolysis, and heating. In particular, heat generation complicates TEM observations as the local temperature can affect material properties. Here, the heat generation due to electron irradiation is quantified using both top-down and bottom-up approaches: direct temperature measurements using nanowatt calorimeters as well as the quantification of energy loss due to inelastic scattering events using electron energy loss spectroscopy. Combining both techniques, a microscopic model is developed for beam-induced heating and to identify the primary electron-to-heat conversion mechanism to be associated with valence electrons. Building on these results, the model provides guidelines to estimate temperature rise for general materials with reasonable accuracy. This study extends the ability to quantify thermal impact on materials down to the atomic scale.
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Affiliation(s)
- Joonsuk Park
- Department of Materials Science and EngineeringStanford UniversityStanfordCA94305USA
| | - Kiho Bae
- Department of Mechanical EngineeringStanford UniversityStanfordCA94305USA
| | - Taeho Roy Kim
- Stanford Nano Shared FacilitiesStanford UniversityStanfordCA94305USA
| | - Christopher Perez
- Department of Mechanical EngineeringStanford UniversityStanfordCA94305USA
| | - Aditya Sood
- Stanford Institute for Materials and Energy SciencesSLAC National Accelerator LaboratoryMenlo ParkCA94025USA
| | - Mehdi Asheghi
- Department of Mechanical EngineeringStanford UniversityStanfordCA94305USA
| | - Kenneth E. Goodson
- Department of Mechanical EngineeringStanford UniversityStanfordCA94305USA
| | - Woosung Park
- Division of Mechanical Systems EngineeringSookmyung Women's UniversitySeoul04310South Korea
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5
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Guzelturk B, Utterback JK, Coropceanu I, Kamysbayev V, Janke EM, Zajac M, Yazdani N, Cotts BL, Park S, Sood A, Lin MF, Reid AH, Kozina ME, Shen X, Weathersby SP, Wood V, Salleo A, Wang X, Talapin DV, Ginsberg NS, Lindenberg AM. Nonequilibrium Thermodynamics of Colloidal Gold Nanocrystals Monitored by Ultrafast Electron Diffraction and Optical Scattering Microscopy. ACS NANO 2020; 14:4792-4804. [PMID: 32208676 DOI: 10.1021/acsnano.0c00673] [Citation(s) in RCA: 15] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/03/2023]
Abstract
Metal nanocrystals exhibit important optoelectronic and photocatalytic functionalities in response to light. These dynamic energy conversion processes have been commonly studied by transient optical probes to date, but an understanding of the atomistic response following photoexcitation has remained elusive. Here, we use femtosecond resolution electron diffraction to investigate transient lattice responses in optically excited colloidal gold nanocrystals, revealing the effects of nanocrystal size and surface ligands on the electron-phonon coupling and thermal relaxation dynamics. First, we uncover a strong size effect on the electron-phonon coupling, which arises from reduced dielectric screening at the nanocrystal surfaces and prevails independent of the optical excitation mechanism (i.e., inter- and intraband). Second, we find that surface ligands act as a tuning parameter for hot carrier cooling. Particularly, gold nanocrystals with thiol-based ligands show significantly slower carrier cooling as compared to amine-based ligands under intraband optical excitation due to electronic coupling at the nanocrystal/ligand interfaces. Finally, we spatiotemporally resolve thermal transport and heat dissipation in photoexcited nanocrystal films by combining electron diffraction with stroboscopic elastic scattering microscopy. Taken together, we resolve the distinct thermal relaxation time scales ranging from 1 ps to 100 ns associated with the multiple interfaces through which heat flows at the nanoscale. Our findings provide insights into optimization of gold nanocrystals and their thin films for photocatalysis and thermoelectric applications.
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Affiliation(s)
- Burak Guzelturk
- Department of Materials Science and Engineering, Stanford University, Stanford, California 94305, United States
- Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo Park, California 94025 United States
| | - James K Utterback
- Department of Chemistry, University of California, Berkeley, California 94720, United States
| | - Igor Coropceanu
- Department of Chemistry and James Franck Institute, University of Chicago, Chicago, Illinois 60637, United States
| | - Vladislav Kamysbayev
- Department of Chemistry and James Franck Institute, University of Chicago, Chicago, Illinois 60637, United States
| | - Eric M Janke
- Department of Chemistry and James Franck Institute, University of Chicago, Chicago, Illinois 60637, United States
| | - Marc Zajac
- Department of Materials Science and Engineering, Stanford University, Stanford, California 94305, United States
| | - Nuri Yazdani
- Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo Park, California 94025 United States
- Department of Information Technology and Electrical Engineering, ETH Zurich, 8092 Zurich, Switzerland
| | - Benjamin L Cotts
- Department of Materials Science and Engineering, Stanford University, Stanford, California 94305, United States
| | - Suji Park
- Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo Park, California 94025 United States
| | - Aditya Sood
- Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo Park, California 94025 United States
| | - Ming-Fu Lin
- SLAC National Accelerator Laboratory, Menlo Park, California 94025, United States
| | - Alexander H Reid
- SLAC National Accelerator Laboratory, Menlo Park, California 94025, United States
| | - Michael E Kozina
- SLAC National Accelerator Laboratory, Menlo Park, California 94025, United States
| | - Xiaozhe Shen
- SLAC National Accelerator Laboratory, Menlo Park, California 94025, United States
| | - Stephen P Weathersby
- SLAC National Accelerator Laboratory, Menlo Park, California 94025, United States
| | - Vanessa Wood
- Department of Information Technology and Electrical Engineering, ETH Zurich, 8092 Zurich, Switzerland
| | - Alberto Salleo
- Department of Materials Science and Engineering, Stanford University, Stanford, California 94305, United States
| | - Xijie Wang
- SLAC National Accelerator Laboratory, Menlo Park, California 94025, United States
| | - Dmitri V Talapin
- Department of Chemistry and James Franck Institute, University of Chicago, Chicago, Illinois 60637, United States
| | - Naomi S Ginsberg
- Department of Chemistry, University of California, Berkeley, California 94720, United States
- Department of Physics, University of California, Berkeley, California 94720, United States
- Molecular Biophysics and Integrated Bioimaging Division and Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States
- Kavli Energy NanoSciences Institute, Berkeley, California 94720, United States
| | - Aaron M Lindenberg
- Department of Materials Science and Engineering, Stanford University, Stanford, California 94305, United States
- Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo Park, California 94025 United States
- The PULSE Institute for Ultrafast Energy Science, SLAC National Accelerator Laboratory, Menlo Park, California 94025, United States
- Department of Photon Science, Stanford University and SLAC National Accelerator Laboratory, Menlo Park, California 94025, United States
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Du DX, Flannigan DJ. Imaging phonon dynamics with ultrafast electron microscopy: Kinematical and dynamical simulations. STRUCTURAL DYNAMICS (MELVILLE, N.Y.) 2020; 7:024103. [PMID: 32341940 PMCID: PMC7166119 DOI: 10.1063/1.5144682] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 01/09/2020] [Accepted: 03/09/2020] [Indexed: 06/11/2023]
Abstract
Ultrafast x-ray and electron scattering techniques have proven to be useful for probing the transient elastic lattice deformations associated with photoexcited coherent acoustic phonons. Indeed, femtosecond electron imaging using an ultrafast electron microscope (UEM) has been used to directly image the influence of nanoscale structural and morphological discontinuities on the emergence, propagation, dispersion, and decay behaviors in a variety of materials. Here, we describe our progress toward the development of methods ultimately aimed at quantifying acoustic-phonon properties from real-space UEM images via conventional image simulation methods extended to the associated strain-wave lattice deformation symmetries and extents. Using a model system consisting of pristine single-crystal Ge and a single, symmetric Lamb-type guided-wave mode, we calculate the transient strain profiles excited in a wedge specimen and then apply both kinematical- and dynamical-scattering methods to simulate the resulting UEM bright-field images. While measurable contrast strengths arising from the phonon wavetrains are found for optimally oriented specimens using both approaches, incorporation of dynamical scattering effects via a multi-slice method returns better qualitative agreement with experimental observations. Contrast strengths arising solely from phonon-induced local lattice deformations are increased by nearly an order of magnitude when incorporating multiple electron scattering effects. We also explicitly demonstrate the effects of changes in global specimen orientation on the observed contrast strength, and we discuss the implications for increasing the sophistication of the model with respect to quantification of phonon properties from UEM images.
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Affiliation(s)
| | - David J. Flannigan
- Author to whom correspondence should be addressed:. Tel.: +1 612-625-3867
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Gaulandris F, Simonsen SB, Wagner JB, Mølhave K, Muto S, Kuhn LT. Methods for Calibration of Specimen Temperature During In Situ Transmission Electron Microscopy Experiments. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2020; 26:3-17. [PMID: 31957636 DOI: 10.1017/s1431927619015344] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/10/2023]
Abstract
One of the biggest challenges for in situ heating transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) is the ability to measure the local temperature of the specimen accurately. Despite technological improvements in the construction of TEM/STEM heating holders, the problem of being able to measure the real sample temperature is still the subject of considerable discussion. In this study, we review the present literature on methodologies for temperature calibration. We analyze calibration methods that require the use of a thermometric material in addition to the specimen under study, as well as methods that can be performed directly on the specimen of interest without the need for a previous calibration. Finally, an overview of the most important characteristics of all the treated techniques, including temperature ranges and uncertainties, is provided in order to provide an accessory database to consult before an in situ TEM/STEM temperature calibration experiment.
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Affiliation(s)
- Fabrizio Gaulandris
- Department of Energy Conversion and Storage, Technical University of Denmark, Fysikvej, DK-2800 Kgs. Lyngby, Denmak
| | - Søren B Simonsen
- Department of Energy Conversion and Storage, Technical University of Denmark, Fysikvej, DK-2800 Kgs. Lyngby, Denmak
| | - Jakob B Wagner
- DTU Nanolab, Technical University of Denmark, Fysikvej DK-2800 Kgs. Lyngby, Denmark
| | - Kristian Mølhave
- DTU Nanolab, Technical University of Denmark, Fysikvej DK-2800 Kgs. Lyngby, Denmark
| | - Shun Muto
- Institute of Materials and Systems for Sustainability, Nagoya University, 464-8601 Furocho, Chikusa-ku, Nagoya, Aichi, Japan
| | - Luise T Kuhn
- Department of Energy Conversion and Storage, Technical University of Denmark, Fysikvej, DK-2800 Kgs. Lyngby, Denmak
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VandenBussche EJ, Flannigan DJ. Sources of error in Debye-Waller-effect measurements relevant to studies of photoinduced structural dynamics. Ultramicroscopy 2018; 196:111-120. [PMID: 30352384 DOI: 10.1016/j.ultramic.2018.10.002] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/04/2018] [Revised: 09/23/2018] [Accepted: 10/04/2018] [Indexed: 10/28/2022]
Abstract
We identify and quantify several practical effects likely to be present in both static and ultrafast electron-scattering experiments that may interfere with the Debye-Waller (DW) effect. Using 120-nm thick, small-grained, polycrystalline aluminum foils as a test system, we illustrate the impact of specimen tilting, in-plane translation, and changes in z height on Debye-Scherrer-ring intensities. We find that tilting by less than one degree can result in statistically-significant changes in diffracted-beam intensities for large specimen regions containing > 105 nanocrystalline grains. We demonstrate that, in addition to effective changes in the field of view with tilting, slight texturing of the film can result in deviations from expected DW-effect behavior. Further, we find that in-plane translations of as little as 20 nm also produce statistically-significant intensity changes, while normalization to total image counts eliminates such effects arising from changes in z height. The results indicate that the use of polycrystalline films in ultrafast electron-scattering experiments can greatly reduce the negative impacts of these effects as compared to single-crystal specimens, though it does not entirely eliminate them. Thus, it is important to account for such effects when studying thin-foil specimens having relatively short reciprocal-lattice rods.
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Affiliation(s)
- Elisah J VandenBussche
- Department of Chemical Engineering and Materials Science, University of Minnesota, 421 Washington Ave. SE, Minneapolis, MN 55455, United States
| | - David J Flannigan
- Department of Chemical Engineering and Materials Science, University of Minnesota, 421 Washington Ave. SE, Minneapolis, MN 55455, United States.
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