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For: Anada S, Nomura Y, Hirayama T, Yamamoto K. Sparse coding and dictionary learning for electron hologram denoising. Ultramicroscopy 2019;206:112818. [DOI: 10.1016/j.ultramic.2019.112818] [Citation(s) in RCA: 12] [Impact Index Per Article: 2.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/29/2018] [Revised: 07/25/2019] [Accepted: 07/26/2019] [Indexed: 11/18/2022]
Number Cited by Other Article(s)
1
Takahashi Y, Akashi T, Tanigaki T. Removal of phase residues in electron holography. Microscopy (Oxf) 2024;73:376-380. [PMID: 38236158 DOI: 10.1093/jmicro/dfad062] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/13/2023] [Revised: 10/31/2023] [Accepted: 12/18/2023] [Indexed: 01/19/2024]  Open
2
Lee S, Midoh Y, Tomita Y, Tamaoka T, Auchi M, Sasaki T, Murakami Y. Noise reduction of electron holography observations for a thin-foiled Nd-Fe-B specimen using the wavelet hidden Markov model. Appl Microsc 2024;54:4. [PMID: 38630318 PMCID: PMC11024082 DOI: 10.1186/s42649-024-00097-w] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/06/2023] [Accepted: 03/26/2024] [Indexed: 04/21/2024]  Open
3
Sasaki Y, Yamamoto K, Anada S, Yoshimoto N. Low-dose measurement of electric potential distribution in organic light-emitting diode by phase-shifting electron holography with 3D tensor decomposition. Microscopy (Oxf) 2023;72:485-493. [PMID: 36852846 DOI: 10.1093/jmicro/dfad019] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/31/2023] [Revised: 02/20/2023] [Accepted: 02/27/2023] [Indexed: 03/01/2023]  Open
4
Anada S, Nomura Y, Yamamoto K. Enhancing performance of electron holography with mathematical and machine learning-based denoising techniques. Microscopy (Oxf) 2023;72:461-484. [PMID: 37428597 DOI: 10.1093/jmicro/dfad037] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/28/2023] [Revised: 06/13/2023] [Accepted: 07/09/2023] [Indexed: 07/12/2023]  Open
5
Botifoll M, Pinto-Huguet I, Arbiol J. Machine learning in electron microscopy for advanced nanocharacterization: current developments, available tools and future outlook. NANOSCALE HORIZONS 2022;7:1427-1477. [PMID: 36239693 DOI: 10.1039/d2nh00377e] [Citation(s) in RCA: 14] [Impact Index Per Article: 7.0] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/16/2023]
6
Katsuno H, Kimura Y, Yamazaki T, Takigawa I. Early Detection of Nucleation Events From Solution in LC-TEM by Machine Learning. Front Chem 2022;10:818230. [PMID: 35141199 PMCID: PMC8819544 DOI: 10.3389/fchem.2022.818230] [Citation(s) in RCA: 4] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/19/2021] [Accepted: 01/03/2022] [Indexed: 01/05/2023]  Open
7
Anada S, Nomura Y, Hirayama T, Yamamoto K. Computational Evaluation of Sparse Coding on off-axis Electron Holograms: Comparison Between Charge-Coupled Device and Direct-Detection Device Cameras. Microscopy (Oxf) 2021;71:41-49. [PMID: 34410409 DOI: 10.1093/jmicro/dfab031] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/21/2021] [Revised: 07/29/2021] [Accepted: 08/18/2021] [Indexed: 11/14/2022]  Open
8
Yamamoto K, Anada S, Sato T, Yoshimoto N, Hirayama T. Phase-shifting electron holography for accurate measurement of potential distributions in organic and inorganic semiconductors. Microscopy (Oxf) 2021;70:24-38. [PMID: 33044557 DOI: 10.1093/jmicro/dfaa061] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/09/2020] [Revised: 09/28/2020] [Accepted: 10/09/2020] [Indexed: 11/14/2022]  Open
9
Cho Y, Lee S, Murakami Y. Magnetic flux density measurements from narrow grain boundaries produced in sintered permanent magnets. Microscopy (Oxf) 2021;70:17-23. [PMID: 32572498 DOI: 10.1093/jmicro/dfaa032] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/18/2020] [Revised: 06/11/2020] [Accepted: 06/19/2020] [Indexed: 11/13/2022]  Open
10
Nomura Y, Yamamoto K, Anada S, Hirayama T, Igaki E, Saitoh K. Denoising of series electron holograms using tensor decomposition. Microscopy (Oxf) 2020;70:255-264. [PMID: 32945839 DOI: 10.1093/jmicro/dfaa057] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/19/2020] [Revised: 09/07/2020] [Accepted: 09/15/2020] [Indexed: 11/14/2022]  Open
11
Anada S, Nomura Y, Hirayama T, Yamamoto K. Simulation-Trained Sparse Coding for High-Precision Phase Imaging in Low-Dose Electron Holography. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2020;26:429-438. [PMID: 32513331 DOI: 10.1017/s1431927620001452] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
12
Midoh Y, Nakamae K. Accuracy improvement of phase estimation in electron holography using noise reduction methods. Microscopy (Oxf) 2020;69:123-131. [PMID: 31977048 DOI: 10.1093/jmicro/dfz115] [Citation(s) in RCA: 9] [Impact Index Per Article: 2.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/01/2019] [Revised: 11/21/2019] [Accepted: 11/25/2019] [Indexed: 11/14/2022]  Open
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