Surface potential mapping: A qualitative material contrast in SPM

Pulsed Force Kelvin Probe Force Microscopy-A New Type of Kelvin Probe Force Microscopy under Ambient Conditions

Kelvin probe force microscopy (KPFM) is an increasingly popular scanning probe microscopy technique used for nanoscale imaging of surface potential for various materials, such as metals, semiconductors, biological samples, and photovoltaics, to reveal their surface work function and/or local accumulation of charges. This featured review outlines the operation principles and applications of KPFM, including several typical commercially available variants. We highlight the significance of surface potential measurements, present the details of the method operation, and discuss the causes of the limitation on spatial resolution. Then, we present the pulsed force Kelvin probe force microscopy (PF-KPFM) as an innovative improvement to KPFM, which provides an enhanced spatial resolution of <10 nm under ambient conditions. PF-KPFM is promising for the characterization of heterogeneous materials with spatial variations of electrical properties. It will be especially instrumental for investigating emerging perovskite photovoltaics, heterogeneous catalysts, 2D materials, and ferroelectric materials, among others.

Sub-10 nm spatial resolution for electrical properties measurements using bimodal excitation in electric force microscopy

We demonstrate that under ambient and humidity-controlled conditions, operation of bimodal excitation single-scan electric force microscopy with no electrical feedback loop increases the spatial resolution of surface electrical property measurements down to the 5 nm limit. This technical improvement is featured on epitaxial graphene layers on SiC, which is used as a model sample. The experimental conditions developed to achieve such resolution are discussed and linked to the stable imaging achieved using the proposed method. The application of the herein reported method is achieved without the need to apply DC bias voltages, which benefits specimens that are highly sensitive to polarization. Besides, it allows the simultaneous parallel acquisition of surface electrical properties (such as contact potential difference) at the same scanning rate as in amplitude modulation atomic force microscopy (AFM) topography measurements. This makes it attractive for applications in high scanning speed AFM experiments in various fields for material screening and metrology of semiconductor systems.

Title Synergistic Effect of Al₂O₃ Inclusion and Pearlite on the Localized Corrosion Evolution Process of Carbon Steel in Marine Environment

The initiation and evolution of the localized corrosion in carbon steel were investigated in a simulated marine environment of Xisha Island in the South China Sea. In the initial stage, localized corrosion occurred in the form of corrosion spot. The localized corrosion morphology and electrochemical information during corrosion process were tracked by field emission scanning electron microscopy energy dispersive spectrometry (FE-SEM-EDS), scanning vibrating electrode technique (SVET) and scanning Kelvin probe force microscopy (SKPFM). Localized corrosion was induced by the microcrevices around Al₂O₃ inclusions. The occluded cells and oxygen concentration cell formed in the pits could accelerate the localized corrosion. Pearlite accelerated the dissolution of the inside and surrounding ferrite via the galvanic effect between Fe₃C and ferrite. Overall, the localized corrosion was initiated and evaluated under a synergistic effect of crevice corrosion, occluded cells, oxygen concentration cell and the galvanic couple between FeC₃ and ferrite.

Multifrequency Kelvin probe force microscopy on self assembled molecular layers and quantitative assessment of images' quality

The application of single-pass multifrequency Kelvin probe force microscopy (KPFM) for topography and contact potential difference (CPD) measurements of organic self-assembled monolayers (SAM) is demonstrated. Four modes of mechanical and electrical cantilever excitation were tested in order to obtain the best possible resolution in the CPD measurements. The algorithm using maximum capacity of information channel for quantitative image quality assessment was proposed to compare and assess the quality of the recorded images and imaging modes. The improvement of the quality of CPD imaging in multiresonance operation was confirmed.

He-Ion Microscopy as a High-Resolution Probe for Complex Quantum Heterostructures in Core-Shell Nanowires

Core-shell semiconductor nanowires (NW) with internal quantum heterostructures are amongst the most complex nanostructured materials to be explored for assessing the ultimate capabilities of diverse ultrahigh-resolution imaging techniques. To probe the structure and composition of these materials in their native environment with minimal damage and sample preparation calls for high-resolution electron or ion microscopy methods, which have not yet been tested on such classes of ultrasmall quantum nanostructures. Here, we demonstrate that scanning helium ion microscopy (SHeIM) provides a powerful and straightforward method to map quantum heterostructures embedded in complex III-V semiconductor NWs with unique material contrast at ∼1 nm resolution. By probing the cross sections of GaAs-Al(Ga)As core-shell NWs with coaxial GaAs quantum wells as well as short-period GaAs/AlAs superlattice (SL) structures in the shell, the Al-rich and Ga-rich layers are accurately discriminated by their image contrast in excellent agreement with correlated, yet destructive, scanning transmission electron microscopy and atom probe tomography analysis. Most interestingly, quantitative He-ion dose-dependent SHeIM analysis of the ternary AlGaAs shell layers and of compositionally nonuniform GaAs/AlAs SLs reveals distinct alloy composition fluctuations in the form of Al-rich clusters with size distributions between ∼1-10 nm. In the GaAs/AlAs SLs the alloy clustering vanishes with increasing SL-period (>5 nm-GaAs/4 nm-AlAs), providing insights into critical size dimensions for atomic intermixing effects in short-period SLs within a NW geometry. The straightforward SHeIM technique therefore provides unique benefits in imaging the tiniest nanoscale features in topography, structure and composition of a multitude of diverse complex semiconductor nanostructures.

An attempt to correlate surface physics with chemical properties: molecular beam and Kelvin probe investigations of Ce1-xZrxO2 thin films

What is the correlation between physical properties of the surfaces (such as surface potential, electronic nature of the surface), and chemical and catalysis properties (such as chemisorption, sticking probability of surface)? An attempt has been made to explore any correlation that might exist between the physical and chemical properties of thin film surfaces. Kelvin probe microscopy (KPM) and the molecular beam (MB) methods were employed to carry out the surface potential, and oxygen adsorption and oxygen storage capacity (OSC) measurements on Ce_1-xZr_xO₂ thin films. A sol-gel synthesis procedure and spin-coating deposition method have been applied to make continuous nanocrystalline Ce_1-xZr_xO₂ (x = 0-1) (CZ) thin films with uniform thickness (35-50 nm); however, surface roughness and porosity inherently changes with CZ composition. MB studies of O₂ adsorption on CZ reveal high OSC for Ce_0.9Zr_0.1O₂, which also exhibits highly porous and significantly rough surface characteristics. The surface potential observed from KPM studies varied between 30 and 80 mV, with Ce-rich compositions exhibiting the highest surface potential. Surface potential shows large changes after reduction or oxidation of the CZ film demonstrating the influence of Ce³⁺/Ce⁴⁺ on surface potential, which is also a key to catalytic activity for ceria-based catalysts. The surface potential measured from KPM and the OSC measured from MB vary linearly and they depend on the Ce³⁺/Ce⁴⁺ ratio. More and detailed studies are suggested to arrive at a correlation between the physical and chemical properties of the surfaces.

Fast, high-resolution surface potential measurements in air with heterodyne Kelvin probe force microscopy

Kelvin probe force microscopy (KPFM) adapts an atomic force microscope to measure electric potential on surfaces at nanometer length scales. Here we demonstrate that Heterodyne-KPFM enables scan rates of several frames per minute in air, and concurrently maintains spatial resolution and voltage sensitivity comparable to frequency-modulation KPFM, the current spatial resolution standard. Two common classes of topography-coupled artifacts are shown to be avoidable with H-KPFM. A second implementation of H-KPFM is also introduced, in which the voltage signal is amplified by the first cantilever resonance for enhanced sensitivity. The enhanced temporal resolution of H-KPFM can enable the imaging of many dynamic processes, such as such as electrochromic switching, phase transitions, and device degredation (battery, solar, etc), which take place over seconds to minutes and involve changes in electric potential at nanometer lengths.

Excluding Contact Electrification in Surface Potential Measurement Using Kelvin Probe Force Microscopy

Kelvin probe force microscopy (KPFM), a characterization method that could image surface potentials of materials at the nanoscale, has extensive applications in characterizing the electric and electronic properties of metal, semiconductor, and insulator materials. However, it requires deep understanding of the physics of the measuring process and being able to rule out factors that may cause artifacts to obtain accurate results. In the most commonly used dual-pass KPFM, the probe works in tapping mode to obtain surface topography information in a first pass before lifting to a certain height to measure the surface potential. In this paper, we have demonstrated that the tapping-mode topography scan pass during the typical dual-pass KPFM measurement may trigger contact electrification between the probe and the sample, which leads to a charged sample surface and thus can introduce a significant error to the surface potential measurement. Contact electrification will happen when the probe enters into the repulsive force regime of a tip-sample interaction, and this can be detected by the phase shift of the probe vibration. In addition, the influences of scanning parameters, sample properties, and the probe's attributes have also been examined, in which lower free cantilever vibration amplitude, larger adhesion between the probe tip and the sample, and lower cantilever spring constant of the probe are less likely to trigger contact electrification. Finally, we have put forward a guideline to rationally decouple contact electrification from the surface potential measurement. They are decreasing the free amplitude, increasing the set-point amplitude, and using probes with a lower spring constant.

Nanoscale Insights into the Hydrogenation Process of Layered α-MoO3

The hydrogenation process of the layered α-MoO3 crystal was investigated on a nanoscale. At low hydrogen concentration, the hydrogenation can lead to formation of HxMoO3 without breaking the MoO3 atomic flat surface. For hydrogenation with high hydrogen concentration, hydrogen atoms accumulated along the <101> direction on the MoO3, which induced the formation of oxygen vacancy line defects. The injected hydrogen atoms acted as electron donors to increase electrical conductivity of the MoO3. Near-field optical measurements indicated that both of the HxMoO3 and oxygen vacancies were responsible for the coloration of the hydrogenated MoO3, with the latter contributing dominantly. On the other hand, diffusion of hydrogen atoms from the surface into the body of the MoO3 will encounter a surface diffusion energy barrier, which was for the first time measured to be around 80 meV. The energy barrier also sets an upper limit for the amount of hydrogen atoms that can be bound locally inside the MoO3 via hydrogenation. We believe that our findings has provided a clear picture of the hydrogenation mechanisms in layered transition-metal oxides, which will be helpful for control of their optoelectronic properties via hydrogenation.

The effect of patch potentials in Casimir force measurements determined by heterodyne Kelvin probe force microscopy

Measurements of the Casimir force require the elimination of the electrostatic force between the surfaces. However, due to electrostatic patch potentials, the voltage required to minimize the total force may not be sufficient to completely nullify the electrostatic interaction. Thus, these surface potential variations cause an additional force, which can obscure the Casimir force signal. In this paper, we inspect the spatially varying surface potential of e-beamed, sputtered, sputtered and annealed, and template stripped gold surfaces with Heterodyne amplitude modulated Kelvin probe force microscopy (HAM-KPFM). It is demonstrated that HAM-KPFM improves the spatial resolution of surface potential measurements compared to amplitude modulated Kelvin probe force microscopy. We find that patch potentials vary depending on sample preparation, and that the calculated pressure can be similar to the pressure difference between Casimir force calculations employing the plasma and Drude models.

Dynamics of Dielectrophoretic-Force-Directed Assembly of NaYF4 Colloidal Nanocrystals into Tunable Multilayered Micropatterns

The dynamics of dielectrophoretic-force-directed assembly of polarizable colloidal upconverting β-NaYF4 nanocrystals into tunable multilayers on charge micropatterns written by atomic force microscopy is investigated. Multilayered nanocrystal assembly by this nanoxerography process occurs in two phases. During the first phase typically lasting a few minutes, the nanocrystal assemblies grow up to a maximum thickness under the influence of strong dielectrophoretic forces exerted by the charge patterns. Subsequently, the nanocrystals start to diffuse back into the solvent, leaving a single layer attached to the charge patterns. A theoretical model based on the Fokker-Planck equation is formulated to describe this dynamics involving an interplay of diffusive and dielectrophoretic forces. Being in good agreement with the experimental results, this approach may be reliably extended to simulate the directed assembly of other types of polarizable colloids from liquid phase by nanoxerography.

Observing optical plasmons on a single nanometer scale

The exceptional capability of plasmonic structures to confine light into deep subwavelength volumes has fashioned rapid expansion of interest from both fundamental and applicative perspectives. Surface plasmon nanophotonics enables to investigate light - matter interaction in deep nanoscale and harness electromagnetic and quantum properties of materials, thus opening pathways for tremendous potential applications. However, imaging optical plasmonic waves on a single nanometer scale is yet a substantial challenge mainly due to size and energy considerations. Here, for the first time, we use Kelvin Probe Force Microscopy (KPFM) under optical illumination to image and characterize plasmonic modes. We experimentally demonstrate unprecedented spatial resolution and measurement sensitivity both on the order of a single nanometer. By comparing experimentally obtained images with theoretical calculation results, we show that KPFM maps may provide valuable information on the phase of the optical near field. Additionally, we propose a theoretical model for the relation between surface plasmons and the material workfunction measured by KPFM. Our findings provide the path for using KPFM for high resolution measurements of optical plasmons, prompting the scientific frontier towards quantum plasmonic imaging on submolecular scales.

EFM data mapped into 2D images of tip-sample contact potential difference and capacitance second derivative

We report a simple technique for mapping Electrostatic Force Microscopy (EFM) bias sweep data into 2D images. The method allows simultaneous probing, in the same scanning area, of the contact potential difference and the second derivative of the capacitance between tip and sample, along with the height information. The only required equipment consists of a microscope with lift-mode EFM capable of phase shift detection. We designate this approach as Scanning Probe Potential Electrostatic Force Microscopy (SPP-EFM). An open-source MATLAB Graphical User Interface (GUI) for images acquisition, processing and analysis has been developed. The technique is tested with Indium Tin Oxide (ITO) and with poly(3-hexylthiophene) (P3HT) nanowires for organic transistor applications.

Structure and Volta potential of lipid multilayers: effect of X-ray irradiation

The effect of hard X-ray radiation on the structure and electrostatics of solid-supported lipid multilayer membranes is investigated using a scanning Kelvin probe (SKP) integrated with a high-energy synchrotron beamline to enable in situ measurements of the membranes' local Volta potential (V(p)) during X-ray structural characterization. The undulator radiation employed does not induce any detectable structural damage, but the V(p) of both bare and lipid-modified substrates is found to undergo strong radiation-induced shifts, almost immediately after X-ray exposure. Sample regions that are macroscopically distant (~cm) from the irradiated region experience an exponential V(p) growth with a characteristic time constant of several minutes. The V(p) variations occurring upon periodic on/off X-ray beam switching are fully or partially reversible depending on the location and time-scale of the SKP measurement. The general relevance of these findings for synchrotron-based characterization of biomolecular thin films is critically reviewed.

Graphene on Si(111)7×7

We demonstrate that it is possible to mechanically exfoliate graphene under ultrahigh vacuum conditions on the atomically well defined surface of single crystalline silicon. The flakes are several hundred nanometers in lateral size and their optical contrast is very faint, in agreement with calculated data. Single-layer graphene is investigated by Raman mapping. The graphene and 2D peaks are shifted and narrowed compared to undoped graphene. With spatially resolved Kelvin probe measurements we show that this is due to p-type doping with hole densities of n(h) ~/= 6 × 10(12) cm(-2). The in vacuo preparation technique presented here should open up new possibilities to influence the properties of graphene by introducing adsorbates in a controlled way.

Triboelectricity: macroscopic charge patterns formed by self-arraying ions on polymer surfaces

Tribocharged polymers display macroscopically patterned positive and negative domains, verifying the fractal geometry of electrostatic mosaics previously detected by electric probe microscopy. Excess charge on contacting polyethylene (PE) and polytetrafluoroethylene (PTFE) follows the triboelectric series but with one caveat: net charge is the arithmetic sum of patterned positive and negative charges, as opposed to the usual assumption of uniform but opposite signal charging on each surface. Extraction with n-hexane preferentially removes positive charges from PTFE, while 1,1-difluoroethane and ethanol largely remove both positive and negative charges. Using suitable analytical techniques (electron energy-loss spectral imaging, infrared microspectrophotometry and carbonization/colorimetry) and theoretical calculations, the positive species were identified as hydrocarbocations and the negative species were identified as fluorocarbanions. A comprehensive model is presented for PTFE tribocharging with PE: mechanochemical chain homolytic rupture is followed by electron transfer from hydrocarbon free radicals to the more electronegative fluorocarbon radicals. Polymer ions self-assemble according to Flory-Huggins theory, thus forming the experimentally observed macroscopic patterns. These results show that tribocharging can only be understood by considering the complex chemical events triggered by mechanical action, coupled to well-established physicochemical concepts. Patterned polymers can be cut and mounted to make macroscopic electrets and multipoles.

Nanomechanical characterization by double-pass force-distance mapping

We demonstrate high speed force-distance mapping using a double-pass scheme. The topography is measured in tapping mode in the first pass and this information is used in the second pass to move the tip over the sample. In the second pass, the cantilever dither signal is turned off and the sample is vibrated. Rapid (few kHz frequency) force-distance curves can be recorded with small peak interaction force, and can be processed into an image. Such a double-pass measurement eliminates the need for feedback during force-distance measurements. The method is demonstrated on self-assembled peptidic nanofibers.

Nanocontact electrification: patterned surface charges affecting adhesion, transfer, and printing

Contact electrification creates an invisible mark, overlooked and often undetected by conventional surface spectroscopic measurements. It impacts our daily lives macroscopically during electrostatic discharge and is equally relevant on the nanoscale in areas such as soft lithography, transfer, and printing. This report describes a new conceptual approach to studying and utilizing contact electrification beyond prior surface force apparatus and point-contact implementations. Instead of a single point contact, our process studies nanocontact electrification that occurs between multiple nanocontacts of different sizes and shapes that can be formed using flexible materials, in particular, surface-functionalized poly(dimethylsiloxane) (PDMS) stamps and other common dielectrics (PMMA, SU-8, PS, PAA, and SiO(2)). Upon the formation of conformal contacts and forced delamination, contacted regions become charged, which is directly observed using Kelvin probe force microscopy revealing images of charge with sub-100-nm lateral resolution. The experiments reveal chemically driven interfacial proton exchange as the dominant charging mechanism for the materials that have been investigated so far. The recorded levels of uncompensated charges approach the theoretical limit that is set by the dielectric breakdown strength of the air gap that forms as the surfaces are delaminated. The macroscopic presence of the charges is recorded using force-distance curve measurements involving a balance and a micromanipulator to control the distance between the delaminated objects. Coulomb attraction between the delaminated surfaces reaches 150 N/m(2). At such a magnitude, the force finds many applications. We demonstrate the utility of printed charges in the fields of (i) nanoxerography and (ii) nanotransfer printing whereby the smallest objects are ∼10 nm in diameter and the largest objects are in the millimeter to centimeter range. The printed charges are also shown to affect the electronic properties of contacted surfaces. For example, in the case of a silicon-on-insulator field effect transistors are in contact with PDMS and subsequent delamination leads to threshold voltage shifts that exceed 500 mV.

Nanoscale characterization of the dielectric charging phenomenon in PECVD silicon nitride thin films with various interfacial structures based on Kelvin probe force microscopy

This work presents a novel characterization methodology for the dielectric charging phenomenon in electrostatically driven MEMS devices using Kelvin probe force microscopy (KPFM). It has been used to study plasma-enhanced chemical vapor deposition (PECVD) silicon nitride thin films in view of application in electrostatic capacitive RF MEMS switches. The proposed technique takes the advantage of the atomic force microscope (AFM) tip to simulate charge injection through asperities, and then the induced surface potential is measured. The impact of bias amplitude, bias polarity, and bias duration employed during charge injection has been explored. The influence of various parameters on the charging/discharging processes has been investigated: dielectric film thickness, SiN(x) material deposition conditions, and under layers. Fourier transform infrared spectroscopy (FT-IR) and x-ray photoelectron spectroscopy (XPS) material characterization techniques have been used to determine the chemical bonds and compositions, respectively, of the SiN(x) films being investigated. The required samples for this technique consist only of thin dielectric films deposited over planar substrates, and no photolithography steps are required. Therefore, the proposed methodology provides a low cost and quite fast solution compared to other available characterization techniques of actual MEMS switches. Finally, the comparison between the KPFM results and the discharge current transients (DCT) measurements shows a quite good agreement.

Force gradient sensitive detection in lift-mode Kelvin probe force microscopy

We demonstrate frequency modulation Kelvin probe force microscopy operated in lift-mode under ambient conditions. Frequency modulation detection is sensitive to force gradients rather than forces as in the commonly used amplitude modulation technique. As a result there is less influence from electric fields originating from the tip's cone and cantilever, and the recorded surface potential does not suffer from the large lateral averaging observed in amplitude modulated Kelvin probe force microscopy. The frequency modulation technique further shows a reduced dependence on the lift-height and the frequency shift can be used to map the second order derivative of the tip-sample capacitance which gives high resolution material contrast of dielectric sample properties. The sequential nature of the lift-mode technique overcomes various problems of single-scan techniques, where crosstalk between the Kelvin probe and topography feedbacks often impair the correct interpretation of the recorded data in terms of quantitative electric surface potentials.

On the influence of environment gases, relative humidity and gas purification on dielectric charging/discharging processes in electrostatically driven MEMS/NEMS devices

In this paper, we investigate the impact of environment gases and relative humidity on dielectric charging phenomenon in electrostatically actuated micro- and nano-electromechanical systems (MEMS and NEMS). The research is based on surface potential measurements using Kelvin probe force microscopy (KPFM). Plasma-enhanced chemical vapor deposition (PECVD) silicon nitride films were investigated in view of applications in electrostatic capacitive RF MEMS switches. Charges were injected through the atomic force microscope (AFM) tip, and the induced surface potential was measured using KPFM. Experiments have been performed in air and in nitrogen environments, both under different relative humidity levels ranging from 0.02% to 40%. The impact of oxygen gas and hydrocarbon contaminants has been studied for the first time by using different gas purifiers in both air and nitrogen lines. Voltage pulses with different bias amplitudes have been applied during the charge injection step under all investigated environmental conditions in order to investigate the effect of bias amplitude. The investigation reveals a deeper understanding of charging and discharging processes and could further lead to improved operating environment conditions in order to minimize the dielectric charging. Finally, the nanoscale KPFM results obtained in this study show a good correlation with the device level measurements for capacitive MEMS switches reported in the literature.

Nanocontact electrification through forced delamination of dielectric interfaces

This article reports patterned transfer of charge between conformal material interfaces through a concept referred to as nanocontact electrification. Nanocontacts of different size and shape are formed between surface-functionalized polydimethylsiloxane (PDMS) stamps and other dielectric materials (PMMA, SiO(2)). Forced delamination and cleavage of the interface yields a well-defined charge pattern with a minimal feature size of 100 nm. The process produces charged surfaces and associated fields that exceed the breakdown strength of air, leading to strong long-range adhesive forces and force-distance curves, which are recorded over macroscopic distances. The process is applied to fabricate charge-patterned surfaces for nanoxerography demonstrating 200 nm resolution nanoparticle prints and applied to thin film electronics where the patterned charges are used to shift the threshold voltages of underlying transistors.

Numerical simulations for a quantitative analysis of AFM electrostatic nanopatterning on PMMA by Kelvin force microscopy

Electrostatic nanopatterning of electret thin films by atomic force microscopy (AFM) has emerged as an alternative efficient tool for the directed assembly of nano-objects on surfaces. High-resolution charge imaging of such charge patterns can be performed by AFM-based Kelvin force microscopy (KFM). Nevertheless, quantitative analysis of KFM surface potential mappings is not trivial because of side-capacitance effects induced by the tip cone and the cantilever of the scanning probe. In this paper, we developed numerical simulations of KFM measurements taking into account these artifacts, so as to estimate the actual surface charge density of square charge patterns (nominal sizes ranging from 100 nm to 10 microm) written by AFM into polymethylmethacrylate (PMMA) thin films. This work revealed that, under our conditions, such charge patterns exhibit a surface charge density between 1.5 x 10(-3) and 3.8 x 10(-3) C m(-2), depending on the assumed depth of injected charges. These results are crucial to quantify the actual electric field generated by such charge patterns and thus the electrostatic forces responsible for the directed assembly of nano-objects onto these electrostatic traps.

Detection of charge distributions in insulator surfaces

Charge distribution in insulators has received considerable attention but still poses great scientific challenges, largely due to a current lack of firm knowledge about the nature and speciation of charges. Recent studies using analytical microscopies have shown that insulators contain domains with excess fixed ions forming various kinds of potential distribution patterns, which are also imaged by potential mapping using scanning electric probe microscopy. Results from the authors' laboratory show that solid insulators are seldom electroneutral, as opposed to a widespread current assumption. Excess charges can derive from a host of charging mechanisms: excess local ion concentration, radiochemical and tribochemical reactions added to the partition of hydroxonium and hydronium ions derived from atmospheric water. The last factor has been largely overlooked in the literature, but recent experimental evidence suggests that it plays a decisive role in insulator charging. Progress along this line is expected to help solve problems related to unwanted electrostatic discharges, while creating new possibilities for energy storage and handling as well as new electrostatic devices.

Ultrasharp and high aspect ratio carbon nanotube atomic force microscopy probes for enhanced surface potential imaging

The resolution of scanning surface potential microscopy (SSPM) is mainly limited by non-local electrostatic interactions due to the finite probe size. Here we present high resolution surface potential imaging with ultrasharp and high aspect ratio carbon nanotube (CNT) atomic force microscopy (AFM) probes fabricated via dielectrophoresis. Enhancement of surface potential contrast by several factors is reported for integrated circuit structures and purple membrane fragments for these CNT AFM probes as compared to conventional probes. In particular, ultrahigh lateral resolution (∼2 nm) surface potential images of self-assembled bacteriorhodopsin proteins are reported at ambient conditions, with the implication of label-free protein detection by SSPM techniques.

Electrostatic nanopatterning of PMMA by AFM charge writing for directed nano-assembly

Electrostatic nanopatterning of poly(methylmethacrylate) (PMMA) thin films by atomic force microscopy (AFM) charge writing was investigated using Kelvin force microscopy (KFM). The lateral size of the electrostatic patterns and the amount of injected charges are closely correlated and can be controlled by the height of the voltage pulses applied to the AFM tip and the tip-sample separation during the writing process. Charge retention measurements show that PMMA has excellent charge storage properties in air under relative humidities from 1% to 60% and withstands immersion in ultra-pure water. This study thus reveals that PMMA is a very promising electret to create efficient electrostatic nanopatterns for directed self-assembly of nanoscale objects, including the broad range of colloidal particles or molecules in aqueous solutions.

Scanning Kelvin probe imaging of the potential profiles in fixed and dynamic planar LECs

We measure the potential profiles of both dynamic and fixed junction planar light-emitting electrochemical cells (LECs) using Scanning Kelvin Probe Microscopy (SKPM) and compare the results against models of LEC operation. We find that, in conventional dynamic junction LECs formed using lithium trifluoromethanesulfonate (LiTf), poly(ethylene oxide) (PEO), and the soluble alkoxy-PPV derivative poly[2-methoxy-5-(3',7'-dimethyl-octyloxy)-p-phenylenevinylene (MDMO-PPV), the majority (>90%) of the potential is dropped near the cathode with little potential drop across either the film or the anode/polymer interface. In contrast, when examining fixed junction LECs where the LiTf is replaced with [2-(methacryloyloxy)ethyl] trimethylammonium 2-(methacryloyloxy)ethane-sulfonate (METMA/MES), the potential is dropped at both contacts during the initial poling. The potential profile evolves over a period of approximately 60 min under bias to achieve a final profile similar to that obtained in the LiTf systems. In addition to elucidating the differences between conventional dynamic LECs and fixed LECs incorporating cross-linkable ion pair monomers, the results on both systems provide direct evidence for a primarily "p-type" LEC consistent with the emitting junction near the cathode and relatively small electric fields across the bulk of the device for these two material systems.

High-aspect ratio metal tips attached to atomic force microscopy cantilevers with controlled angle, length, and radius for electrostatic force microscopy

We demonstrate a method to fabricate a high-aspect ratio metal tip attached to microfabricated cantilevers with controlled angle, length, and radius, for use in electrostatic force microscopy. A metal wire, after gluing it into a guiding slot that is cut into the cantilever, is shaped into a long, thin tip using a focused ion beam. The high-aspect ratio results in considerable reduction of the capacitive force between tip body and sample when compared to a metal coated pyramidal tip.

Local surface charges direct the deposition of carbon nanotubes and fullerenes into nanoscale patterns

This article reports on the directed deposition of carbon nanotubes (CNTs) and fullerenes onto solid surfaces using local electrostatic fields. Arbitrary patterns of local surface charges are created by charge writing with an atomic force microscope. During the subsequent development of the sample in an aqueous suspension containing surfactant-stabilized CNTs or fullerenes, Coulomb attraction guides the positioning and alignment of these particles onto the charge patterns. The surface potential of the charge patterns provides a direct control over the particle attachment. CNTs and fullerenes precisely reproduce the charge patterns, yielding structures with a lateral resolution down to the particle diameter.

Fringing field directed assembly of nanomaterials

This letter reports on a new gas-phase printing approach to deposit nanomaterials into addressable areas on a surface with 50 nm lateral accuracy. Localized fringing fields that form around conventional resist patterns (PMMA and SiO2) with openings to a silicon substrate are used to direct the assembly of nanomaterials into the openings. Directed assembly was observed due to a naturally occurring inbuilt charge differential at the material interface that was further enhanced by corona charging to yield a field strength exceeding 1 MV/m in Kelvin probe force microscopy (KFM) measurements. The assembly process is independent of the nanomaterial source and type: an evaporative, plasma, and electrospray source have been tested to deposit silicon and metallic nanoparticles. The results suggest a potential route to form nanolenses on the basis of charged resist structures; a 3-fold size reduction has been observed between the structures and the assembled particles. Applications range from the integration of functional nanomaterial building blocks to the elimination of lift-off steps in semiconductor processing.

Wetting and electrical properties of the human hair surface: delipidation observed at the nanoscale

The electrostatic properties and the wetting behaviour of the human hair surface at the nanometric scale have been investigated by using atomic force microscopy (AFM). Surface potential imaging was used to determine the electrostatic properties while non-contact mode AFM was used to investigate the wetting properties of a test liquid, squalane. We have studied natural hair and hair in which different covalently (18-methyleicosanoic acid) and non-covalently bound fatty acids present at the cuticle surface were selectively extracted. This study shows how the removal of these acids causes various profound changes in hair wettability at the cuticle scale.

Nanoscale Structural and Electronic Properties of Ultrathin Blends of Two Polyaromatic Molecules: A Kelvin Probe Force Microscopy Investigation

We describe a Kelvin Probe Force Microscopy (KPFM) study on the morphological and electronic properties of complex mono and bi-molecular ultrathin films self-assembled on mica. These architectures are made up from an electron-donor (D), a synthetic all-benzenoid polycyclic aromatic hydrocarbon, and an electron-acceptor (A), perylene-bis-dicarboximide. The former molecule self-assembles into fibers in single component films, while the latter molecule forms discontinuous layers. Taking advantage of the different solubility and self-organizing properties of the A and D molecules, multicomponent ultrathin films characterized by nanoscale phase segregated fibers of D embedded in a discontinuous layer of A are formed. The direct estimation of the surface potential, and consequently the local workfunction from KPFM images allow a comparison of the local electronic properties of the blend with those of the monocomponent films. A change in the average workfunction values of the A and D nanostructures in the blend occurs which is primarily caused by the intimate contact between the two components and the molecular order within the nanostructure self-assembled at the surface. Additional roles can be ascribed to the molecular packing density, to the presence of defects in the film, to the different conformation of the aliphatic peripheral chains that might cover the conjugated core and to the long-range nature of the electrostatic interactions employed to map the surface by KPFM limiting the spatial and potential resolution. The local workfunction studies of heterojunctions can be of help to tune the electronic properties of active multicomponent films, which is crucial for the fabrication of efficient organic electronic devices as solar cells.

Influence of Molecular Order on the Local Work Function of Nanographene Architectures: A Kelvin-Probe Force Microscopy Study

We report a Kelvin-probe force microscopy (KPFM) investigation on the structural and electronic properties of different submicron-scale supramolecular architectures of a synthetic nanographene, including extended layers, percolated networks and broken patterns grown from solutions at surfaces. This study made it possible to determine the local work function (WF) of the different pi-conjugated nanostructures adsorbed on mica with a resolution below 10 nm and 0.05 eV. It revealed that the WF strongly depends on the local molecular order at the surface, in particular on the delocalization of electrons in the pi-states, on the molecular orientation at surfaces, on the molecular packing density, on the presence of defects in the film and on the different conformations of the aliphatic peripheral chains that might cover the conjugated core. These results were confirmed by comparing the KPFM-estimated local WF of layers supported on mica, where the molecules are preferentially packed edge-on on the substrate, with the ultraviolet photoelectron spectroscopy microscopically measured WF of layers adsorbed on graphite, where the molecules should tend to assemble face-on at the surface. It appears that local WF studies are of paramount importance for understanding the electronic properties of active organic nanostructures, being therefore fundamental for the building of high-performance organic electronic devices, including field-effect transistors, light-emitting diodes and solar cells.

Charging process and Coulomb-force-directed printing of nanoparticles with sub-100-nm lateral resolution

This article reports on a new charging process and Coulomb-force-directed assembly of nanoparticles onto charged surface areas with sub-100-nm resolution. The charging is accomplished using a flexible nanostructured thin silicon electrode. Electrical nanocontacts have been created as small as 50 nm by placing the nanostructured electrode onto an electret surface. The nanocontacts have been used to inject charge into 50 nm sized areas. Nanoparticles were assembled onto the charge patterns, and a lateral resolution of 60 nm has been observed for the first time. A comparison of the nanoparticle patterns with the surface potential distribution recorded by Kelvin probe force microscopy (KFM) revealed a mismatch in the lateral resolution. One possible explanation is that nanoparticles may visualize charge patterns at a sub-60-nm length scale that is not well resolved using KFM.

Strong nonlinear current-voltage behaviour in perovskite-derivative calcium copper titanate

The discovery of a giant dielectric constant of 10(5) in CaCu(3)Ti(4)O(12) has increased interest in this perovskite-type oxide. Here we demonstrate that, in addition to high permittivity, CaCu(3)Ti(4)O(12) has remarkably strong nonlinear current-voltage characteristics without the addition of any dopants. An intrinsic electrostatic barrier at the grain boundaries is responsible for the unusual nonlinear behaviour. The nonlinear coefficient of CaCu(3)Ti(4)O(12) reaches a value of 900, which is even greater than that of the varistor material ZnO. As a result, CaCu(3)Ti(4)O(12) may lead to efficient switching and gas-sensing devices.

Atomic force microscopy imaging of hair: correlations between surface potential and wetting at the nanometer scale

We report investigations of hair surface potential under wetting at the nanometric scale by atomic force microscopy (AFM). Surface potential imaging was used to characterize the electrostatic properties of the hair samples. We found that the surface potential noticeably increases along the edges of the cuticles. These results are correlated with wetting behavior of different liquids performed using AFM in noncontact mode.

Guiding self-assembly with the tip of an atomic force microscope

We report the guided self-assembly of nanoparticles to geometrically well-defined charge patterns written on a dielectric surface with the conductive tip of an atomic force microscope (AFM). Charges are deposited in 30-90-nm thick fluorocarbon layers by applying voltage pulses to the conductive AFM tip. The samples are being developed by dipping them into an organic suspension of silica nanoparticles. Coulomb forces draw the nanoparticles to the charge patterns. With this simple process, we achieve a resolution of about 800 nm.

Development of preparation methods for and insights obtained from atomic force microscopy of fluid spaces in cortical bone

Several preparation methods were developed to investigate the dimensions and surface structure of fluid spaces within cortical bone, using atomic force microscopy (AFM). Of special interest was the morphology of the lacunocanalicular system, which serves as a conduit between osteocytes encased in bone tissue, the intramedullary cavity, blood vessels running through the bone, and the periosteal surface of bone. Fracture and the removal of either the mineral or the organic component is a method by which each component can be investigated at a very high resolution in situ. Although fractured bone was too rough to image details of the lacunocanalicular system, post-treatment with ethylene diamine tetraacetic acid (EDTA) or papain allowed for investigation of the collagen matrix or the mineral crystals of bone, respectively. Cut and polished bone was smooth enough for identifying the lacunae of bone using AFM, but unambiguous differentiation between the canaliculi and cracks in the bone surface was not possible. However, when the lacunocanalicular system was filled with polymethylmethacrylate (PMMA), it was possible to image casts of the lacunocanalicular system by selectively etching away the surrounding bone matrix. Using this method, we identified individual canaliculi and measured their dimensions. Furthermore, by carefully etching away the bone matrix in successive etches, it was shown that the wall structure of the canaliculus is dominated by collagen fibrils. These observations have important implications for fluid flow in bone.