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Chen D, Jiang J, Weatherley TFK, Carlin JF, Banerjee M, Grandjean N. GaN Surface Passivation by MoS 2 Coating. NANO LETTERS 2024; 24:10124-10130. [PMID: 39132976 PMCID: PMC11342355 DOI: 10.1021/acs.nanolett.4c02259] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/13/2024] [Revised: 08/06/2024] [Accepted: 08/07/2024] [Indexed: 08/13/2024]
Abstract
In this study, we investigate the impact of two-dimensional MoS2 coating on the optical properties of surface GaN/AlGaN quantum wells (QWs). A strong enhancement in GaN QW light emission is observed with monolayer-MoS2 coating, yielding luminescence intensity comparable to that from a QW capped by an AlGaN barrier. Our results demonstrate that MoS2, despite its quite different nature from III-nitride semiconductors, acts as an effective barrier for surface GaN QWs and suppresses spatially localized intrinsic surface states. This finding provides novel pathways for efficient III-nitride surface passivation.
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Affiliation(s)
- Danxuan Chen
- Laboratory
of Advanced Semiconductors for Photonics and Electronics, Institute
of Physics, École Polytechnique Fédérale
de Lausanne (EPFL), CH-1015 Lausanne, Switzerland
| | - Jin Jiang
- Laboratory
of Quantum Physics, Institute of Physics, École Polytechnique Fédérale de Lausanne (EPFL), CH-1015 Lausanne, Switzerland
| | - Thomas F. K. Weatherley
- Laboratory
of Advanced Semiconductors for Photonics and Electronics, Institute
of Physics, École Polytechnique Fédérale
de Lausanne (EPFL), CH-1015 Lausanne, Switzerland
| | - Jean-François Carlin
- Laboratory
of Advanced Semiconductors for Photonics and Electronics, Institute
of Physics, École Polytechnique Fédérale
de Lausanne (EPFL), CH-1015 Lausanne, Switzerland
| | - Mitali Banerjee
- Laboratory
of Quantum Physics, Institute of Physics, École Polytechnique Fédérale de Lausanne (EPFL), CH-1015 Lausanne, Switzerland
| | - Nicolas Grandjean
- Laboratory
of Advanced Semiconductors for Photonics and Electronics, Institute
of Physics, École Polytechnique Fédérale
de Lausanne (EPFL), CH-1015 Lausanne, Switzerland
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2
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Blaga C, Labordet Álvarez Á, Balgarkashi A, Banerjee M, Fontcuberta I Morral A, Dimitrievska M. Unveiling the complex phonon nature and phonon cascades in 1L to 5L WSe 2 using multiwavelength excitation Raman scattering. NANOSCALE ADVANCES 2024:d4na00399c. [PMID: 39157051 PMCID: PMC11325308 DOI: 10.1039/d4na00399c] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/13/2024] [Accepted: 07/29/2024] [Indexed: 08/20/2024]
Abstract
Tungsten diselenide (WSe2) is a 2D semiconducting material, promising for novel optoelectronic and phononic applications. WSe2 has complex lattice dynamics and phonon structure. Numerous discrepancies in the literature exist regarding the interpretation and identification of phonon modes. This work presents a complete investigation of the vibrational properties of 1L to 5L flakes and bulk WSe2 using multi-wavelength Raman spectroscopy. We especially highlight measurements using 785 nm excitation, which have not been performed before. These allow us to solve inconsistences in the literature in terms of defect-activated non-Γ point single phonon modes and Breit-Wigner-Fano type resonance. We identify 35 Raman peaks per flake thickness, which we attribute to either one-phonon or multi-phonon modes, including two-phonon scattering due to a van Hove singularity (vHs). The measurements are in excellent agreement with the theoretical predictions. Using photoluminescence measurements, we identify photon-exciton coupling leading to resonant Raman scattering, suggesting wavelength laser excitations best suited for further investigations of specific WSe2 flake thicknesses. Finally, we report the observation of phonon-cascades for all WSe2 flake thicknesses, indicating strong phonon-electron interactions during early carrier relaxation processes in WSe2. This research provides a solid foundation and reference for future investigations of the vibrational properties of WSe2, paving the way for further development of this material towards applications.
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Affiliation(s)
- Claire Blaga
- Laboratory of Semiconductor Materials, Institute of Materials, School of Engineering, École Polytechnique Fédérale de Lausanne 1015 Lausanne Switzerland
| | - Ángel Labordet Álvarez
- Nanomaterials Spectroscopy and Imaging Group, Transport at Nanoscale Interfaces Laboratory, Swiss Federal Laboratories for Material Science and Technology (EMPA) Ueberlandstrasse 129 8600 Duebendorf Switzerland
| | - Akshay Balgarkashi
- Laboratory of Semiconductor Materials, Institute of Materials, School of Engineering, École Polytechnique Fédérale de Lausanne 1015 Lausanne Switzerland
| | - Mitali Banerjee
- Laboratory of Quantum Physics, Topology and Correlations, Institute of Physics, School of Basic Sciences, Ecole Polytechnique Fédérale de Lausanne 1015 Lausanne Switzerland
| | - Anna Fontcuberta I Morral
- Laboratory of Semiconductor Materials, Institute of Materials, School of Engineering, École Polytechnique Fédérale de Lausanne 1015 Lausanne Switzerland
- Institute of Physics, School of Basic Sciences, Ecole Polytechnique Fédérale de Lausanne 1015 Lausanne Switzerland
| | - Mirjana Dimitrievska
- Laboratory of Semiconductor Materials, Institute of Materials, School of Engineering, École Polytechnique Fédérale de Lausanne 1015 Lausanne Switzerland
- Nanomaterials Spectroscopy and Imaging Group, Transport at Nanoscale Interfaces Laboratory, Swiss Federal Laboratories for Material Science and Technology (EMPA) Ueberlandstrasse 129 8600 Duebendorf Switzerland
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3
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Celano U, Schmidt D, Beitia C, Orji G, Davydov AV, Obeng Y. Metrology for 2D materials: a perspective review from the international roadmap for devices and systems. NANOSCALE ADVANCES 2024; 6:2260-2269. [PMID: 38694454 PMCID: PMC11059534 DOI: 10.1039/d3na01148h] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 12/26/2023] [Accepted: 03/30/2024] [Indexed: 05/04/2024]
Abstract
The International Roadmap for Devices and Systems (IRDS) predicts the integration of 2D materials into high-volume manufacturing as channel materials within the next decade, primarily in ultra-scaled and low-power devices. While their widespread adoption in advanced chip manufacturing is evolving, the need for diverse characterization methods is clear. This is necessary to assess structural, electrical, compositional, and mechanical properties to control and optimize 2D materials in mass-produced devices. Although the lab-to-fab transition remains nascent and a universal metrology solution is yet to emerge, rapid community progress underscores the potential for significant advancements. This paper reviews current measurement capabilities, identifies gaps in essential metrology for CMOS-compatible 2D materials, and explores fundamental measurement science limitations when applying these techniques in high-volume semiconductor manufacturing.
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Affiliation(s)
- Umberto Celano
- School of Electrical, Computer and Energy Engineering, Arizona State University Tempe AZ 85287 USA
| | | | - Carlos Beitia
- Unity-SC 611 Rue Aristide Berges 38330 Montbonnot-Saint-Martin France
| | - George Orji
- National Institute of Standards and Technology 100 Bureau Drive Gaithersburg MD USA
| | - Albert V Davydov
- National Institute of Standards and Technology 100 Bureau Drive Gaithersburg MD USA
| | - Yaw Obeng
- National Institute of Standards and Technology 100 Bureau Drive Gaithersburg MD USA
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4
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Lee H, Im S, Lee C, Lee H, Chu SW, Ho AHP, Kim D. Probing Temperature-Induced Plasmonic Nonlinearity: Unveiling Opto-Thermal Effects on Light Absorption and Near-Field Enhancement. NANO LETTERS 2024; 24:3598-3605. [PMID: 38407029 DOI: 10.1021/acs.nanolett.3c04420] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/27/2024]
Abstract
Precise measurement and control of local heating in plasmonic nanostructures are vital for diverse nanophotonic devices. Despite significant efforts, challenges in understanding temperature-induced plasmonic nonlinearity persist, particularly in light absorption and near-field enhancement due to the absence of suitable measurement techniques. This study presents an approach allowing simultaneous measurements of light absorption and near-field enhancement through angle-resolved near-field scanning optical microscopy with iterative opto-thermal analysis. We revealed gold thin films exhibit sublinear nonlinearity in near-field enhancement due to nonlinear opto-thermal effects, while light absorption shows both sublinear and superlinear behaviors at varying thicknesses. These observations align with predictions from a simple harmonic oscillation model, in which changes in damping parameters affect light absorption and field enhancement differently. The sensitivity of our method was experimentally examined by measuring the opto-thermal responses of three-dimensional nanostructure arrays. Our findings have direct implications for advancing plasmonic applications, including photocatalysis, photovoltaics, photothermal effects, and surface-enhanced Raman spectroscopy.
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Affiliation(s)
- Hongki Lee
- School of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea 03722
| | - Seongmin Im
- School of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea 03722
| | - Changhun Lee
- School of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea 03722
| | - Hyunwoong Lee
- School of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea 03722
| | - Shi-Wei Chu
- Department of Physics National, Taiwan University, Taipei, Taiwan 10617
- Brain Research Center National, Tsing Hua University, Hsinchu, Taiwan 30013
| | - Aaron Ho-Pui Ho
- Department of Biomedical Engineering, The Chinese University of Hong Kong, Hong Kong 999077, China
| | - Donghyun Kim
- School of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea 03722
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5
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Curie D, Krogel JT, Cavar L, Solanki A, Upadhyaya P, Li T, Pai YY, Chilcote M, Iyer V, Puretzky A, Ivanov I, Du MH, Reboredo F, Lawrie B. Correlative Nanoscale Imaging of Strained hBN Spin Defects. ACS APPLIED MATERIALS & INTERFACES 2022; 14:41361-41368. [PMID: 36048915 DOI: 10.1021/acsami.2c11886] [Citation(s) in RCA: 4] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/15/2023]
Abstract
Spin defects like the negatively charged boron vacancy color center (VB-) in hexagonal boron nitride (hBN) may enable new forms of quantum sensing with near-surface defects in layered van der Waals heterostructures. Here, the effect of strain on VB- color centers in hBN is revealed with correlative cathodoluminescence and photoluminescence microscopies. Strong localized enhancement and redshifting of the VB- luminescence is observed at creases, consistent with density functional theory calculations showing VB- migration toward regions with moderate uniaxial compressive strain. The ability to manipulate spin defects with highly localized strain is critical to the development of practical 2D quantum devices and quantum sensors.
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Affiliation(s)
- David Curie
- Department of Physics and Astronomy, Vanderbilt University, Nashville, Tennessee 37235, United States
| | - Jaron T Krogel
- Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | - Lukas Cavar
- Department of Physics, Indiana University, Bloomington, Indiana 47405, United States
| | - Abhishek Solanki
- Elmore Family School of Electrical and Computer Engineering, Purdue University, West Lafayette, Indiana 47907, United States
| | - Pramey Upadhyaya
- Elmore Family School of Electrical and Computer Engineering, Purdue University, West Lafayette, Indiana 47907, United States
| | - Tongcang Li
- Elmore Family School of Electrical and Computer Engineering, Purdue University, West Lafayette, Indiana 47907, United States
- Department of Physics and Astronomy, Purdue University, West Lafayette, Indiana 47907, United States
| | - Yun-Yi Pai
- Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
- Quantum Science Center, Oak Ridge, Tennessee 37831, United States
| | - Michael Chilcote
- Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
- Quantum Science Center, Oak Ridge, Tennessee 37831, United States
| | - Vasudevan Iyer
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | - Alexander Puretzky
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | - Ilia Ivanov
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | - Mao-Hua Du
- Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | - Fernando Reboredo
- Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | - Benjamin Lawrie
- Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
- Quantum Science Center, Oak Ridge, Tennessee 37831, United States
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6
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Francaviglia L, Zipfel J, Carlstroem J, Sridhar S, Riminucci F, Blach D, Wong E, Barnard E, Watanabe K, Taniguchi T, Weber-Bargioni A, Ogletree DF, Aloni S, Raja A. Optimizing cathodoluminescence microscopy of buried interfaces through nanoscale heterostructure design. NANOSCALE 2022; 14:7569-7578. [PMID: 35502865 DOI: 10.1039/d1nr08082b] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/14/2023]
Abstract
Mapping the optical response of buried interfaces with nanoscale spatial resolution is crucial in several systems where an active component is embedded within a buffer layer for structural or functional reasons. Here, we demonstrate that cathodoluminescence microscopy is not only an ideal tool for visualizing buried interfaces, but can be optimized through heterostructure design. We focus on the prototypical system of monolayers of semiconducting transition metal dichalcogenide sandwiched between hexagonal boron nitride layers. We leverage the encapsulating layers to tune the nanoscale spatial resolution achievable in cathodoluminescence mapping while also controlling the brightness of the emission. Thicker encapsulation layers result in a brighter emission while thinner ones enhance the spatial resolution at the expense of the signal intensity. We find that a favorable trade-off between brightness and resolution is achievable up to about ∼100 nm of total encapsulation. Beyond this value, the brightness gain is marginal, while the spatial resolution enters a regime that is achievable by diffraction-limited optical microscopy. By preparing samples of varying encapsulation thickness, we are able to determine a surprisingly isotropic exciton diffusion length of >200 nm within the hexagonal boron nitride which is the dominant factor that determines spatial resolution. We further demonstrate that we can overcome the exciton diffusion-limited spatial resolution by using spectrally distinct signals, which is the case for nanoscale inhomogeneities within monolayer transition metal dichalcogenides.
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Affiliation(s)
- Luca Francaviglia
- Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, CA, USA.
| | - Jonas Zipfel
- Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, CA, USA.
| | - Johan Carlstroem
- Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, CA, USA.
| | - Sriram Sridhar
- Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, CA, USA.
- Department of Materials Science and Engineering, University of California, Berkeley, CA 94720, USA
| | - Fabrizio Riminucci
- Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, CA, USA.
- Dipartimento di Fisica, Università del Salento, Strada Provinciale Lecce-Monteroni, Campus Ecotekne, Lecce, 73100, Italy
| | - Daria Blach
- Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, CA, USA.
- Department of Chemistry, Purdue University, West Lafayette, IN 47909, USA
| | - Ed Wong
- Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, CA, USA.
| | - Edward Barnard
- Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, CA, USA.
| | - Kenji Watanabe
- Research Center for Functional Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan
| | - Takashi Taniguchi
- International Center for Materials Nanoarchitectonics, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan
| | | | - D Frank Ogletree
- Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, CA, USA.
| | - Shaul Aloni
- Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, CA, USA.
| | - Archana Raja
- Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, CA, USA.
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7
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Tang PW, Shiau SY, Chou HC, Zhang XQ, Yu JR, Sung CT, Lee YH, Chen C. Visualization of Band Shifting and Interlayer Coupling in W xMo 1-xS 2 Alloys Using Near-Field Broadband Absorption Microscopy. ACS NANO 2022; 16:7503-7511. [PMID: 35486895 DOI: 10.1021/acsnano.1c10593] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/14/2023]
Abstract
Beyond-diffraction-limit optical absorption spectroscopy provides in-depth information on the graded band structures of composition-spread and stacked two-dimensional materials, in which direct/indirect bandgap, interlayer coupling, and defects significantly modify their optoelectronic functionalities such as photoluminescence efficiency. We here visualize the spatially varying band structure of monolayer and bilayer transition metal dichalcogenide alloys by using near-field broadband absorption microscopy. The near-field spectral and spatial information manifests the excitonic band shift that results from the interplay of composition spreading and interlayer coupling. These results enable us to identify, notably, the top layer of the bilayer alloy as pure WS2. We also use the aberration-free near-field transmission images to demarcate the exact boundaries of alloyed and pure transition metal dichalcogenides. This technology can offer valuable insights on various layered structures in the era of "stacking science" in the quest of quantum optoelectronic devices.
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Affiliation(s)
- Po-Wen Tang
- Research Center for Applied Sciences, Academia Sinica, Taipei 115, Taiwan
| | - Shiue-Yuan Shiau
- Physics Division, National Center for Theoretical Sciences, Taipei 106, Taiwan
| | - He-Chun Chou
- Research Center for Applied Sciences, Academia Sinica, Taipei 115, Taiwan
| | - Xin-Quan Zhang
- Department of Materials Science and Engineering, National Tsing-Hua University, Hsinchu 300, Taiwan
| | - Jia-Ru Yu
- Research Center for Applied Sciences, Academia Sinica, Taipei 115, Taiwan
| | - Chun-Te Sung
- Research Center for Applied Sciences, Academia Sinica, Taipei 115, Taiwan
- Department of Materials Science and Engineering, National Tsing-Hua University, Hsinchu 300, Taiwan
| | - Yi-Hsien Lee
- Department of Materials Science and Engineering, National Tsing-Hua University, Hsinchu 300, Taiwan
| | - Chi Chen
- Research Center for Applied Sciences, Academia Sinica, Taipei 115, Taiwan
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8
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Tappy N, Fontcuberta I Morral A, Monachon C. Image shift correction, noise analysis, and model fitting of (cathodo-)luminescence hyperspectral maps. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2022; 93:053702. [PMID: 35649803 DOI: 10.1063/5.0080486] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/01/2021] [Accepted: 04/02/2022] [Indexed: 06/15/2023]
Abstract
Hyperspectral imaging is an important asset of modern spectroscopy. It allows us to perform optical metrology at a high spatial resolution, for example in cathodoluminescence in scanning electron microscopy. However, hyperspectral datasets present added challenges in their analysis compared to individually taken spectra due to their lower signal to noise ratio and specific aberrations. On the other hand, the large volume of information in a hyperspectral dataset allows the application of advanced statistical analysis methods derived from machine-learning. In this article, we present a methodology to perform model fitting on hyperspectral maps, leveraging principal component analysis to perform a thorough noise analysis of the dataset. We explain how to correct the imaging shift artifact, specific to imaging spectroscopy, by directly evaluating it from the data. The impact of goodness-of-fit-indicators and parameter uncertainties is discussed. We provide indications on how to apply this technique to a variety of hyperspectral datasets acquired using other experimental techniques. As a practical example, we provide an implementation of this analysis using the open-source Python library hyperspy, which is implemented using the well established Jupyter Notebook framework in the scientific community.
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Affiliation(s)
- Nicolas Tappy
- Laboratory of Semiconductor Materials, Institute of Materials, Faculty of Engineering, Ecole Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland
| | - Anna Fontcuberta I Morral
- Laboratory of Semiconductor Materials, Institute of Materials, Faculty of Engineering, Ecole Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland
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9
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Negri M, Francaviglia L, Kaplan D, Swaminathan V, Salviati G, Fontcuberta I Morral A, Fabbri F. Excitonic absorption and defect-related emission in three-dimensional MoS 2 pyramids. NANOSCALE 2022; 14:1179-1186. [PMID: 34918727 PMCID: PMC8793919 DOI: 10.1039/d1nr06041d] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 09/14/2021] [Accepted: 11/27/2021] [Indexed: 06/14/2023]
Abstract
MoS2 micro-pyramids have demonstrated interesting properties in the fields of photonics and non-linear optics. In this work, we show the excitonic absorption and cathodoluminescence (CL) emission of MoS2 micro-pyramids grown by chemical vapor deposition (CVD) on SiO2 substrates. The excitonic absorption was obtained at room and cryogenic temperatures by taking advantage of the cathodoluminescence emission of the SiO2 substrate. We detected the CL emission related to defect intra-gap states, localized at the pyramid edges and with an enhanced intensity at the pyramid basal vertices. The photoluminescence and absorption analysis provided the Stokes shift of both the A and B excitons in the MoS2 pyramids. This analysis provides new insights into the optical functionality of MoS2 pyramids. This method can be applied to other 3D structures within the 2D materials family.
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Affiliation(s)
- M Negri
- Institute of Materials, Faculty of Engineering, École Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland.
- Institute for Materials for Electronics and Magnetism (IMEM-CNR), Parco Area delle Scienze 37/A, 43124 Parma, Italy
| | - L Francaviglia
- Institute of Materials, Faculty of Engineering, École Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland.
| | - D Kaplan
- U.S. Army RDECOM-ARDEC, Fuze Precision Armaments and Technology Directorate, Picatinny Arsenal, NJ 07806, USA
| | - V Swaminathan
- U.S. Army RDECOM-ARDEC, Fuze Precision Armaments and Technology Directorate, Picatinny Arsenal, NJ 07806, USA
- Department of Physics, Penn State University, USA
| | - G Salviati
- Institute for Materials for Electronics and Magnetism (IMEM-CNR), Parco Area delle Scienze 37/A, 43124 Parma, Italy
| | - A Fontcuberta I Morral
- Institute of Materials, Faculty of Engineering, École Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland.
- Institute of Physics, Faculty of Basic Sciences, École Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland
| | - F Fabbri
- NEST, Istituto Nanoscienze - CNR, Scuola Normale Superiore, Piazza San Silvestro 12, 56127 Pisa, Italy
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10
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Seravalli L, Bosi M, Fiorenza P, Panasci SE, Orsi D, Rotunno E, Cristofolini L, Rossi F, Giannazzo F, Fabbri F. Gold nanoparticle assisted synthesis of MoS 2 monolayers by chemical vapor deposition. NANOSCALE ADVANCES 2021; 3:4826-4833. [PMID: 36134320 PMCID: PMC9418562 DOI: 10.1039/d1na00367d] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 05/18/2021] [Accepted: 06/30/2021] [Indexed: 06/16/2023]
Abstract
The use of metal nanoparticles is an established paradigm for the synthesis of semiconducting one-dimensional nanostructures. In this work we study their effect on the synthesis of two-dimensional semiconducting materials, by using gold nanoparticles for chemical vapor deposition growth of two-dimensional molybdenum disulfide (MoS2). In comparison with the standard method, the employment of gold nanoparticles allows us to obtain large monolayer MoS2 flakes, up to 20 μm in lateral size, even if they are affected by the localized overgrowth of MoS2 bilayer and trilayer islands. Important modifications of the optical and electronic properties of MoS2 triangular domains are reported, where the photoluminescence intensity of the A exciton is strongly quenched and a shift to a positive threshold voltage in back-gated field effect transistors is observed. These results indicate that the use of gold nanoparticles influences the flake growth and properties, indicating a method for possible localized synthesis of two-dimensional materials, improving the lateral size of monolayers and modifying their properties.
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Affiliation(s)
- L Seravalli
- Institute for Materials for Electronics and Magnetism (IMEM-CNR) Parco Area delle Scienze 37/a 43124 Parma Italy
| | - M Bosi
- Institute for Materials for Electronics and Magnetism (IMEM-CNR) Parco Area delle Scienze 37/a 43124 Parma Italy
| | - P Fiorenza
- Institute for Microelectronics and Microsystems (CNR-IMM) Z. I. VIII Strada 5 95121 Catania Italy
| | - S E Panasci
- Institute for Microelectronics and Microsystems (CNR-IMM) Z. I. VIII Strada 5 95121 Catania Italy
| | - D Orsi
- Department of Mathematical, Physical and Computer Sciences, University of Parma Parco Area delle Scienze 7/a 43124 Parma Italy
| | - E Rotunno
- Istituto Nanoscienze-CNR via G Campi 213/a 41125 Modena Italy
| | - L Cristofolini
- Department of Mathematical, Physical and Computer Sciences, University of Parma Parco Area delle Scienze 7/a 43124 Parma Italy
| | - F Rossi
- Institute for Materials for Electronics and Magnetism (IMEM-CNR) Parco Area delle Scienze 37/a 43124 Parma Italy
| | - F Giannazzo
- Institute for Microelectronics and Microsystems (CNR-IMM) Z. I. VIII Strada 5 95121 Catania Italy
| | - F Fabbri
- NEST, Istituto Nanoscienze - CNR, Scuola Normale Superiore Piazza San Silvestro 12 56127 Pisa Italy
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