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Ben-Smith A, Choi SH, Boandoh S, Lee BH, Vu DA, Nguyen HTT, Adofo LA, Jin JW, Kim SM, Lee YH, Kim KK. Photo-oxidative Crack Propagation in Transition Metal Dichalcogenides. ACS NANO 2024; 18:3125-3133. [PMID: 38227480 DOI: 10.1021/acsnano.3c08755] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 01/17/2024]
Abstract
Monolayered transition-metal dichalcogenides (TMDs) are easily exposed to air, and their crystal quality can often be degraded via oxidation, leading to poor electronic and optical device performance. The degradation becomes more severe in the presence of defects, grain boundaries, and residues. Here, we report crack propagation in pristine TMD monolayers grown by chemical vapor deposition under ambient conditions and light illumination. Under a high relative humidity (RH) of ∼60% and white light illumination, the cracks appear randomly. Photo-oxidative cracks gradually propagated along the grain boundaries of the TMD monolayers. In contrast, under low RH conditions of ∼2%, cracks were scarcely observed. Crack propagation is predominantly attributed to the accumulation of water underneath the TMD monolayers, which is preferentially absorbed by hygroscopic alkali metal-based precursor residues. Crack propagation is further accelerated by the cyclic process of photo-oxidation in a basic medium, leading to localized tensile strain. We also found that such crack propagation is prevented after the removal of alkali metals via the transfer of the sample to other substrates.
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Affiliation(s)
- Andrew Ben-Smith
- Center for Integrated Nanostructure Physics (CINAP), Institute for Basic Science (IBS), Suwon 16419, Republic of Korea
- Department of Energy Science, Sungkyunkwan University (SKKU), Suwon 16419, Republic of Korea
| | - Soo Ho Choi
- Center for Integrated Nanostructure Physics (CINAP), Institute for Basic Science (IBS), Suwon 16419, Republic of Korea
- Department of Energy Science, Sungkyunkwan University (SKKU), Suwon 16419, Republic of Korea
| | - Stephen Boandoh
- Center for Integrated Nanostructure Physics (CINAP), Institute for Basic Science (IBS), Suwon 16419, Republic of Korea
- Department of Energy Science, Sungkyunkwan University (SKKU), Suwon 16419, Republic of Korea
| | - Byung Hoon Lee
- Department of Energy Science, Sungkyunkwan University (SKKU), Suwon 16419, Republic of Korea
| | - Duc Anh Vu
- Department of Energy Science, Sungkyunkwan University (SKKU), Suwon 16419, Republic of Korea
| | - Huong Thi Thanh Nguyen
- Department of Energy Science, Sungkyunkwan University (SKKU), Suwon 16419, Republic of Korea
| | - Laud Anim Adofo
- Department of Energy Science, Sungkyunkwan University (SKKU), Suwon 16419, Republic of Korea
| | - Jeong Won Jin
- Department of Energy Science, Sungkyunkwan University (SKKU), Suwon 16419, Republic of Korea
| | - Soo Min Kim
- Department of Chemistry, Sookmyung Women's University, Seoul 14072, Republic of Korea
| | - Young Hee Lee
- Center for Integrated Nanostructure Physics (CINAP), Institute for Basic Science (IBS), Suwon 16419, Republic of Korea
- Department of Energy Science, Sungkyunkwan University (SKKU), Suwon 16419, Republic of Korea
| | - Ki Kang Kim
- Center for Integrated Nanostructure Physics (CINAP), Institute for Basic Science (IBS), Suwon 16419, Republic of Korea
- Department of Energy Science, Sungkyunkwan University (SKKU), Suwon 16419, Republic of Korea
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Lee Y, Chang S, Chen S, Chen S, Chen H. Optical Inspection of 2D Materials: From Mechanical Exfoliation to Wafer-Scale Growth and Beyond. ADVANCED SCIENCE (WEINHEIM, BADEN-WURTTEMBERG, GERMANY) 2022; 9:e2102128. [PMID: 34716758 PMCID: PMC8728831 DOI: 10.1002/advs.202102128] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/20/2021] [Revised: 07/13/2021] [Indexed: 05/11/2023]
Abstract
Optical inspection is a rapid and non-destructive method for characterizing the properties of two-dimensional (2D) materials. With the aid of optical inspection, in situ and scalable monitoring of the properties of 2D materials can be implemented industrially to advance the development and progress of 2D material-based devices toward mass production. This review discusses the optical inspection techniques that are available to characterize various 2D materials, including graphene, transition metal dichalcogenides (TMDCs), hexagonal boron nitride (h-BN), group-III monochalcogenides, black phosphorus (BP), and group-IV monochalcogenides. First, the authors provide an introduction to these 2D materials and the processes commonly used for their fabrication. Then they review several of the important structural properties of 2D materials, and discuss how to characterize them using appropriate optical inspection tools. The authors also describe the challenges and opportunities faced when applying optical inspection to recently developed 2D materials, from mechanically exfoliated to wafer-scale-grown 2D materials. Most importantly, the authors summarize the techniques available for largely and precisely enhancing the optical signals from 2D materials. This comprehensive review of the current status and perspective of future trends for optical inspection of the structural properties of 2D materials will facilitate the development of next-generation 2D material-based devices.
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Affiliation(s)
- Yang‐Chun Lee
- Department of Materials Science and EngineeringNational Taiwan UniversityNo. 1, Sec. 4, Roosevelt RoadTaipei10617Taiwan
| | - Sih‐Wei Chang
- Department of Materials Science and EngineeringNational Taiwan UniversityNo. 1, Sec. 4, Roosevelt RoadTaipei10617Taiwan
| | - Shu‐Hsien Chen
- Department of Materials Science and EngineeringNational Taiwan UniversityNo. 1, Sec. 4, Roosevelt RoadTaipei10617Taiwan
| | - Shau‐Liang Chen
- Department of Materials Science and EngineeringNational Taiwan UniversityNo. 1, Sec. 4, Roosevelt RoadTaipei10617Taiwan
| | - Hsuen‐Li Chen
- Department of Materials Science and EngineeringNational Taiwan UniversityNo. 1, Sec. 4, Roosevelt RoadTaipei10617Taiwan
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Ludwiczak K, Da̧browska AK, Binder J, Tokarczyk M, Iwański J, Kurowska B, Turczyński J, Kowalski G, Bożek R, Stȩpniewski R, Pacuski W, Wysmołek A. Heteroepitaxial Growth of High Optical Quality, Wafer-Scale van der Waals Heterostrucutres. ACS APPLIED MATERIALS & INTERFACES 2021; 13:47904-47911. [PMID: 34606228 PMCID: PMC8517960 DOI: 10.1021/acsami.1c11867] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/28/2021] [Accepted: 09/16/2021] [Indexed: 05/05/2023]
Abstract
Transition metal dichalcogenides (TMDs) are materials that can exhibit intriguing optical properties like a change of the bandgap from indirect to direct when being thinned down to a monolayer. Well-resolved narrow excitonic resonances can be observed for such monolayers although only for materials of sufficient crystalline quality and so far mostly available in the form of micrometer-sized flakes. A further significant improvement of optical and electrical properties can be achieved by transferring the TMD on hexagonal boron nitride (hBN). To exploit the full potential of TMDs in future applications, epitaxial techniques have to be developed that not only allow the growth of large-scale, high-quality TMD monolayers but also allow the growth to be performed directly on large-scale epitaxial hBN. In this work, we address this problem and demonstrate that MoSe2 of high optical quality can be directly grown on epitaxial hBN on an entire 2 in. wafer. We developed a combined growth theme for which hBN is first synthesized at high temperature by metal organic vapor phase epitaxy (MOVPE) and as a second step MoSe2 is deposited on top by molecular beam epitaxy (MBE) at much lower temperatures. We show that this structure exhibits excellent optical properties, manifested by narrow excitonic lines in the photoluminescence spectra. Moreover, the material is homogeneous on the area of the whole 2 in. wafer with only ±0.14 meV deviation of excitonic energy. Our mixed growth technique may guide the way for future large-scale production of high quality TMD/hBN heterostructures.
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Affiliation(s)
- Katarzyna Ludwiczak
- Faculty
of Physics, University of Warsaw, ul. Pasteura 5, 02-093 Warsaw, Poland
| | | | - Johannes Binder
- Faculty
of Physics, University of Warsaw, ul. Pasteura 5, 02-093 Warsaw, Poland
| | - Mateusz Tokarczyk
- Faculty
of Physics, University of Warsaw, ul. Pasteura 5, 02-093 Warsaw, Poland
| | - Jakub Iwański
- Faculty
of Physics, University of Warsaw, ul. Pasteura 5, 02-093 Warsaw, Poland
| | - Bogusława Kurowska
- Institute
of Physics Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warsaw, Poland
| | - Jakub Turczyński
- Institute
of Physics Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warsaw, Poland
| | - Grzegorz Kowalski
- Faculty
of Physics, University of Warsaw, ul. Pasteura 5, 02-093 Warsaw, Poland
| | - Rafał Bożek
- Faculty
of Physics, University of Warsaw, ul. Pasteura 5, 02-093 Warsaw, Poland
| | - Roman Stȩpniewski
- Faculty
of Physics, University of Warsaw, ul. Pasteura 5, 02-093 Warsaw, Poland
| | - Wojciech Pacuski
- Faculty
of Physics, University of Warsaw, ul. Pasteura 5, 02-093 Warsaw, Poland
| | - Andrzej Wysmołek
- Faculty
of Physics, University of Warsaw, ul. Pasteura 5, 02-093 Warsaw, Poland
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