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For: Hite JK, Robinson ZR, Eddy CR, Feigelson BN. Electron backscatter diffraction study of hexagonal boron nitride growth on Cu single-crystal substrates. ACS Appl Mater Interfaces 2015;7:15200-15205. [PMID: 26090544 DOI: 10.1021/acsami.5b00723] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
Number Cited by Other Article(s)
1
Roy S, Zhang X, Puthirath AB, Meiyazhagan A, Bhattacharyya S, Rahman MM, Babu G, Susarla S, Saju SK, Tran MK, Sassi LM, Saadi MASR, Lai J, Sahin O, Sajadi SM, Dharmarajan B, Salpekar D, Chakingal N, Baburaj A, Shuai X, Adumbumkulath A, Miller KA, Gayle JM, Ajnsztajn A, Prasankumar T, Harikrishnan VVJ, Ojha V, Kannan H, Khater AZ, Zhu Z, Iyengar SA, Autreto PADS, Oliveira EF, Gao G, Birdwell AG, Neupane MR, Ivanov TG, Taha-Tijerina J, Yadav RM, Arepalli S, Vajtai R, Ajayan PM. Structure, Properties and Applications of Two-Dimensional Hexagonal Boron Nitride. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2021;33:e2101589. [PMID: 34561916 DOI: 10.1002/adma.202101589] [Citation(s) in RCA: 120] [Impact Index Per Article: 40.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/25/2021] [Revised: 05/24/2021] [Indexed: 05/09/2023]
2
Ranjan A, O'Shea SJ, Bosman M, Raghavan N, Pey KL. Localized Probing of Dielectric Breakdown in Multilayer Hexagonal Boron Nitride. ACS APPLIED MATERIALS & INTERFACES 2020;12:55000-55010. [PMID: 33258598 DOI: 10.1021/acsami.0c17107] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/12/2023]
3
Brülke C, Bauer O, Sokolowski MM. The influence of an interfacial hBN layer on the fluorescence of an organic molecule. BEILSTEIN JOURNAL OF NANOTECHNOLOGY 2020;11:1663-1684. [PMID: 33194516 PMCID: PMC7653332 DOI: 10.3762/bjnano.11.149] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 05/29/2020] [Accepted: 10/09/2020] [Indexed: 06/11/2023]
4
Chou H, Majumder S, Roy A, Catalano M, Zhuang P, Quevedo-Lopez M, Colombo L, Banerjee SK. Dependence of h-BN Film Thickness as Grown on Nickel Single-Crystal Substrates of Different Orientations. ACS APPLIED MATERIALS & INTERFACES 2018;10:44862-44870. [PMID: 30489058 DOI: 10.1021/acsami.8b16816] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/09/2023]
5
Khan MH, Jamali SS, Lyalin A, Molino PJ, Jiang L, Liu HK, Taketsugu T, Huang Z. Atomically Thin Hexagonal Boron Nitride Nanofilm for Cu Protection: The Importance of Film Perfection. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2017;29:1603937. [PMID: 27874217 DOI: 10.1002/adma.201603937] [Citation(s) in RCA: 12] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/25/2016] [Revised: 09/29/2016] [Indexed: 06/06/2023]
6
SIMS of transfer ribonucleic acid molecules encapsulated between free-standing graphene sheets. Biointerphases 2016;11:02A324. [PMID: 26932227 DOI: 10.1116/1.4942879] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/17/2022]  Open
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