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For: Feng W, Zheng W, Chen X, Liu G, Hu P. Gate Modulation of Threshold Voltage Instability in Multilayer InSe Field Effect Transistors. ACS Appl Mater Interfaces 2015;7:26691-26695. [PMID: 26575205 DOI: 10.1021/acsami.5b08635] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/05/2023]
Number Cited by Other Article(s)
1
Liu HY, Wu JY. Tunable Electronic Properties of Two-Dimensional GaSe1-xTex Alloys. NANOMATERIALS (BASEL, SWITZERLAND) 2023;13:818. [PMID: 36903697 PMCID: PMC10005243 DOI: 10.3390/nano13050818] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 02/04/2023] [Revised: 02/18/2023] [Accepted: 02/21/2023] [Indexed: 06/18/2023]
2
Noh G, Song H, Choi H, Kim M, Jeong JH, Lee Y, Choi MY, Oh S, Jo MK, Woo DY, Jo Y, Park E, Moon E, Kim TS, Chai HJ, Huh W, Lee CH, Kim CJ, Yang H, Song S, Jeong HY, Kim YS, Lee GH, Lim J, Kim CG, Chung TM, Kwak JY, Kang K. Large Memory Window of van der Waals Heterostructure Devices Based on MOCVD-Grown 2D Layered Ge4 Se9. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2022;34:e2204982. [PMID: 36000232 DOI: 10.1002/adma.202204982] [Citation(s) in RCA: 7] [Impact Index Per Article: 3.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/02/2022] [Revised: 08/12/2022] [Indexed: 06/15/2023]
3
Hu H, Wang H, Sun Y, Li J, Wei J, Xie D, Zhu H. Out-of-plane and in-plane ferroelectricity of atom-thick two-dimensional InSe. NANOTECHNOLOGY 2021;32:385202. [PMID: 34116515 DOI: 10.1088/1361-6528/ac0ac5] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/23/2021] [Accepted: 06/11/2021] [Indexed: 06/12/2023]
4
Wang Y, Liu S, Li Q, Quhe R, Yang C, Guo Y, Zhang X, Pan Y, Li J, Zhang H, Xu L, Shi B, Tang H, Li Y, Yang J, Zhang Z, Xiao L, Pan F, Lu J. Schottky barrier heights in two-dimensional field-effect transistors: from theory to experiment. REPORTS ON PROGRESS IN PHYSICS. PHYSICAL SOCIETY (GREAT BRITAIN) 2021;84:056501. [PMID: 33761489 DOI: 10.1088/1361-6633/abf1d4] [Citation(s) in RCA: 26] [Impact Index Per Article: 8.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/16/2020] [Accepted: 03/24/2021] [Indexed: 06/12/2023]
5
Wen S, Lan C, Li C, Zhou S, He T, Zhang R, Zou R, Hu H, Yin Y, Liu Y. Gate-bias instability of few-layer WSe2 field effect transistors. RSC Adv 2021;11:6818-6824. [PMID: 35423215 PMCID: PMC8694931 DOI: 10.1039/d0ra09376a] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/04/2020] [Accepted: 02/03/2021] [Indexed: 11/26/2022]  Open
6
Novel two-dimensional Ga(In)S1-Se as high-efficiency OER catalysts for photocatalytic water splitting. J SOLID STATE CHEM 2020. [DOI: 10.1016/j.jssc.2020.121730] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
7
Kumar AS, Wang M, Li Y, Fujita R, Gao XPA. Interfacial Charge Transfer and Gate-Induced Hysteresis in Monochalcogenide InSe/GaSe Heterostructures. ACS APPLIED MATERIALS & INTERFACES 2020;12:46854-46861. [PMID: 32955239 DOI: 10.1021/acsami.0c09635] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
8
Wang Y, Gao J, Wei B, Han Y, Wang C, Gao Y, Liu H, Han L, Zhang Y. Reduction of the ambient effect in multilayer InSe transistors and a strategy toward stable 2D-based optoelectronic applications. NANOSCALE 2020;12:18356-18362. [PMID: 32870216 DOI: 10.1039/d0nr04120c] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
9
Liu L, Wu L, Wang A, Liu H, Ma R, Wu K, Chen J, Zhou Z, Tian Y, Yang H, Shen C, Bao L, Qin Z, Pantelides ST, Gao HJ. Ferroelectric-Gated InSe Photodetectors with High On/Off Ratios and Photoresponsivity. NANO LETTERS 2020;20:6666-6673. [PMID: 32822183 DOI: 10.1021/acs.nanolett.0c02448] [Citation(s) in RCA: 17] [Impact Index Per Article: 4.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
10
Chen F, Cui A, Wang X, Gao C, Xu L, Jiang K, Zhang J, Hu Z, Chu J. Lattice vibration characteristics in layered InSe films and the electronic behavior of field-effect transistors. NANOTECHNOLOGY 2020;31:335702. [PMID: 32344392 DOI: 10.1088/1361-6528/ab8df1] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
11
Luo P, Zhuge F, Zhang Q, Chen Y, Lv L, Huang Y, Li H, Zhai T. Doping engineering and functionalization of two-dimensional metal chalcogenides. NANOSCALE HORIZONS 2019;4:26-51. [PMID: 32254144 DOI: 10.1039/c8nh00150b] [Citation(s) in RCA: 106] [Impact Index Per Article: 21.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/15/2023]
12
Wells SA, Henning A, Gish JT, Sangwan VK, Lauhon LJ, Hersam MC. Suppressing Ambient Degradation of Exfoliated InSe Nanosheet Devices via Seeded Atomic Layer Deposition Encapsulation. NANO LETTERS 2018;18:7876-7882. [PMID: 30418785 DOI: 10.1021/acs.nanolett.8b03689] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/28/2023]
13
Fan Y, Liu X, Wang J, Ai H, Zhao M. Silicene and germanene on InSe substrates: structures and tunable electronic properties. Phys Chem Chem Phys 2018;20:11369-11377. [DOI: 10.1039/c8cp00610e] [Citation(s) in RCA: 32] [Impact Index Per Article: 5.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/31/2023]
14
Shi B, Wang Y, Li J, Zhang X, Yan J, Liu S, Yang J, Pan Y, Zhang H, Yang J, Pan F, Lu J. n-Type Ohmic contact and p-type Schottky contact of monolayer InSe transistors. Phys Chem Chem Phys 2018;20:24641-24651. [DOI: 10.1039/c8cp04615h] [Citation(s) in RCA: 25] [Impact Index Per Article: 4.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
15
Politano A, Chiarello G, Samnakay R, Liu G, Gürbulak B, Duman S, Balandin AA, Boukhvalov DW. The influence of chemical reactivity of surface defects on ambient-stable InSe-based nanodevices. NANOSCALE 2016;8:8474-8479. [PMID: 27049751 DOI: 10.1039/c6nr01262k] [Citation(s) in RCA: 26] [Impact Index Per Article: 3.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/05/2023]
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