1
|
Fu X, Liu Z, Wang H, Xie D, Sun Y. Small Feature-Size Transistors Based on Low-Dimensional Materials: From Structure Design to Nanofabrication Techniques. ADVANCED SCIENCE (WEINHEIM, BADEN-WURTTEMBERG, GERMANY) 2024:e2400500. [PMID: 38884208 DOI: 10.1002/advs.202400500] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/13/2024] [Revised: 05/11/2024] [Indexed: 06/18/2024]
Abstract
For several decades after Moore's Law is proposed, there is a continuous effort to reduce the feature-size of transistors. However, as the size of transistors continues to decrease, numerous challenges and obstacles including severe short channel effects (SCEs) are emerging. Recently, low-dimensional materials have provided new opportunities for constructing small feature-size transistors due to their superior electrical properties compared to silicon. Here, state-of-the-art low-dimensional materials-based transistors with small feature-sizes are reviewed. Different from other works that mainly focus on material characteristics of a specific device structure, the discussed topics are utilizing device structure design including vertical structure and nano-gate structure, and nanofabrication techniques to achieve small feature-sizes of transistors. A comprehensive summary of these small feature-size transistors is presented by illustrating their operation mechanism, relevant fabrication processes, and corresponding performance parameters. Besides, the role of small feature-size transistors based on low-dimensional materials in further reducing the small footprint is also clarified and their cutting-edge applications are highlighted. Finally, a comparison and analysis between state-of-art transistors is made, as well as a glimpse into the future research trajectory of low dimensional materials-based small feature-size transistors is briefly outlined.
Collapse
Affiliation(s)
- Xiaqing Fu
- School of Microelectronics, Shanghai University, Shanghai, 201800, P. R. China
| | - Zhifang Liu
- School of Integrated Circuits and Electronics, Beijing Institute of Technology, Beijing, 100081, P. R. China
| | - Huaipeng Wang
- School of Integrated Circuits, Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, 100084, P. R. China
| | - Dan Xie
- School of Integrated Circuits, Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing, 100084, P. R. China
| | - Yilin Sun
- School of Integrated Circuits and Electronics, Beijing Institute of Technology, Beijing, 100081, P. R. China
| |
Collapse
|
2
|
Chin HT, Wang DC, Gulo DP, Yao YC, Yeh HC, Muthu J, Chen DR, Kao TC, Kalbáč M, Lin PH, Cheng CM, Hofmann M, Liang CT, Liu HL, Chuang FC, Hsieh YP. Tungsten Nitride (W 5N 6): An Ultraresilient 2D Semimetal. NANO LETTERS 2024; 24:67-73. [PMID: 38149785 DOI: 10.1021/acs.nanolett.3c03243] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 12/28/2023]
Abstract
Two-dimensional transition metal nitrides offer intriguing possibilities for achieving novel electronic and mechanical functionality owing to their distinctive and tunable bonding characteristics compared to other 2D materials. We demonstrate here the enabling effects of strong bonding on the morphology and functionality of 2D tungsten nitrides. The employed bottom-up synthesis experienced a unique substrate stabilization effect beyond van-der-Waals epitaxy that favored W5N6 over lower metal nitrides. Comprehensive structural and electronic characterization reveals that monolayer W5N6 can be synthesized at large scale and shows semimetallic behavior with an intriguing indirect band structure. Moreover, the material exhibits exceptional resilience against mechanical damage and chemical reactions. Leveraging these electronic properties and robustness, we demonstrate the application of W5N6 as atomic-scale dry etch stops that allow the integration of high-performance 2D materials contacts. These findings highlight the potential of 2D transition metal nitrides for realizing advanced electronic devices and functional interfaces.
Collapse
Affiliation(s)
- Hao-Ting Chin
- Molecular Science and Technology Program, Taiwan International Graduate Program, Academia Sinica, Taipei 10617, Taiwan
- International Graduate Program of Molecular Science and Technology, National Taiwan University, Taipei 10617, Taiwan
- Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei 10617, Taiwan
| | - Deng-Chi Wang
- Department of Physics, National Sun Yat-Sen University, Kaohsiung 80424, Taiwan
| | | | - Yu-Chi Yao
- Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei 10617, Taiwan
- Department of Physics, National Taiwan University, Taipei 10617, Taiwan
| | - Hao-Chen Yeh
- Institute of Physics, Academia Sinica, Taipei 115201, Taiwan
| | - Jeyavelan Muthu
- Department of Physics, National Taiwan University, Taipei 10617, Taiwan
- International Graduate Program of Nano Science and Technology, National Taiwan University, Taipei 10617, Taiwan
| | - Ding-Rui Chen
- Molecular Science and Technology Program, Taiwan International Graduate Program, Academia Sinica, Taipei 10617, Taiwan
- International Graduate Program of Molecular Science and Technology, National Taiwan University, Taipei 10617, Taiwan
- Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei 10617, Taiwan
| | - Tzu-Chun Kao
- Graduate Institute of Applied Physics, National Taiwan University, Taipei 10617, Taiwan
| | - Martin Kalbáč
- J. Heyrovský Institute of Physical Chemistry, Czech Academy of Sciences, Dolejškova 2155/3, 182 23 Prague, Czech Republic
| | - Ping-Hui Lin
- National Synchrotron Radiation Research Center (NSRRC), Hsinchu 300092, Taiwan
| | - Cheng-Maw Cheng
- National Synchrotron Radiation Research Center (NSRRC), Hsinchu 300092, Taiwan
| | - Mario Hofmann
- Department of Physics, National Taiwan University, Taipei 10617, Taiwan
| | - Chi-Te Liang
- Department of Physics, National Taiwan University, Taipei 10617, Taiwan
| | - Hsiang-Lin Liu
- Department of Physics, National Taiwan Normal University, Taipei 11677, Taiwan
| | - Feng-Chuan Chuang
- Department of Physics, National Sun Yat-Sen University, Kaohsiung 80424, Taiwan
- Physics Division, National Center for Theoretical Sciences, Taipei 10617, Taiwan
- Center for Theoretical and Computational Physics, National Sun Yat-sen University, Kaohsiung 80424, Taiwan
| | - Ya-Ping Hsieh
- Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei 10617, Taiwan
| |
Collapse
|
3
|
Liu L, Chen Y, Chen L, Xie B, Li G, Kong L, Tao Q, Li Z, Yang X, Lu Z, Ma L, Lu D, Yang X, Liu Y. Ultrashort vertical-channel MoS 2 transistor using a self-aligned contact. Nat Commun 2024; 15:165. [PMID: 38167517 PMCID: PMC10761794 DOI: 10.1038/s41467-023-44519-x] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/24/2023] [Accepted: 12/15/2023] [Indexed: 01/05/2024] Open
Abstract
Two-dimensional (2D) semiconductors hold great promises for ultra-scaled transistors. In particular, the gate length of MoS2 transistor has been scaled to 1 nm and 0.3 nm using single wall carbon nanotube and graphene, respectively. However, simultaneously scaling the channel length of these short-gate transistor is still challenging, and could be largely attributed to the processing difficulties to precisely align source-drain contact with gate electrode. Here, we report a self-alignment process for realizing ultra-scaled 2D transistors. By mechanically folding a graphene/BN/MoS2 heterostructure, source-drain metals could be precisely aligned around the folded edge, and the channel length is only dictated by heterostructure thickness. Together, we could realize sub-1 nm gate length and sub-50 nm channel length for vertical MoS2 transistor simultaneously. The self-aligned device exhibits on-off ratio over 105 and on-state current of 250 μA/μm at 4 V bias, which is over 40 times higher compared to control sample without self-alignment process.
Collapse
Affiliation(s)
- Liting Liu
- Key Laboratory for Micro-Nano Optoelectronic Devices of Ministry of Education, School of Physics and Electronics, Hunan University, Changsha, 410082, China
| | - Yang Chen
- Key Laboratory for Micro-Nano Optoelectronic Devices of Ministry of Education, School of Physics and Electronics, Hunan University, Changsha, 410082, China
| | - Long Chen
- Key Laboratory for Micro-Nano Optoelectronic Devices of Ministry of Education, School of Physics and Electronics, Hunan University, Changsha, 410082, China
| | - Biao Xie
- Key Laboratory for Micro-Nano Optoelectronic Devices of Ministry of Education, School of Physics and Electronics, Hunan University, Changsha, 410082, China
| | - Guoli Li
- Key Laboratory for Micro-Nano Optoelectronic Devices of Ministry of Education, School of Physics and Electronics, Hunan University, Changsha, 410082, China.
| | - Lingan Kong
- Key Laboratory for Micro-Nano Optoelectronic Devices of Ministry of Education, School of Physics and Electronics, Hunan University, Changsha, 410082, China
| | - Quanyang Tao
- Key Laboratory for Micro-Nano Optoelectronic Devices of Ministry of Education, School of Physics and Electronics, Hunan University, Changsha, 410082, China
| | - Zhiwei Li
- Key Laboratory for Micro-Nano Optoelectronic Devices of Ministry of Education, School of Physics and Electronics, Hunan University, Changsha, 410082, China
| | - Xiaokun Yang
- Key Laboratory for Micro-Nano Optoelectronic Devices of Ministry of Education, School of Physics and Electronics, Hunan University, Changsha, 410082, China
| | - Zheyi Lu
- Key Laboratory for Micro-Nano Optoelectronic Devices of Ministry of Education, School of Physics and Electronics, Hunan University, Changsha, 410082, China
| | - Likuan Ma
- Key Laboratory for Micro-Nano Optoelectronic Devices of Ministry of Education, School of Physics and Electronics, Hunan University, Changsha, 410082, China
| | - Donglin Lu
- Key Laboratory for Micro-Nano Optoelectronic Devices of Ministry of Education, School of Physics and Electronics, Hunan University, Changsha, 410082, China
| | - Xiangdong Yang
- Institute of Micro/Nano Materials and Devices, Ningbo University of Technology, Ningbo, 315211, China
| | - Yuan Liu
- Key Laboratory for Micro-Nano Optoelectronic Devices of Ministry of Education, School of Physics and Electronics, Hunan University, Changsha, 410082, China.
| |
Collapse
|
4
|
Cheng T, Zhu Z, Wang X, Zhu L, Li A, Jiang L, Cao Y. Atomic layer deposition assisted fabrication of large-scale metal nanogaps for surface enhanced Raman scattering. NANOTECHNOLOGY 2023; 34:265301. [PMID: 36996801 DOI: 10.1088/1361-6528/acc8d9] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/31/2022] [Accepted: 03/30/2023] [Indexed: 06/19/2023]
Abstract
Metal nanogaps can confine electromagnetic field into extremely small volumes, exhibiting strong surface plasmon resonance effect. Therefore, metal nanogaps show great prospects in enhancing light-matter interaction. However, it is still challenging to fabricate large-scale (centimeter scale) nanogaps with precise control of gap size at nanoscale, limiting the practical applications of metal nanogaps. In this work, we proposed a facile and economic strategy to fabricate large-scale sub-10 nm Ag nanogaps by the combination of atomic layer deposition (ALD) and mechanical rolling. The plasmonic nanogaps can be formed in the compacted Ag film by the sacrificial Al2O3deposited via ALD. The size of nanogaps are determined by the twice thickness of Al2O3with nanometric control. Raman results show that SERS activity depends closely on the nanogap size, and 4 nm Ag nanogaps exhibit the best SERS activity. By combining with other porous metal substrates, various sub-10 nm metal nanogaps can be fabricated over large scale. Therefore, this strategy will have significant implications for the preparation of nanogaps and enhanced spectroscopy.
Collapse
Affiliation(s)
- Tangjie Cheng
- Institute of Micro-nano Photonics and Quantum Manipulation, School of Science, Nanjing University of Science and Technology, Nanjing, 210094, People's Republic of China
| | - Zebin Zhu
- Institute of Micro-nano Photonics and Quantum Manipulation, School of Science, Nanjing University of Science and Technology, Nanjing, 210094, People's Republic of China
| | - Xinxin Wang
- Institute of Micro-nano Photonics and Quantum Manipulation, School of Science, Nanjing University of Science and Technology, Nanjing, 210094, People's Republic of China
| | - Lin Zhu
- National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences, Collaborative Innovation Center of Advanced Microstructures, Jiangsu Key Laboratory of Artificial Functional Materials, Nanjing University, Nanjing, 210093, People's Republic of China
| | - Aidong Li
- National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences, Collaborative Innovation Center of Advanced Microstructures, Jiangsu Key Laboratory of Artificial Functional Materials, Nanjing University, Nanjing, 210093, People's Republic of China
| | - Liyong Jiang
- Institute of Micro-nano Photonics and Quantum Manipulation, School of Science, Nanjing University of Science and Technology, Nanjing, 210094, People's Republic of China
| | - Yanqiang Cao
- Institute of Micro-nano Photonics and Quantum Manipulation, School of Science, Nanjing University of Science and Technology, Nanjing, 210094, People's Republic of China
| |
Collapse
|
5
|
Wei T, Han Z, Zhong X, Xiao Q, Liu T, Xiang D. Two dimensional semiconducting materials for ultimately scaled transistors. iScience 2022; 25:105160. [PMID: 36204270 PMCID: PMC9529977 DOI: 10.1016/j.isci.2022.105160] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022] Open
Abstract
Two dimensional (2D) semiconductors have been established as promising candidates to break through the short channel effect that existed in Si metal-oxide-semiconductor field-effect-transistor (MOSFET), owing to their unique atomically layered structure and dangling-bond-free surface. The last decade has witnessed the significant progress in the size scaling of 2D transistors by various approaches, in which the physical gate length of the transistors has shrank from micrometer to sub-one nanometer with superior performance, illustrating their potential as a replacement technology for Si MOSFETs. Here, we review state-of-the-art techniques to achieve ultra-scaled 2D transistors with novel configurations through the scaling of channel, gate, and contact length. We provide comprehensive views of the merits and drawbacks of the ultra-scaled 2D transistors by summarizing the relevant fabrication processes with the corresponding critical parameters achieved. Finally, we identify the key opportunities and challenges for integrating ultra-scaled 2D transistors in the next-generation heterogeneous circuitry.
Collapse
Affiliation(s)
- Tianyao Wei
- Institute of Optoelectronics, Fudan University, Shanghai 200438, People’s Republic of China
- Frontier Institute of Chip and System, Fudan University, Shanghai 200438, People’s Republic of China
| | - Zichao Han
- Institute of Optoelectronics, Fudan University, Shanghai 200438, People’s Republic of China
| | - Xinyi Zhong
- Department of Materials Science, Fudan University, Shanghai 200433, People’s Republic of China
| | - Qingyu Xiao
- Department of Materials Science, Fudan University, Shanghai 200433, People’s Republic of China
| | - Tao Liu
- Institute of Optoelectronics, Fudan University, Shanghai 200438, People’s Republic of China
- Zhangjiang Fudan International Innovation Centre, Fudan University, Shanghai 200438, People’s Republic of China
- Corresponding author
| | - Du Xiang
- Frontier Institute of Chip and System, Fudan University, Shanghai 200438, People’s Republic of China
- Zhangjiang Fudan International Innovation Centre, Fudan University, Shanghai 200438, People’s Republic of China
- Shanghai Qi Zhi Institute, Shanghai 200232, People’s Republic of China
- Corresponding author
| |
Collapse
|
6
|
Lin H, Zhang Z, Zhang H, Lin KT, Wen X, Liang Y, Fu Y, Lau AKT, Ma T, Qiu CW, Jia B. Engineering van der Waals Materials for Advanced Metaphotonics. Chem Rev 2022; 122:15204-15355. [PMID: 35749269 DOI: 10.1021/acs.chemrev.2c00048] [Citation(s) in RCA: 17] [Impact Index Per Article: 8.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/16/2022]
Abstract
The outstanding chemical and physical properties of 2D materials, together with their atomically thin nature, make them ideal candidates for metaphotonic device integration and construction, which requires deep subwavelength light-matter interaction to achieve optical functionalities beyond conventional optical phenomena observed in naturally available materials. In addition to their intrinsic properties, the possibility to further manipulate the properties of 2D materials via chemical or physical engineering dramatically enhances their capability, evoking new science on light-matter interaction, leading to leaped performance of existing functional devices and giving birth to new metaphotonic devices that were unattainable previously. Comprehensive understanding of the intrinsic properties of 2D materials, approaches and capabilities for chemical and physical engineering methods, the resulting property modifications and novel functionalities, and applications of metaphotonic devices are provided in this review. Through reviewing the detailed progress in each aspect and the state-of-the-art achievement, insightful analyses of the outstanding challenges and future directions are elucidated in this cross-disciplinary comprehensive review with the aim to provide an overall development picture in the field of 2D material metaphotonics and promote rapid progress in this fast emerging and prosperous field.
Collapse
Affiliation(s)
- Han Lin
- School of Science, RMIT University, Melbourne, Victoria 3000, Australia.,The Australian Research Council (ARC) Industrial Transformation Training, Centre in Surface Engineering for Advanced Materials (SEAM), Swinburne University of Technology, Hawthorn, Victoria 3122, Australia
| | - Zhenfang Zhang
- School of Textile Science and Engineering, Xi'an Polytechnic University, Xi'an 710048, China
| | - Huihui Zhang
- Centre for Translational Atomaterials, School of Science, Computing and Engineering Technologies, Swinburne University of Technology, P.O. Box 218, Hawthorn, Victoria 3122, Australia
| | - Keng-Te Lin
- School of Science, RMIT University, Melbourne, Victoria 3000, Australia
| | - Xiaoming Wen
- Centre for Translational Atomaterials, School of Science, Computing and Engineering Technologies, Swinburne University of Technology, P.O. Box 218, Hawthorn, Victoria 3122, Australia
| | - Yao Liang
- Centre for Translational Atomaterials, School of Science, Computing and Engineering Technologies, Swinburne University of Technology, P.O. Box 218, Hawthorn, Victoria 3122, Australia
| | - Yang Fu
- Centre for Translational Atomaterials, School of Science, Computing and Engineering Technologies, Swinburne University of Technology, P.O. Box 218, Hawthorn, Victoria 3122, Australia
| | - Alan Kin Tak Lau
- Centre for Translational Atomaterials, School of Science, Computing and Engineering Technologies, Swinburne University of Technology, P.O. Box 218, Hawthorn, Victoria 3122, Australia
| | - Tianyi Ma
- School of Science, RMIT University, Melbourne, Victoria 3000, Australia.,Centre for Translational Atomaterials, School of Science, Computing and Engineering Technologies, Swinburne University of Technology, P.O. Box 218, Hawthorn, Victoria 3122, Australia
| | - Cheng-Wei Qiu
- Department of Electrical and Computer Engineering, National University of Singapore, Singapore 117583, Singapore
| | - Baohua Jia
- School of Science, RMIT University, Melbourne, Victoria 3000, Australia.,The Australian Research Council (ARC) Industrial Transformation Training, Centre in Surface Engineering for Advanced Materials (SEAM), Swinburne University of Technology, Hawthorn, Victoria 3122, Australia.,Centre for Translational Atomaterials, School of Science, Computing and Engineering Technologies, Swinburne University of Technology, P.O. Box 218, Hawthorn, Victoria 3122, Australia
| |
Collapse
|
7
|
Lawson ZR, Preston AS, Korsa MT, Dominique NL, Tuff WJ, Sutter E, Camden JP, Adam J, Hughes RA, Neretina S. Plasmonic Gold Trimers and Dimers with Air-Filled Nanogaps. ACS APPLIED MATERIALS & INTERFACES 2022; 14:28186-28198. [PMID: 35695394 DOI: 10.1021/acsami.2c04800] [Citation(s) in RCA: 7] [Impact Index Per Article: 3.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/15/2023]
Abstract
The subwavelength confinement of light energy in the nanogaps formed between adjacent plasmonic nanostructures provides the foundational basis for nanophotonic applications. Within this realm, air-filled nanogaps are of central importance because they present a cavity where application-specific nanoscale objects can reside. When forming such configurations on substrate surfaces, there is an inherent difficulty in that the most technologically relevant nanogap widths require closely spaced nanostructures separated by distances that are inaccessible through standard electron-beam lithography techniques. Herein, we demonstrate an assembly route for the fabrication of aligned plasmonic gold trimers with air-filled vertical nanogaps having widths that are defined with spatial controls that exceed those of lithographic processes. The devised procedure uses a sacrificial oxide layer to define the nanogap, a glancing angle deposition to impose a directionality on trimer formation, and a sacrificial antimony layer whose sublimation regulates the gold assembly process. By further implementing a benchtop nanoimprint lithography process and a glancing angle ion milling procedure as additional controls over the assembly, it is possible to deterministically position trimers in periodic arrays and extend the assembly process to dimer formation. The optical response of the structures, which is characterized using polarization-dependent spectroscopy, surface-enhanced Raman scattering, and refractive index sensitivity measurements, shows properties that are consistent with simulation. This work, hence, forwards the wafer-based processing techniques needed to form air-filled nanogaps and place plasmonic energy at site-specific locations.
Collapse
Affiliation(s)
- Zachary R Lawson
- College of Engineering, University of Notre Dame, Notre Dame, Indiana 46556, United States
| | - Arin S Preston
- College of Engineering, University of Notre Dame, Notre Dame, Indiana 46556, United States
| | - Matiyas T Korsa
- Computational Materials Group, SDU Centre for Photonics Engineering, Mads Clausen Institute, University of Southern Denmark, 5230 Odense, Denmark
| | - Nathaniel L Dominique
- Department of Chemistry and Biochemistry, University of Notre Dame, Notre Dame, Indiana 46556, United States
| | - Walker J Tuff
- College of Engineering, University of Notre Dame, Notre Dame, Indiana 46556, United States
| | - Eli Sutter
- Department of Mechanical and Materials Engineering, University of Nebraska-Lincoln, Lincoln, Nebraska 68588, United States
| | - Jon P Camden
- Department of Chemistry and Biochemistry, University of Notre Dame, Notre Dame, Indiana 46556, United States
| | - Jost Adam
- Computational Materials Group, SDU Centre for Photonics Engineering, Mads Clausen Institute, University of Southern Denmark, 5230 Odense, Denmark
| | - Robert A Hughes
- College of Engineering, University of Notre Dame, Notre Dame, Indiana 46556, United States
| | - Svetlana Neretina
- College of Engineering, University of Notre Dame, Notre Dame, Indiana 46556, United States
- Department of Chemistry and Biochemistry, University of Notre Dame, Notre Dame, Indiana 46556, United States
| |
Collapse
|
8
|
Dai C, Liu Y, Wei D. Two-Dimensional Field-Effect Transistor Sensors: The Road toward Commercialization. Chem Rev 2022; 122:10319-10392. [PMID: 35412802 DOI: 10.1021/acs.chemrev.1c00924] [Citation(s) in RCA: 57] [Impact Index Per Article: 28.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
Abstract
The evolutionary success in information technology has been sustained by the rapid growth of sensor technology. Recently, advances in sensor technology have promoted the ambitious requirement to build intelligent systems that can be controlled by external stimuli along with independent operation, adaptivity, and low energy expenditure. Among various sensing techniques, field-effect transistors (FETs) with channels made of two-dimensional (2D) materials attract increasing attention for advantages such as label-free detection, fast response, easy operation, and capability of integration. With atomic thickness, 2D materials restrict the carrier flow within the material surface and expose it directly to the external environment, leading to efficient signal acquisition and conversion. This review summarizes the latest advances of 2D-materials-based FET (2D FET) sensors in a comprehensive manner that contains the material, operating principles, fabrication technologies, proof-of-concept applications, and prototypes. First, a brief description of the background and fundamentals is provided. The subsequent contents summarize physical, chemical, and biological 2D FET sensors and their applications. Then, we highlight the challenges of their commercialization and discuss corresponding solution techniques. The following section presents a systematic survey of recent progress in developing commercial prototypes. Lastly, we summarize the long-standing efforts and prospective future development of 2D FET-based sensing systems toward commercialization.
Collapse
Affiliation(s)
- Changhao Dai
- State Key Laboratory of Molecular Engineering of Polymers, Department of Macromolecular Science, Fudan University, Shanghai 200433, China.,Laboratory of Molecular Materials and Devices, Fudan University, Shanghai 200433, China
| | - Yunqi Liu
- Laboratory of Molecular Materials and Devices, Fudan University, Shanghai 200433, China
| | - Dacheng Wei
- State Key Laboratory of Molecular Engineering of Polymers, Department of Macromolecular Science, Fudan University, Shanghai 200433, China.,Laboratory of Molecular Materials and Devices, Fudan University, Shanghai 200433, China
| |
Collapse
|
9
|
Xie G, Bai H, Miao G, Feng G, Yang J, He Y, Li X, Li Y. The Applications of Ultra-Thin Nanofilm for Aerospace Advanced Manufacturing Technology. NANOMATERIALS 2021; 11:nano11123282. [PMID: 34947631 PMCID: PMC8708582 DOI: 10.3390/nano11123282] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 11/17/2021] [Revised: 11/29/2021] [Accepted: 11/29/2021] [Indexed: 12/18/2022]
Abstract
With the development of industrial civilization, advanced manufacturing technology has attracted widespread concern, including in the aerospace industry. In this paper, we report the applications of ultra-thin atomic layer deposition nanofilm in the advanced aerospace manufacturing industry, including aluminum anti-oxidation and secondary electron suppression, which are critical in high-power and miniaturization development. The compact and uniform aluminum oxide film, which is formed by thermal atomic layer deposition (ALD), can prevent the deep surface oxidation of aluminum during storage, avoiding the waste of material and energy in repetitive production. The total secondary electron yield of the C/TiN component nanofilm, deposited through plasma-enhanced atomic layer deposition, decreases 25% compared with an uncoated surface. The suppression of secondary electron emission is of great importance in solving the multipactor for high-power microwave components in space. Moreover, the controllable, ultra-thin uniform composite nanofilm can be deposited directly on the complex surface of devices without any transfer process, which is critical for many different applications. The ALD nanofilm shows potential for promoting system performance and resource consumption in the advanced aerospace manufacturing industry.
Collapse
Affiliation(s)
- Guibai Xie
- National Key Laboratory of Science and Technology on Space Microwave, China Academy of Space Technology (Xi’an), Xi’an 710100, China; (H.B.); (G.M.); (G.F.); (J.Y.); (Y.H.)
- Hangzhou HTYS Information Technology Co., Ltd., Hangzhou 310024, China
- Correspondence: (G.X.); (X.L.); (Y.L.); Tel.: +86-185-1062-8564 (G.X.)
| | - Hongwu Bai
- National Key Laboratory of Science and Technology on Space Microwave, China Academy of Space Technology (Xi’an), Xi’an 710100, China; (H.B.); (G.M.); (G.F.); (J.Y.); (Y.H.)
- Hangzhou HTYS Information Technology Co., Ltd., Hangzhou 310024, China
- Polytechnic Institute, Zhejiang University, Hangzhou 310015, China
| | - Guanghui Miao
- National Key Laboratory of Science and Technology on Space Microwave, China Academy of Space Technology (Xi’an), Xi’an 710100, China; (H.B.); (G.M.); (G.F.); (J.Y.); (Y.H.)
| | - Guobao Feng
- National Key Laboratory of Science and Technology on Space Microwave, China Academy of Space Technology (Xi’an), Xi’an 710100, China; (H.B.); (G.M.); (G.F.); (J.Y.); (Y.H.)
| | - Jing Yang
- National Key Laboratory of Science and Technology on Space Microwave, China Academy of Space Technology (Xi’an), Xi’an 710100, China; (H.B.); (G.M.); (G.F.); (J.Y.); (Y.H.)
| | - Yun He
- National Key Laboratory of Science and Technology on Space Microwave, China Academy of Space Technology (Xi’an), Xi’an 710100, China; (H.B.); (G.M.); (G.F.); (J.Y.); (Y.H.)
| | - Xiaojun Li
- National Key Laboratory of Science and Technology on Space Microwave, China Academy of Space Technology (Xi’an), Xi’an 710100, China; (H.B.); (G.M.); (G.F.); (J.Y.); (Y.H.)
- Correspondence: (G.X.); (X.L.); (Y.L.); Tel.: +86-185-1062-8564 (G.X.)
| | - Yun Li
- National Key Laboratory of Science and Technology on Space Microwave, China Academy of Space Technology (Xi’an), Xi’an 710100, China; (H.B.); (G.M.); (G.F.); (J.Y.); (Y.H.)
- Correspondence: (G.X.); (X.L.); (Y.L.); Tel.: +86-185-1062-8564 (G.X.)
| |
Collapse
|
10
|
Lee D, Kim D, Kim DS, Park HR, Sohn C, Namgung S, Chung K, Jun YC, Kim DK, Choo H, Roh YG. High sensitivity bolometers based on metal nanoantenna dimers with a nanogap filled with vanadium dioxide. Sci Rep 2021; 11:15863. [PMID: 34354170 PMCID: PMC8342706 DOI: 10.1038/s41598-021-95429-1] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/30/2021] [Accepted: 07/27/2021] [Indexed: 12/04/2022] Open
Abstract
One critical factor for bolometer sensitivity is efficient electromagnetic heating of thermistor materials, which plasmonic nanogap structures can provide through the electric field enhancement. In this report, using finite element method simulation, electromagnetic heating of nanorod dimer antennas with a nanogap filled with vanadium dioxide (VO2) was studied for long-wavelength infrared detection. Because VO2 is a thermistor material, the electrical resistance between the two dimer ends depends on the dimer’s temperature. The simulation results show that, due to the high heating ability of the nanogap, the temperature rise is several times higher than expected from the areal coverage. This excellent performance is observed over various nanorod lengths and gap widths, ensuring wavelength tunability and ultrafast operating speed, thereby making the dimer structures a promising candidate for high sensitivity bolometers.
Collapse
Affiliation(s)
- Dukhyung Lee
- Department of Physics and Quantum Photonics Institute, Ulsan National Institute of Science and Technology (UNIST), Ulsan, 44949, Republic of Korea.
| | - Dasom Kim
- Department of Physics and Quantum Photonics Institute, Ulsan National Institute of Science and Technology (UNIST), Ulsan, 44949, Republic of Korea
| | - Dai-Sik Kim
- Department of Physics and Quantum Photonics Institute, Ulsan National Institute of Science and Technology (UNIST), Ulsan, 44949, Republic of Korea
| | - Hyeong-Ryeol Park
- Department of Physics and Quantum Photonics Institute, Ulsan National Institute of Science and Technology (UNIST), Ulsan, 44949, Republic of Korea
| | - Changhee Sohn
- Department of Physics and Quantum Photonics Institute, Ulsan National Institute of Science and Technology (UNIST), Ulsan, 44949, Republic of Korea
| | - Seon Namgung
- Department of Physics and Quantum Photonics Institute, Ulsan National Institute of Science and Technology (UNIST), Ulsan, 44949, Republic of Korea
| | - Kunook Chung
- Department of Physics and Quantum Photonics Institute, Ulsan National Institute of Science and Technology (UNIST), Ulsan, 44949, Republic of Korea
| | - Young Chul Jun
- School of Materials Science and Engineering, Ulsan National Institute of Science and Technology (UNIST), Ulsan, 44919, Republic of Korea
| | - Dong Kyun Kim
- Samsung Advanced Institute of Technology, Samsung Electronics, Suwon, 16678, Republic of Korea
| | - Hyuck Choo
- Samsung Advanced Institute of Technology, Samsung Electronics, Suwon, 16678, Republic of Korea
| | - Young-Geun Roh
- Samsung Advanced Institute of Technology, Samsung Electronics, Suwon, 16678, Republic of Korea
| |
Collapse
|
11
|
Sun Y, Niu G, Ren W, Meng X, Zhao J, Luo W, Ye ZG, Xie YH. Hybrid System Combining Two-Dimensional Materials and Ferroelectrics and Its Application in Photodetection. ACS NANO 2021; 15:10982-11013. [PMID: 34184877 DOI: 10.1021/acsnano.1c01735] [Citation(s) in RCA: 26] [Impact Index Per Article: 8.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/13/2023]
Abstract
Photodetectors are one of the most important components for a future "Internet-of-Things" information society. Compared to the mainstream semiconductor-based photodetectors, emerging devices based on two-dimensional (2D) materials and ferroelectrics as well as their hybrid systems have been extensively studied in recent decades due to their outstanding performances and related interesting physical, electrical, and optoelectronic phenomena. In this paper, we review the photodetection based on 2D materials and ferroelectric hybrid systems. The fundamentals of 2D and ferroelectric materials as well as the interaction in the hybrid system will be introduced. Ferroelectricity modulated optoelectronic properties in the hybrid system will be discussed in detail. After the basics and figures of merit of photodetectors are summarized, the 2D-ferroelectrics devices with different structures including p-n diodes, Schottky diodes, and field-effect transistors will be reviewed and compared. The polarization of ferroelectrics offers the possibility of the modulation and enhancement of the photodetection in the hybrid detectors, which will be discussed in depth. Finally, the challenges and perspectives of the photodetectors based on 2D ferroelectrics will be proposed. This Review outlines the important aspects of the recent development of the hybrid system of 2D and ferroelectric materials, which could interact with each other and thus lead to photodetectors with higher performances. Such a Review will be helpful for the research of emerging physical phenomena and for the design of multifunctional nanoscale electronic and optoelectronic devices.
Collapse
Affiliation(s)
- Yanxiao Sun
- Electronic Materials Research Laboratory Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic Science and Engineering, Xi'an Jiaotong University, No. 28, Xianning West Road, Xi'an 710049, Shaanxi, P. R. China
| | - Gang Niu
- Electronic Materials Research Laboratory Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic Science and Engineering, Xi'an Jiaotong University, No. 28, Xianning West Road, Xi'an 710049, Shaanxi, P. R. China
| | - Wei Ren
- Electronic Materials Research Laboratory Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic Science and Engineering, Xi'an Jiaotong University, No. 28, Xianning West Road, Xi'an 710049, Shaanxi, P. R. China
| | - Xiangjian Meng
- National Laboratory for Infrared Physics Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, P. R. China
| | - Jinyan Zhao
- Electronic Materials Research Laboratory Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic Science and Engineering, Xi'an Jiaotong University, No. 28, Xianning West Road, Xi'an 710049, Shaanxi, P. R. China
| | - Wenbo Luo
- State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 611731, P. R. China
| | - Zuo-Guang Ye
- Department of Chemistry and 4D Laboratories, Simon Fraser University, Burnaby V5A 1S6, British Columbia, Canada
| | - Ya-Hong Xie
- Department of Materials Science and Engineering, University of California Los Angeles, Los Angeles 90024, California, United States
| |
Collapse
|