Resonant Tender X-ray Diffraction for Disclosing the Molecular Packing of Paracrystalline Conjugated Polymer Films

Front propagation in ultrastable glasses is dynamically heterogeneous

Upon heating, ultrastable glassy films transform into liquids via a propagating equilibration front, resembling the heterogeneous melting of crystals. A microscopic understanding of this robust phenomenology is, however, lacking because experimental resolution is limited. We simulate the heterogeneous transformation kinetics of ultrastable configurations prepared using the swap Monte Carlo algorithm, thus allowing a direct comparison with experiments. We resolve the liquid-glass interface both in space and in time as well as the underlying particle motion responsible for its propagation. We perform a detailed statistical analysis of the interface geometry and kinetics over a broad range of temperatures. We show that the dynamic heterogeneity of the bulk liquid is passed on to the front that propagates heterogeneously in space and intermittently in time. This observation allows us to relate the averaged front velocity to the equilibrium diffusion coefficient of the liquid. We suggest that an experimental characterization of the interface geometry during the heterogeneous devitrification of ultrastable glassy films could provide direct experimental access to the long-sought characteristic length scale of dynamic heterogeneity in bulk supercooled liquids.

Flatfielding of hybrid pixel detectors in tender x-ray scattering

The ability of the soft matter interfaces beamline at National Synchrotron Light Source II to access x-ray energy in the tender x-ray regime, i.e., from 2.1 to 5 keV, enables new resonant x-ray scattering studies at the sulfur K-edge and others. We present a new approach to correct data acquired in the tender x-ray regime with a Pilatus3 detector in order to improve the data quality and to correct the various artifacts inherent to hybrid pixel detectors, such as variations in modules' efficiency or noisy detector module junctions. This new flatfielding significantly enhances the data quality and enables detection of weak scattering signals.

Resolving the backbone tilt of crystalline poly(3-hexylthiophene) with resonant tender X-ray diffraction

The way in which conjugated polymers pack in the solid state strongly affects the performance of polymer-based optoelectronic devices. However, even for the most crystalline conjugated polymers the precise packing of chains within the unit cell is not well established. Here we show that by performing resonant X-ray diffraction experiments at the sulfur K-edge we are able to resolve the tilting of the planar backbones of crystalline poly(3-hexylthiophene) (P3HT) within the unit cell. This approach exploits the anisotropic nature of the X-ray optical properties of conjugated polymers, enabling us to discern between different proposed crystal structures. By comparing our data with simulations based on different orientations, a tilting of the planar conjugated backbone with respect to the side chain stacking direction of 30 ± 5° is determined.

Decoupling Complex Multi-Length-Scale Morphology in Non-Fullerene Photovoltaics with Nitrogen K-Edge Resonant Soft X-ray Scattering

Complex morphology in organic photovoltaics (OPVs) and other functional soft materials commonly dictates performance. Such complexity in OPVs originates from the mesoscale kinetically trapped non-equilibrium state, which governs device charge generation and transport. Resonant soft X-ray scattering (RSoXS) has been revolutionary in the exploration of OPV morphology in the past decade due to its chemical and orientation sensitivity. However, for non-fullerene OPVs, RSoXS analysis near the carbon K-edge is challenging, due to the chemical similarity of the materials used in active layers. An innovative approach is provided by nitrogen K-edge RSoXS (NK-RSoXS), utilizing the spatial and orientational contrasts from the cyano groups in the acceptor materials, which allows for determination of phase separation. NK-RSoXS clearly visualizes the combined feature sizes in PM6:Y6 blends from crystallization and liquid-liquid demixing, while PM6:Y6:Y6-BO ternary blends with reduced phase-separation size and enhanced material crystallization can lead to current amplification in devices. Nitrogen is common in organic semiconductors and other soft materials, and the strong and directional N 1s → π* resonances make NK-RSoXS a powerful tool to uncover the mesoscale complexity and open opportunities to understand heterogeneous systems.

Probing morphology and chemistry in complex soft materials within situresonant soft x-ray scattering

Small angle scattering methodologies have been evolving at fast pace over the past few decades due to the ever-increasing demands for more details on the complex nanostructures of multiphase and multicomponent soft materials like polymer assemblies and biomaterials. Currently, element-specific and contrast variation techniques such as resonant (elastic) soft/tender x-ray scattering, anomalous small angle x-ray scattering, and contrast-matching small angle neutron scattering, or combinations of above are routinely used to extract the chemical composition and spatial arrangement of constituent elements at multiple length scales and examine electronic ordering phenomena. Here we present some recent advances in selectively characterizing structural architectures of complex soft materials, which often contain multi-components with a wide range of length scales and multiple functionalities, where novel resonant scattering approaches have been demonstrated to decipher a higher level of structural complexity that correlates to functionality. With the advancement of machine learning and artificial intelligence assisted correlative analysis, high-throughput and autonomous experiments would open a new paradigm of material research. Further development of resonant x-ray scattering instrumentation with crossplatform sample environments will enable multimodalin situ/operando characterization of the system dynamics with much improved spatial and temporal resolution.

Anisotropic Resonant X-ray Diffraction of a Conjugated Polymer at the Sulfur K-Edge

The planar, aromatic nature of the backbone of conjugated polymers endows them with anisotropic properties. Here we show that the resonant X-ray diffraction of a sulfur-containing semicrystalline conjugated polymer at the sulfur K-edge is highly anisotropic, with strong modulation of diffracted intensity depending upon the relative orientation of the polarization of the incident beam with respect to the diffracting crystal planes. Through determination of the anisotropic resonant scattering factors, we can spectroscopically reproduce the observed resonant anisotropic scattering effects based on a proposed unit cell geometry for the polymer.