Topography-Correlated Confocal Raman Microscopy with Cylindrical Vector Beams for Probing Nanoscale Structural Order

Revealing local structural properties of an atomically thin MoSe2 surface using optical microscopy

Using a triangular molybdenum diselenide (MoSe₂) flake as surface-enhanced Raman spectroscopy (SERS) platform, we demonstrate the dependency of the Raman enhancement on laser beam polarization and local structure using copper phthalocyanine (CuPc) as probe. Second harmonic generation (SHG) and photoluminescence spectroscopy and microscopy are used to reveal the structural irregularities of the MoSe₂ flake. The Raman enhancement in the focus of an azimuthally polarized beam, which possesses exclusively an in-plane electric field component is stronger than the enhancement by a focused radially polarized beam, where the out-of-plane electric field component dominates. This phenomenon indicates that the face-on oriented CuPc molecules strongly interact with the MoSe₂ flake via charge transfer and dipole-dipole interaction. Furthermore, the Raman scattering maps on the irregular MoSe₂ surface show a distinct correlation with the SHG and photoluminescence optical images, indicating the relationship between local structure and optical properties of the MoSe₂ flake. These results contribute to understand the impacts of local structural properties on the Raman enhancement at the surface of the 2D transition-metal dichalcogenide.

Polarization Raman Imaging of Organic Monolayer Islands for Crystal Orientation Analysis

An organic semiconductor film made of diphenyl derivative dinaphtho[2,3-b:2',3'-f]thieno[3,2-b]thiophene (DPh-DNTT) has high carrier mobility. However, this mobility may be greatly affected by the crystal orientation of the DPh-DNTT's first layer. Polarization Raman microscopy is widely used to quantitatively analyze the molecular orientation, and thus holds great potential as a powerful tool to investigate the crystal orientation of monolayer DPh-DNTT with high spatial resolution. In this study, we demonstrate polarization Raman imaging of monolayer DPh-DNTT islands for crystal orientation analysis. We found that the DPh-DNTT sample indicated a strong dependence of the Raman intensity on the incident polarization direction. Based on the polarization dependence, we developed an analytical method of determining the crystal orientation of the monolayer DPh-DNTT islands and experimentally confirmed that our technique was highly effective at imaging the islands' crystal orientation with a spatial resolution of a few hundred nanometers.

Revealing the local crystallinity of single silicon core-shell nanowires using tip-enhanced Raman spectroscopy

Tip-enhanced Raman spectroscopy is combined with polarization angle-resolved spectroscopy to investigate the nanometer-scale structural properties of core-shell silicon nanowires (crystalline Si core and amorphous Si shell), which were synthesized by platinum-catalyzed vapor-liquid-solid growth and silicon overcoating by thermal chemical vapor deposition. Local changes in the fraction of crystallinity in these silicon nanowires are characterized at an optical resolution of about 300 nm. Furthermore, we are able to resolve the variations in the intensity ratios of the Raman peaks of crystalline Si and amorphous Si by applying tip-enhanced Raman spectroscopy, at sample positions being 8 nm apart. The local crystallinity revealed using confocal Raman spectroscopy and tip-enhanced Raman spectroscopy agrees well with the high-resolution transmission electron microscopy images. Additionally, the polarizations of Raman scattering and the photoluminescence signal from the tip-sample nanogap are explored by combining polarization angle-resolved emission spectroscopy with tip-enhanced optical spectroscopy. Our work demonstrates the significant potential of resolving local structural properties of Si nanomaterials at the sub-10 nanometer scale using tip-enhanced Raman techniques.

Local Observation of Phase Segregation in Mixed-Halide Perovskite

Mixed-halide perovskites have emerged as promising materials for optoelectronics due to their tunable band gap in the entire visible region. A challenge remains, however, in the photoinduced phase segregation, narrowing the band gap of mixed-halide perovskites under illumination thus restricting applications. Here, we use a combination of spatially resolved and bulk measurements to give an in-depth insight into this important yet unclear phenomenon. We demonstrate that photoinduced phase segregation in mixed-halide perovskites selectively occurs at the grain boundaries rather than within the grain centers by using shear-force scanning probe microscopy in combination with confocal optical spectroscopy. Such difference is further evidenced by light-biased bulk Fourier-transform photocurrent spectroscopy, which shows the iodine-rich domain as a minority phase coexisting with the homogeneously mixed phase during illumination. By mapping the surface potential of mixed-halide perovskites, we evidence the higher concentration of positive space charge near the grain boundary possibly provides the initial driving force for phase segregation, while entropic mixing dominates the reverse process. Our work offers detailed insight into the microscopic processes occurring at the boundary of crystalline perovskite grains and will support the development of better passivation strategies, ultimately allowing the processing of more environmentally stable perovskite films.

Second-harmonic generation in single CdSe nanowires by focused cylindrical vector beams

Cylindrical vector beams with radial or azimuthal polarization have created great interest due to their unique focusing characteristics and focal components. In this Letter, we investigate second-harmonic general (SHG) of single CdSe nanowires (NWs) excited by tightly focused cylindrical vector beams of 150 fs pulses at 800 nm. With the specific polarizations in the focal region, we demonstrate a three-dimensional interaction between the focal electric field components and the NWs. The excitation anisotropy of the SHG can directly be derived from the imaging patterns with the cylindrical vector beams. The highest SHG excitation efficiency is observed when the polarization is parallel to the long axis of the NW, which is confirmed by the conventional linear polarization approach. Our work with cylindrical vector beams provides a new approach to study the nonlinear phenomenon of single semiconductor NWs in three dimensions and it could be applied to many other nanoscale systems.

Surface Reconstructions in Organic Crystals: Simulations of the Effect of Temperature and Defectivity on Bulk and (001) Surfaces of 2,2':6',2″-Ternaphthalene

2,2':6',2″-Ternaphthalene (NNN) is a novel, blue-emitting material, suitable for preparation of organic light-emitting diodes. Its crystal structure has been solved recently, but its thermal behavior and surface properties have not yet been explored, partly due to the difficulty in obtaining high quality crystals. In the present study we use classical molecular dynamics to investigate the thermal behavior of bulk and (001) surfaces of NNN. Our bulk simulations indicate the occurrence of a phase transition at about 600 K. The transition is facilitated by the presence of a free (001) surface, since a reconstruction leading to a very similar structure occurs around 550 K in our surface models. This holds for both ideal and defective surface models, containing a small number of vacancies (one or two missing molecules in the outermost layer). In all cases, the process is triggered by thermal motion and involves the reorientation of the molecules with respect to the (001) plane. Both the bulk and surface phases share the monoclinic space group P21/a with a herringbone disposition of molecules. These findings and their implications for the use of NNN in organic electronics are discussed.

Revealing nanoscale optical properties and morphology in perfluoropentacene films by confocal and tip-enhanced near-field optical microscopy and spectroscopy

Combining confocal and high resolution near-field optical microscopy and spectroscopy, we propose a sensitive method for determining the local morphology in organic semiconductor thin films.