Tip-induced orientational order of surfactant micelles on gold

Effect of Bromide on the Surfactant Stabilization Layer Density of Gold Nanorods

Some studies have speculated that the concentration of bromide ions plays a crucial role in the surfactant density surrounding gold nanorods (AuNR). Small-angle X-ray and neutron scattering (SAXS and SANS) experiments were conducted to analyze any influence the bromide ions might have on the stabilization layer and the aggregation behavior of the ligand CTAB molecules in general. The AuNR were immersed in solutions containing a fixed CTA⁺ concentration of 2 mM and varying bromide ion concentrations from 0 to 22 mM. A patchy AuNR stabilization shell at low bromide ion concentrations was found, contrary to previously published SANS studies on the AuNR stabilization shell. However, with increasing bromide ion concentration, the density of the stabilization shell increases asymptotically toward a closed/collapsed bilayer configuration. AuNR grown under similar conditions show higher anisotropy with larger bromide ion concentrations. Both results indicate that anisotropic growth strongly depends on a sufficiently dense stabilization layer established by high bromide ion concentrations.

Cationic-Surfactant-Coated Mica Surfaces below the Critical Micellar Concentration: 1. Patchy Structures As Revealed by Peak Force Tapping AFM Mode

The morphology and structure of the self-assembled surfactant aggregates at the solid-liquid interface remain controversial. For the well-studied system of cationic cetyltrimethylammonium bromide (C₁₆TAB) adsorbed onto the opposite negatively charged, atomically smooth mica surface, a variety of surface aggregates have been previously reported: AFM imaging pointing to cylinders and surface micelles as opposed to mono/bilayer-like structures revealed by neutron and X-ray reflectometry, NMR, spectroscopic techniques, and numerical simulations. To reconcile with the latter results, we revisit the morphometry of the C₁₆TAB-coated mica surfaces using the recent peak force tapping (PFT-AFM) mode that allows fragile structures to be imaged with the lowest possible applied force. The evolution of the structural organization at the mica-water interface is investigated above the Krafft boundary over a wide concentration range (from 1/1000 to 2 cmc) after long equilibration times to ensure thermodynamic equilibrium. A complex but fairly complete picture has emerged: At very low concentrations, the C₁₆TAB surfactants adsorb as isolated molecules before forming small clusters. Above 1/140 cmc, monolayer-like stripes are formed. As the concentration is increased, a connected network of these patches progressively covers the mica substrate. Above 1/80 cmc, bilayer-like patches build on top of the underlying monolayer, and ultimately a complete bilayer (at about half the cmc) covers the entire mica substrate. Thanks to the less invasive PFT-AFM imaging mode, our observations not only agree with the theoretical predictions and numerical simulations but also reconcile, at last, the direct observations by means of the AFM imaging technique with the results obtained with other techniques.

Atomic Force Microscopy Force Mapping Analysis of an Adsorbed Surfactant above and below the Critical Micelle Concentration

Force curves collected using an atomic force microscope (AFM) in the presence of adsorbed surfactants are often used to draw conclusions about adsorbed film packing, rigidity, and thickness. However, some noteworthy features of such force curve characteristics have yet to be thoroughly investigated and explained. In this work, we collected force curves from tetradecyltrimethylammonium bromide films adsorbed on highly oriented pyrolytic graphite (HOPG), silica, and silica that had been hydrophobized by functionalization with dichlorodimethyl silane. Breakthrough events in the force curves from several different trials were compared to show that the breakthrough distance, often reported as the adsorbed film thickness, increased with concentration below the critical micelle concentration (CMC) but was approximately 3.5 nm on all surfaces between 2× and 10× CMC; an unexpected result because of the different surface chemistries for the three surfaces. We employed an AFM probe with a different force constant ( k) value as well as a colloidal probe and the breakthrough distance remained approximately 3.5 nm in all cases. Gradient mapping, a variant of force mapping, was also implemented on the three surfaces and resulted in a new technique for visualizing adsorbed surfactant in situ. The resulting maps showed patches of adsorbed surfactant below the CMC and revealed that with increasing concentration, the size of the patches increased resulting in full coverage near and above the CMC. These results are, to our knowledge, the first time force mapping has been used to spatially track patches of adsorbed surfactant. Finally, layers of surfactants on an AFM tip were investigated by collecting a force map on a single AFM tip using the tip of a separate AFM probe. A breakthrough event was observed between the tips, indicating that a layer of surfactant was present on at least one, if not both tips.

Inhibition and promotion of copper corrosion by CTAB in a microreactor system

We report on an optical microscopy technique for the analysis of corrosion kinetics of metal thin films in microreactor systems and use it to study the role of cetyltrimethylammonium bromide surfactant as a corrosion inhibitor in a copper-gold galvanic coplanar microsystem. A minimum in the dissolution rate of copper is observed when the surfactant concentration is approximately 0.8 mM. To explain why the inhibitory role of the surfactant does not extend to higher concentrations, we use zero resistance ammetry with separated half cells and show that while the surfactant inhibits cathodic reactions on gold, it also promotes the corrosion of copper because of the catalytic action of bromide counterions. These two competing processes lead to the observed minimum in the dissolution rate.