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Oyibo G, Barrett T, Jois S, Blackburn JL, Lee JU. Measuring the Electronic Bandgap of Carbon Nanotube Networks in Non-Ideal p-n Diodes. MATERIALS (BASEL, SWITZERLAND) 2024; 17:3676. [PMID: 39124340 PMCID: PMC11312849 DOI: 10.3390/ma17153676] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/20/2024] [Revised: 07/15/2024] [Accepted: 07/20/2024] [Indexed: 08/12/2024]
Abstract
The measurement of the electronic bandgap and exciton binding energy in quasi-one-dimensional materials such as carbon nanotubes is challenging due to many-body effects and strong electron-electron interactions. Unlike bulk semiconductors, where the electronic bandgap is well known, the optical resonance in low-dimensional semiconductors is dominated by excitons, making their electronic bandgap more difficult to measure. In this work, we measure the electronic bandgap of networks of polymer-wrapped semiconducting single-walled carbon nanotubes (s-SWCNTs) using non-ideal p-n diodes. We show that our s-SWCNT networks have a short minority carrier lifetime due to the presence of interface trap states, making the diodes non-ideal. We use the generation and recombination leakage currents from these non-ideal diodes to measure the electronic bandgap and excitonic levels of different polymer-wrapped s-SWCNTs with varying diameters: arc discharge (~1.55 nm), (7,5) (0.83 nm), and (6,5) (0.76 nm). Our values are consistent with theoretical predictions, providing insight into the fundamental properties of networks of s-SWCNTs. The techniques outlined here demonstrate a robust strategy that can be applied to measuring the electronic bandgaps and exciton binding energies of a broad variety of nanoscale and quantum-confined semiconductors, including the most modern nanoscale transistors that rely on nanowire geometries.
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Affiliation(s)
- Gideon Oyibo
- College of Nanotechnology, Science, and Engineering, State University of New York-Albany, Albany, NY 12203, USA; (G.O.); (T.B.); (S.J.)
| | - Thomas Barrett
- College of Nanotechnology, Science, and Engineering, State University of New York-Albany, Albany, NY 12203, USA; (G.O.); (T.B.); (S.J.)
| | - Sharadh Jois
- College of Nanotechnology, Science, and Engineering, State University of New York-Albany, Albany, NY 12203, USA; (G.O.); (T.B.); (S.J.)
| | | | - Ji Ung Lee
- College of Nanotechnology, Science, and Engineering, State University of New York-Albany, Albany, NY 12203, USA; (G.O.); (T.B.); (S.J.)
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2
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Kandi D, Martha S, Thirumurugan A, Parida KM. CdS QDs-Decorated Self-Doped γ-Bi 2MoO 6: A Sustainable and Versatile Photocatalyst toward Photoreduction of Cr(VI) and Degradation of Phenol. ACS OMEGA 2017; 2:9040-9056. [PMID: 31457427 PMCID: PMC6645666 DOI: 10.1021/acsomega.7b01250] [Citation(s) in RCA: 25] [Impact Index Per Article: 3.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/25/2017] [Accepted: 12/01/2017] [Indexed: 05/18/2023]
Abstract
In this work, CdS quantum dots (QDs)-sensitized self-doped Bi2MoO6 has been synthesized using glucose as reducing agent by hydrothermal method, followed by in situ deposition of the QDs. The synthesized catalyst has been employed to reduce toxic Cr(VI) and degrade phenol from the aqueous solution. The structural, optical, and electrochemical characterizations are performed using X-ray diffraction, UV-vis diffuse reflection, photoluminescence (PL), scanning electron microscopy, transmission electron microscopy (TEM), Fourier transform infrared spectroscopy, and electrochemical impedance spectroscopy. The optical properties were precisely investigated by calculating the Urbach energy, PL, and photoluminescence excitation spectra. The orderly distribution of QDs is confirmed from the correlation between full width at half-maximum of PL spectra, Urbach energy, and TEM analysis. The versatile photocatalytic activity has been tested toward Cr(VI) reduction and degradation of phenol. 3% CdS QDs-sensitized self-doped Bi2MoO6 showed highest activity, i.e., 97 and 47.5% toward reduction of Cr(VI) and degradation of phenol under solar light. The reduction of Cr(VI) by the catalyst is supported by the kinetics and determination of the pHPZC value. In addition to this, the photostability and reusability test showed that the catalyst can be reused up to five cycles without diminishing its activity.
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Affiliation(s)
- Debasmita Kandi
- Centre
for Nano Science and Nano Technology, Institute of Technical Education
and Research, Siksha ‘O’ Anusandhan
University, Bhubaneswar 751030, India
| | - Satyabadi Martha
- Centre
for Nano Science and Nano Technology, Institute of Technical Education
and Research, Siksha ‘O’ Anusandhan
University, Bhubaneswar 751030, India
| | - Arun Thirumurugan
- Advanced
Material Laboratory, Department of Mechanical Engineering, University of Chile, Santiago 8370448, Chile
| | - K. M. Parida
- Centre
for Nano Science and Nano Technology, Institute of Technical Education
and Research, Siksha ‘O’ Anusandhan
University, Bhubaneswar 751030, India
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Li J, Gan L, Fang Z, He H, Ye Z. Bright Tail States in Blue-Emitting Ultrasmall Perovskite Quantum Dots. J Phys Chem Lett 2017; 8:6002-6008. [PMID: 29192491 DOI: 10.1021/acs.jpclett.7b02786] [Citation(s) in RCA: 31] [Impact Index Per Article: 4.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 06/07/2023]
Abstract
All-inorganic lead halide perovskite quantum dots (CsPbBr3 QDs) are attracting significant research interests because of their highly efficient light-emitting performance combined with tunable emission wavelength facilely realized by ion exchange. However, blue emission from perovskite QDs with strong quantum confinement is rarely reported and suffers from lower luminescence efficiency. Here we report blue-emitting ultrasmall (∼3 nm) CsPbBr3 QDs with photoluminescence (PL) quantum yield as high as 68%. Using time-resolved and steady-state PL spectroscopy, we elucidate the mechanism of the highly efficient PL as recombination of excitons localized in radiative band tail states. Through analyzing the spectral-dependent PL lifetime and the PL line shape, we obtain a large band tail width of ∼80 meV and a high density of state of ∼1020 cm-3. The relaxation of photocarriers into the radiative tail states suppresses the capture by nonradiative centers. Our results provide solid evidence for the positive role of band tail states in the optical properties of lead halide perovskites, which can be further tailored for high-performance optoelectronic devices.
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Affiliation(s)
- Jing Li
- State Key Laboratory of Silicon Materials, School of Materials Science and Engineering, Zhejiang University , Hangzhou 310027, China
| | - Lu Gan
- State Key Laboratory of Silicon Materials, School of Materials Science and Engineering, Zhejiang University , Hangzhou 310027, China
| | - Zhishan Fang
- State Key Laboratory of Silicon Materials, School of Materials Science and Engineering, Zhejiang University , Hangzhou 310027, China
| | - Haiping He
- State Key Laboratory of Silicon Materials, School of Materials Science and Engineering, Zhejiang University , Hangzhou 310027, China
| | - Zhizhen Ye
- State Key Laboratory of Silicon Materials, School of Materials Science and Engineering, Zhejiang University , Hangzhou 310027, China
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Lee SH, Xu Y, Khim D, Park WT, Kim DY, Noh YY. Effect of Polymer Gate Dielectrics on Charge Transport in Carbon Nanotube Network Transistors: Low-k Insulator for Favorable Active Interface. ACS APPLIED MATERIALS & INTERFACES 2016; 8:32421-32431. [PMID: 27933829 DOI: 10.1021/acsami.6b06882] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/27/2023]
Abstract
Charge transport in carbon nanotube network transistors strongly depends on the properties of the gate dielectric that is in direct contact with the semiconducting carbon nanotubes. In this work, we investigate the dielectric effects on charge transport in polymer-sorted semiconducting single-walled carbon nanotube field-effect transistors (s-SWNT-FETs) by using three different polymer insulators: A low-permittivity (εr) fluoropolymer (CYTOP, εr = 1.8), poly(methyl methacrylate) (PMMA, εr = 3.3), and a high-εr ferroelectric relaxor [P(VDF-TrFE-CTFE), εr = 14.2]. The s-SWNT-FETs with polymer dielectrics show typical ambipolar charge transport with high ON/OFF ratios (up to ∼105) and mobilities (hole mobility up to 6.77 cm2 V-1 s-1 for CYTOP). The s-SWNT-FET with the lowest-k dielectric, CYTOP, exhibits the highest mobility owing to formation of a favorable interface for charge transport, which is confirmed by the lowest activation energies, evaluated by the fluctuation-induced tunneling model (FIT) and the traditional Arrhenius model (EaFIT = 60.2 meV and EaArr = 10 meV). The operational stability of the devices showed a good agreement with the activation energies trend (drain current decay ∼14%, threshold voltage shift ∼0.26 V in p-type regime of CYTOP devices). The poor performance in high-εr devices is accounted for by a large energetic disorder caused by the randomly oriented dipoles in high-k dielectrics. In conclusion, the low-k dielectric forms a favorable interface with s-SWNTs for efficient charge transport in s-SWNT-FETs.
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Affiliation(s)
- Seung-Hoon Lee
- Department of Nanobio Materials and Electronics, School of Materials Science and Engineering, Heeger Center for Advanced Materials, Gwangju Institute of Science and Technology (GIST) , 261 Cheomdan-gwagiro, Buk-gu, Gwangju 500-712, Republic of Korea
- Department of Energy and Materials Engineering, Dongguk University , 26 Pil-dong, 3-ga, Jung-gu, Seoul 100-715, Republic of Korea
| | - Yong Xu
- Department of Energy and Materials Engineering, Dongguk University , 26 Pil-dong, 3-ga, Jung-gu, Seoul 100-715, Republic of Korea
| | - Dongyoon Khim
- Department of Physics and Centre for Plastic Electronics, Blackett Laboratory, Imperial College London , London SW7 2AZ, U.K
| | - Won-Tae Park
- Department of Energy and Materials Engineering, Dongguk University , 26 Pil-dong, 3-ga, Jung-gu, Seoul 100-715, Republic of Korea
| | - Dong-Yu Kim
- Department of Nanobio Materials and Electronics, School of Materials Science and Engineering, Heeger Center for Advanced Materials, Gwangju Institute of Science and Technology (GIST) , 261 Cheomdan-gwagiro, Buk-gu, Gwangju 500-712, Republic of Korea
| | - Yong-Young Noh
- Department of Energy and Materials Engineering, Dongguk University , 26 Pil-dong, 3-ga, Jung-gu, Seoul 100-715, Republic of Korea
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Soavi G, Grupp A, Budweg A, Scotognella F, Hefner T, Hertel T, Lanzani G, Leitenstorfer A, Cerullo G, Brida D. Below-gap excitation of semiconducting single-wall carbon nanotubes. NANOSCALE 2015; 7:18337-18342. [PMID: 26488340 DOI: 10.1039/c5nr05218a] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/05/2023]
Abstract
We investigate the optoelectronic properties of the semiconducting (6,5) species of single-walled carbon nanotubes by measuring ultrafast transient transmission changes with 20 fs time resolution. We demonstrate that photons with energy below the lowest exciton resonance efficiently lead to linear excitation of electronic states. This finding challenges the established picture of a vanishing optical absorption below the fundamental excitonic resonance. Our result points towards below-gap electronic states as an intrinsic property of semiconducting nanotubes.
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Affiliation(s)
- G Soavi
- Department of Physics and Center for Applied Photonics, University of Konstanz, D-78457 Konstanz, Germany. and Dipartimento di Fisica, Politecnico di Milano, Piazza L. da Vinci 32, 20133 Milano, Italy
| | - A Grupp
- Department of Physics and Center for Applied Photonics, University of Konstanz, D-78457 Konstanz, Germany.
| | - A Budweg
- Department of Physics and Center for Applied Photonics, University of Konstanz, D-78457 Konstanz, Germany.
| | - F Scotognella
- Dipartimento di Fisica, Politecnico di Milano, Piazza L. da Vinci 32, 20133 Milano, Italy and IFN-CNR, Piazza L. da Vinci, 32, 20133 Milano, Italy
| | - T Hefner
- Inst. for Physical and Theoretical Chemistry Dept. of Chemistry and Pharmacy, University of Würzburg, Würzburg 97074, Germany
| | - T Hertel
- Inst. for Physical and Theoretical Chemistry Dept. of Chemistry and Pharmacy, University of Würzburg, Würzburg 97074, Germany
| | - G Lanzani
- Center for Nano Science and Technology@PoliMi, Istituto Italiano di Tecnologia, Via Giovanni Pascoli, 70/3, 20133 Milano, Italy
| | - A Leitenstorfer
- Department of Physics and Center for Applied Photonics, University of Konstanz, D-78457 Konstanz, Germany.
| | - G Cerullo
- Dipartimento di Fisica, Politecnico di Milano, Piazza L. da Vinci 32, 20133 Milano, Italy and IFN-CNR, Piazza L. da Vinci, 32, 20133 Milano, Italy
| | - D Brida
- Department of Physics and Center for Applied Photonics, University of Konstanz, D-78457 Konstanz, Germany.
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Toyoda T, Yindeesuk W, Okuno T, Akimoto M, Kamiyama K, Hayase S, Shen Q. Electronic structures of two types of TiO2 electrodes: inverse opal and nanoparticulate cases. RSC Adv 2015. [DOI: 10.1039/c5ra07092a] [Citation(s) in RCA: 24] [Impact Index Per Article: 2.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022] Open
Abstract
We present a comparison between the electronic structures of inverse opal (IO) and nanoparticulate (NP)-TiO2 electrodes.
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Affiliation(s)
- Taro Toyoda
- Department of Engineering Science
- The University of Electro-Communications
- Chofu
- Japan
- Core Research for Evolutional Science and Technology (CREST)
| | - Witoon Yindeesuk
- Department of Engineering Science
- The University of Electro-Communications
- Chofu
- Japan
| | - Tsuyoshi Okuno
- Department of Engineering Science
- The University of Electro-Communications
- Chofu
- Japan
| | - Masaya Akimoto
- Department of Engineering Science
- The University of Electro-Communications
- Chofu
- Japan
| | | | - Shuzi Hayase
- Graduate School of Life Science and Systems Engineering
- Kyushu Institute of Technology
- Kitakyushu
- Japan
- Core Research for Evolutional Science and Technology (CREST)
| | - Qing Shen
- Department of Engineering Science
- The University of Electro-Communications
- Chofu
- Japan
- Core Research for Evolutional Science and Technology (CREST)
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Qian Q, Li G, Jin Y, Liu J, Zou Y, Jiang K, Fan S, Li Q. Trap-state-dominated suppression of electron conduction in carbon nanotube thin-film transistors. ACS NANO 2014; 8:9597-605. [PMID: 25171328 DOI: 10.1021/nn503903y] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/27/2023]
Abstract
The often observed p-type conduction of single carbon nanotube field-effect transistors is usually attributed to the Schottky barriers at the metal contacts induced by the work function differences or by the doping effect of the oxygen adsorption when carbon nanotubes are exposed to air, which cause the asymmetry between electron and hole injections. However, for carbon nanotube thin-film transistors, our contrast experiments between oxygen doping and electrostatic doping demonstrate that the doping-generated transport barriers do not introduce any observable suppression of electron conduction, which is further evidenced by the perfect linear behavior of transfer characteristics with the channel length scaling. On the basis of the above observation, we conclude that the environmental adsorbates work by more than simply shifting the Fermi level of the CNTs; more importantly, these adsorbates cause a poor gate modulation efficiency of electron conduction due to the relatively large trap state density near the conduction band edge of the carbon nanotubes, for which we further propose quantitatively that the adsorbed oxygen-water redox couple is responsible.
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Affiliation(s)
- Qingkai Qian
- State Key Laboratory of Low-Dimensional Quantum Physics, Department of Physics & Tsinghua-Foxconn Nanotechnology Research Center, Tsinghua University , Beijing 100084, China
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McMorrow JJ, Cress CD, Affouda CA. Charge injection in high-κ gate dielectrics of single-walled carbon nanotube thin-film transistors. ACS NANO 2012; 6:5040-5050. [PMID: 22545966 DOI: 10.1021/nn300672k] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/31/2023]
Abstract
We investigate charge injection into the gate dielectric of single-walled carbon nanotube thin-film transistors (SWCNT-TFTs) having Al(2)O(3) and HfO(2) gate dielectrics. We demonstrate the use of electric field gradient microscopy (EFM) to identify the sign and approximate the magnitude of the injected charge carriers. Charge injection rates and saturation levels are found to differ between electrons and holes and also vary according to gate dielectric material. Electrically, Al(2)O(3) gated devices demonstrate smaller average hysteresis and notably higher average on-state current and p-type mobility than those gated by HfO(2). These differences in transfer characteristics are attributed to the charge injection, observed via EFM, and correlate well with differences in tunneling barrier height for electrons and holes formed in the conduction and valence at the SWCNT/dielectric interface, respectively. This work emphasizes the need to understand the SWCNT/dielectric interface to overcome charge injection that occurs in the focused field region adjacent to SWCNTs and indicates that large barrier heights are key to minimizing the effect.
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