3
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Prabhathan P, Sreekanth KV, Teng J, Ko JH, Yoo YJ, Jeong HH, Lee Y, Zhang S, Cao T, Popescu CC, Mills B, Gu T, Fang Z, Chen R, Tong H, Wang Y, He Q, Lu Y, Liu Z, Yu H, Mandal A, Cui Y, Ansari AS, Bhingardive V, Kang M, Lai CK, Merklein M, Müller MJ, Song YM, Tian Z, Hu J, Losurdo M, Majumdar A, Miao X, Chen X, Gholipour B, Richardson KA, Eggleton BJ, Sharda K, Wuttig M, Singh R. Roadmap for phase change materials in photonics and beyond. iScience 2023; 26:107946. [PMID: 37854690 PMCID: PMC10579438 DOI: 10.1016/j.isci.2023.107946] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/20/2023] Open
Abstract
Phase Change Materials (PCMs) have demonstrated tremendous potential as a platform for achieving diverse functionalities in active and reconfigurable micro-nanophotonic devices across the electromagnetic spectrum, ranging from terahertz to visible frequencies. This comprehensive roadmap reviews the material and device aspects of PCMs, and their diverse applications in active and reconfigurable micro-nanophotonic devices across the electromagnetic spectrum. It discusses various device configurations and optimization techniques, including deep learning-based metasurface design. The integration of PCMs with Photonic Integrated Circuits and advanced electric-driven PCMs are explored. PCMs hold great promise for multifunctional device development, including applications in non-volatile memory, optical data storage, photonics, energy harvesting, biomedical technology, neuromorphic computing, thermal management, and flexible electronics.
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Affiliation(s)
- Patinharekandy Prabhathan
- Division of Physics and Applied Physics, School of Physical and Mathematical Sciences, Nanyang Technological University, 21 Nanyang Link, Singapore 637371, Singapore
- Centre for Disruptive Photonic Technologies, The Photonic Institute, 50 Nanyang Avenue, Singapore 639798, Singapore
| | - Kandammathe Valiyaveedu Sreekanth
- Institute of Materials Research and Engineering (IMRE), Agency for Science, Technology and Research (A∗STAR), 2 Fusionopolis Way, Innovis #08-03, Singapore 138634, Republic of Singapore
| | - Jinghua Teng
- Institute of Materials Research and Engineering (IMRE), Agency for Science, Technology and Research (A∗STAR), 2 Fusionopolis Way, Innovis #08-03, Singapore 138634, Republic of Singapore
| | - Joo Hwan Ko
- School of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology, Gwangju 61005, Republic of Korea
| | - Young Jin Yoo
- School of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology, Gwangju 61005, Republic of Korea
| | - Hyeon-Ho Jeong
- School of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology, Gwangju 61005, Republic of Korea
| | - Yubin Lee
- School of Materials Science and Engineering, Gwangju Institute of Science and Technology, Gwangju 61005, Republic of Korea
| | - Shoujun Zhang
- DELL, Center for Terahertz Waves and College of Precision Instrument and Optoelectronics Engineering, Key Laboratory of Optoelectronic Information Technology (Ministry of Education of China), Tianjin University, Tianjin 300072, China
| | - Tun Cao
- DELL, School of Optoelectronic Engineering and Instrumentation Science, Dalian University of Technology, Dalian 116024, China
| | - Cosmin-Constantin Popescu
- Department of Materials Science & Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA
| | - Brian Mills
- Department of Materials Science & Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA
| | - Tian Gu
- Department of Materials Science & Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA
- Materials Research Laboratory, Massachusetts Institute of Technology, Cambridge, MA, USA
| | - Zhuoran Fang
- Department of Electrical & Computer Engineering, University of Washington, Washington, Seattle, USA
| | - Rui Chen
- Department of Electrical & Computer Engineering, University of Washington, Washington, Seattle, USA
| | - Hao Tong
- Wuhan National Research Center for Optoelectronics, School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, China
| | - Yi Wang
- Wuhan National Research Center for Optoelectronics, School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, China
| | - Qiang He
- Wuhan National Research Center for Optoelectronics, School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, China
| | - Yitao Lu
- Wuhan National Research Center for Optoelectronics, School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, China
| | - Zhiyuan Liu
- Wuhan National Research Center for Optoelectronics, School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, China
| | - Han Yu
- Institute of Advanced Materials, Beijing Normal University, Beijing 100875, China
| | - Avik Mandal
- Nanoscale Optics Lab, ECE Department, University of Alberta, Edmonton, Canada
| | - Yihao Cui
- Nanoscale Optics Lab, ECE Department, University of Alberta, Edmonton, Canada
| | - Abbas Sheikh Ansari
- Nanoscale Optics Lab, ECE Department, University of Alberta, Edmonton, Canada
| | - Viraj Bhingardive
- Nanoscale Optics Lab, ECE Department, University of Alberta, Edmonton, Canada
| | - Myungkoo Kang
- CREOL, College of Optics and Photonics, University of Central Florida, Orlando, FL, USA
| | - Choon Kong Lai
- Institute of Photonics and Optical Science (IPOS), School of Physics, The University of Sydney, New South Wales, NSW 2006, Australia
- The University of Sydney Nano Institute (Sydney Nano), The University of Sydney, New South Wales, NSW 2006, Australia
| | - Moritz Merklein
- Institute of Photonics and Optical Science (IPOS), School of Physics, The University of Sydney, New South Wales, NSW 2006, Australia
- The University of Sydney Nano Institute (Sydney Nano), The University of Sydney, New South Wales, NSW 2006, Australia
| | | | - Young Min Song
- School of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology, Gwangju 61005, Republic of Korea
- Anti-Viral Research Center, Gwangju Institute of Science and Technology, Gwangju 61005, Republic of Korea
- AI Graduate School, Gwangju Institute of Science and Technology, Gwangju 61005, Republic of Korea
| | - Zhen Tian
- DELL, Center for Terahertz Waves and College of Precision Instrument and Optoelectronics Engineering, Key Laboratory of Optoelectronic Information Technology (Ministry of Education of China), Tianjin University, Tianjin 300072, China
| | - Juejun Hu
- Department of Materials Science & Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA
- Materials Research Laboratory, Massachusetts Institute of Technology, Cambridge, MA, USA
| | - Maria Losurdo
- Istituto di Chimica della Materia Condensata e di Tecnologie per l'Energia, CNR-ICMATE, Corso Stati Uniti 4, 35127 Padova, Italy
| | - Arka Majumdar
- Department of Electrical & Computer Engineering, University of Washington, Washington, Seattle, USA
| | - Xiangshui Miao
- Wuhan National Research Center for Optoelectronics, School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, China
| | - Xiao Chen
- Institute of Advanced Materials, Beijing Normal University, Beijing 100875, China
| | - Behrad Gholipour
- Nanoscale Optics Lab, ECE Department, University of Alberta, Edmonton, Canada
| | - Kathleen A. Richardson
- CREOL, College of Optics and Photonics, University of Central Florida, Orlando, FL, USA
- Department of Materials Science and Engineering, University of Central Florida, Orlando, FL, USA
| | - Benjamin J. Eggleton
- Institute of Photonics and Optical Science (IPOS), School of Physics, The University of Sydney, New South Wales, NSW 2006, Australia
- The University of Sydney Nano Institute (Sydney Nano), The University of Sydney, New South Wales, NSW 2006, Australia
| | - Kanudha Sharda
- iScience, Cell Press, 125 London Wall, Barbican, London EC2Y 5AJ, UK
- iScience, Cell Press, RELX India Pvt Ltd., 14th Floor, Building No. 10B, DLF Cyber City, Phase II, Gurugram, Haryana 122002, India
| | - Matthias Wuttig
- Institute of Physics IA, RWTH Aachen University, 52074 Aachen, Germany
- Peter Grünberg Institute (PGI 10), Forschungszentrum Jülich, 52428 Jülich, Germany
| | - Ranjan Singh
- Division of Physics and Applied Physics, School of Physical and Mathematical Sciences, Nanyang Technological University, 21 Nanyang Link, Singapore 637371, Singapore
- Centre for Disruptive Photonic Technologies, The Photonic Institute, 50 Nanyang Avenue, Singapore 639798, Singapore
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5
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Wong WW, Wang N, Esser BD, Church SA, Li L, Lockrey M, Aharonovich I, Parkinson P, Etheridge J, Jagadish C, Tan HH. Bottom-up, Chip-Scale Engineering of Low Threshold, Multi-Quantum-Well Microring Lasers. ACS NANO 2023; 17:15065-15076. [PMID: 37449797 DOI: 10.1021/acsnano.3c04234] [Citation(s) in RCA: 1] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 07/18/2023]
Abstract
Integrated, on-chip lasers are vital building blocks in future optoelectronic and nanophotonic circuitry. Specifically, III-V materials that are of technological relevance have attracted considerable attention. However, traditional microcavity laser fabrication techniques, including top-down etching and bottom-up catalytic growth, often result in undesirable cavity geometries with poor scalability and reproducibility. Here, we utilize the selective area epitaxy method to deterministically engineer thousands of microring lasers on a single chip. Specifically, we realize a catalyst-free, epitaxial growth of a technologically critical material, InAsP/InP, in a ring-like cavity with embedded multi-quantum-well heterostructures. We elucidate a detailed growth mechanism and leverage the capability to deterministically control the adatom diffusion lengths on selected crystal facets to reproducibly achieve ultrasmooth cavity sidewalls. The engineered devices exhibit a tunable emission wavelength in the telecommunication O-band and show low-threshold lasing with over 80% device efficacy across the chip. Our work marks a significant milestone toward the implementation of a fully integrated III-V materials platform for next-generation high-density integrated photonic and optoelectronic circuits.
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Affiliation(s)
- Wei Wen Wong
- Department of Electronic Materials Engineering, Research School of Physics, The Australian National University, Canberra, ACT 2600, Australia
- Australian Research Council Centre of Excellence for Transformative Meta-Optical Systems, Research School of Physics, The Australian National University, Canberra, ACT 2600, Australia
| | - Naiyin Wang
- Department of Electronic Materials Engineering, Research School of Physics, The Australian National University, Canberra, ACT 2600, Australia
- Australian Research Council Centre of Excellence for Transformative Meta-Optical Systems, Research School of Physics, The Australian National University, Canberra, ACT 2600, Australia
| | - Bryan D Esser
- Monash Centre for Electron Microscopy, Monash University, Clayton, Victoria 3800, Australia
| | - Stephen A Church
- Photon Science Institute and Department of Physics and Astronomy, School of Natural Sciences, The University of Manchester, Manchester M13 9PL, United Kingdom
| | - Li Li
- Australian National Fabrication Facility ACT Node, Research School of Physics, The Australian National University, Canberra, ACT 2600, Australia
| | - Mark Lockrey
- Microstructural Analysis Unit, University of Technology Sydney, Ultimo, New South Wales 2007, Australia
| | - Igor Aharonovich
- School of Mathematical and Physical Sciences, Faculty of Science, University of Technology Sydney, Ultimo, New South Wales 2007, Australia
- Australian Research Council Centre of Excellence for Transformative Meta-Optical Systems, Faculty of Science, University of Technology Sydney, Ultimo, New South Wales 2007, Australia
| | - Patrick Parkinson
- Photon Science Institute and Department of Physics and Astronomy, School of Natural Sciences, The University of Manchester, Manchester M13 9PL, United Kingdom
| | - Joanne Etheridge
- Monash Centre for Electron Microscopy, Monash University, Clayton, Victoria 3800, Australia
- Department of Materials Science and Engineering, Monash University, Clayton, Victoria 3800, Australia
- School of Physics and Astronomy, Monash University, Clayton, Victoria 3800, Australia
| | - Chennupati Jagadish
- Department of Electronic Materials Engineering, Research School of Physics, The Australian National University, Canberra, ACT 2600, Australia
- Australian Research Council Centre of Excellence for Transformative Meta-Optical Systems, Research School of Physics, The Australian National University, Canberra, ACT 2600, Australia
| | - Hark Hoe Tan
- Department of Electronic Materials Engineering, Research School of Physics, The Australian National University, Canberra, ACT 2600, Australia
- Australian Research Council Centre of Excellence for Transformative Meta-Optical Systems, Research School of Physics, The Australian National University, Canberra, ACT 2600, Australia
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Voronkov G, Zakoyan A, Ivanov V, Iraev D, Stepanov I, Yuldashev R, Grakhova E, Lyubopytov V, Morozov O, Kutluyarov R. Design and Modeling of a Fully Integrated Microring-Based Photonic Sensing System for Liquid Refractometry. SENSORS (BASEL, SWITZERLAND) 2022; 22:9553. [PMID: 36502253 PMCID: PMC9738929 DOI: 10.3390/s22239553] [Citation(s) in RCA: 2] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 10/19/2022] [Revised: 11/29/2022] [Accepted: 12/02/2022] [Indexed: 06/17/2023]
Abstract
The design of a refractometric sensing system for liquids analysis with a sensor and the scheme for its intensity interrogation combined on a single photonic integrated circuit (PIC) is proposed. A racetrack microring resonator with a channel for the analyzed liquid formed on the top is used as a sensor, and another microring resonator with a lower Q-factor is utilized to detect the change in the resonant wavelength of the sensor. As a measurement result, the optical power at its drop port is detected in comparison with the sum of the powers at the through and drop ports. Simulations showed the possibility of registering a change in the analyte refractive index with a sensitivity of 110 nm per refractive index unit. The proposed scheme was analyzed with a broadband source, as well as a source based on an optoelectronic oscillator using an optical phase modulator. The second case showed the fundamental possibility of implementing an intensity interrogator on a PIC using an external typical single-mode laser as a source. Meanwhile, additional simulations demonstrated an increased system sensitivity compared to the conventional interrogation scheme with a broadband or tunable light source. The proposed approach provides the opportunity to increase the integration level of a sensing device, significantly reducing its cost, power consumption, and dimensions.
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Affiliation(s)
- Grigory Voronkov
- Ufa University of Science and Technology, 32, Z. Validi St., Ufa 450076, Russia
| | - Aida Zakoyan
- Ufa University of Science and Technology, 32, Z. Validi St., Ufa 450076, Russia
| | - Vladislav Ivanov
- Ufa University of Science and Technology, 32, Z. Validi St., Ufa 450076, Russia
| | - Dmitry Iraev
- Ufa University of Science and Technology, 32, Z. Validi St., Ufa 450076, Russia
| | - Ivan Stepanov
- Ufa University of Science and Technology, 32, Z. Validi St., Ufa 450076, Russia
| | - Roman Yuldashev
- Ufa University of Science and Technology, 32, Z. Validi St., Ufa 450076, Russia
| | - Elizaveta Grakhova
- Ufa University of Science and Technology, 32, Z. Validi St., Ufa 450076, Russia
| | - Vladimir Lyubopytov
- Ufa University of Science and Technology, 32, Z. Validi St., Ufa 450076, Russia
| | - Oleg Morozov
- Kazan National Research Technical University named after A. N. Tupolev-KAI (KNRTU-KAI), 10, Karl Marx Street, Kazan 420111, Russia
- Kazan Federal University, 18, Kremlyovskaya Str., Kazan 420008, Russia
| | - Ruslan Kutluyarov
- Ufa University of Science and Technology, 32, Z. Validi St., Ufa 450076, Russia
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8
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Karasiński P, Zięba M, Gondek E, Nizioł J, Gorantla S, Rola K, Bachmatiuk A, Tyszkiewicz C. Sol-Gel Derived Silica-Titania Waveguide Films for Applications in Evanescent Wave Sensors-Comprehensive Study. MATERIALS (BASEL, SWITZERLAND) 2022; 15:7641. [PMID: 36363233 PMCID: PMC9654017 DOI: 10.3390/ma15217641] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 09/22/2022] [Revised: 10/21/2022] [Accepted: 10/27/2022] [Indexed: 06/16/2023]
Abstract
Composite silica-titania waveguide films of refractive index ca. 1.8 are fabricated on glass substrates using a sol-gel method and dip-coating technique. Tetraethyl orthosilicate and tetraethyl orthotitanate with molar ratio 1:1 are precursors. Fabricated waveguides are annealed at 500 °C for 60 min. Their optical properties are studied using ellipsometry and UV-Vis spectrophotometry. Optical losses are determined using the streak method. The material structure and chemical composition, of the silica-titania films are analyzed using transmission electron microscopy (TEM) and electron dispersive spectroscopy (EDS), respectively. The surface morphology was investigated using atomic force microscopy (AFM) and scanning electron microscopy (SEM) methods. The results presented in this work show that the waveguide films are amorphous, and their parameters are stable for over a 13 years. The optical losses depend on their thickness and light polarization. Their lowest values are less than 0.06 dB cm-1. The paper presents the results of theoretical analysis of scattering losses on nanocrystals and pores in the bulk and interfaces of the waveguide film. These results combined with experimental data clearly indicate that light scattering at the interface to a glass substrate is the main source of optical losses. Presented waveguide films are suitable for application in evanescent wave sensors.
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Affiliation(s)
- Paweł Karasiński
- Department of Optoelectronics, Silesian University of Technology, ul. B. Krzywoustego 2, 44-100 Gliwice, Poland
| | - Magdalena Zięba
- Department of Optoelectronics, Silesian University of Technology, ul. B. Krzywoustego 2, 44-100 Gliwice, Poland
| | - Ewa Gondek
- Institute of Physics, Cracow University of Technology, ul. Podchorążych 1, 30-084 Kraków, Poland
| | - Jacek Nizioł
- Faculty of Physics and Applied Computer Science, AGH University of Science and Technology, al. Mickiewicza 30, 30-059 Krakow, Poland
| | - Sandeep Gorantla
- Łukasiewicz Research Network—PORT Polish Center for Technology Development, ul. Stabłowicka 147, 54-066 Wrocław, Poland
| | - Krzysztof Rola
- Łukasiewicz Research Network—PORT Polish Center for Technology Development, ul. Stabłowicka 147, 54-066 Wrocław, Poland
| | - Alicja Bachmatiuk
- Łukasiewicz Research Network—PORT Polish Center for Technology Development, ul. Stabłowicka 147, 54-066 Wrocław, Poland
| | - Cuma Tyszkiewicz
- Department of Optoelectronics, Silesian University of Technology, ul. B. Krzywoustego 2, 44-100 Gliwice, Poland
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