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Armakavicius N, Kühne P, Papamichail A, Zhang H, Knight S, Persson A, Stanishev V, Chen JT, Paskov P, Schubert M, Darakchieva V. Electronic Properties of Group-III Nitride Semiconductors and Device Structures Probed by THz Optical Hall Effect. MATERIALS (BASEL, SWITZERLAND) 2024; 17:3343. [PMID: 38998423 PMCID: PMC11243707 DOI: 10.3390/ma17133343] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/30/2024] [Revised: 06/11/2024] [Accepted: 06/27/2024] [Indexed: 07/14/2024]
Abstract
Group-III nitrides have transformed solid-state lighting and are strategically positioned to revolutionize high-power and high-frequency electronics. To drive this development forward, a deep understanding of fundamental material properties, such as charge carrier behavior, is essential and can also unveil new and unforeseen applications. This underscores the necessity for novel characterization tools to study group-III nitride materials and devices. The optical Hall effect (OHE) emerges as a contactless method for exploring the transport and electronic properties of semiconductor materials, simultaneously offering insights into their dielectric function. This non-destructive technique employs spectroscopic ellipsometry at long wavelengths in the presence of a magnetic field and provides quantitative information on the charge carrier density, sign, mobility, and effective mass of individual layers in multilayer structures and bulk materials. In this paper, we explore the use of terahertz (THz) OHE to study the charge carrier properties in group-III nitride heterostructures and bulk material. Examples include graded AlGaN channel high-electron-mobility transistor (HEMT) structures for high-linearity devices, highlighting the different grading profiles and their impact on the two-dimensional electron gas (2DEG) properties. Next, we demonstrate the sensitivity of the THz OHE to distinguish the 2DEG anisotropic mobility parameters in N-polar GaN/AlGaN HEMTs and show that this anisotropy is induced by the step-like surface morphology. Finally, we present the temperature-dependent results on the charge carrier properties of 2DEG and bulk electrons in GaN with a focus on the effective mass parameter and review the effective mass parameters reported in the literature. These studies showcase the capabilities of the THz OHE for advancing the understanding and development of group-III materials and devices.
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Affiliation(s)
- Nerijus Armakavicius
- Center for III-Nitride Technology (C3NiT-Janzén), Linköping University, 581 83 Linköping, Sweden
- Department of Physics, Chemistry and Biology (IFM), Linköping University, 581 83 Linköping, Sweden
| | - Philipp Kühne
- Center for III-Nitride Technology (C3NiT-Janzén), Linköping University, 581 83 Linköping, Sweden
- Department of Physics, Chemistry and Biology (IFM), Linköping University, 581 83 Linköping, Sweden
| | - Alexis Papamichail
- Center for III-Nitride Technology (C3NiT-Janzén), Linköping University, 581 83 Linköping, Sweden
- Department of Physics, Chemistry and Biology (IFM), Linköping University, 581 83 Linköping, Sweden
| | - Hengfang Zhang
- Center for III-Nitride Technology (C3NiT-Janzén), Linköping University, 581 83 Linköping, Sweden
- Department of Physics, Chemistry and Biology (IFM), Linköping University, 581 83 Linköping, Sweden
| | - Sean Knight
- Center for III-Nitride Technology (C3NiT-Janzén), Linköping University, 581 83 Linköping, Sweden
- Department of Physics, Chemistry and Biology (IFM), Linköping University, 581 83 Linköping, Sweden
| | - Axel Persson
- Center for III-Nitride Technology (C3NiT-Janzén), Linköping University, 581 83 Linköping, Sweden
- Department of Physics, Chemistry and Biology (IFM), Linköping University, 581 83 Linköping, Sweden
| | - Vallery Stanishev
- Center for III-Nitride Technology (C3NiT-Janzén), Linköping University, 581 83 Linköping, Sweden
- Department of Physics, Chemistry and Biology (IFM), Linköping University, 581 83 Linköping, Sweden
| | - Jr-Tai Chen
- Center for III-Nitride Technology (C3NiT-Janzén), Linköping University, 581 83 Linköping, Sweden
- SweGaN AB, 582 78 Linköping, Sweden
| | - Plamen Paskov
- Center for III-Nitride Technology (C3NiT-Janzén), Linköping University, 581 83 Linköping, Sweden
- Department of Physics, Chemistry and Biology (IFM), Linköping University, 581 83 Linköping, Sweden
| | - Mathias Schubert
- Center for III-Nitride Technology (C3NiT-Janzén), Linköping University, 581 83 Linköping, Sweden
- Department of Electrical and Computer Engineering, University of Nebraska-Lincoln, Lincoln, NB 68588, USA
| | - Vanya Darakchieva
- Center for III-Nitride Technology (C3NiT-Janzén), Linköping University, 581 83 Linköping, Sweden
- Department of Physics, Chemistry and Biology (IFM), Linköping University, 581 83 Linköping, Sweden
- NanoLund, Center for III-Nitride Technology (C3NiT-Janzén), Terahertz Materials Analysis Center, THeMAC and Solid State Physics Division, Lund University, 221 00 Lund, Sweden
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2
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Casanova-Chafer J, Garcia-Aboal R, Llobet E, Atienzar P. Enhanced CO 2 Sensing by Oxygen Plasma-Treated Perovskite-Graphene Nanocomposites. ACS Sens 2024; 9:830-839. [PMID: 38320174 DOI: 10.1021/acssensors.3c02166] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 02/08/2024]
Abstract
Carbon dioxide (CO2) is a major greenhouse gas responsible for global warming and climate change. The development of sensitive CO2 sensors is crucial for environmental and industrial applications. This paper presents a novel CO2 sensor based on perovskite nanocrystals immobilized on graphene and functionalized with oxygen plasma treatment. The impact of this post-treatment method was thoroughly investigated using various characterization techniques, including Raman spectroscopy, X-ray diffraction, and X-ray photoelectron spectroscopy. The detection of CO2 at parts per million (ppm) levels demonstrated that the hybrids subjected to 5 min of oxygen plasma treatment exhibited a 3-fold improvement in sensing performance compared to untreated layers. Consequently, the CO2 sensing capability of the oxygen-treated samples showed a limit of detection and limit of quantification of 6.9 and 22.9 ppm, respectively. Furthermore, the influence of ambient moisture on the CO2 sensing performance was also evaluated, revealing a significant effect of oxygen plasma treatment.
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Affiliation(s)
- Juan Casanova-Chafer
- Chimie des Interactions Plasma Surface, Université de Mons, Mons 7000, Belgium
- Universitat Rovira i Virgili, Tarragona 43007, Spain
| | - Rocio Garcia-Aboal
- Instituto de Tecnología Química, CSIC-UPV, Universitat Politècnica de València, Valencia 46022, Spain
| | - Eduard Llobet
- Universitat Rovira i Virgili, Tarragona 43007, Spain
- Research Institute in Sustainability, Climate Change and Energy Transition (IU-RESCAT), Vila-seca 43480, Spain
| | - Pedro Atienzar
- Instituto de Tecnología Química, CSIC-UPV, Universitat Politècnica de València, Valencia 46022, Spain
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3
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Agulto VC, Iwamoto T, Kitahara H, Toya K, Mag-Usara VK, Imanishi M, Mori Y, Yoshimura M, Nakajima M. Terahertz time-domain ellipsometry with high precision for the evaluation of GaN crystals with carrier densities up to 10 20 cm -3. Sci Rep 2021; 11:18129. [PMID: 34526558 PMCID: PMC8443745 DOI: 10.1038/s41598-021-97253-z] [Citation(s) in RCA: 14] [Impact Index Per Article: 3.5] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/21/2021] [Accepted: 08/20/2021] [Indexed: 01/09/2023] Open
Abstract
Gallium nitride (GaN) is one of the most technologically important semiconductors and a fundamental component in many optoelectronic and power devices. Low-resistivity GaN wafers are in demand and actively being developed to improve the performance of vertical GaN power devices necessary for high-voltage and high-frequency applications. For the development of GaN devices, nondestructive characterization of electrical properties particularly for carrier densities in the order of 1019 cm-3 or higher is highly favorable. In this study, we investigated GaN single crystals with different carrier densities of up to 1020 cm-3 using THz time-domain ellipsometry in reflection configuration. The p- and s-polarized THz waves reflected off the GaN samples are measured and then corrected based on the analysis of multiple waveforms measured with a rotating analyzer. We show that performing such analysis leads to a ten times higher precision than by merely measuring the polarization components. As a result, the carrier density and mobility parameters can be unambiguously determined even at high conductivities.
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Affiliation(s)
- Verdad C Agulto
- Institute of Laser Engineering, Osaka University, Suita, Osaka, 565-0871, Japan
| | | | - Hideaki Kitahara
- Institute of Laser Engineering, Osaka University, Suita, Osaka, 565-0871, Japan
| | - Kazuhiro Toya
- Institute of Laser Engineering, Osaka University, Suita, Osaka, 565-0871, Japan
| | | | - Masayuki Imanishi
- Graduate School of Engineering, Osaka University, Suita, Osaka, 565-0871, Japan
| | - Yusuke Mori
- Graduate School of Engineering, Osaka University, Suita, Osaka, 565-0871, Japan
| | - Masashi Yoshimura
- Institute of Laser Engineering, Osaka University, Suita, Osaka, 565-0871, Japan
| | - Makoto Nakajima
- Institute of Laser Engineering, Osaka University, Suita, Osaka, 565-0871, Japan.
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Panna AR, Hu IF, Kruskopf M, Patel DK, Jarrett DG, Liu CI, Payagala SU, Saha D, Rigosi AF, Newell DB, Liang CT, Elmquist RE. Graphene quantum Hall effect parallel resistance arrays. PHYSICAL REVIEW. B 2021; 103:10.1103/physrevb.103.075408. [PMID: 34263094 PMCID: PMC8276113 DOI: 10.1103/physrevb.103.075408] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/29/2023]
Abstract
As first recognized in 2010, epitaxial graphene on SiC(0001) provides a platform for quantized Hall resistance (QHR) metrology unmatched by other two-dimensional structures and materials. Here we report graphene parallel QHR arrays, with metrologically precise quantization near 1000 Ω. These arrays have tunable carrier densities, due to uniform epitaxial growth and chemical functionalization, allowing quantization at the robust ν = 2 filling factor in array devices at relative precision better than 10-8. Broad tunability of the carrier density also enables investigation of the ν = 6 plateau. Optimized networks of QHR devices described in this work suppress Ohmic contact resistance error using branched contacts and avoid crossover leakage with interconnections that are superconducting for quantizing magnetic fields up to 13.5 T. Our work enables more direct scaling of resistance for quantized values in arrays of arbitrary network geometry.
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Affiliation(s)
- Alireza R Panna
- Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899-8171, USA
| | - I-Fan Hu
- Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899-8171, USA
- Department of Physics, National Taiwan University, Taipei 10617, Taiwan, Republic of China
| | - Mattias Kruskopf
- Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899-8171, USA
- Physikalisch-Technische Bundesanstalt, Bundesallee 100, 38116 Braunschweig, Germany
| | - Dinesh K Patel
- Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899-8171, USA
- Department of Physics, National Taiwan University, Taipei 10617, Taiwan, Republic of China
| | - Dean G Jarrett
- Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899-8171, USA
| | - Chieh-I Liu
- Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899-8171, USA
- Department of Chemistry and Biochemistry, University of Maryland, College Park, Maryland 20742, USA
| | - Shamith U Payagala
- Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899-8171, USA
| | - Dipanjan Saha
- Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899-8171, USA
| | - Albert F Rigosi
- Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899-8171, USA
| | - David B Newell
- Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899-8171, USA
| | - Chi-Te Liang
- Department of Physics, National Taiwan University, Taipei 10617, Taiwan, Republic of China
| | - Randolph E Elmquist
- Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899-8171, USA
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González E, Casanova-Chafer J, Romero A, Vilanova X, Mitrovics J, Llobet E. LoRa Sensor Network Development for Air Quality Monitoring or Detecting Gas Leakage Events. SENSORS 2020; 20:s20216225. [PMID: 33142820 PMCID: PMC7672618 DOI: 10.3390/s20216225] [Citation(s) in RCA: 13] [Impact Index Per Article: 2.6] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 10/11/2020] [Revised: 10/28/2020] [Accepted: 10/30/2020] [Indexed: 12/18/2022]
Abstract
During the few last years, indoor and outdoor Air Quality Monitoring (AQM) has gained a lot of interest among the scientific community due to its direct relation with human health. The Internet of Things (IoT) and, especially, Wireless Sensor Networks (WSN) have given rise to the development of wireless AQM portable systems. This paper presents the development of a LoRa (short for long-range) based sensor network for AQM and gas leakage events detection. The combination of both a commercial gas sensor and a resistance measurement channel for graphene chemoresistive sensors allows both the calculation of an Air Quality Index based on the concentration of reducing species such as volatile organic compounds (VOCs) and CO, and it also makes possible the detection of NO2, which is an important air pollutant. The graphene sensor tested with the LoRa nodes developed allows the detection of NO2 pollution in just 5 min as well as enables monitoring sudden changes in the background level of this pollutant in the atmosphere. The capability of the system of detecting both reducing and oxidizing pollutant agents, alongside its low-cost, low-power, and real-time monitoring features, makes this a solution suitable to be used in wireless AQM and early warning systems.
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Affiliation(s)
- Ernesto González
- Electronic Engineering, Uiversitat Rovira i Virgili, MINOS, 43007 Tarragona, Spain; (E.G.); (J.C.-C.); (A.R.); (E.L.)
| | - Juan Casanova-Chafer
- Electronic Engineering, Uiversitat Rovira i Virgili, MINOS, 43007 Tarragona, Spain; (E.G.); (J.C.-C.); (A.R.); (E.L.)
| | - Alfonso Romero
- Electronic Engineering, Uiversitat Rovira i Virgili, MINOS, 43007 Tarragona, Spain; (E.G.); (J.C.-C.); (A.R.); (E.L.)
| | - Xavier Vilanova
- Electronic Engineering, Uiversitat Rovira i Virgili, MINOS, 43007 Tarragona, Spain; (E.G.); (J.C.-C.); (A.R.); (E.L.)
- Correspondence: ; Tel.: +34-977-558-502
| | | | - Eduard Llobet
- Electronic Engineering, Uiversitat Rovira i Virgili, MINOS, 43007 Tarragona, Spain; (E.G.); (J.C.-C.); (A.R.); (E.L.)
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Knight S, Schöche S, Kühne P, Hofmann T, Darakchieva V, Schubert M. Tunable cavity-enhanced terahertz frequency-domain optical Hall effect. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2020; 91:083903. [PMID: 32872950 DOI: 10.1063/5.0010267] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/08/2020] [Accepted: 07/28/2020] [Indexed: 06/11/2023]
Abstract
Presented here is the development and demonstration of a tunable cavity-enhanced terahertz (THz) frequency-domain optical Hall effect (OHE) technique. The cavity consists of at least one fixed and one tunable Fabry-Pérot resonator. The approach is suitable for the enhancement of the optical signatures produced by the OHE in semi-transparent conductive layer structures with plane parallel interfaces. Tuning one of the cavity parameters, such as the external cavity thickness, permits shifting of the frequencies of the constructive interference and provides substantial enhancement of the optical signatures produced by the OHE. A cavity-tuning optical stage and gas flow cell are used as examples of instruments that exploit tuning an external cavity to enhance polarization changes in a reflected THz beam. Permanent magnets are used to provide the necessary external magnetic field. Conveniently, the highly reflective surface of a permanent magnet can be used to create the tunable external cavity. The signal enhancement allows the extraction of the free charge carrier properties of thin films and can eliminate the need for expensive superconducting magnets. Furthermore, the thickness of the external cavity establishes an additional independent measurement condition, similar to, for example, the magnetic field strength, THz frequency, and angle of incidence. A high electron mobility transistor (HEMT) structure and epitaxial graphene are studied as examples. The tunable cavity-enhancement effect provides a maximum increase of more than one order of magnitude in the change of certain polarization components for both the HEMT structure and epitaxial graphene at particular frequencies and external cavity sizes.
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Affiliation(s)
- Sean Knight
- Department of Electrical and Computer Engineering, University of Nebraska-Lincoln, Lincoln, Nebraska 68588-0511, USA
| | - Stefan Schöche
- J. A. Woollam Co., Inc., Lincoln, Nebraska 68508-2243, USA
| | - Philipp Kühne
- Terahertz Materials Analysis Center, THeMAC and Center for III-Nitride Technology, C3NiT-Janzén, Department of Physics, Chemistry and Biology, Linköping University, SE 58183 Linköping, Sweden
| | - Tino Hofmann
- Department of Physics and Optical Science, University of North Carolina at Charlotte, Charlotte, North Carolina 28223, USA
| | - Vanya Darakchieva
- Terahertz Materials Analysis Center, THeMAC and Center for III-Nitride Technology, C3NiT-Janzén, Department of Physics, Chemistry and Biology, Linköping University, SE 58183 Linköping, Sweden
| | - Mathias Schubert
- Department of Electrical and Computer Engineering, University of Nebraska-Lincoln, Lincoln, Nebraska 68588-0511, USA
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Electronic and Transport Properties of Epitaxial Graphene on SiC and 3C-SiC/Si: A Review. APPLIED SCIENCES-BASEL 2020. [DOI: 10.3390/app10124350] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 01/04/2023]
Abstract
The electronic and transport properties of epitaxial graphene are dominated by the interactions the material makes with its surroundings. Based on the transport properties of epitaxial graphene on SiC and 3C-SiC/Si substrates reported in the literature, we emphasize that the graphene interfaces formed between the active material and its environment are of paramount importance, and how interface modifications enable the fine-tuning of the transport properties of graphene. This review provides a renewed attention on the understanding and engineering of epitaxial graphene interfaces for integrated electronics and photonics applications.
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Uprety P, Subedi I, Junda MM, Collins RW, Podraza NJ. Photogenerated Carrier Transport Properties in Silicon Photovoltaics. Sci Rep 2019; 9:19015. [PMID: 31831793 PMCID: PMC6908689 DOI: 10.1038/s41598-019-55173-z] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/05/2019] [Accepted: 11/22/2019] [Indexed: 11/29/2022] Open
Abstract
Electrical transport parameters for active layers in silicon (Si) wafer solar cells are determined from free carrier optical absorption using non-contacting optical Hall effect measurements. Majority carrier transport parameters [carrier concentration (N), mobility (μ), and conductivity effective mass (m*)] are determined for both the n-type emitter and p-type bulk wafer Si of an industrially produced aluminum back surface field (Al-BSF) photovoltaic device. From measurements under 0 and ±1.48 T external magnetic fields and nominally “dark” conditions, the following respective [n, p]-type Si parameters are obtained: N = [(3.6 ± 0.1) × 1018 cm−3, (7.6 ± 0.1) × 1015 cm−3]; μ = [166 ± 6 cm2/Vs, 532 ± 12 cm2/Vs]; and m* = [(0.28 ± 0.03) × me, (0.36 ± 0.02) × me]. All values are within expectations for this device design. Contributions from photogenerated carriers in both regions of the p-n junction are obtained from measurements of the solar cell under “light” 1 sun illumination (AM1.5 solar irradiance spectrum). From analysis of combined dark and light optical Hall effect measurements, photogenerated minority carrier transport parameters [minority carrier concentration (Δp or Δn) and minority carrier mobility (μh or μe)] under 1 sun illumination for both n- and p-type Si components of the solar cell are determined. Photogenerated minority carrier concentrations are [(7.8 ± 0.2) × 1016 cm−3, (2.2 ± 0.2) × 1014 cm−3], and minority carrier mobilities are [331 ± 191 cm2/Vs, 766 ± 331 cm2/Vs], for the [n, p]-type Si, respectively, values that are within expectations from literature. Using the dark majority carrier concentration and the effective equilibrium minority carrier concentration under 1 sun illumination, minority carrier effective lifetime and diffusion length are calculated in the n-type emitter and p-type wafer Si with the results also being consistent with literature. Solar cell device performance parameters including photovoltaic device efficiency, open circuit voltage, fill factor, and short circuit current density are also calculated from these transport parameters obtained via optical Hall effect using the diode equation and PC1D solar cell simulations. The calculated device performance parameters are found to be consistent with direct current-voltage measurement demonstrating the validity of this technique for electrical transport property measurements of the semiconducting layers in complete Si solar cells. To the best of our knowledge, this is the first method that enables determination of both minority and majority carrier transport parameters in both active layers of the p-n junction in a complete solar cell.
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Affiliation(s)
- Prakash Uprety
- Wright Center for Photovoltaics Innovation and Commercialization & Department of Physics and Astronomy, University of Toledo, Toledo, OH, 43606, USA
| | - Indra Subedi
- Wright Center for Photovoltaics Innovation and Commercialization & Department of Physics and Astronomy, University of Toledo, Toledo, OH, 43606, USA
| | - Maxwell M Junda
- Wright Center for Photovoltaics Innovation and Commercialization & Department of Physics and Astronomy, University of Toledo, Toledo, OH, 43606, USA
| | - Robert W Collins
- Wright Center for Photovoltaics Innovation and Commercialization & Department of Physics and Astronomy, University of Toledo, Toledo, OH, 43606, USA
| | - Nikolas J Podraza
- Wright Center for Photovoltaics Innovation and Commercialization & Department of Physics and Astronomy, University of Toledo, Toledo, OH, 43606, USA.
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Halim J, Persson I, Moon EJ, Kühne P, Darakchieva V, Persson POÅ, Eklund P, Rosen J, Barsoum MW. Electronic and optical characterization of 2D Ti 2C and Nb 2C (MXene) thin films. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2019; 31:165301. [PMID: 30669136 DOI: 10.1088/1361-648x/ab00a2] [Citation(s) in RCA: 30] [Impact Index Per Article: 5.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/09/2023]
Abstract
Two-dimensional (2D) transition metal carbides and/or nitrides (MXenes) are a new class of 2D materials, with extensive opportunities for property tailoring due to the numerous possibilities for varying chemistries and surface terminations. Here, Ti2AlC and Nb2AlC MAX phase epitaxial thin films were deposited on sapphire substrates by physical vapor deposition. The films were then etched in LiF/HCl solutions, yielding Li-intercalated, 2D Ti2CT z and Nb2CT z films, whose terminations, transport and optical properties were characterized. The former exhibits metallic conductivity, with weak localization below 50 K. In contrast, the Nb-based film exhibits an increase in resistivity with decreasing temperature from RT down to 40 K consistent with variable range hopping transport. The optical properties of both films were determined from spectroscopic ellipsometry in the 0.75 to 3.50 eV range. The results for Ti2CT z films confirm the metallic behavior. In contrast, no evidence of metallic behavior is observed for the Nb2CT z film. The present work therefore demonstrates that one fruitful approach to alter the electronic and optical properties of MXenes is to change the nature of the transition metal.
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Affiliation(s)
- Joseph Halim
- Department of Physics, Chemistry and Biology (IFM), Thin Film Physics Division, Linköping University, SE-58183 Linköping, Sweden
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Knight S, Prabhakaran D, Binek C, Schubert M. Electromagnon excitation in cupric oxide measured by Fabry-Pérot enhanced terahertz Mueller matrix ellipsometry. Sci Rep 2019; 9:1353. [PMID: 30718629 PMCID: PMC6362027 DOI: 10.1038/s41598-018-37639-8] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/23/2018] [Accepted: 12/10/2018] [Indexed: 11/18/2022] Open
Abstract
Here we present the use of Fabry-Pérot enhanced terahertz (THz) Mueller matrix ellipsometry to measure an electromagnon excitation in monoclinic cupric oxide (CuO). As a magnetically induced ferroelectric multiferroic, CuO exhibits coupling between electric and magnetic order. This gives rise to special quasiparticle excitations at THz frequencies called electromagnons. In order to measure the electromagnons in CuO, we exploit single-crystal CuO as a THz Fabry-Pérot cavity to resonantly enhance the excitation’s signature. This enhancement technique enables the complex index of refraction to be extracted. We observe a peak in the absorption coefficient near 0.705 THz and 215 K, which corresponds to the electromagnon excitation. This absorption peak is observed along only one major polarizability axis in the monoclinic a–c plane. We show the excitation can be represented using the Lorentz oscillator model, and discuss how these Lorentz parameters evolve with temperature. Our findings are in excellent agreement with previous characterizations by THz time-domain spectroscopy (THz-TDS), which demonstrates the validity of this enhancement technique.
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Affiliation(s)
- Sean Knight
- Department of Electrical and Computer Engineering, University of Nebraska-Lincoln, Lincoln, Nebraska, 68588-0511, USA.
| | - Dharmalingam Prabhakaran
- Department of Physics, Clarendon Laboratory, University of Oxford, Parks Road, Oxford, OX1 3PU, United Kingdom
| | - Christian Binek
- Department of Physics and Astronomy, University of Nebraska-Lincoln, Lincoln, Nebraska, 68588-0511, USA
| | - Mathias Schubert
- Department of Electrical and Computer Engineering, University of Nebraska-Lincoln, Lincoln, Nebraska, 68588-0511, USA.,Terahertz Materials Analysis Center, Department of Physics, Chemistry and Biology, Linköping University, SE-58183, Linköping, Sweden.,Leibniz-Institut für Polymerforschung Dresden e.V., Dresden, 01069, Germany
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