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Gawai UP, Kamble SD. Signature of the Kondo effect in superparamagnetic GO incorporated Cobalt substituted Ni/NiO nanoparticles. Sci Rep 2024; 14:24460. [PMID: 39424805 PMCID: PMC11489572 DOI: 10.1038/s41598-024-67447-2] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/11/2024] [Accepted: 07/11/2024] [Indexed: 10/21/2024] Open
Abstract
The study reports on the magnetization, magnetoresistance, and transport properties of superparamagnetic 10% Co-doped Ni/NiO (C10-NN), Graphene Oxide (GO) incorporated 10% Co-doped Ni/NiO (C10-NNG), and 15% Co-doped Ni/NiO (C15-NN) nanoparticles synthesized via a microwave-assisted sol-gel auto-combustion method. All samples show hysteresis in negative Magnetoresistance (M-R) at different temperatures. Resistivity ρ(T) versus temperature plots of samples C10-NN and C15-NN show metallic behavior with applied fields of 0, 1, 5, 8 T, and at 0 T, 1 T respectively. However, the plot of R-T of the C15-NN sample shows a significant difference at 0 T and 1 T. At 0 T for this sample, the metallic behavior is observed for temperature T > TM, with the resistivity falling abruptly at and above TM = 246 K. The resistivity decreases with increasing temperature, exhibiting metallic behavior again above TMM < 276 K. This jump at 276 K, indicating a metal-to metal transition. The Kondo effect is observed for the first time in C10-NNG sample. The upturn of resistivity ρ(T) towards low temperature in the C10-NNG sample is well described by the power series equation and Kondo term. This sample exhibits the upturn resistivity along with a metal-insulator transition above and below the Kondo temperature TK ≈ 93.51(2) K at the 0 T, 1 T, 5 T, and 8 T fields.
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Affiliation(s)
- Umesh Prakash Gawai
- Department of Physics, DDSP, Arts, Commerce & Science College, Erandol, Jalgaon, M.S., 425 109, India.
| | - Shilpa Dayanand Kamble
- Department of Physics, Shri Madhavrao Patil Mahavidyalaya, Murum, Omerga, Osmanabad, M.S., 413 606, India
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Lee DK, Lee S, Sim H, Park Y, Choi SY, Son J. Piezo strain-controlled phase transition in single-crystalline Mott switches for threshold-manipulated leaky integrate-and-fire neurons. SCIENCE ADVANCES 2024; 10:eadk8836. [PMID: 38578998 PMCID: PMC10997191 DOI: 10.1126/sciadv.adk8836] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/15/2023] [Accepted: 02/29/2024] [Indexed: 04/07/2024]
Abstract
Electrical manipulation of the metal-insulator transition (MIT) in quantum materials has attracted considerable attention toward the development of ultracompact neuromorphic devices because of their stimuli-triggered transformations. VO2 is expected to undergo abrupt electronic phase transition by piezo strain near room temperature; however, the unrestricted integration of defect-free VO2 films on piezoelectric substrates is required to fully exploit this emerging phenomenon in oxide heterostructures. Here, we demonstrate the integration of single-crystalline VO2 films on highly lattice-mismatched PMN-PT piezoelectric substrates using a single-crystal TiO2-nanomembrane (NM) template. Using our strategy on heterogeneous integration, single-crystal-like steep transition was observed in the defect-free VO2 films on TiO2-NM-PMN-PT. Unprecedented TMI modulation (5.2 kelvin) and isothermal resistance of VO2 [ΔR/R (Eg) ≈ 18,000% at 315 kelvin] were achieved by the efficient strain transfer-induced MIT, which cannot be achieved using directly grown VO2/PMN-PT substrates. Our results provide a fundamental strategy to realize a single-crystalline artificial heterojunction for promoting the application of artificial neurons using emergent materials.
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Affiliation(s)
- Dong Kyu Lee
- Department of Materials Science and Engineering, Pohang University of Science and Technology (POSTECH), Pohang 37673, Republic of Korea
- Department of Materials Science and Engineering, Research Institute of Advanced Materials, Seoul National University, Seoul 08826, Republic of Korea
| | - Sungwon Lee
- Department of Materials Science and Engineering, Pohang University of Science and Technology (POSTECH), Pohang 37673, Republic of Korea
- Department of Materials Science and Engineering, Research Institute of Advanced Materials, Seoul National University, Seoul 08826, Republic of Korea
| | - Hyeji Sim
- Department of Materials Science and Engineering, Pohang University of Science and Technology (POSTECH), Pohang 37673, Republic of Korea
| | - Yunkyu Park
- Department of Materials Science and Engineering, Pohang University of Science and Technology (POSTECH), Pohang 37673, Republic of Korea
| | - Si-Young Choi
- Department of Materials Science and Engineering, Pohang University of Science and Technology (POSTECH), Pohang 37673, Republic of Korea
| | - Junwoo Son
- Department of Materials Science and Engineering, Pohang University of Science and Technology (POSTECH), Pohang 37673, Republic of Korea
- Department of Materials Science and Engineering, Research Institute of Advanced Materials, Seoul National University, Seoul 08826, Republic of Korea
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Lee YJ, Kim Y, Gim H, Hong K, Jang HW. Nanoelectronics Using Metal-Insulator Transition. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2024; 36:e2305353. [PMID: 37594405 DOI: 10.1002/adma.202305353] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/05/2023] [Revised: 08/02/2023] [Indexed: 08/19/2023]
Abstract
Metal-insulator transition (MIT) coupled with an ultrafast, significant, and reversible resistive change in Mott insulators has attracted tremendous interest for investigation into next-generation electronic and optoelectronic devices, as well as a fundamental understanding of condensed matter systems. Although the mechanism of MIT in Mott insulators is still controversial, great efforts have been made to understand and modulate MIT behavior for various electronic and optoelectronic applications. In this review, recent progress in the field of nanoelectronics utilizing MIT is highlighted. A brief introduction to the physics of MIT and its underlying mechanisms is begun. After discussing the MIT behaviors of various Mott insulators, recent advances in the design and fabrication of nanoelectronics devices based on MIT, including memories, gas sensors, photodetectors, logic circuits, and artificial neural networks are described. Finally, an outlook on the development and future applications of nanoelectronics utilizing MIT is provided. This review can serve as an overview and a comprehensive understanding of the design of MIT-based nanoelectronics for future electronic and optoelectronic devices.
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Affiliation(s)
- Yoon Jung Lee
- Department of Materials Science and Engineering, Research Institute of Advanced Materials, Seoul National University, Seoul, 08826, Republic of Korea
| | - Youngmin Kim
- Department of Materials Science and Engineering, Research Institute of Advanced Materials, Seoul National University, Seoul, 08826, Republic of Korea
| | - Hyeongyu Gim
- Department of Materials Science and Engineering, Chonnam National University, Gwangju, 61186, Republic of Korea
| | - Kootak Hong
- Department of Materials Science and Engineering, Chonnam National University, Gwangju, 61186, Republic of Korea
| | - Ho Won Jang
- Department of Materials Science and Engineering, Research Institute of Advanced Materials, Seoul National University, Seoul, 08826, Republic of Korea
- Advanced Institute of Convergence Technology, Seoul National University, Suwon, 16229, Republic of Korea
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Pesquera D, Fernández A, Khestanova E, Martin LW. Freestanding complex-oxide membranes. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2022; 34:383001. [PMID: 35779514 DOI: 10.1088/1361-648x/ac7dd5] [Citation(s) in RCA: 6] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/22/2022] [Accepted: 07/01/2022] [Indexed: 06/15/2023]
Abstract
Complex oxides show a vast range of functional responses, unparalleled within the inorganic solids realm, making them promising materials for applications as varied as next-generation field-effect transistors, spintronic devices, electro-optic modulators, pyroelectric detectors, or oxygen reduction catalysts. Their stability in ambient conditions, chemical versatility, and large susceptibility to minute structural and electronic modifications make them ideal subjects of study to discover emergent phenomena and to generate novel functionalities for next-generation devices. Recent advances in the synthesis of single-crystal, freestanding complex oxide membranes provide an unprecedented opportunity to study these materials in a nearly-ideal system (e.g. free of mechanical/thermal interaction with substrates) as well as expanding the range of tools for tweaking their order parameters (i.e. (anti-)ferromagnetic, (anti-)ferroelectric, ferroelastic), and increasing the possibility of achieving novel heterointegration approaches (including interfacing dissimilar materials) by avoiding the chemical, structural, or thermal constraints in synthesis processes. Here, we review the recent developments in the fabrication and characterization of complex-oxide membranes and discuss their potential for unraveling novel physicochemical phenomena at the nanoscale and for further exploiting their functionalities in technologically relevant devices.
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Affiliation(s)
- David Pesquera
- Catalan Institute of Nanoscience and Nanotechnology (ICN2), CSIC and BIST Campus UAB, Bellaterra, Barcelona 08193, Spain
| | - Abel Fernández
- Department of Materials Science and Engineering, University of California, Berkeley, CA 94720, United States of America
| | | | - Lane W Martin
- Department of Materials Science and Engineering, University of California, Berkeley, CA 94720, United States of America
- Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, United States of America
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Soni K, S H, Chandra M, Rajput P, Mavani KR. Switching of majority charge carriers by Zn doping in NdNiO 3 thin films. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2021; 33:015602. [PMID: 32927449 DOI: 10.1088/1361-648x/abb864] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
We have studied the effects of Zn doping on the structural and electronic properties of epitaxial NdNiO3 thin films grown on single-crystal LaAlO3 (001) (LAO) substrates by pulsed laser deposition. The films are deposited in two sets, one with variation in Zn doping, and another with variation in thickness for undoped and 2% Zn doping. The experimental investigations show that Zn occupies Ni-site and that the films are grown with an in-plane compressive strain on LAO. All the films show metal-to-insulator transitions with a thermal hysteresis in the temperature-dependent resistivity curves except 5% Zn-doped film, which remains metallic. The theoretical fits show non-Fermi liquid behaviour, which gets influenced by Zn doping. The Hall resistance measurements clearly show that Zn doping causes injection of holes in the system which affects the electronic properties as follows: i) the metallic conduction increases by two factors just by 0.5% Zn doping whereas, 5% doping completely suppresses the insulating state, ii) a reversal of the sign of Hall coefficient of resistance is observed at low temperature.
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Affiliation(s)
- Kavita Soni
- Discipline of Physics, Indian Institute of Technology (IIT) Indore, Khandwa Road, Simrol, 453 552, India
| | - Harisankar S
- Discipline of Physics, Indian Institute of Technology (IIT) Indore, Khandwa Road, Simrol, 453 552, India
| | - Mahesh Chandra
- Discipline of Physics, Indian Institute of Technology (IIT) Indore, Khandwa Road, Simrol, 453 552, India
| | - Parasmani Rajput
- Atomic & Molecular Physics Division, Bhabha Atomic Research Center (BARC), Trombay, Mumbai 400 085, India
| | - K R Mavani
- Discipline of Physics, Indian Institute of Technology (IIT) Indore, Khandwa Road, Simrol, 453 552, India
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Large magnetoelectric coupling in multiferroic oxide heterostructures assembled via epitaxial lift-off. Nat Commun 2020; 11:3190. [PMID: 32581280 PMCID: PMC7314756 DOI: 10.1038/s41467-020-16942-x] [Citation(s) in RCA: 24] [Impact Index Per Article: 6.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/23/2019] [Accepted: 06/02/2020] [Indexed: 11/16/2022] Open
Abstract
Epitaxial films may be released from growth substrates and transferred to structurally and chemically incompatible substrates, but epitaxial films of transition metal perovskite oxides have not been transferred to electroactive substrates for voltage control of their myriad functional properties. Here we demonstrate good strain transmission at the incoherent interface between a strain-released film of epitaxially grown ferromagnetic La0.7Sr0.3MnO3 and an electroactive substrate of ferroelectric 0.68Pb(Mg1/3Nb2/3)O3-0.32PbTiO3 in a different crystallographic orientation. Our strain-mediated magnetoelectric coupling compares well with respect to epitaxial heterostructures, where the epitaxy responsible for strong coupling can degrade film magnetization via strain and dislocations. Moreover, the electrical switching of magnetic anisotropy is repeatable and non-volatile. High-resolution magnetic vector maps reveal that micromagnetic behaviour is governed by electrically controlled strain and cracks in the film. Our demonstration should inspire others to control the physical/chemical properties in strain-released epitaxial oxide films by using electroactive substrates to impart strain via non-epitaxial interfaces. Key properties of transition metal perovskite oxides are degraded after epitaxial growth on ferroelectric substrates due to lattice-mismatch strain. Here, the authors use epitaxial lift-off and transfer to overcome this problem and demonstrate electric field control of a bulk-like magnetization.
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Andrews JL, Santos DA, Meyyappan M, Williams RS, Banerjee S. Building Brain-Inspired Logic Circuits from Dynamically Switchable Transition-Metal Oxides. TRENDS IN CHEMISTRY 2019. [DOI: 10.1016/j.trechm.2019.07.005] [Citation(s) in RCA: 17] [Impact Index Per Article: 3.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/26/2022]
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Oh C, Jo M, Son J. All-Solid-State Synaptic Transistors with High-Temperature Stability Using Proton Pump Gating of Strongly Correlated Materials. ACS APPLIED MATERIALS & INTERFACES 2019; 11:15733-15740. [PMID: 30968690 DOI: 10.1021/acsami.9b00392] [Citation(s) in RCA: 19] [Impact Index Per Article: 3.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/09/2023]
Abstract
Designing energy-efficient artificial synapses with adaptive and programmable electronic signals is essential to effectively mimic synaptic functions for brain-inspired computing systems. Here, we report all-solid-state three-terminal artificial synapses that exploit proton-doped metal-insulator transition in a correlated oxide NdNiO3 (NNO) channel by proton (H+) injection/extraction in response to gate voltage. Gate voltage reversibly controls the H+ concentration in the NNO channel with facile H+ transport from a H+-containing porous silica electrolyte. Gate-induced H+ intercalation in the NNO gives rise to nonvolatile multilevel analogue states due to H+-induced conductance modulation, accompanied by significant modulation of the out-of-plane lattice parameters. This correlated transistor operated by a proton pump shows synaptic characteristics such as long-term potentiation and depression, with nonvolatile and distinct multilevel conductance switching by a low voltage pulse (≥ 50 mV), with high energy efficiency (∼1 pJ) and tolerance to heat (≤150 °C). These results will guide the development of scalable, thermally-stable solid-state electronic synapses that operate at low voltage.
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Affiliation(s)
- Chadol Oh
- Department of Materials Science and Engineering (MSE) , Pohang University of Science and Technology (POSTECH) , Pohang 37673 , Republic of Korea
| | - Minguk Jo
- Department of Materials Science and Engineering (MSE) , Pohang University of Science and Technology (POSTECH) , Pohang 37673 , Republic of Korea
| | - Junwoo Son
- Department of Materials Science and Engineering (MSE) , Pohang University of Science and Technology (POSTECH) , Pohang 37673 , Republic of Korea
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9
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Giant nonvolatile resistive switching in a Mott oxide and ferroelectric hybrid. Proc Natl Acad Sci U S A 2019; 116:8798-8802. [PMID: 30975746 DOI: 10.1073/pnas.1822138116] [Citation(s) in RCA: 29] [Impact Index Per Article: 5.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/18/2022] Open
Abstract
Controlling the electronic properties of oxides that feature a metal-insulator transition (MIT) is a key requirement for developing a new class of electronics often referred to as "Mottronics." A simple, controllable method to switch the MIT properties in real time is needed for practical applications. Here we report a giant, nonvolatile resistive switching (ΔR/R > 1,000%) and strong modulation of the MIT temperature (ΔTc > 30 K) in a voltage-actuated V2O3/PMN-PT [Pb(Mg,Nb)O3-PbTiO3] heterostructure. This resistive switching is an order of magnitude larger than ever encountered in any other similar systems. The control of the V2O3 electronic properties is achieved using the transfer of switchable ferroelastic strain from the PMN-PT substrate into the epitaxially grown V2O3 film. Strain can reversibly promote/hinder the structural phase transition in the V2O3, thus advancing/suppressing the associated MIT. The giant resistive switching and strong Tc modulation could enable practical implementations of voltage-controlled Mott devices and provide a platform for exploring fundamental electronic properties of V2O3.
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10
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Bisht RS, Daptary GN, Bid A, Raychaudhuri AK. Continuous transition from weakly localized regime to strong localization regime in Nd 0.7La 0.3NiO 3 films. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2019; 31:145603. [PMID: 30734721 DOI: 10.1088/1361-648x/aafdba] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/09/2023]
Abstract
We report an investigation of metal-insulator transition (MIT) using conductivity and magnetoconductance (MC) measurements down to 0.3 K in Nd0.7La0.3NiO3 films grown on crystalline substrates of LaAlO3 (LAO), SrTiO3 (STO), and NdGaO3 (NGO) by pulsed laser deposition. The film grown on LAO experiences a compressive strain and shows metallic behavior with the onset of a weak resistivity upturn below 2 K which is linked to the onset of weak localization contribution. Films grown on STO and NGO show a cross-over from a positive temperature coefficient (PTC) resistance regime to negative temperature coefficient (NTC) resistance regime at definite temperatures. We establish that a cross-over from PTC to NTC on cooling does not necessarily constitute a MIT because the extrapolated conductivity at zero temperature [Formula: see text] though small (<10 S cm-1) is finite, signaling the existence of a bad metallic state and absence of an activated transport. The value of [Formula: see text] for films grown on NGO is reduced by a factor of 40 compared to that for films grown on STO. We show that a combination of certain physical factors makes substituted nickelate (that are known to exhibit first-order Mott type transition), undergo a continuous transition as seen in systems undergoing disorder/composition driven Anderson transition. The MC measurement also supports the above observation and shows that at low temperatures, there exists a positive MC that arises from the quantum interference which co-exists with a spin-related negative MC that becomes progressively stronger as the electrons approach a strongly localized state in the film grown on NGO.
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Affiliation(s)
- Ravindra Singh Bisht
- Department of Condensed Matter Physics and Material Sciences, S.N. Bose National Centre for Basic Sciences, Block JD, Sector III, Salt Lake, Kolkata 700106, India
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Preziosi D, Lopez-Mir L, Li X, Cornelissen T, Lee JH, Trier F, Bouzehouane K, Valencia S, Gloter A, Barthélémy A, Bibes M. Direct Mapping of Phase Separation across the Metal-Insulator Transition of NdNiO 3. NANO LETTERS 2018; 18:2226-2232. [PMID: 29589952 DOI: 10.1021/acs.nanolett.7b04728] [Citation(s) in RCA: 19] [Impact Index Per Article: 3.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/08/2023]
Abstract
Perovskite rare-earth nickelates RNiO3 are prototype correlated oxides displaying a metal-insulator transition (MIT) at a temperature tunable by the ionic radius of the rare-earth R. Although its precise origin remains a debated topic, the MIT can be exploited in various types of applications, notably for resistive switching and neuromorphic computation. So far, the MIT has been mostly studied by macroscopic techniques, and insights into its nanoscale mechanisms were only provided recently by X-ray photoemission electron microscopy through absorption line shifts, used as an indirect proxy to the resistive state. Here, we directly image the local resistance of NdNiO3 thin films across their first-order MIT using conductive-atomic force microscopy. Our resistance maps reveal the nucleation of ∼100-300 nm metallic domains in the insulating state that grow and percolate as temperature increases. We discuss the resistance contrast mechanism, analyze the microscopy and transport data within a percolation model, and propose experiments to harness this mesoscopic electronic texture in devices.
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Affiliation(s)
- Daniele Preziosi
- Unité Mixte de Physique, CNRS, Thales , Université Paris-Sud, Université Paris-Saclay , 91767 Palaiseau , France
| | - Laura Lopez-Mir
- ICMAB-CSIC Campus de la UAB , 08193 Bellaterra, Barcelona , Spain
| | - Xiaoyan Li
- Laboratoire de Physique des Solides Université Paris Sud, CNRS , Bât 510 , 91405 Orsay , France
| | - Tom Cornelissen
- Unité Mixte de Physique, CNRS, Thales , Université Paris-Sud, Université Paris-Saclay , 91767 Palaiseau , France
| | - Jin Hong Lee
- Unité Mixte de Physique, CNRS, Thales , Université Paris-Sud, Université Paris-Saclay , 91767 Palaiseau , France
| | - Felix Trier
- Unité Mixte de Physique, CNRS, Thales , Université Paris-Sud, Université Paris-Saclay , 91767 Palaiseau , France
| | - Karim Bouzehouane
- Unité Mixte de Physique, CNRS, Thales , Université Paris-Sud, Université Paris-Saclay , 91767 Palaiseau , France
| | - Sergio Valencia
- Helmholtz-Zentrum Berlin für Materialien und Energie , Albert-Einstein-Strasse 15 , D-12489 Berlin , Germany
| | - Alexandre Gloter
- Laboratoire de Physique des Solides Université Paris Sud, CNRS , Bât 510 , 91405 Orsay , France
| | - Agnès Barthélémy
- Unité Mixte de Physique, CNRS, Thales , Université Paris-Sud, Université Paris-Saclay , 91767 Palaiseau , France
| | - Manuel Bibes
- Unité Mixte de Physique, CNRS, Thales , Université Paris-Sud, Université Paris-Saclay , 91767 Palaiseau , France
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Heo S, Oh C, Son J, Jang HM. Influence of tensile-strain-induced oxygen deficiency on metal-insulator transitions in NdNiO 3-δ epitaxial thin films. Sci Rep 2017; 7:4681. [PMID: 28680074 PMCID: PMC5498495 DOI: 10.1038/s41598-017-04884-2] [Citation(s) in RCA: 29] [Impact Index Per Article: 4.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/23/2017] [Accepted: 05/22/2017] [Indexed: 12/03/2022] Open
Abstract
We report direct evidence that oxygen vacancies affect the structural and electrical parameters in tensile-strained NdNiO3−δ epitaxial thin films by elaborately adjusting the amount of oxygen deficiency (δ) with changing growth temperature TD. The modulation in tensile strain and TD tended to increase oxygen deficiency (δ) in NdNiO3−δ thin films; this process relieves tensile strain of the thin film by oxygen vacancy incorporation. The oxygen deficiency is directly correlated with unit-cell volume and the metal-insulator transition temperature (TMI), i.e., resulting in the increase of both unit-cell volume and metal-insulator transition temperature as oxygen vacancies are incorporated. Our study suggests that the intrinsic defect sensitively influences both structural and electronic properties, and provides useful knobs for tailoring correlation-induced properties in complex oxides.
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Affiliation(s)
- Seungyang Heo
- Division of Advanced Materials Science (AMS), Pohang University of Science and Technology (POSTECH), Pohang, 790-784, Republic of Korea
| | - Chadol Oh
- Department of Materials Science and Engineering (MSE), Pohang University of Science and Technology (POSTECH), Pohang, 790-784, Republic of Korea
| | - Junwoo Son
- Department of Materials Science and Engineering (MSE), Pohang University of Science and Technology (POSTECH), Pohang, 790-784, Republic of Korea.
| | - Hyun Myung Jang
- Division of Advanced Materials Science (AMS), Pohang University of Science and Technology (POSTECH), Pohang, 790-784, Republic of Korea.,Department of Materials Science and Engineering (MSE), Pohang University of Science and Technology (POSTECH), Pohang, 790-784, Republic of Korea
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Ziss D, Martín-Sánchez J, Lettner T, Halilovic A, Trevisi G, Trotta R, Rastelli A, Stangl J. Comparison of different bonding techniques for efficient strain transfer using piezoelectric actuators. JOURNAL OF APPLIED PHYSICS 2017; 121:135303. [PMID: 28522879 PMCID: PMC5433547 DOI: 10.1063/1.4979859] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/01/2023]
Abstract
In this paper, strain transfer efficiencies from a single crystalline piezoelectric lead magnesium niobate-lead titanate substrate to a GaAs semiconductor membrane bonded on top are investigated using state-of-the-art x-ray diffraction (XRD) techniques and finite-element-method (FEM) simulations. Two different bonding techniques are studied, namely, gold-thermo-compression and polymer-based SU8 bonding. Our results show a much higher strain-transfer for the "soft" SU8 bonding in comparison to the "hard" bonding via gold-thermo-compression. A comparison between the XRD results and FEM simulations allows us to explain this unexpected result with the presence of complex interface structures between the different layers.
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Affiliation(s)
- Dorian Ziss
- Institute of Semiconductor and Solid State Physics, Johannes Kepler University, Altenbergerstraβe 69, Linz 4040, Austria
| | - Javier Martín-Sánchez
- Institute of Semiconductor and Solid State Physics, Johannes Kepler University, Altenbergerstraβe 69, Linz 4040, Austria
| | - Thomas Lettner
- Royal Institute of Technology, KTH, Brinellvägen 8, Stockholm SE-100 44, Sweden
| | - Alma Halilovic
- Institute of Semiconductor and Solid State Physics, Johannes Kepler University, Altenbergerstraβe 69, Linz 4040, Austria
| | - Giovanna Trevisi
- IMEM - CNR Institute, Parco Area delle Scienze 37/a, Parma 43124, Italy
| | - Rinaldo Trotta
- Institute of Semiconductor and Solid State Physics, Johannes Kepler University, Altenbergerstraβe 69, Linz 4040, Austria
| | - Armando Rastelli
- Institute of Semiconductor and Solid State Physics, Johannes Kepler University, Altenbergerstraβe 69, Linz 4040, Austria
| | - Julian Stangl
- Institute of Semiconductor and Solid State Physics, Johannes Kepler University, Altenbergerstraβe 69, Linz 4040, Austria
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