Nanoparticle characterization by means of scanning free grazing emission X-ray fluorescence

Exploring the Depths of Corrosion: A Novel GE-XANES Technique for Investigating Compositionally Complex Alloys

In this study, we propose the use of nondestructive, depth-resolved, element-specific characterization using grazing exit X-ray absorption near-edge structure spectroscopy (GE-XANES) to investigate the corrosion process in compositionally complex alloys (CCAs). By combining grazing exit X-ray fluorescence spectroscopy (GE-XRF) geometry and a pnCCD detector, we provide a scanning-free, nondestructive, depth-resolved analysis in a sub-micrometer depth range, which is especially relevant for layered materials, such as corroded CCAs. Our setup allows for spatial and energy-resolved measurements and directly extracts the desired fluorescence line, free from scattering events and other overlapping lines. We demonstrate the potential of our approach on a compositionally complex CrCoNi alloy and a layered reference sample with known composition and specific layer thickness. Our findings indicate that this new GE-XANES approach has exciting opportunities for studying surface catalysis and corrosion processes in real-world materials.

Traceable Characterization of Nanomaterials by X-ray Spectrometry Using Calibrated Instrumentation

Traceable characterization methods allow for the accurate correlation of the functionality or toxicity of nanomaterials with their underlaying chemical, structural or physical material properties. These correlations are required for the directed development of nanomaterials to reach target functionalities such as conversion efficiencies or selective sensitivities. The reliable characterization of nanomaterials requires techniques that often need to be adapted to the nano-scaled dimensions of the samples with respect to both the spatial dimensions of the probe and the instrumental or experimental discrimination capability. The traceability of analytical methods revealing information on chemical material properties relies on reference materials or qualified calibration samples, the spatial elemental distributions of which must be very similar to the nanomaterial of interest. At the nanoscale, however, only few well-known reference materials exist. An alternate route to establish the required traceability lays in the physical calibration of the analytical instrument’s response behavior and efficiency in conjunction with a good knowledge of the various interaction probabilities. For the elemental analysis, speciation, and coordination of nanomaterials, such a physical traceability can be achieved with X-ray spectrometry. This requires the radiometric calibration of energy- and wavelength-dispersive X-ray spectrometers, as well as the reliable determination of atomic X-ray fundamental parameters using such instrumentation. In different operational configurations, the information depths, discrimination capability, and sensitivity of X-ray spectrometry can be considerably modified while preserving its traceability, allowing for the characterization of surface contamination as well as interfacial thin layer and nanoparticle chemical compositions. Furthermore, time-resolved and hybrid approaches provide access to analytical information under operando conditions or reveal dimensional information, such as elemental or species depth profiles of nanomaterials. The aim of this review is to demonstrate the absolute quantification capabilities of SI-traceable X-ray spectrometry based upon calibrated instrumentation and knowledge about X-ray interaction probabilities.

Toroidal multilayer mirrors for laboratory soft X-ray grazing emission X-ray fluorescence

Efficient soft X-ray spectroscopy in the laboratory is still a challenging task. Here, we report on new toroidal multilayer optics designed and applied with the laser-produced plasma (LPP) source of the Berlin Laboratory for innovative X-ray technologies. The optics are described and characterized, and the application of the updated source to scanning-free grazing emission X-ray fluorescence is demonstrated on thermoelectric gold-doped copper oxide nanofilms. The comparison with synchrotron measurements allows estimating a flux on the sample of approximately 7.5 × 10⁹ photons/s in the 1 keV range on a 100 µm × 100 µm spot, emphasizing the suitability of the updated LPP source for the application in photon hungry experiments.

Characterization of Nanoparticles: Advances

Over the past two decades, the unique properties of engineered nanoparticles (NPs) have placed them at the centre of revolutionary advancements in many sectors of science, technology and commerce. Multi-technique and multi-disciplinary analytical approaches are required to identify, quantify, and characterize the chemical composition, size and size distribution, surface properties and the number and concentration of NPs. In this chapter, an overview of the recent advances in the characterization of NPs will be presented.

Laboratory Setup for Scanning-Free Grazing Emission X-ray Fluorescence

Grazing incidence and grazing emission X-ray fluorescence spectroscopy (GI/GE-XRF) are techniques that enable nondestructive, quantitative analysis of elemental depth profiles with a resolution in the nanometer regime. A laboratory setup for soft X-ray GEXRF measurements is presented. Reasonable measurement times could be achieved by combining a highly brilliant laser produced plasma (LPP) source with a scanning-free GEXRF setup, providing a large solid angle of detection. The detector, a pnCCD, was operated in a single photon counting mode in order to utilize its energy dispersive properties. GEXRF profiles of the Ni-L_α,β line of a nickel-carbon multilayer sample, which displays a lateral (bi)layer thickness gradient, were recorded at several positions. Simulations of theoretical profiles predicted a prominent intensity minimum at grazing emission angles between 5° and 12°, depending strongly on the bilayer thickness of the sample. This information was used to retrieve the bilayer thickness gradient. The results are in good agreement with values obtained by X-ray reflectometry, conventional X-ray fluorescence and transmission electron microscopy measurements and serve as proof-of-principle for the realized GEXRF setup. The presented work demonstrates the potential of nanometer resolved elemental depth profiling in the soft X-ray range with a laboratory source, opening, for example, the possibility of in-line or even in situ process control in semiconductor industry.

A flexible setup for angle-resolved X-ray fluorescence spectrometry with laboratory sources

X-ray fluorescence (XRF) analysis is one of the standard tools for the analysis of stratified materials and is widely applied for the investigation of electronics and coatings. The composition and thickness of the layers can be determined quantitatively and non-destructively. Recent work showed that these capabilities can be extended towards retrieving stratigraphic information like concentration depth profiles using angle-resolved XRF (ARXRF). This paper introduces an experimental sample chamber which was developed as a multi-purpose tool enabling different measurement geometries suited for transmission measurements, conventional XRF, ARXRF, etc. The chamber was specifically designed for attaching all kinds of laboratory X-ray sources for the soft and hard X-ray ranges as well as various detection systems. In detail, a setup for ARXRF using an X-ray tube with a polycapillary X-ray lens as source is presented. For such a type of setup, both the spectral and lateral characterizations of the radiation field are crucial for quantitative ARXRF measurements. The characterization is validated with the help of a stratified validation sample.