Moving graphene devices from lab to market: advanced graphene-coated nanoprobes

Revealing the Interlayer Interaction Forces in 2D Graphene Materials by Graphene-Wrapped Nanoprobe

Understanding the interlayer interaction between 2D layered structures is critical for the construction of various micro- and nanoscale functional devices. However, both the normal and the tangential interlayer interactions between 2D layered materials have rarely been studied simultaneously. In this work, an immersion and lift-up method is proposed to wrap a layer of graphene flakes onto a plasma-pretreated atomic force microscopy (AFM) nanoprobe for the measurements of interaction forces by AFM. The normal interactions (adhesion force and adhesion energy) and tangential interactions (friction force) between two different probes (Pt-coated probe and graphene-wrapped probe) and two different 2D graphene materials [graphene and graphene oxide (GO)] were systematically measured, respectively. The adhesion energies of Pt-GO, Pt-graphene, graphene-GO, and graphene-graphene were measured to be 0.72 ± 0.05, 0.41 ± 0.03, 0.19 ± 0.02, and 0.10 ± 0.02 J m-2, respectively. The graphene-graphene contact pair showed the lowest adhesion force (5.57 ± 1.03 nN) and adhesion energy (0.10 ± 0.02 J m-2), which was attributed to the strong covalent bonds and charge density distribution. The friction coefficients of Pt-GO, graphene-GO, Pt-graphene, and graphene-graphene were determined to be 0.38, 0.14, 0.054, and 0.013. The graphene-graphene tribo-pair exhibited a superlow friction state for a long time, which was attributed to incommensurate contact and weak van der Waals interactions. These findings provide a technical route to reveal the interlayer interactions of various 2D layered materials, which can be widely applied in microelectromechanical systems.

On the quality of commercial chemical vapour deposited hexagonal boron nitride

The semiconductors industry has put its eyes on two-dimensional (2D) materials produced by chemical vapour deposition (CVD) because they can be grown at the wafer level with small thickness fluctuations, which is necessary to build electronic devices and circuits. However, CVD-grown 2D materials can contain significant amounts of lattice distortions, which degrades the performance at the device level and increases device-to-device variability. Here we statistically analyse the quality of commercially available CVD-grown hexagonal boron nitride (h-BN) from the most popular suppliers. h-BN is of strategic importance because it is one of the few insulating 2D materials, and can be used as anti-scattering substrate and gate dielectric. We find that the leakage current and electrical homogeneity of all commercially available CVD h-BN samples are significantly worse than those of mechanically exfoliated h-BN of similar thickness. Moreover, in most cases the properties of the CVD h-BN samples analysed don't match the technical specifications given by the suppliers, and the sample-to-sample variability is unsuitable for the reproducible fabrication of capacitors, transistors or memristors in different batches. In the short term, suppliers should try to provide accurate sample specifications matching the properties of the commercialized materials, and researchers should keep such inaccuracies in mind; and in the middle term suppliers should try to reduce the density of defects to enable the fabrication of high-performance devices with high reliability and reproducibility.

Current-Limited Conductive Atomic Force Microscopy

Conductive atomic force microscopy (CAFM) has become the preferred tool of many companies and academics to analyze the electronic properties of materials and devices at the nanoscale. This technique scans the surface of a sample using an ultrasharp conductive nanoprobe so that the contact area between them is very small (<100 nm2) and it can measure the properties of the sample with a very high lateral resolution. However, measuring relatively low currents (∼1 nA) in such small areas produces high current densities (∼1000 A/cm2), which almost always results in fast nanoprobe degradation. That is not only expensive but also endangers the reliability of the data collected because detecting which data sets are affected by tip degradation can be complex. Here, we show an inexpensive long-sought solution for this problem by using a current limitation system. We test its performance by measuring the tunneling current across a reference ultrathin dielectric when applying ramped voltage stresses at hundreds of randomly selected locations of its surface, and we conclude that the use of a current limitation system increases the lifetime of the tips by a factor of ∼50. Our work contributes to significantly enhance the reliability of one of the most important characterization techniques in the field of nanoelectronics.

Dissipation Mechanisms and Superlubricity in Solid Lubrication by Wet-Transferred Solution-Processed Graphene Flakes: Implications for Micro Electromechanical Devices

Solution-processed few-layer graphene flakes, dispensed to rotating and sliding contacts via liquid dispersions, are gaining increasing attention as friction modifiers to achieve low friction and wear at technologically relevant interfaces. Vanishing friction states, i.e., superlubricity, have been documented for nearly-ideal nanoscale contacts lubricated by individual graphene flakes. However, there is no clear understanding if superlubricity might persist for larger and morphologically disordered contacts, as those typically obtained by incorporating wet-transferred solution-processed flakes into realistic microscale contact junctions. In this study, we address the friction performance of solution-processed graphene flakes by means of colloidal probe atomic force microscopy. We use a state-of-the-art additive-free aqueous dispersion to coat micrometric silica beads, which are then sled under ambient conditions against prototypical material substrates, namely, graphite and the transition metal dichalcogenides (TMDs) MoS₂ and WS₂. High resolution microscopy proves that the random assembly of the wet-transferred flakes over the silica probes results into an inhomogeneous coating, formed by graphene patches that control contact mechanics through tens-of-nanometers tall protrusions. Atomic-scale friction force spectroscopy reveals that dissipation proceeds via stick-slip instabilities. Load-controlled transitions from dissipative stick-slip to superlubric continuous sliding may occur for the graphene-graphite homojunctions, whereas single- and multiple-slips dissipative dynamics characterizes the graphene-TMD heterojunctions. Systematic numerical simulations demonstrate that the thermally activated single-asperity Prandtl-Tomlinson model comprehensively describes friction experiments involving different graphene-coated colloidal probes, material substrates, and sliding regimes. Our work establishes experimental procedures and key concepts that enable mesoscale superlubricity by wet-transferred liquid-processed graphene flakes. Together with the rise of scalable material printing techniques, our findings support the use of such nanomaterials to approach superlubricity in micro electromechanical systems.

Solid Platinum Nanoprobes for Highly Reliable Conductive Atomic Force Microscopy

Conductive atomic force microscopy (CAFM) is a powerful technique to investigate electrical and mechanical properties of materials and devices at the nanoscale. However, its main challenge is the reliability of the probe tips and their interaction with the samples. The most common probe tips used in CAFM studies are made of Si coated with a thin (∼20 nm) film of Pt or Pt-rich alloys (such as Pt/Ir), but this can degrade fast due to high current densities (>10²A/cm²) and mechanical frictions. Si tips coated with doped diamond and solid doped diamond tips are more durable, but they are significantly more expensive and their high stiffness often damages the surface of most samples. One growing alternative is to use solid Pt tips, which have an intermediate price and are expected to be more durable than metal-coated silicon tips. However, a thorough characterization of the performance of solid Pt probes for CAFM research has never been reported. In this article, we characterize the performance of solid Pt probes for nanoelectronics research by performing various types of experiments and compare them to Pt/Ir-coated Si probes. Our results indicate that solid Pt probes exhibit a lateral resolution that is very similar to that of Pt/Ir-coated Si probes but with the big advantage of a much longer lifetime. Moreover, the probe-to-probe deviation of the electrical data collected is small. The use of solid Pt probes can help researchers to enhance the reliability of their CAFM experiments.

High-reliability graphene-wrapped nanoprobes for scanning probe microscopy

The nanoprobe is a powerful tool in scanning probe microscopy (SPM) that is used to explore various fields of nanoscience. However, the tips can wear out very fast due to the low stability of conventional probes, especially after the measurement of high currents or lateral friction, which results in image distortion and test imprecision. Herein, a novel functional nanoprobe is presented using graphene sheets in a high-quality graphene solution wrapped round a plasma-treated conventional Pt-Ir coated nanoprobe, which shows highly stability and resistance to degradation, leading to a significantly increased lifetime. Furthermore, we show that the graphene-wrapped nanoprobes have the advantages of enhanced electrical conductivity and reduced tip-sample friction, compared with Pt-Ir coated nanoprobes. The simplicity and low cost of this method make it valuable to various functional graphene-wrapped nanoprobes and applications.

Adhesion Between MXenes and Other 2D Materials

MXenes, a large family of two-dimensional (2D) early transition metal carbides and nitrides, have excellent electrical and electrochemical properties, which can also be explored in assemblies with other 2D materials, like graphene and transition metal dichalcogenides (TMDs), creating heterostructures with unique properties. Understanding the interaction mechanism between 2D materials is critical for the design and manipulation of these 2D heterostructures. Our previous work investigated the interaction between SiO₂ and two MXenes (Ti₃C₂T_x and Ti₂CT_x). However, no experimental research has been done on MXene interlayer interactions and interactions in MXene heterostructures. Here, we used atomic force microscopy (AFM) with SiO₂ tip and Ti₃C₂T_x and Ti₂CT_x MXene-coated tips, respectively, to measure the adhesion energies of graphene, MoSe₂, Ti₃C₂T_x, and Ti₂CT_x MXene with other 2D materials. The measured adhesion energies show that only the interfaces involving graphene demonstrate dependence on the number of material monolayers in a stack. Comparing 40 interacting pairs of 2D materials, the lowest adhesion energy (∼0.27 J/m²) was found for the interfaces involving MoSe₂ and the highest adhesion energy was observed for the interfaces involving Ti₃C₂T_x (∼1.23 J/m²). The obtained set of experimental data for 2D interfaces involving MXenes provides a basis for a future in-depth understanding of adhesive mechanisms at interfaces between 2D materials, which is an important topic for the design of 2D heterostructures with controlled interfacial strength and properties.

Recent Applications of Advanced Atomic Force Microscopy in Polymer Science: A Review

Atomic force microscopy (AFM) has been extensively used for the nanoscale characterization of polymeric materials. The coupling of AFM with infrared spectroscope (AFM-IR) provides another advantage to the chemical analyses and thus helps to shed light upon the study of polymers. This paper reviews some recent progress in the application of AFM and AFM-IR in polymer science. We describe the principle of AFM-IR and the recent improvements to enhance its resolution. We also discuss the latest progress in the use of AFM-IR as a super-resolution correlated scanned-probe infrared spectroscopy for the chemical characterization of polymer materials dealing with polymer composites, polymer blends, multilayers, and biopolymers. To highlight the advantages of AFM-IR, we report several results in studying the crystallization of both miscible and immiscible blends as well as polymer aging. Finally, we demonstrate how this novel technique can be used to determine phase separation, spherulitic structure, and crystallization mechanisms at nanoscales, which has never been achieved before. The review also discusses future trends in the use of AFM-IR in polymer materials, especially in polymer thin film investigation.

Fabrication of a graphene layer probe to measure force interactions in layered heterojunctions

Layered heterojunctions have been widely used as two-dimensional (2D) semiconductors with unique electronic and optical properties recently. However, the force interactions in layered heterojunctions have been seldom studied. In this study, we propose a simple method to fabricate a graphene layer probe (GLP) to measure the force interactions in layered heterojunctions by atomic force microscope (AFM). The graphene layer probe was formed by attaching a multilayer graphene nanoflake onto a silica microsphere that had been glued to the AFM cantilever under an optical microscope. The frictional, normal, and adhesive forces between the graphene layer probe and four different 2D layered materials (HOPG, h-BN, MoS₂, and WS₂) were measured. Superlubricity was achieved at these layered heterojunctions with friction coefficients varying from 0.0005 (GLP/HOPG) to 0.003 (GLP/WS₂). The variations of friction, adhesion, and van der Waals (vdW) interaction were consistent with the variations of the interlayer shear stress, the surface energy of the composed 2D layered materials, and the Hamaker constant of the heterojunctions, respectively. The good agreement between the measurements and theories confirms that this method is reliable for the fabrication of graphene or other 2D layered material probes and can be widely used for layered heterojunction measurements.

Understanding Current Instabilities in Conductive Atomic Force Microscopy

: Conductive atomic force microscopy (CAFM) is one of the most powerful techniques in studying the electrical properties of various materials at the nanoscale. However, understanding current fluctuations within one study (due to degradation of the probe tips) and from one study to another (due to the use of probe tips with different characteristics), are still two major problems that may drive CAFM researchers to extract wrong conclusions. In this manuscript, these two issues are statistically analyzed by collecting experimental CAFM data and processing them using two different computational models. Our study indicates that: (i) before their complete degradation, CAFM tips show a stable state with degraded conductance, which is difficult to detect and it requires CAFM tip conductivity characterization before and after the CAFM experiments; and (ii) CAFM tips with low spring constants may unavoidably lead to the presence of a ~1.2 nm thick water film at the tip/sample junction, even if the maximum contact force allowed by the setup is applied. These two phenomena can easily drive CAFM users to overestimate the properties of the samples under test (e.g., oxide thickness). Our study can help researchers to better understand the current shifts that were observed during their CAFM experiments, as well as which probe tip to use and how it degrades. Ultimately, this work may contribute to enhancing the reliability of CAFM investigations.

Phase imaging and nanoscale energy dissipation of supported graphene using amplitude modulation atomic force microscopy

We investigate the phase imaging of supported graphene using amplitude modulation atomic force microscopy (AFM), the so-called tapping mode. The phase contrast between graphene and the neighboring substrate grows in hard tapping conditions and the contrast is enhanced compared to the topographic one. Therefore, phase measurements could enable the high-contrast imaging of graphene and related two-dimensional materials and heterostructures, which is not achievable with conventional AFM based topographic measurements. Obtained phase maps are then transformed into energy dissipation maps, which are important for graphene applications in various nano-mechanical systems. From a fundamental point of view, energy dissipation gives further insight into mechanical properties. Reliable measurements, obtained in the repulsive regime, show that the energy dissipation on a graphene-covered substrate is lower than that on a bare one, so graphene provides certain shielding in tip-substrate interaction. Based on the obtained phase curves and their derivatives, as well as on correlation measurements based on AFM nanoindentation and force modulation microscopy, we conclude that the main dissipation channels in graphene-substrate systems are short-range hysteresis and long-range interfacial forces.

Graphene Coated Nanoprobes: A Review

Nanoprobes are one of the most important components in several fields of nanoscience to study materials, molecules and particles. In scanning probe microscopes, the nanoprobes consist on silicon tips coated with thin metallic films to provide additional properties, such as conductivity. However, if the experiments involve high currents or lateral frictions, the initial properties of the tips can wear out very fast. One possible solution is the use of hard coatings, such as diamond, or making the entire tip out of a precious material (platinum or diamond). However, this strategy is more expensive and the diamond coatings can damage the samples. In this context, the use of graphene as a protective coating for nanoprobes has attracted considerable interest. Here we review the main literature in this field, and discuss the fabrication, performance and scalability of nanoprobes.

Enhanced plasmonic nanofocusing of terahertz waves in tapered graphene multilayers

We investigate the plasmonic nanofocusing of terahertz waves in tapered graphene multilayers separated by dielectrics. The nanofocusing effect is significantly enhanced in the graphene multilayer taper compared with that in a single layer graphene taper due to interlayer coupling between surface plasmon polaritons. The results are optimized by choosing an appropriate layer number of graphene and the field amplitude has been enhanced by 620 folds at λ = 50 μm. Additionally, the structure can slow light to a group velocity ~1/2815 of the light speed in vacuum. Our study provides a unique approach to compress terahertz waves into deep subwavelength scale and may find great applications in terahertz nanodevices for imaging, detecting and spectroscopy.