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Number Cited by Other Article(s)
1
Zheng Y, Zhang Z, Liu W, Wu Y, Fu X, Li L, Su J, Gao Y. Investigations on the Electrochemical and Mechanical Properties of Sb2 O3 Nanobelts by In Situ Transmission Electron Microscopy. SMALL METHODS 2022;6:e2101416. [PMID: 35132830 DOI: 10.1002/smtd.202101416] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/14/2021] [Revised: 01/03/2022] [Indexed: 06/14/2023]
2
Gao D, Yang Z, Zheng L, Zheng K. Piezoresistive effect of n-type 〈111〉-oriented Si nanowires under large tension/compression. NANOTECHNOLOGY 2017;28:095702. [PMID: 28120814 DOI: 10.1088/1361-6528/aa56ec] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
3
Zheng K, Zhang Z, Hu Y, Chen P, Lu W, Drennan J, Han X, Zou J. Orientation Dependence of Electromechanical Characteristics of Defect-free InAs Nanowires. NANO LETTERS 2016;16:1787-1793. [PMID: 26837494 DOI: 10.1021/acs.nanolett.5b04842] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/05/2023]
4
Shao R, Gao P, Zheng K. The effect of tensile and bending strain on the electrical properties of p-type 〈110〉 silicon nanowires. NANOTECHNOLOGY 2015;26:265703. [PMID: 26059313 DOI: 10.1088/0957-4484/26/26/265703] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
5
Phan HP, Kozeki T, Dinh T, Fujii T, Qamar A, Zhu Y, Namazu T, Nguyen NT, Dao DV. Piezoresistive effect of p-type silicon nanowires fabricated by a top-down process using FIB implantation and wet etching. RSC Adv 2015. [DOI: 10.1039/c5ra13425k] [Citation(s) in RCA: 34] [Impact Index Per Article: 3.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]  Open
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