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Bielinski AR, Kamphaus EP, Cheng L, Martinson ABF. Resolving the Heat Generated from ZrO 2 Atomic Layer Deposition Surface Reactions. Angew Chem Int Ed Engl 2023:e202301843. [PMID: 37316957 DOI: 10.1002/anie.202301843] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/06/2023] [Indexed: 06/16/2023]
Abstract
In situ pyroelectric calorimetry and spectroscopic ellipsometry were used to investigate surface reactions in atomic layer deposition (ALD) of zirconium oxide (ZrO2 ). Calibrated and time-resolved in situ ALD calorimetry provides new insights into the thermodynamics and kinetics of saturating surface reactions for tetrakis(dimethylamino)zirconium(IV) (TDMAZr) and water. The net ALD reaction heat ranged from 0.197 mJ cm-2 at 76 °C to 0.155 mJ cm-2 at 158 °C, corresponding to an average of 4.0 eV/Zr at all temperatures. A temperature dependence for reaction kinetics was not resolved over the range investigated. The temperature dependence of net reaction heat and distribution among metalorganic and oxygen source exposure is attributed to factors including growth rate, equilibrium surface hydroxylation, and the extent of the reaction. ZrO2 -forming surface reactions were investigated computationally using DFT methods to better understand the influence of surface hydration on reaction thermodynamics.
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Affiliation(s)
- Ashley R Bielinski
- Materials Science Division, Argonne National Laboratory, Lemont, IL-60439, USA
| | - Ethan P Kamphaus
- Materials Science Division, Argonne National Laboratory, Lemont, IL-60439, USA
| | - Lei Cheng
- Materials Science Division, Argonne National Laboratory, Lemont, IL-60439, USA
| | - Alex B F Martinson
- Materials Science Division, Argonne National Laboratory, Lemont, IL-60439, USA
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Jašík J, Valtera S, Vaidulych M, Bunian M, Lei Y, Halder A, Tarábková H, Jindra M, Kavan L, Frank O, Bartling S, Vajda Š. Oxidative dehydrogenation of cyclohexene on atomically precise subnanometer Cu 4-nPd n (0 ≤ n ≤ 4) tetramer clusters: the effect of cluster composition and support on performance. Faraday Discuss 2023; 242:70-93. [PMID: 36214279 DOI: 10.1039/d2fd00108j] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 02/03/2023]
Abstract
The pronounced effects of the composition of four-atom monometallic Cu and Pd and bimetallic CuPd clusters and the support on the catalytic activity and selectivity in the oxidative dehydrogenation of cyclohexene are reported. The ultra-nanocrystalline diamond supported clusters are highly active and dominantly produce benzene; some of the mixed clusters also produce cyclohexadiene, which are all clusters with a much suppressed combustion channel. The also highly active TiO2-supported tetramers solely produce benzene, without any combustion to CO2. The selectivity of the zirconia-supported mixed CuPd clusters and the monometallic Cu cluster is entirely different; though they are less active in comparison to clusters with other supports, these clusters produce significant fractions of cyclohexadiene, with their selectivity towards cyclohexadiene gradually increasing with the increasing number of copper atoms in the cluster, reaching about 50% for Cu3Pd1. The zirconia-supported copper tetramer stands out from among all the other tetramers in this reaction, with a selectivity towards cyclohexadiene of 70%, which far exceeds those of all the other cluster-support combinations. The findings from this study indicate a positive effect of copper on the stability of the mixed tetramers and potential new ways of fine-tuning catalyst performance by controlling the composition of the active site and via cluster-support interactions in complex oxidative reactions under the suppression of the undesired combustion of the feed.
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Affiliation(s)
- Juraj Jašík
- Department of Nanocatalysis, J. Heyrovský Institute of Physical Chemistry v.v.i., Czech Academy of Sciences, Dolejškova 2155/3, 182 23 Prague 8, Czech Republic.
| | - Stanislav Valtera
- Department of Nanocatalysis, J. Heyrovský Institute of Physical Chemistry v.v.i., Czech Academy of Sciences, Dolejškova 2155/3, 182 23 Prague 8, Czech Republic.
| | - Mykhailo Vaidulych
- Department of Nanocatalysis, J. Heyrovský Institute of Physical Chemistry v.v.i., Czech Academy of Sciences, Dolejškova 2155/3, 182 23 Prague 8, Czech Republic.
| | - Muntaseer Bunian
- Department of Chemical and Materials Engineering, The University of Alabama in Huntsville, Huntsville, Alabama 35899, USA
| | - Yu Lei
- Department of Chemical and Materials Engineering, The University of Alabama in Huntsville, Huntsville, Alabama 35899, USA
| | - Avik Halder
- Materials Science Division, Argonne National Laboratory, 9600 South Cass Avenue, Lemont, Illinois 60439, USA
| | - Hana Tarábková
- Department of Electrochemical Materials, J. Heyrovský Institute of Physical Chemistry v.v.i., Czech Academy of Sciences, Dolejškova 2155/3, 182 23 Prague 8, Czech Republic
| | - Martin Jindra
- Department of Electrochemical Materials, J. Heyrovský Institute of Physical Chemistry v.v.i., Czech Academy of Sciences, Dolejškova 2155/3, 182 23 Prague 8, Czech Republic.,Department of Physical Chemistry, University of Chemistry and Technology in Prague, Technická 5, 166 28 Prague, Czech Republic
| | - Ladislav Kavan
- Department of Electrochemical Materials, J. Heyrovský Institute of Physical Chemistry v.v.i., Czech Academy of Sciences, Dolejškova 2155/3, 182 23 Prague 8, Czech Republic
| | - Otakar Frank
- Department of Electrochemical Materials, J. Heyrovský Institute of Physical Chemistry v.v.i., Czech Academy of Sciences, Dolejškova 2155/3, 182 23 Prague 8, Czech Republic
| | - Stephan Bartling
- Leibniz Institute for Catalysis (LIKAT), Albert-Einstein-Strasse 29a, D-18059 Rostock, Germany
| | - Štefan Vajda
- Department of Nanocatalysis, J. Heyrovský Institute of Physical Chemistry v.v.i., Czech Academy of Sciences, Dolejškova 2155/3, 182 23 Prague 8, Czech Republic.
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Shen C, Yin Z, Collins F, Pinna N. Atomic Layer Deposition of Metal Oxides and Chalcogenides for High Performance Transistors. ADVANCED SCIENCE (WEINHEIM, BADEN-WURTTEMBERG, GERMANY) 2022; 9:e2104599. [PMID: 35712776 PMCID: PMC9376853 DOI: 10.1002/advs.202104599] [Citation(s) in RCA: 13] [Impact Index Per Article: 6.5] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 10/15/2021] [Revised: 03/23/2022] [Indexed: 06/15/2023]
Abstract
Atomic layer deposition (ALD) is a deposition technique well-suited to produce high-quality thin film materials at the nanoscale for applications in transistors. This review comprehensively describes the latest developments in ALD of metal oxides (MOs) and chalcogenides with tunable bandgaps, compositions, and nanostructures for the fabrication of high-performance field-effect transistors. By ALD various n-type and p-type MOs, including binary and multinary semiconductors, can be deposited and applied as channel materials, transparent electrodes, or electrode interlayers for improving charge-transport and switching properties of transistors. On the other hand, MO insulators by ALD are applied as dielectrics or protecting/encapsulating layers for enhancing device performance and stability. Metal chalcogenide semiconductors and their heterostructures made by ALD have shown great promise as novel building blocks to fabricate single channel or heterojunction materials in transistors. By correlating the device performance to the structural and chemical properties of the ALD materials, clear structure-property relations can be proposed, which can help to design better-performing transistors. Finally, a brief concluding remark on these ALD materials and devices is presented, with insights into upcoming opportunities and challenges for future electronics and integrated applications.
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Affiliation(s)
- Chengxu Shen
- Institut für Chemie and IRIS Adlershof, Humboldt-Universität zu Berlin, Brook-Taylor-Str. 2, Berlin, 12489, Germany
| | - Zhigang Yin
- Institut für Chemie and IRIS Adlershof, Humboldt-Universität zu Berlin, Brook-Taylor-Str. 2, Berlin, 12489, Germany
- State Key Laboratory of Structural Chemistry, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, 155 Yangqiao West Road, Fuzhou, Fujian, 350002, China
- Fujian Science & Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou, Fujian, 350108, China
| | - Fionn Collins
- Institut für Chemie and IRIS Adlershof, Humboldt-Universität zu Berlin, Brook-Taylor-Str. 2, Berlin, 12489, Germany
| | - Nicola Pinna
- Institut für Chemie and IRIS Adlershof, Humboldt-Universität zu Berlin, Brook-Taylor-Str. 2, Berlin, 12489, Germany
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Zhou J, Tian X, Wang B, Zhang S, Liu Z, Chen W. Application of Low Temperature Atomic Layer Deposition Packaging Technology in OLED and Its Implications for Organic and Perovskite Solar Cell Packaging. ACTA CHIMICA SINICA 2022. [DOI: 10.6023/a21110513] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/24/2022]
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Monne MA, Howlader CQ, Mishra B, Chen MY. Synthesis of Printable Polyvinyl Alcohol for Aerosol Jet and Inkjet Printing Technology. MICROMACHINES 2021; 12:220. [PMID: 33671530 PMCID: PMC7926513 DOI: 10.3390/mi12020220] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 01/20/2021] [Revised: 02/12/2021] [Accepted: 02/12/2021] [Indexed: 11/16/2022]
Abstract
Polyvinyl Alcohol (PVA) is a promising polymer due to its high solubility with water, availability in low molecular weight, having short polymer chain, and cost-effectiveness in processing. Printed technology is gaining popularity to utilize processible solution materials at low/room temperature. This work demonstrates the synthesis of PVA solution for 2.5% w/w, 4.5% w/w, 6.5% w/w, 8.5% w/w and 10.5% w/w aqueous solution was formulated. Then the properties of the ink, such as viscosity, contact angle, surface tension, and printability by inkjet and aerosol jet printing, were investigated. The wettability of the ink was investigated on flexible (Kapton) and non-flexible (Silicon) substrates. Both were identified as suitable substrates for all concentrations of PVA. Additionally, we have shown aerosol jet printing (AJP) and inkjet printing (IJP) can produce multi-layer PVA structures. Finally, we have demonstrated the use of PVA as sacrificial material for micro-electro-mechanical-system (MEMS) device fabrication. The dielectric constant of printed PVA is 168 at 100 kHz, which shows an excellent candidate material for printed or traditional transistor fabrication.
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Affiliation(s)
- Mahmuda Akter Monne
- Materials Science, Engineering, and Commercialization Program, Texas State University, San Marcos, TX 78666, USA; (M.A.M.); (C.Q.H.); (B.M.)
| | - Chandan Qumar Howlader
- Materials Science, Engineering, and Commercialization Program, Texas State University, San Marcos, TX 78666, USA; (M.A.M.); (C.Q.H.); (B.M.)
| | - Bhagyashree Mishra
- Materials Science, Engineering, and Commercialization Program, Texas State University, San Marcos, TX 78666, USA; (M.A.M.); (C.Q.H.); (B.M.)
| | - Maggie Yihong Chen
- Materials Science, Engineering, and Commercialization Program, Texas State University, San Marcos, TX 78666, USA; (M.A.M.); (C.Q.H.); (B.M.)
- Ingram School of Engineering, Texas State University, San Marcos, TX 78666, USA
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Monne MA, Grubb PM, Stern H, Subbaraman H, Chen RT, Chen MY. Inkjet-Printed Graphene-Based 1 × 2 Phased Array Antenna. MICROMACHINES 2020; 11:E863. [PMID: 32961862 PMCID: PMC7570259 DOI: 10.3390/mi11090863] [Citation(s) in RCA: 9] [Impact Index Per Article: 2.3] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 08/18/2020] [Revised: 09/15/2020] [Accepted: 09/17/2020] [Indexed: 11/16/2022]
Abstract
Low-cost and conformal phased array antennas (PAAs) on flexible substrates are of particular interest in many applications. The major deterrents to developing flexible PAA systems are the difficulty in integrating antenna and electronics circuits on the flexible surface, as well as the bendability and oxidation rate of radiating elements and electronics circuits. In this research, graphene ink was developed from graphene flakes and used to inkjet print the radiating element and the active channel of field effect transistors (FETs). Bending and oxidation tests were carried out to validate the application of printed flexible graphene thin films in flexible electronics. An inkjet-printed graphene-based 1 × 2 element phased array antenna was designed and fabricated. Graphene-based field effect transistors were used as switches in the true-time delay line of the phased array antenna. The graphene phased array antenna was 100% inkjet printed on top of a 5 mil flexible Kapton® substrate, at room temperature. Four possible azimuth steering angles were designed for -26.7°, 0°, 13°, and 42.4°. Measured far-field patterns show good agreement with simulation results.
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Affiliation(s)
- Mahmuda Akter Monne
- Materials Science Engineering and Commercialization, Texas State University, San Marcos, TX 78666-4684, USA;
| | - Peter Mack Grubb
- Department of Electrical and Computer Engineering, University of Texas at Austin, Austin, TX 78712-1589, USA; (P.M.G.); (R.T.C.)
| | - Harold Stern
- Ingram School of Engineering, Texas State University, San Marcos, TX 78666-4684, USA;
| | - Harish Subbaraman
- Department of Electrical and Computer Engineering, Boise State University, Boise, ID 83725-0001, USA;
| | - Ray T. Chen
- Department of Electrical and Computer Engineering, University of Texas at Austin, Austin, TX 78712-1589, USA; (P.M.G.); (R.T.C.)
| | - Maggie Yihong Chen
- Materials Science Engineering and Commercialization, Texas State University, San Marcos, TX 78666-4684, USA;
- Ingram School of Engineering, Texas State University, San Marcos, TX 78666-4684, USA;
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Chen G, Weng Y, Sun F, Zhou X, Wu C, Yan Q, Guo T, Zhang Y. Low-temperature atomic layer deposition of Al 2O 3/alucone nanolaminates for OLED encapsulation. RSC Adv 2019; 9:20884-20891. [PMID: 35515527 PMCID: PMC9065804 DOI: 10.1039/c9ra02111f] [Citation(s) in RCA: 24] [Impact Index Per Article: 4.8] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/19/2019] [Accepted: 06/27/2019] [Indexed: 01/30/2023] Open
Abstract
Thin film encapsulation (TFE) is one of the key problems that hinders the lifetime and widespread commercialization of flexible organic light-emitting diodes (OLEDs). In this work, TFE of OLEDs with Al2O3/alucone laminates grown by atomic layer deposition (ALD) and molecular layer deposition (MLD) as moisture barriers were demonstrated. The barrier performances of Al2O3/alucone laminates with respect to the individual layer thickness and the number of dyads were investigated. It was found that alucone with suitable layer thickness could reduce the permeation to the defect zones of the inorganic layer by prolonging the permeation pathway, sequentially improving the moisture barrier performance. The water vapor transmission rate (WVTR) could be further lowered with increasing the number of dyads of the laminates, the WVTR value reached 1.44 × 10-4 g per m2 per day for laminates with 5.5 dyads. These laminates were incorporated in OLEDs with pixel define layer (PDL), and were found to be able to evidently prolong the lifetime of the OLED.
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Affiliation(s)
- Guixiong Chen
- College of Physics and Information Engineering, Fuzhou University Fuzhou 350002 People's Republic of China
| | - Yalian Weng
- College of Physics and Information Engineering, Fuzhou University Fuzhou 350002 People's Republic of China
| | - Fan Sun
- College of Physics and Information Engineering, Fuzhou University Fuzhou 350002 People's Republic of China
| | - Xiongtu Zhou
- College of Physics and Information Engineering, Fuzhou University Fuzhou 350002 People's Republic of China
| | - Chaoxing Wu
- College of Physics and Information Engineering, Fuzhou University Fuzhou 350002 People's Republic of China
| | - Qun Yan
- College of Physics and Information Engineering, Fuzhou University Fuzhou 350002 People's Republic of China
| | - Tailiang Guo
- College of Physics and Information Engineering, Fuzhou University Fuzhou 350002 People's Republic of China
| | - Yongai Zhang
- College of Physics and Information Engineering, Fuzhou University Fuzhou 350002 People's Republic of China
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