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Zhou Y, Zhang H, Li Z, Huang S, Du J, Han A, Shi J, Wang G, Shi Q, Zhao W, Fu H, Fan B, Meng F, Liu W, Liu Z, Zhang L. Heavy Boron-Doped Silicon Tunneling Inter-layer Enables Efficient Silicon Heterojunction Solar Cells. ACS APPLIED MATERIALS & INTERFACES 2024; 16:46889-46896. [PMID: 39169801 DOI: 10.1021/acsami.4c07897] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 08/23/2024]
Abstract
P-type hydrogenated nanocrystalline silicon (nc-Si:H) has been used as a hole-selective layer for efficient n-type crystalline silicon heterojunction (SHJ) solar cells. However, the presence of an additional valence band offset at the interface between intrinsic amorphous hydrogenated silicon and p-type nc-Si:H films will limit the hole carrier transportation. In this work, it has been found that when a heavily boron-doped silicon oxide layer deposited with high hydrogen dilution to silane (pB) was inserted into their interface, the fill factor of SHJ solar cells increases 3% absolutely because of the reduced valence band offset and the increased opportunity to provide a hopping tunnel assisted by the doping energy level and valence band tail states. Furthermore, the additional boron incorporation in intrinsic amorphous silicon adjacent to pB helps to enhance the built-in electric field, thus increasing the hole selectivity. By these means, the power conversion efficiency was improved from 23.9% to approximately 25%.
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Affiliation(s)
- Yinuo Zhou
- Research Center for New Energy Technology, State Key Laboratory of Materials for Integrated Circuits, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Changning, Shanghai 200050, China
- Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Shijingshan, Beijing 100049, China
| | - Honghua Zhang
- Research Center for New Energy Technology, State Key Laboratory of Materials for Integrated Circuits, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Changning, Shanghai 200050, China
- Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Shijingshan, Beijing 100049, China
| | - Zhenfei Li
- Research Center for New Energy Technology, State Key Laboratory of Materials for Integrated Circuits, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Changning, Shanghai 200050, China
| | - Shenglei Huang
- Research Center for New Energy Technology, State Key Laboratory of Materials for Integrated Circuits, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Changning, Shanghai 200050, China
- School of Physical Science and Technology, ShanghaiTech University, Shanghai 201210, China
| | - Junlin Du
- Research Center for New Energy Technology, State Key Laboratory of Materials for Integrated Circuits, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Changning, Shanghai 200050, China
| | - Anjun Han
- Research Center for New Energy Technology, State Key Laboratory of Materials for Integrated Circuits, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Changning, Shanghai 200050, China
| | - Jianhua Shi
- Research Center for New Energy Technology, State Key Laboratory of Materials for Integrated Circuits, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Changning, Shanghai 200050, China
| | - Guangyuan Wang
- Research Center for New Energy Technology, State Key Laboratory of Materials for Integrated Circuits, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Changning, Shanghai 200050, China
| | - Qiang Shi
- Research Center for New Energy Technology, State Key Laboratory of Materials for Integrated Circuits, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Changning, Shanghai 200050, China
| | - Wenjie Zhao
- Research Center for New Energy Technology, State Key Laboratory of Materials for Integrated Circuits, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Changning, Shanghai 200050, China
| | - Haoxin Fu
- Tongwei New Energy (Chengdu) Company, Ltd., Chengdu, Sichuan 610200, China
| | - Bin Fan
- Tongwei New Energy (Chengdu) Company, Ltd., Chengdu, Sichuan 610200, China
| | - Fanying Meng
- Research Center for New Energy Technology, State Key Laboratory of Materials for Integrated Circuits, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Changning, Shanghai 200050, China
- Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Shijingshan, Beijing 100049, China
| | - Wenzhu Liu
- Research Center for New Energy Technology, State Key Laboratory of Materials for Integrated Circuits, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Changning, Shanghai 200050, China
- Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Shijingshan, Beijing 100049, China
| | - Zhengxin Liu
- Research Center for New Energy Technology, State Key Laboratory of Materials for Integrated Circuits, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Changning, Shanghai 200050, China
- Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Shijingshan, Beijing 100049, China
- School of Physical Science and Technology, ShanghaiTech University, Shanghai 201210, China
| | - Liping Zhang
- Research Center for New Energy Technology, State Key Laboratory of Materials for Integrated Circuits, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Changning, Shanghai 200050, China
- Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Shijingshan, Beijing 100049, China
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Gill VK, Juneja S, Dixit SK, Vashist S, Kumar S. Structural and optical properties of phosphorous doped nanocrystalline silicon deposited using a VHF PECVD process for silicon heterojunction solar cells and optimization of a simple p-n junction cell using SCAP-1D tool. RSC Adv 2024; 14:23873-23885. [PMID: 39081655 PMCID: PMC11287241 DOI: 10.1039/d4ra02429j] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/30/2024] [Accepted: 07/22/2024] [Indexed: 08/02/2024] Open
Abstract
Initially hydrogenated silicon (Si:H) thin films have been deposited using a plasma-enhanced chemical vapor deposition technique (PECVD) using silane (SiH4) as a precursor gas diluted in an inert gas argon (Ar) environment. Subsequently phosphine gas (PH3) was used as the n-type dopant and the deposition was carried out at a fixed substrate temperature of 200 °C. The PH3 flow rate was varied in the range of 0-1 sccm. The effect of PH3 flow rates on optical, electrical, and structural properties of hydrogenated amorphous and micro/nanocrystalline silicon films has been investigated and detailed analysis is presented. These films may find application in heterojunction solar cells as an emitter layer. Further, a crystalline silicon (c-Si) based simple p-n junction solar cell is simulated using an SCAP-1D tool to observe the effect of layer thickness and doping density on solar cell parameters.
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Affiliation(s)
- Vijay Kumar Gill
- Department of Electronics and Communication Engineering, Manav Rachna University Aravalli Hills Faridabad Haryana - 121004 India
| | - Sucheta Juneja
- CSIR Network of Institutes for Solar Energy, CSIR - National Physical Laboratory Dr K. S. Krishnan Marg New Delhi 110012 India
| | - Shiv Kumar Dixit
- Department of Electronics and Communication Engineering, Manav Rachna University Aravalli Hills Faridabad Haryana - 121004 India
| | - Shruti Vashist
- Department of Electronics and Communication Engineering, Manav Rachna University Aravalli Hills Faridabad Haryana - 121004 India
| | - Sushil Kumar
- CSIR Network of Institutes for Solar Energy, CSIR - National Physical Laboratory Dr K. S. Krishnan Marg New Delhi 110012 India
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Kosarev IV, Kistanov AA. Carrier transport in bulk and two-dimensional Zn 2(V,Nb,Ta)N 3 ternary nitrides. NANOSCALE 2024; 16:10030-10037. [PMID: 38711346 DOI: 10.1039/d4nr01292e] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/08/2024]
Abstract
Density functional theory-based simulations are applied to study the electronic structures, carrier masses, carrier mobility and carrier relaxation times in bulk and two-dimensional (2D) Zn2(V,Nb,Ta)N3 ternary nitrides. Bulk Zn2(V,Nb,Ta)N3 possess moderate band gap sizes of 2.17 eV, 3.11 eV, and 3.40 eV, respectively. Two-dimensional Zn2(V,Nb,Ta)N3 have slightly higher band gap sizes of 2.77 eV, 3.33 eV, and 3.23 eV, respectively. Carrier mass, carrier mobility and carrier relaxation time are found to be anisotropic in all the studied structures. Bulk and 2D samples show an order of magnitude higher electron mobility compared to hole mobility. The highest electron mobility in bulk Zn2NbN3 and Zn2TaN3 is about ∼103 cm2 V-1 s-1. Importantly, for 2D Zn2NbN3, an abnormally high electron mobility of 1.67 × 104 cm2 V-1 s-1 is observed, which is not inferior to the highest known electron mobility values in 2D materials. Such a high electron mobility in 2D Zn2NbN3 can be attributed to a strong delocalization of the conduction band minimum, which is responsible for electron transport. Therefore, this work opens up new materials for high performance nanodevices, such as tandem solar cells and field-effect transistors. This study also provides deep physical insights into the nature of carrier transport mechanisms in bulk and 2D Zn2(V,Nb,Ta)N3 ternary nitrides.
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Affiliation(s)
- Igor V Kosarev
- The Laboratory of Metals and Alloys Under Extreme Impacts, Ufa University of Science and Technology, Ufa 450076, Russia.
| | - Andrey A Kistanov
- The Laboratory of Metals and Alloys Under Extreme Impacts, Ufa University of Science and Technology, Ufa 450076, Russia.
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Bhattacharya S, Pandey A, Alam S, Komarala VK. Development of high conducting phosphorous doped nanocrystalline thin silicon films for silicon heterojunction solar cells application. NANOTECHNOLOGY 2024; 35:325701. [PMID: 38710179 DOI: 10.1088/1361-6528/ad47cb] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/01/2024] [Accepted: 05/06/2024] [Indexed: 05/08/2024]
Abstract
We have investigated the plasma-enhanced chemical vapor deposition growth of the phosphorus-doped hydrogenated nanocrystalline silicon (n-nc-Si:H) film as an electron-selective layer in silicon heterojunction (SHJ) solar cells. The effect of power densities on the precursor gas dissociation are investigated using optical emission spectra and the crystalline fraction in n-nc-Si:H films are correlated with the dark conductivity. With thePdof 122 mW cm-2and ∼2% phosphorus doping, we observed Raman crystallinity of 53%, high dark conductivity of 43 S cm-1, and activation energy of ∼23 meV from the ∼30 nm n-nc-Si:H film. The n-nc-Si:H layer improves the textured c-Si surface passivation by two-fold to ∼2 ms compared to the phosphorus-doped hydrogenated amorphous silicon (n-a-Si:H) layers. An enhancement in the open-circuit voltage and external quantum efficiency (from >650 nm) due to the better passivation at the rear side of the cell after integrating the n-nc-Si:H layer compared to its n-a-Si:H counterpart. An improvement in the charge carrier transport is also observed with an increase in fill factor from ∼71% to ∼75%, mainly due to a reduction in electron-selective contact resistivity from ∼271 to ∼61 mΩ-cm2. Finally, with the relatively better c-Si surface passivation and carrier selectivity, a power conversion efficiency of ∼19.90% and pseudo-efficiency of ∼21.90% have been realized from the SHJ cells.
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Affiliation(s)
- Shrestha Bhattacharya
- Solar Photovoltaics Laboratory, Department of Energy Science and Engineering, Indian Institute of Technology Delhi, New Delhi-110 016, India
| | - Ashutosh Pandey
- Solar Photovoltaics Laboratory, Department of Energy Science and Engineering, Indian Institute of Technology Delhi, New Delhi-110 016, India
| | - Shahnawaz Alam
- Solar Photovoltaics Laboratory, Department of Energy Science and Engineering, Indian Institute of Technology Delhi, New Delhi-110 016, India
| | - Vamsi Krishna Komarala
- Solar Photovoltaics Laboratory, Department of Energy Science and Engineering, Indian Institute of Technology Delhi, New Delhi-110 016, India
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Bernal-Díaz A, Hernández-Gordillo A, Alonso JC, Rodil SE, Bizarro M. Strong thickness dependence in thin film photocatalytic heterojunctions: the ZnO-Bi 2O 3 case study. Dalton Trans 2024; 53:7081-7092. [PMID: 38567490 DOI: 10.1039/d4dt00697f] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 04/04/2024]
Abstract
Semiconductor heterojunctions are an effective way to achieve efficient photocatalysts, as they can provide an adequate redox potential with visible light excitation. Several works have reported synergistic effects with nanoparticle semiconductor materials. The question is still open for thin film heterojunctions formed by stacked layers, as photocatalysis is considered a surface phenomenon. To investigate if the internal layer really affects or modifies the photocatalytic properties of the external material, we analyze the thin film heterojunction with ZnO and Bi2O3 semiconductors deposited by spray pyrolysis in two configurations: substrate/ZnO/Bi2O3 and substrate/Bi2O3/ZnO. Microstructural analysis was performed to verify the formation of the physical junction of the materials and discard new ternary phases. The photocatalytic activity was analyzed as a function of the thickness of the layers under blue light irradiation. We determined the conduction and valence bands positions, the carrier concentrations, mobilities, Fermi levels, etc. that allowed us to distinguish two reaction mechanisms depending on the configuration. There is a strong compromise between the order and thickness of the layers with the photocatalytic activity. The internal electric field produced in the interface defines the route of the photogenerated charges, and therefore the photocatalytic response. Thus, well-designed thin film heterojunctions can indeed improve the photocatalytic activity of the surface layer.
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Affiliation(s)
- Alberto Bernal-Díaz
- Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México, Circuito Exterior S/N, Cd. Universitaria, Coyoacán, Mexico City, 04510, Mexico.
| | - Agileo Hernández-Gordillo
- Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México, Circuito Exterior S/N, Cd. Universitaria, Coyoacán, Mexico City, 04510, Mexico.
| | - Juan Carlos Alonso
- Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México, Circuito Exterior S/N, Cd. Universitaria, Coyoacán, Mexico City, 04510, Mexico.
| | - Sandra E Rodil
- Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México, Circuito Exterior S/N, Cd. Universitaria, Coyoacán, Mexico City, 04510, Mexico.
| | - Monserrat Bizarro
- Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México, Circuito Exterior S/N, Cd. Universitaria, Coyoacán, Mexico City, 04510, Mexico.
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Shi C, Shi J, Guan Z, Ge J. Surface Cleaning and Passivation Technologies for the Fabrication of High-Efficiency Silicon Heterojunction Solar Cells. MATERIALS (BASEL, SWITZERLAND) 2023; 16:3144. [PMID: 37109980 PMCID: PMC10145110 DOI: 10.3390/ma16083144] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 03/18/2023] [Revised: 04/06/2023] [Accepted: 04/14/2023] [Indexed: 06/19/2023]
Abstract
Silicon heterojunction (SHJ) solar cells are increasingly attracting attention due to their low-temperature processing, lean steps, significant temperature coefficient, and their high bifacial capability. The high efficiency and thin wafer nature of SHJ solar cells make them ideal for use as high-efficiency solar cells. However, the complicated nature of the passivation layer and prior cleaning render a well-passivated surface difficult to achieve. In this study, developments and the classification of surface defect removal and passivation technologies are explored. Further, surface cleaning and passivation technologies of high-efficiency SHJ solar cells within the last five years are reviewed and summarized.
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Affiliation(s)
| | | | | | - Jia Ge
- Correspondence: (Z.G.); (J.G.)
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Zahid MA, Khokhar MQ, Kim Y, Yi J. Utilization of CaF
2
/ITO Double‐Layer Anti‐Reflective Coating for Increasing the Efficiency in Rear Emitter SHJ Solar Cells. CRYSTAL RESEARCH AND TECHNOLOGY 2022. [DOI: 10.1002/crat.202100233] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
Affiliation(s)
- Muhammad Aleem Zahid
- Department of Electrical and Computer Engineering Sungkyunkwan University Suwon Gyeonggi‐Do 16419 South Korea
| | - Muhammad Quddamah Khokhar
- Department of Electrical and Computer Engineering Sungkyunkwan University Suwon Gyeonggi‐Do 16419 South Korea
| | - Youngkuk Kim
- Department of Electrical and Computer Engineering Sungkyunkwan University Suwon Gyeonggi‐Do 16419 South Korea
| | - Junsin Yi
- Department of Electrical and Computer Engineering Sungkyunkwan University Suwon Gyeonggi‐Do 16419 South Korea
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Garcia-Barrientos A, Bernal-Ponce JL, Plaza-Castillo J, Cuevas-Salgado A, Medina-Flores A, Garcia-Monterrosas MS, Torres-Jacome A. Analysis, Synthesis and Characterization of Thin Films of a-Si:H (n-type and p-type) Deposited by PECVD for Solar Cell Applications. MATERIALS (BASEL, SWITZERLAND) 2021; 14:6349. [PMID: 34771875 PMCID: PMC8585228 DOI: 10.3390/ma14216349] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 09/07/2021] [Revised: 10/13/2021] [Accepted: 10/21/2021] [Indexed: 11/18/2022]
Abstract
In this paper, the analysis, synthesis and characterization of thin films of a-Si:H deposited by PECVD were carried out. Three types of films were deposited: In the first series (00 process), an intrinsic a-Si:H film was doped. In the second series (A1-A5 process), n-type samples were doped, and to carry this out, a gas mixture of silane (SiH4), dihydrogen (H2) and phosphine (PH3) was used. In the third series (B1-B5 process), p-type samples were doped using a mixture of silane (SiH4), dihydrogen (H2) and diborane (B2H6). The films' surface morphology was characterized by atomic force microscopy (AFM), while the analysis of the films was performed by scanning electron microscopy (SEM), and UV-visible ellipsometry was used to obtain the optical band gap and film thickness. According to the results of the present study, it can be concluded that the best conditions can be obtained when the flow of dopant gases (phosphine or diborane) increases, as seen in the conductivity graphs, where the films with the highest flow of dopant gas reached the highest conductivities compared to the minimum required for materials made of a-Si:H silicon for high-quality solar cells. It can be concluded from the results that the magnitude of the conductivity, which increased by several orders, represents an important result, since we could improve the efficiency of solar cells based on a-Si:H.
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Affiliation(s)
- Abel Garcia-Barrientos
- Facultad de Ciencias, Universidad Autónoma de San Luis Potosi, San Luis Potosi 78295, Mexico
| | - Jose Luis Bernal-Ponce
- Departamento de Ingeniería Mecánica, Instituto Tecnológico de Orizaba, Orizaba 94300, Mexico; (J.L.B.-P.); (M.S.G.-M.)
| | - Jairo Plaza-Castillo
- Facultad de Ciencias Básicas, Universidad del Atlántico, Barranquilla 081001, Colombia;
| | - Alberto Cuevas-Salgado
- Departamento de Ingeniería Mecánica, Instituto Tecnológico de Tlalnepantla, Tlalnepantla de Baz 54070, Mexico;
| | - Ariosto Medina-Flores
- Instituto de Investigación en Metalurgia y Materiales, Universidad Michoacana de San Nicolás de Hidalgo, Morelia 58030, Mexico;
| | | | - Alfonso Torres-Jacome
- Departamento de Electrónica, Instituto Nacional de Astrofísica, Óptica y Electrónica (INAOE), Tonantzintla 72840, Mexico;
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