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For: Feng P, Zhang D, Zhang P, Wang Y, Gan Y. Nanoscale characterization of the heterogeneous interfacial oxidation layer of graphene/Cu based on a SEM electron beam induced reduction effect. Phys Chem Chem Phys 2023;25:8816-8825. [PMID: 36916298 DOI: 10.1039/d2cp05809j] [Citation(s) in RCA: 2] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 03/05/2023]
Number Cited by Other Article(s)
1
Huang L, Gan Y. A review on SEM imaging of graphene layers. Micron 2024;187:103716. [PMID: 39276729 DOI: 10.1016/j.micron.2024.103716] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/29/2024] [Revised: 09/03/2024] [Accepted: 09/06/2024] [Indexed: 09/17/2024]
2
Feng P, Zhang D, Zhang G, Li C, Wang Y, Chen G, Gan Y. SEM Electron-Beam-Induced Ultrathin Carbon Deposition Layer on Cu Substrate: Improved Dry Oxidation Protection Performance than CVD Single Layer Graphene. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2024;20:e2309285. [PMID: 38402441 DOI: 10.1002/smll.202309285] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/13/2023] [Revised: 01/14/2024] [Indexed: 02/26/2024]
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