Resolving the backbone tilt of crystalline poly(3-hexylthiophene) with resonant tender X-ray diffraction

Flatfielding of hybrid pixel detectors in tender x-ray scattering

The ability of the soft matter interfaces beamline at National Synchrotron Light Source II to access x-ray energy in the tender x-ray regime, i.e., from 2.1 to 5 keV, enables new resonant x-ray scattering studies at the sulfur K-edge and others. We present a new approach to correct data acquired in the tender x-ray regime with a Pilatus3 detector in order to improve the data quality and to correct the various artifacts inherent to hybrid pixel detectors, such as variations in modules' efficiency or noisy detector module junctions. This new flatfielding significantly enhances the data quality and enables detection of weak scattering signals.