Alternative configuration scheme for signal amplification with scanning ion conductance microscopy

Scanning ion conductance microscope with a capacitance-compensated current source amplifier

A high-speed imaging method for a scanning ion conductance microscope (SICM) based on a current source amplifier that compensates for unavoidable capacitance is proposed. The capacitance is generated on a side wall of a nanopipette in the principle of the SICM. The electrical response time is deteriorated due to the capacitance, and the probe overshoots the setpoint of the detection of the sample surface. A capacitance compensation circuit was installed in a feedback circuit of the current source amplifier. The proposed capacitance compensation method is useful because it can shorten the imaging time by only installing the compensation circuit in the ion current detection circuit of an existing SICM. The maximum approaching speeds with and without capacitance compensation were found to be 1050 and 450 µm/s, respectively. The approaching speed with capacitance compensation was 2.3 times faster than that without capacitance compensation. A topographic image of the test sample was successfully obtained at an approaching speed of 1050 µm/s. The images of microvillus dynamics of COS-7 cells were obtained at ∼23.4 s/frame as an application of the developed technology.

Noncontact Nanoscale Imaging of Cells

The reduction in ion current as a fine pipette approaches a cell surface allows the cell surface topography to be imaged, with nanoscale resolution, without contact with the delicate cell surface. A variety of different methods have been developed and refined to scan the topography of the dynamic cell surface at high resolution and speed. Measurement of cell topography can be complemented by performing local probing or mapping of the cell surface using the same pipette. This can be done by performing single-channel recording, applying force, delivering agonists, using pipettes fabricated to contain an electrochemical probe, or combining with fluorescence imaging. These methods in combination have great potential to image and map the surface of live cells at the nanoscale.

Development of high-speed ion conductance microscopy

Scanning ion conductance microscopy (SICM) can image the surface topography of specimens in ionic solutions without mechanical probe-sample contact. This unique capability is advantageous for imaging fragile biological samples but its highest possible imaging rate is far lower than the level desired in biological studies. Here, we present the development of high-speed SICM. The fast imaging capability is attained by a fast Z-scanner with active vibration control and pipette probes with enhanced ion conductance. By the former, the delay of probe Z-positioning is minimized to sub-10 µs, while its maximum stroke is secured at 6 μm. The enhanced ion conductance lowers a noise floor in ion current detection, increasing the detection bandwidth up to 100 kHz. Thus, temporal resolution 100-fold higher than that of conventional systems is achieved, together with spatial resolution around 20 nm.