Coherent bremsstrahlung from kilovolt electrons in zone axis orientations

Transverse recoil imprinted on free-electron radiation

Phenomena of free-electron X-ray radiation are treated almost exclusively with classical electrodynamics, despite the intrinsic interaction being that of quantum electrodynamics. The lack of quantumness arises from the vast disparity between the electron energy and the much smaller photon energy, resulting in a small cross-section that makes quantum effects negligible. Here we identify a fundamentally distinct phenomenon of electron radiation that bypasses this energy disparity, and thus displays extremely strong quantum features. This phenomenon arises when free-electron transverse scattering occurs during the radiation process, creating entanglement between each transversely recoiled electron and the photons it emitted. This phenomenon profoundly modifies the characteristics of free-electron radiation mediated by crystals, compared to conventional classical analysis and even previous quantum analysis. We also analyze conditions to detect this phenomenon using low-emittance electron beams and high-resolution X-ray spectrometers. These quantum radiation features could guide the development of compact coherent X-ray sources facilitated by nanophotonics and quantum optics.

espm: A Python library for the simulation of STEM-EDXS datasets

We present two open-source Python packages: "electron spectro-microscopy" (espm) and "electron microscopy tables" (emtables). The espm software enables the simulation of scanning transmission electron microscopy energy-dispersive X-ray spectroscopy datacubes, based on user-defined chemical compositions and spatial abundance maps of constituent phases. The simulation process uses X-ray emission cross-sections generated via state-of-the-art calculations made with emtables. These tables are designed to be easily modifiable, either manually or using espm. The simulation framework is designed to test the application of decomposition algorithms for the analysis of STEM-EDX spectrum images with access to a known ground truth. We validate our approach using the case of a complex geology-related sample, comparing raw simulated and experimental datasets and the outputs of their non-negative matrix factorization. In addition to testing machine learning algorithms, our packages will also help experimental design, for instance, predicting dataset characteristics or establishing minimum counts needed to measure nanoscale features.

A brief peek at the cyclotron in our microscope

The influence of low energy bremsstrahlung emission on the performance of electron spectrometers and monochromators is investigated. Despite the occurrence of multi-photon events, the effect of the main azimuthal (organ pipe) mode is likely to be negligible. Potentially more serious is a new radial mode not considered in the classical theory but revealed in the quantum mechanics picture. The progress of the finely focused wave at the spectrometer entrance slit is described by a coherent wave packet of many oscillator states. It is shielded from disruption by a relatively much longer half-life. Cavity effects causing additional suppression of bremsstrahlung emission are briefly discussed.

Parametric x-ray radiation and coherent bremsstrahlung from nonrelativistic electrons in crystals

A theoretical analysis of radiation spectra produced during the coherent interaction of nonrelativistic electrons with crystals has been carried out. The output intensity has been found to be the result of interference between two distinguishable phenomena, coherent Bremsstrahlung and parametric x-ray radiation. The latter is determined by a coherent summation of transition radiation from electrons interacting with successive crystallographic planes. The interference is shown to be considerable for the case of nonrelativistic electrons, and so allows us to describe quantitatively the experiments of Korobochko et al. (Zh. Eksp. Teor. Fiz. 48, 1248 (1965) [Sov. Phys. JETP 21, 834 (1965)]) and Reese et al. [Philos. Mag. A 49, 697 (1984)]. The conditions for possible application of coherent x-ray radiation, a comparison with synchrotron radiation, and the requirements for experimental setup are discussed.

Loss of grain boundary segregant during ion milling

It is shown that material segregated to grain boundaries can be lost during ion milling. This specimen preparation artifact has been studied in the case of bismuth in copper and has also been observed for phosphorus in stainless steel. The loss is associated with specimen heating during ion milling and can be alleviated by good clamping and cooling of the specimen during milling. Specimen heating permits grain boundary diffusion of the segregating element to the specimen surfaces with subsequent loss of segregant from the specimen by evaporation or sputtering during ion milling. Loss of bismuth during in situ heating to 200-300 degrees C is demonstrated. Therefore, care must be taken in specimen preparation for analytical electron microscopy measurement of such segregation. Similar effects may occur during ion milling of other materials, especially those where low thermal conductivity will result in high beam heating. In these cases, care must be taken to avoid loss of segregant during specimen preparation. Additional tests showed that no significant loss of segregant was observed during X-ray microanalysis, even at nominal room temperature and probe currents five-fold higher than that normally used for microanalysis.