Wan W, Chen FR, Zhu Y. Design of compact ultrafast microscopes for single- and multi-shot imaging with MeV electrons.
Ultramicroscopy 2018;
194:143-153. [PMID:
30142490 DOI:
10.1016/j.ultramic.2018.08.005]
[Citation(s) in RCA: 11] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/06/2018] [Revised: 07/31/2018] [Accepted: 08/07/2018] [Indexed: 11/19/2022]
Abstract
Ultrafast high-energy electron microscopy, taking advantage of strong interaction of electrons with matter while minimizing space charge problems, can be used to address a wide range of grand challenges in basics energy sciences. However, MeV-electron lenses are inherently bulky and expensive, preventing them from acceptance in a broad scientific community. In this article, we report our novel design of a compact, low-cost imaging-lens system for MeV-electrons based on quadrupole multiplets, including triplet, quadruplet and quintuplet, both symmetric and asymmetric. We compare optical performance of quadrupole-based condenser, objective and projector lenses with that of the traditional round-lenses and discuss the strategy for their practical use in constructing MeV-electron microscopes for high spatial and temporal resolution single- and multi-shot imaging. Combining the compound electron-optical system with a photocathode radiofrequency (RF) gun, such a MeV electron microscope can be fit into a small-sized laboratory for ultrafast observations and measurements.
Collapse