1
|
Garg V, Kamaliya B, Singh RK, Panwar AS, Fu J, Mote RG. Controlled Manipulation and Multiscale Modeling of Suspended Silicon Nanostructures under Site-Specific Ion Irradiation. ACS APPLIED MATERIALS & INTERFACES 2020; 12:6581-6589. [PMID: 31910617 DOI: 10.1021/acsami.9b17941] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/10/2023]
Abstract
In this work, controlled bidirectional deformation of suspended nanostructures by site-specific ion irradiation is presented. Multiscale modeling of the bidirectional deformation of nanostructures by site-specific ion irradiation is presented, incorporating molecular dynamics (MD) simulations together with finite element analysis, to substantiate the bending mechanism. Strain engineering of the free-standing nanostructure is employed for controlled deformation through site-specific kiloelectronvolt ion irradiation experimentally using a focused ion beam. We report the detailed bending mechanism of suspended silicon (Si) nanostructures through ion-induced irradiations. MD simulations are presented to understand the ion-solid interactions, defects formation in the silicon nanowire. The atomic-scale simulations reveal that the ion irradiation-induced bidirectional bending occurs through the development of localized tensile-compressive stresses in the lattice due to defect formation associated with atomic displacements. With an increasing ion dose, the evolution of localized tensile to compressive stress is observed, developing the alternate bending directions calculated through finite element analysis. The findings of multiscale modeling are in excellent agreement with the bidirectional nature of bending observed through the experiments. The developed in situ approach for bidirectional controlled manipulation of nanostructures in this work can be used for nanofabrication of numerous novel three-dimensional configurations and can provide a route toward functional nanostructures and devices.
Collapse
Affiliation(s)
- Vivek Garg
- IITB-Monash Research Academy , Indian Institute of Technology Bombay , Powai , Mumbai 400076 , India
- Department of Mechanical Engineering , Indian Institute of Technology Bombay , Powai , Mumbai 400076 , India
- Department of Mechanical and Aerospace Engineering , Monash University , Clayton 3168 , Australia
| | - Bhaveshkumar Kamaliya
- IITB-Monash Research Academy , Indian Institute of Technology Bombay , Powai , Mumbai 400076 , India
- Department of Mechanical and Aerospace Engineering , Monash University , Clayton 3168 , Australia
- Department of Physics , Indian Institute of Technology Bombay , Powai , Mumbai 400076 , India
| | - Ritesh Kumar Singh
- Department of Mechanical Engineering , Indian Institute of Technology Bombay , Powai , Mumbai 400076 , India
| | - Ajay Singh Panwar
- Department of Metallurgical Engineering & Materials Science , Indian Institute of Technology Bombay , Powai , Mumbai 400076 , India
| | - Jing Fu
- Department of Mechanical and Aerospace Engineering , Monash University , Clayton 3168 , Australia
| | - Rakesh G Mote
- Department of Mechanical Engineering , Indian Institute of Technology Bombay , Powai , Mumbai 400076 , India
| |
Collapse
|
2
|
Chen J, Zhang X. Nanoscale size effect and phonon properties of silicon material through simple spectral energy density analysis based on molecular dynamics. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2019; 31:425701. [PMID: 31239426 DOI: 10.1088/1361-648x/ab2c73] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/09/2023]
Abstract
Due to the importance of spectral analysis for the development of highly efficient semiconductor silicon devices and the complexity of current research techniques, the realization of an effective and simple method for phonon spectral analysis is imperative. Based on the molecular dynamics (MD) simulations and the phonon spectral energy density (SED) analysis (Thomas et al 2010 Phys. Rev. B 81 081411), a straightforward method is adopted to obtain the phonon dispersion for silicon films. The MD method is used to investigate the heat conduction of the three-dimensional (3D) thin silicon film with Stillinger-Weber (SW) potential. The thermal conductivity of the silicon is obtained from the non-equilibrium molecular dynamics (NEMD) simulation by using Muller-Plathe (M-P) method (Müller-Plathe 1997 J. Chem. Phys. 106 6082). For further analysis of thermal transport properties based on the phonon concept, the SED analysis technique is utilized by adopting the previously obtained atomic velocities as input. Moreover, the nanoscale size effect on the spectral analysis is considered. Domains with different sizes are studied to achieve a sufficient resolution of the dispersion relation from the phonon SED. The comparison with the results of existing approach demonstrates that the utilized method can accurately and directly obtain the phonon SED profiles along the frequency axis.
Collapse
Affiliation(s)
- Jia Chen
- School of Energy and Power Engineering, Nanjing University of Science and Technology, Nanjing, Jiangsu 210094, People's Republic of China
| | | |
Collapse
|
3
|
Patil SP, Heider Y. A Review on Brittle Fracture Nanomechanics by All-Atom Simulations. NANOMATERIALS (BASEL, SWITZERLAND) 2019; 9:E1050. [PMID: 31336659 PMCID: PMC6669627 DOI: 10.3390/nano9071050] [Citation(s) in RCA: 16] [Impact Index Per Article: 3.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 06/24/2019] [Revised: 07/16/2019] [Accepted: 07/18/2019] [Indexed: 11/25/2022]
Abstract
Despite a wide range of current and potential applications, one primary concern of brittle materials is their sudden and swift collapse. This failure phenomenon exhibits an inability of the materials to sustain tension stresses in a predictable and reliable manner. However, advances in the field of fracture mechanics, especially at the nanoscale, have contributed to the understanding of the material response and failure nature to predict most of the potential dangers. In the following contribution, a comprehensive review is carried out on molecular dynamics (MD) simulations of brittle fracture, wherein the method provides new data and exciting insights into fracture mechanism that cannot be obtained easily from theories or experiments on other scales. In the present review, an abstract introduction to MD simulations, advantages, current limitations and their applications to a range of brittle fracture problems are presented. Additionally, a brief discussion highlights the theoretical background of the macroscopic techniques, such as Griffith's criterion, crack tip opening displacement, J-integral and other criteria that can be linked to the fracture mechanical properties at the nanoscale. The main focus of the review is on the recent advances in fracture analysis of highly brittle materials, such as carbon nanotubes, graphene, silicon carbide, amorphous silica, calcium carbonate and silica aerogel at the nanoscale. These materials are presented here due to their extraordinary mechanical properties and a wide scope of applications. The underlying review grants a more extensive unravelling of the fracture behaviour and mechanical properties at the nanoscale of brittle materials.
Collapse
Affiliation(s)
- Sandeep P Patil
- Institute of General Mechanics, RWTH Aachen University, Templergraben 64, 52062 Aachen, Germany.
| | - Yousef Heider
- Institute of General Mechanics, RWTH Aachen University, Templergraben 64, 52062 Aachen, Germany
- Department of Civil Engineering and Engineering Mechanics, Columbia University, New York, NY 10027, USA
| |
Collapse
|
4
|
Atomic Scale Formation Mechanism of Edge Dislocation Relieving Lattice Strain in a GeSi overlayer on Si(001). Sci Rep 2017; 7:11966. [PMID: 28931841 PMCID: PMC5607354 DOI: 10.1038/s41598-017-12009-y] [Citation(s) in RCA: 11] [Impact Index Per Article: 1.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/11/2017] [Accepted: 08/31/2017] [Indexed: 11/19/2022] Open
Abstract
Understanding how edge misfit dislocations (MDs) form in a GeSi/Si(001) film has been a long standing issue. The challenge is to find a mechanism accounting for the presence of these dislocations at the interface since they are not mobile and cannot nucleate at the surface and glide towards the interface. Furthermore, experiments can hardly detect the nucleation and early stages of growth because of the short time scale involved. Here we present the first semi-quantitative atomistic calculation of the formation of edge dislocations in such films. We use a global optimization method and density functional theory calculations, combined with computations using potential energy functions to identify the best mechanisms. We show that those previously suggested are relevant only for a low film strain and we propose a new mechanism which accounts for the formation of edge dislocations at high film strain. In this one, a 60° MD nucleates as a “split” half-loop with two branches gliding on different planes. One branch belongs to the glide plane of a complementary 60° MD and therefore strongly favors the formation of the complementary MD which is immediately combined with the first MD to form an edge MD.
Collapse
|
5
|
Voyiatzis E, Böhm MC. Atomic and global mechanical properties of systems described by the Stillinger-Weber potential. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2016; 28:325201. [PMID: 27345739 DOI: 10.1088/0953-8984/28/32/325201] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
Abstract
Analytical expressions for the stress and elasticity tensors of materials, in which the interactions are described by the Stillinger-Weber potential, are derived in the context of the stress fluctuation formalism. The derived formulas can be used both in Monte Carlo and molecular dynamics simulations. As an example of possible applications, they are employed to calculate the influence of the temperature and system size on the mechanical properties of crystalline cubic boron nitride. The system has been studied by molecular dynamics simulations. The computed mechanical properties are in good agreement with available experimental data and first principle calculations. In the studied crystalline cubic boron nitride system, the employed formalism is of higher accuracy than the 'small-strain' non-equilibrium method. The dominant contributions to the elastic constants stem from the Born and stress fluctuation terms. An increase in the system size reduces the statistical uncertainties in the computation of the mechanical properties. A rise of the temperature leads to a slight increase in the observed uncertainties. The derived expressions for the stress and elasticity tensors are further decomposed into sums of atomic level stress and atomic level elasticity tensors. The developed factorization enables us (i) to quantify the contribution of the various chemical groups, in the case under consideration of the different atoms, to the observed mechanical properties and (ii) to determine the elastic constants with reduced computational uncertainties. The reason is that the exact values of some terms of the proposed factorization can be determined theoretically beforehand. Thus, they can be substituted in the derived formulas leading to an enhanced convergence.
Collapse
Affiliation(s)
- Evangelos Voyiatzis
- Eduard-Zintl-Institut für Anorganische und Physikalische Chemie and Center of Smart Interfaces, Technische Universität Darmstadt, Alarich-Weiss-Strasse 4, 64287 Darmstadt, Germany
| | | |
Collapse
|
6
|
Albaret T, Tanguy A, Boioli F, Rodney D. Mapping between atomistic simulations and Eshelby inclusions in the shear deformation of an amorphous silicon model. Phys Rev E 2016; 93:053002. [PMID: 27300968 DOI: 10.1103/physreve.93.053002] [Citation(s) in RCA: 47] [Impact Index Per Article: 5.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/07/2015] [Indexed: 11/07/2022]
Abstract
In this paper we perform quasistatic shear simulations of model amorphous silicon bulk samples with Stillinger-Weber-type potentials. Local plastic rearrangements identified based on local energy variations are fitted through their displacement fields on collections of Eshelby spherical inclusions, allowing determination of their transformation strain tensors. The latter are then used to quantitatively reproduce atomistic stress-strain curves, in terms of both shear and pressure components. We demonstrate that our methodology is able to capture the plastic behavior predicted by different Stillinger-Weber potentials, in particular, their different shear tension coupling. These calculations justify the decomposition of plasticity into shear transformations used so far in mesoscale models and provide atomic-scale parameters that can be used to limit the empiricism needed in such models up to now.
Collapse
Affiliation(s)
- T Albaret
- Institut Lumière Matière, UMR5306 Université Lyon 1-CNRS, Université de Lyon, F-69622 Villeurbanne Cedex, France
| | - A Tanguy
- Institut Lumière Matière, UMR5306 Université Lyon 1-CNRS, Université de Lyon, F-69622 Villeurbanne Cedex, France.,LaMCos, INSA-Lyon, CNRS UMR5259, Université de Lyon, F-69621 France
| | - F Boioli
- Institut Lumière Matière, UMR5306 Université Lyon 1-CNRS, Université de Lyon, F-69622 Villeurbanne Cedex, France
| | - D Rodney
- Institut Lumière Matière, UMR5306 Université Lyon 1-CNRS, Université de Lyon, F-69622 Villeurbanne Cedex, France
| |
Collapse
|
7
|
Beltukov YM, Fusco C, Parshin DA, Tanguy A. Boson peak and Ioffe-Regel criterion in amorphous siliconlike materials: The effect of bond directionality. Phys Rev E 2016; 93:023006. [PMID: 26986404 DOI: 10.1103/physreve.93.023006] [Citation(s) in RCA: 13] [Impact Index Per Article: 1.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/02/2015] [Indexed: 06/05/2023]
Abstract
The vibrational properties of model amorphous materials are studied by combining complete analysis of the vibration modes, dynamical structure factor, and energy diffusivity with exact diagonalization of the dynamical matrix and the kernel polynomial method, which allows a study of very large system sizes. Different materials are studied that differ only by the bending rigidity of the interactions in a Stillinger-Weber modelization used to describe amorphous silicon. The local bending rigidity can thus be used as a control parameter, to tune the sound velocity together with local bonds directionality. It is shown that for all the systems studied, the upper limit of the Boson peak corresponds to the Ioffe-Regel criterion for transverse waves, as well as to a minimum of the diffusivity. The Boson peak is followed by a diffusivity's increase supported by longitudinal phonons. The Ioffe-Regel criterion for transverse waves corresponds to a common characteristic mean-free path of 5-7 Å (which is slightly bigger for longitudinal phonons), while the fine structure of the vibrational density of states is shown to be sensitive to the local bending rigidity.
Collapse
Affiliation(s)
- Y M Beltukov
- Ioffe Physical Technical Institute, 194021 St Petersburg, Russian Federation and Université Montpellier II, CNRS, Montpellier 34095, France
| | - C Fusco
- Université de Lyon, MATEIS, INSA-Lyon, CNRS UMR5510, F-69621, France and Institut Lumière Matière, UMR 5306 Université Lyon 1-CNRS, F-69622 Villeurbanne Cedex, France
| | - D A Parshin
- Saint Petersburg State Polytechnical University, 195251 Saint Petersburg, Russian Federation
| | - A Tanguy
- Université de Lyon, LaMCoS, INSA-Lyon, CNRS UMR5259, F-69621, France and Institut Lumière Matière, UMR 5306 Université Lyon 1-CNRS, F-69622 Villeurbanne Cedex, France
| |
Collapse
|
8
|
Goryaeva AM, Carrez P, Cordier P. Modeling defects and plasticity in MgSiO 3 post-perovskite: Part 1-generalized stacking faults. PHYSICS AND CHEMISTRY OF MINERALS 2015; 42:781-792. [PMID: 26594083 PMCID: PMC4643678 DOI: 10.1007/s00269-015-0762-9] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 03/03/2015] [Accepted: 06/13/2015] [Indexed: 06/05/2023]
Abstract
In this work, we examine the transferability of a pairwise potential model (derived for MgSiO3 perovskite) to accurately compute the excess energies of the generalized stacking faults (GSF, also called γ-surfaces) in MgSiO3 post-perovskite. All calculations have been performed at 120 GPa, a pressure relevant to the D″ layer. Taking into account an important aspect of crystal chemistry for complex materials, we consider in detail all possible locations of slip planes in the post-perovskite structure. The γ-surface calculations emphasize the easiness of glide of slip systems with the smallest shear vector [100] and of the [001](010) slip system. Our results are in agreement with previous ab initio calculations. This validates the use the chosen potential model for further full atomistic modeling of dislocations in MgSiO3 post-perovskite.
Collapse
Affiliation(s)
- Alexandra M. Goryaeva
- Unité Matériaux et Transformations - UMR CNRS 8207 - Bat C6, Université Lille 1, 59655 Villeneuve d’Ascq Cedex, France
| | - Philippe Carrez
- Unité Matériaux et Transformations - UMR CNRS 8207 - Bat C6, Université Lille 1, 59655 Villeneuve d’Ascq Cedex, France
| | - Patrick Cordier
- Unité Matériaux et Transformations - UMR CNRS 8207 - Bat C6, Université Lille 1, 59655 Villeneuve d’Ascq Cedex, France
| |
Collapse
|
9
|
|
10
|
France-Lanord A, Blandre E, Albaret T, Merabia S, Lacroix D, Termentzidis K. Atomistic amorphous/crystalline interface modelling for superlattices and core/shell nanowires. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2014; 26:055011. [PMID: 24445610 DOI: 10.1088/0953-8984/26/5/055011] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/03/2023]
Abstract
In this paper we present a systematic and well controlled procedure for building atomistic amorphous/crystalline interfaces in silicon, dedicated to the molecular dynamics simulations of superlattices and core/shell nanowires. The obtained structures depend on the technique used to generate the amorphous phase and their overall quality is estimated through comparisons with structural information and interfacial energies available from experimental and theoretical results. While most of the related studies focus on a single planar interface, we consider here both the generation of multiple superlattice planar interfaces and core/shell nanowire structures. The proposed method provides periodic homogeneous and reproducible, atomically sharp and defect free interface configurations at low temperature and pressure. We also illustrate how the method may be used to predict the thermal transport properties of composite crystalline/amorphous superlattices.
Collapse
|