Structural analysis of strained LaVO3 thin films

inserexs: reflection choice software for resonant elastic X-ray scattering

This paper presents inserexs, an open-source computer program that aims to pre-evaluate the different reflections for resonant elastic X-ray scattering (REXS) diffraction experiments. REXS is an extremely versatile technique that can provide positional and occupational information about the atoms present in a crystal. inserexs was conceived to help REXS experimentalists know beforehand which reflections to choose to determine a parameter of interest. Prior work has already proven this to be useful in the determination of atomic positions in oxide thin films. inserexs allows generalization to any given system and aims to popularize resonant diffraction as an alternative technique to improve the resolution of crystalline structures.

Oxygen crystallographic positions in thin films by non-destructive resonant elastic X-ray scattering

Precisely locating oxygen atoms in nanosized systems is a real challenge. The traditional strategies used for bulk samples fail at probing samples with much less matter. Resonant elastic X-ray scattering (REXS) experiments in the X-ray absorption near-edge structure (XANES) domain have already proved their efficiency in probing transition metal cations in thin films, but it is not feasible to perform such experiments at the low-energy edges of lighter atoms – such as oxygen. In this study, the adequacy of using REXS in the extended X-ray absorption fine structure (EXAFS) domain, also known as extended diffraction absorption fine structure (EDAFS), to solve this issue is shown. The technique has been validated on a bulk FeV2O4 sample, through comparison with results obtained with conventional X-ray diffraction measurements. Subsequently, the positions of oxygen atoms in a thin film were unveiled by using the same strategy. The approach described in this study can henceforth be applied to solve the crystallographic structure of oxides, and will help in better understanding the properties and functionalities which are dictated by the positions of the oxygen atoms in functional nanosized materials.

3D Electron Diffraction: The Nanocrystallography Revolution

Crystallography of nanocrystalline materials has witnessed a true revolution in the past 10 years, thanks to the introduction of protocols for 3D acquisition and analysis of electron diffraction data. This method provides single-crystal data of structure solution and refinement quality, allowing the atomic structure determination of those materials that remained hitherto unknown because of their limited crystallinity. Several experimental protocols exist, which share the common idea of sampling a sequence of diffraction patterns while the crystal is tilted around a noncrystallographic axis, namely, the goniometer axis of the transmission electron microscope sample stage. This Outlook reviews most important 3D electron diffraction applications for different kinds of samples and problematics, related with both materials and life sciences. Structure refinement including dynamical scattering is also briefly discussed.

Precession electron diffraction tomography on twinned crystals: application to CaTiO3 thin films

Strain engineering via epitaxial thin-film synthesis is an efficient way to modify the crystal structure of a material in order to induce new features or improve existing properties. One of the challenges in this approach is to quantify structural changes occurring in these films. While X-ray diffraction is the most widely used technique for obtaining accurate structural information from bulk materials, severe limitations appear in the case of epitaxial thin films. This past decade, precession electron diffraction tomography has emerged as a relevant technique for the structural characterization of nano-sized materials. While its usefulness has already been demonstrated for solving the unknown structure of materials deposited in the form of thin films, the frequent existence of orientation variants within the film introduces a severe bias in the structure refinement, even when using the dynamical diffraction theory to calculate diffracted intensities. This is illustrated here using CaTiO3 films deposited on SrTiO3 substrates as a case study. By taking into account twinning in the structural analysis, it is shown that the structure of the CaTiO3 films can be refined with an accuracy comparable to that obtained by dynamical refinement from non-twinned data. The introduction of the possibility to handle twin data sets is undoubtedly a valuable add-on and, notably, paves the way for a successful use of precession electron diffraction tomography for accurate structural analyses of thin films.

High-Quality LaVO3 Films as Solar Energy Conversion Material

Mott insulating oxides and their heterostructures have recently been identified as potential photovoltaic materials with favorable absorption properties and an intrinsic built-in electric field that can efficiently separate excited electron-hole pairs. At the same time, they are predicted to overcome the Shockley-Queisser limit due to strong electron-electron interaction present. Despite these premises a high concentration of defects commonly observed in Mott insulating films acting as recombination centers can derogate the photovoltaic conversion efficiency. With use of the self-regulated growth kinetics in hybrid molecular beam epitaxy, this obstacle can be overcome. High-quality, stoichiometric LaVO₃ films were grown with defect densities of in-gap states up to 2 orders of magnitude lower compared to the films in the literature, and a factor of 3 lower than LaVO₃ bulk single crystals. Photoconductivity measurements revealed a significant photoresponsivity increase as high as tenfold of stoichiometric LaVO₃ films compared to their nonstoichiometric counterparts. This work marks a critical step toward the realization of high-performance Mott insulator solar cells beyond conventional semiconductors.