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Kumar A, Intonti K, Viscardi L, Durante O, Pelella A, Kharsah O, Sleziona S, Giubileo F, Martucciello N, Ciambelli P, Schleberger M, Di Bartolomeo A. Memory effect and coexistence of negative and positive photoconductivity in black phosphorus field effect transistor for neuromorphic vision sensors. MATERIALS HORIZONS 2024; 11:2397-2405. [PMID: 38470088 DOI: 10.1039/d4mh00027g] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 03/13/2024]
Abstract
Black phosphorus (BP) field-effect transistors with ultrathin channels exhibit unipolar p-type electrical conduction over a wide range of temperatures and pressures. Herein, we study a device that exhibits mobility up to 100 cm2 V-1 s-1 and a memory window up to 1.3 μA. Exposure to a supercontinuum white light source reveals that negative photoconductivity (NPC) and positive photoconductivity (PPC) coexist in the same device. Such behavior is attributed to the chemisorbed O2 molecules, with a minor role of physisorbed H2O molecules. The coexistence of NPC and PPC can be exploited in neuromorphic vision sensors, requiring the human eye retina to process the optical signals through alerting and protection (NPC), adaptation (PPC), followed by imaging and processing. Our results open new avenues for the use of BP and other two-dimentional (2D) semiconducting materials in transistors, memories, and neuromorphic vision sensors for advanced applications in robotics, self-driving cars, etc.
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Affiliation(s)
- Arun Kumar
- Department of Physics 'E.R. Caianiello', University of Salerno, Via Giovanni Paolo II 132, Fisciano 84084, Italy.
| | - Kimberly Intonti
- Department of Physics 'E.R. Caianiello', University of Salerno, Via Giovanni Paolo II 132, Fisciano 84084, Italy.
- CNR-SPIN Salerno, Via Giovanni Paolo II 132, Fisciano 84084, Italy
| | - Loredana Viscardi
- Department of Physics 'E.R. Caianiello', University of Salerno, Via Giovanni Paolo II 132, Fisciano 84084, Italy.
- CNR-SPIN Salerno, Via Giovanni Paolo II 132, Fisciano 84084, Italy
| | - Ofelia Durante
- Department of Physics 'E.R. Caianiello', University of Salerno, Via Giovanni Paolo II 132, Fisciano 84084, Italy.
- CNR-SPIN Salerno, Via Giovanni Paolo II 132, Fisciano 84084, Italy
| | - Aniello Pelella
- Department of Science and Technology, University of Sannio, Via de Sanctis, Benevento 82100, Italy
| | - Osamah Kharsah
- Fakultät für Physik and CENIDE, Universität Duisburg-Essen, Lotharstrasse 1, Duisburg D-47057, Germany
| | - Stephan Sleziona
- Fakultät für Physik and CENIDE, Universität Duisburg-Essen, Lotharstrasse 1, Duisburg D-47057, Germany
| | - Filippo Giubileo
- CNR-SPIN Salerno, Via Giovanni Paolo II 132, Fisciano 84084, Italy
| | | | - Paolo Ciambelli
- Narrando Srl, Via Arcangelo Rotunno 43, Salerno 84134, Italy
| | - Marika Schleberger
- Fakultät für Physik and CENIDE, Universität Duisburg-Essen, Lotharstrasse 1, Duisburg D-47057, Germany
| | - Antonio Di Bartolomeo
- Department of Physics 'E.R. Caianiello', University of Salerno, Via Giovanni Paolo II 132, Fisciano 84084, Italy.
- CNR-SPIN Salerno, Via Giovanni Paolo II 132, Fisciano 84084, Italy
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2
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Zhang Y, Li Q, Ye X, Wang L, He Z, Zhang T, Wang K, Shi F, Yang J, Jiang S, Wang X, Chen C. High-Performance Infrared Detectors Based on Black Phosphorus/Carbon Nanotube Heterojunctions. NANOMATERIALS (BASEL, SWITZERLAND) 2023; 13:2700. [PMID: 37836341 PMCID: PMC10574135 DOI: 10.3390/nano13192700] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/12/2023] [Revised: 09/30/2023] [Accepted: 10/02/2023] [Indexed: 10/15/2023]
Abstract
Infrared detectors have broad application prospects in the fields of detection and communication. Using ideal materials and good device structure is crucial for achieving high-performance infrared detectors. Here, we utilized black phosphorus (BP) and single-walled carbon nanotube (SWCNT) films to construct a vertical van der Waals heterostructure, resulting in high-performance photovoltaic infrared detectors. In the device, a strong built-in electric field was formed in the heterojunction with a favored energy-band matching between the BP and the SWCNT, which caused a good photovoltaic effect. The fabricated devices exhibited a diode-like rectification behavior in the dark, which had a high rectification ratio up to a magnitude of 104 and a low ideal factor of 1.4. Under 1550 nm wavelength illumination, the 2D BP/SWCNT film photodetector demonstrated an open-circuit voltage of 0.34 V, a large external power conversion efficiency (η) of 7.5% and a high specific detectivity (D*) of 3.1 × 109 Jones. This external η was the highest among those for the photovoltaic devices fabricated with the SWCNTs or the heterostructures based on 2D materials and the obtained D* was also higher than those for most of the infrared detectors based on 2D materials or carbon materials. This work showcases the application potential of BP and SWCNTs in the detection field.
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Affiliation(s)
| | | | | | | | | | | | | | | | | | | | | | - Changxin Chen
- National Key Laboratory of Advanced Micro and Nano Manufacture Technology, Key Laboratory for Thin Film and Microfabrication of Ministry of Education, School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China
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3
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Shi F, Gao S, Li Q, Zhang Y, Zhang T, He Z, Wang K, Ye X, Liu J, Jiang S, Chen C. Black Phosphorus Field-Effect Transistors with Improved Contact via Localized Joule Heating. NANOMATERIALS (BASEL, SWITZERLAND) 2023; 13:2607. [PMID: 37764636 PMCID: PMC10534629 DOI: 10.3390/nano13182607] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/20/2023] [Revised: 09/12/2023] [Accepted: 09/19/2023] [Indexed: 09/29/2023]
Abstract
Two-dimensional (2D) black phosphorus (BP) is considered an ideal building block for field-effect transistors (FETs) owing to its unique structure and intriguing properties. To achieve high-performance BP-FETs, it is essential to establish a reliable and low-resistance contact between the BP and the electrodes. In this study, we employed a localized Joule heating method to improve the contact between the 2D BP and gold electrodes, resulting in enhanced BP-FET performance. Upon applying a sufficiently large source-drain voltage, the zero-bias conductance of the device increased by approximately five orders of magnitude, and the linearity of the current-voltage curves was also enhanced. This contact improvement can be attributed to the formation of gold phosphide at the interface of the BP and the gold electrodes owing to current-generated localized Joule heat. The fabricated BP-FET demonstrated a high on/off ratio of 4850 and an on-state conductance per unit channel width of 1.25 μS μm-1, significantly surpassing those of the BP-FETs without electrical annealing. These findings offer a method to achieve a low-resistance BP/metal contact for developing high-performance BP-based electronic devices.
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Affiliation(s)
- Fangyuan Shi
- National Key Laboratory of Advanced Micro and Nano Manufacture Technology, Key Laboratory for Thin Film and Microfabrication of Ministry of Education, School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China
| | - Shengguang Gao
- National Key Laboratory of Advanced Micro and Nano Manufacture Technology, Key Laboratory for Thin Film and Microfabrication of Ministry of Education, School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China
| | - Qichao Li
- National Key Laboratory of Advanced Micro and Nano Manufacture Technology, Key Laboratory for Thin Film and Microfabrication of Ministry of Education, School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China
| | - Yanming Zhang
- National Key Laboratory of Advanced Micro and Nano Manufacture Technology, Key Laboratory for Thin Film and Microfabrication of Ministry of Education, School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China
| | - Teng Zhang
- National Key Laboratory of Advanced Micro and Nano Manufacture Technology, Key Laboratory for Thin Film and Microfabrication of Ministry of Education, School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China
| | - Zhiyan He
- National Key Laboratory of Advanced Micro and Nano Manufacture Technology, Key Laboratory for Thin Film and Microfabrication of Ministry of Education, School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China
| | - Kunchan Wang
- National Key Laboratory of Advanced Micro and Nano Manufacture Technology, Key Laboratory for Thin Film and Microfabrication of Ministry of Education, School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China
| | - Xiaowo Ye
- National Key Laboratory of Advanced Micro and Nano Manufacture Technology, Key Laboratory for Thin Film and Microfabrication of Ministry of Education, School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China
| | - Jichao Liu
- National Key Laboratory of Advanced Micro and Nano Manufacture Technology, Key Laboratory for Thin Film and Microfabrication of Ministry of Education, School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China
| | - Shenghao Jiang
- National Key Laboratory of Advanced Micro and Nano Manufacture Technology, Key Laboratory for Thin Film and Microfabrication of Ministry of Education, School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China
| | - Changxin Chen
- National Key Laboratory of Advanced Micro and Nano Manufacture Technology, Key Laboratory for Thin Film and Microfabrication of Ministry of Education, School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China
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4
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Zhang T, Xie H, Xie S, Hu A, Liu J, Kang J, Hou J, Hao Q, Liu H, Ji H. A Superior Two-Dimensional Phosphorus Flame Retardant: Few-Layer Black Phosphorus. Molecules 2023; 28:5062. [PMID: 37446723 DOI: 10.3390/molecules28135062] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/25/2023] [Revised: 06/13/2023] [Accepted: 06/27/2023] [Indexed: 07/15/2023] Open
Abstract
The usage of flame retardants in flammable polymers has been an effective way to protect both lives and material goods from accidental fires. Phosphorus flame retardants have the potential to be follow-on flame retardants after halogenated variants, because of their low toxicity, high efficiency and compatibility. Recently, the emerging allotrope of phosphorus, two-dimensional black phosphorus, as a flame retardant has been developed. To further understand its performance in flame-retardant efficiency among phosphorus flame retardants, in this work, we built model materials to compare the flame-retardant performances of few-layer black phosphorus, red phosphorus nanoparticles, and triphenyl phosphate as flame-retardant additives in cellulose and polyacrylonitrile. Aside from the superior flame retardancy in polyacrylonitrile, few-layer black phosphorus in cellulose showed the superior flame-retardant efficiency in self-extinguishing, ~1.8 and ~4.4 times that of red phosphorus nanoparticles and triphenyl phosphate with similar lateral size and mass load (2.5~4.8 wt%), respectively. The char layer in cellulose coated with the few-layer black phosphorus after combustion was more continuous and smoother than that with red phosphorus nanoparticles, triphenyl phosphate and blank, and the amount of residues of cellulose coated with the few-layer black phosphorus in thermogravimetric analysis were 10 wt%, 14 wt% and 14 wt% more than that with red phosphorus nanoparticles, triphenyl phosphate and blank, respectively. In addition, although exothermic reactions, the combustion enthalpy changes in the few-layer black phosphorus (-127.1 kJ mol-1) are one third of that of red phosphorus nanoparticles (-381.3 kJ mol-1). Based on a joint thermodynamic, spectroscopic, and microscopic analysis, the superior flame retardancy of the few-layer black phosphorus was attributed to superior combustion reaction suppression from the two-dimensional structure and thermal nature of the few-layer black phosphorus.
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Affiliation(s)
- Taiming Zhang
- State Key Laboratory of Digital Medical Engineering, School of Biological Science and Medical Engineering, Southeast University, 2# Sipailou, Nanjing 210096, China
- Department of Materials Science and Engineering, CAS Key Laboratory of Materials for Energy Conversion, iChEM (Collaborative Innovation Center of Chemistry for Energy Materials), CAS Center for Excellence in Nanoscience, University of Science and Technology of China, Hefei 230026, China
| | - Huanyu Xie
- Department of Materials Science and Engineering, CAS Key Laboratory of Materials for Energy Conversion, iChEM (Collaborative Innovation Center of Chemistry for Energy Materials), CAS Center for Excellence in Nanoscience, University of Science and Technology of China, Hefei 230026, China
| | - Shuai Xie
- Department of Materials Science and Engineering, CAS Key Laboratory of Materials for Energy Conversion, iChEM (Collaborative Innovation Center of Chemistry for Energy Materials), CAS Center for Excellence in Nanoscience, University of Science and Technology of China, Hefei 230026, China
| | - Ajuan Hu
- Department of Materials Science and Engineering, CAS Key Laboratory of Materials for Energy Conversion, iChEM (Collaborative Innovation Center of Chemistry for Energy Materials), CAS Center for Excellence in Nanoscience, University of Science and Technology of China, Hefei 230026, China
| | - Jie Liu
- Department of Materials Science and Engineering, CAS Key Laboratory of Materials for Energy Conversion, iChEM (Collaborative Innovation Center of Chemistry for Energy Materials), CAS Center for Excellence in Nanoscience, University of Science and Technology of China, Hefei 230026, China
| | - Jian Kang
- Department of Materials Science and Engineering, CAS Key Laboratory of Materials for Energy Conversion, iChEM (Collaborative Innovation Center of Chemistry for Energy Materials), CAS Center for Excellence in Nanoscience, University of Science and Technology of China, Hefei 230026, China
| | - Jie Hou
- School of Resource Environment and Safety Engineering, University of South China, Hengyang 421001, China
| | - Qing Hao
- State Key Laboratory of Digital Medical Engineering, School of Biological Science and Medical Engineering, Southeast University, 2# Sipailou, Nanjing 210096, China
| | - Hong Liu
- State Key Laboratory of Digital Medical Engineering, School of Biological Science and Medical Engineering, Southeast University, 2# Sipailou, Nanjing 210096, China
| | - Hengxing Ji
- Department of Materials Science and Engineering, CAS Key Laboratory of Materials for Energy Conversion, iChEM (Collaborative Innovation Center of Chemistry for Energy Materials), CAS Center for Excellence in Nanoscience, University of Science and Technology of China, Hefei 230026, China
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5
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Lien MR, Wang N, Wu J, Soibel A, Gunapala SD, Wang H, Povinelli ML. Resonant Grating-Enhanced Black Phosphorus Mid-Wave Infrared Photodetector. NANO LETTERS 2022; 22:8704-8710. [PMID: 36287194 DOI: 10.1021/acs.nanolett.2c03469] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/16/2023]
Abstract
Black phosphorus (BP) has emerged as a promising materials system for mid-wave infrared photodetection because of its moderate bandgap, high carrier mobility, substrate compatibility, and bandgap tunability. However, its uniquely tunable bandgap can only be taken advantage of with thin layer thicknesses, which ultimately limits the optical absorption of a BP photodetector. This work demonstrates an absorption-boosting resonant metal-insulator-metal (MIM) metasurface grating integrated with a thin-film BP photodetector. We designed and fabricated different MIM gratings and characterized their spectral properties. Then, we show that an MIM structure increased room temperature responsivity from 12 to 77 mA W-1 at 3.37 μm when integrated with a thin-film BP photodetector. Our results show that MIM structures simultaneously increase mid-wave infrared absorption and responsivity in a thin-film BP photodetector.
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Affiliation(s)
- Max R Lien
- Ming Hsieh Department of Electrical and Computer Engineering, University of Southern California, Los Angeles, California 90089, United States
| | - Nan Wang
- Mork Family Department of Chemical Engineering & Materials Science, University of Southern California, Los Angeles, California 90089, United States
| | - Jiangbin Wu
- Ming Hsieh Department of Electrical and Computer Engineering, University of Southern California, Los Angeles, California 90089, United States
| | - Alexander Soibel
- Jet Propulsion Laboratory, California Institute of Technology, 4800 Oak Grove Drive, Pasadena, California 91030, United States
| | - Sarath D Gunapala
- Jet Propulsion Laboratory, California Institute of Technology, 4800 Oak Grove Drive, Pasadena, California 91030, United States
| | - Han Wang
- Ming Hsieh Department of Electrical and Computer Engineering, University of Southern California, Los Angeles, California 90089, United States
- Mork Family Department of Chemical Engineering & Materials Science, University of Southern California, Los Angeles, California 90089, United States
| | - Michelle L Povinelli
- Ming Hsieh Department of Electrical and Computer Engineering, University of Southern California, Los Angeles, California 90089, United States
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6
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Xiong Y, Xu D, Feng Y, Zhang G, Lin P, Chen X. P-Type 2D Semiconductors for Future Electronics. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2022:e2206939. [PMID: 36245325 DOI: 10.1002/adma.202206939] [Citation(s) in RCA: 6] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/30/2022] [Revised: 09/30/2022] [Indexed: 06/16/2023]
Abstract
2D semiconductors represent one of the best candidates to extend Moore's law for their superiorities, such as keeping high carrier mobility and remarkable gate-control capability at atomic thickness. Complementary transistors and van der Waals junctions are critical in realizing 2D semiconductors-based integrated circuits suitable for future electronics. N-type 2D semiconductors have been reported predominantly for the strong electron doping caused by interfacial charge impurities and internal structural defects. By contrast, superior and reliable p-type 2D semiconductors with holes as majority carriers are still scarce. Not only that, but some critical issues have not been adequately addressed, including their controlled synthesis in wafer size and high quality, defect and carrier modulation, optimization of interface and contact, and application in high-speed and low-power integrated devices. Here the material toolkit, synthesis strategies, device basics, and digital electronics closely related to p-type 2D semiconductors are reviewed. Their opportunities, challenges, and prospects for future electronic applications are also discussed, which would be promising or even shining in the post-Moore era.
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Affiliation(s)
- Yunhai Xiong
- MIIT Key Laboratory of Advanced Display Materials and Devices, School of Materials Science and Engineering, Nanjing University of Science and Technology, Nanjing, 210094, China
| | - Duo Xu
- MIIT Key Laboratory of Advanced Display Materials and Devices, School of Materials Science and Engineering, Nanjing University of Science and Technology, Nanjing, 210094, China
| | - Yiping Feng
- MIIT Key Laboratory of Advanced Display Materials and Devices, School of Materials Science and Engineering, Nanjing University of Science and Technology, Nanjing, 210094, China
| | - Guangjie Zhang
- CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing, 100190, China
| | - Pei Lin
- Key Laboratory of Materials Physics of Ministry of Education, School of Physics and Microelectronics, Zhengzhou University, Zhengzhou, 450001, China
| | - Xiang Chen
- MIIT Key Laboratory of Advanced Display Materials and Devices, School of Materials Science and Engineering, Nanjing University of Science and Technology, Nanjing, 210094, China
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7
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Telesio F, Carrega M, Cappelli G, Iorio A, Crippa A, Strambini E, Giazotto F, Serrano-Ruiz M, Peruzzini M, Heun S. Evidence of Josephson Coupling in a Few-Layer Black Phosphorus Planar Josephson Junction. ACS NANO 2022; 16:3538-3545. [PMID: 35099941 PMCID: PMC8945388 DOI: 10.1021/acsnano.1c09315] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 10/21/2021] [Accepted: 01/26/2022] [Indexed: 06/14/2023]
Abstract
Setting up strong Josephson coupling in van der Waals materials in close proximity to superconductors offers several opportunities both to inspect fundamental physics and to develop cryogenic quantum technologies. Here we show evidence of Josephson coupling in a planar few-layer black phosphorus junction. The planar geometry allows us to probe the junction behavior by means of external gates, at different carrier concentrations. Clear signatures of Josephson coupling are demonstrated by measuring supercurrent flow through the junction at milli-Kelvin temperatures. Manifestation of a Fraunhofer pattern with a transverse magnetic field is also reported, confirming the Josephson coupling. These findings represent evidence of proximity Josephson coupling in a planar junction based on a van der Waals material beyond graphene and will expedite further studies, exploiting the peculiar properties of exfoliated black phosphorus thin flakes.
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Affiliation(s)
- Francesca Telesio
- NEST,
Istituto Nanoscienze-CNR and Scuola Normale Superiore, Piazza San Silvestro 12, 56127 Pisa, Italy
| | | | - Giulio Cappelli
- NEST,
Istituto Nanoscienze-CNR and Scuola Normale Superiore, Piazza San Silvestro 12, 56127 Pisa, Italy
| | - Andrea Iorio
- NEST,
Istituto Nanoscienze-CNR and Scuola Normale Superiore, Piazza San Silvestro 12, 56127 Pisa, Italy
| | - Alessandro Crippa
- NEST,
Istituto Nanoscienze-CNR and Scuola Normale Superiore, Piazza San Silvestro 12, 56127 Pisa, Italy
| | - Elia Strambini
- NEST,
Istituto Nanoscienze-CNR and Scuola Normale Superiore, Piazza San Silvestro 12, 56127 Pisa, Italy
| | - Francesco Giazotto
- NEST,
Istituto Nanoscienze-CNR and Scuola Normale Superiore, Piazza San Silvestro 12, 56127 Pisa, Italy
| | | | | | - Stefan Heun
- NEST,
Istituto Nanoscienze-CNR and Scuola Normale Superiore, Piazza San Silvestro 12, 56127 Pisa, Italy
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8
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Lower Limits of Contact Resistance in Phosphorene Nanodevices with Edge Contacts. NANOMATERIALS 2022; 12:nano12040656. [PMID: 35214987 PMCID: PMC8874988 DOI: 10.3390/nano12040656] [Citation(s) in RCA: 2] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 01/26/2022] [Revised: 02/12/2022] [Accepted: 02/14/2022] [Indexed: 02/05/2023]
Abstract
Edge contacts are promising for improving carrier injection and contact resistance in devices based on two-dimensional (2D) materials, among which monolayer black phosphorus (BP), or phosphorene, is especially attractive for device applications. Cutting BP into phosphorene nanoribbons (PNRs) widens the design space for BP devices and enables high-density device integration. However, little is known about contact resistance (RC) in PNRs with edge contacts, although RC is the main performance limiter for 2D material devices. Atomistic quantum transport simulations are employed to explore the impact of attaching metal edge contacts (MECs) on the electronic and transport properties and contact resistance of PNRs. We demonstrate that PNR length downscaling increases RC to 192 Ω µm in 5.2 nm-long PNRs due to strong metallization effects, while width downscaling decreases the RC to 19 Ω µm in 0.5 nm-wide PNRs. These findings illustrate the limitations on PNR downscaling and reveal opportunities in the minimization of RC by device sizing. Moreover, we prove the existence of optimum metals for edge contacts in terms of minimum metallization effects that further decrease RC by ~30%, resulting in lower intrinsic quantum limits to RC of ~90 Ω µm in phosphorene and ~14 Ω µm in ultra-narrow PNRs.
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9
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Poljak M, Matić M. Bandstructure and Size-Scaling Effects in the Performance of Monolayer Black Phosphorus Nanodevices. MATERIALS 2021; 15:ma15010243. [PMID: 35009387 PMCID: PMC8746210 DOI: 10.3390/ma15010243] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 11/17/2021] [Revised: 12/22/2021] [Accepted: 12/24/2021] [Indexed: 11/16/2022]
Abstract
Nanodevices based on monolayer black phosphorus or phosphorene are promising for future electron devices in high density integrated circuits. We investigate bandstructure and size-scaling effects in the electronic and transport properties of phosphorene nanoribbons (PNRs) and the performance of ultra-scaled PNR field-effect transistors (FETs) using advanced theoretical and computational approaches. Material and device properties are obtained by non-equilibrium Green’s function (NEGF) formalism combined with a novel tight-binding (TB) model fitted on ab initio density-functional theory (DFT) calculations. We report significant changes in the dispersion, number, and configuration of electronic subbands, density of states, and transmission of PNRs with nanoribbon width (W) downscaling. In addition, the performance of PNR FETs with 15 nm-long channels are self-consistently assessed by exploring the behavior of charge density, quantum capacitance, and average charge velocity in the channel. The dominant consequence of W downscaling is the decrease of charge velocity, which in turn deteriorates the ON-state current in PNR FETs with narrower nanoribbon channels. Nevertheless, we find optimum nanodevices with W > 1.4 nm that meet the requirements set by the semiconductor industry for the “3 nm” technology generation, which illustrates the importance of properly accounting bandstructure effects that occur in sub-5 nm-wide PNRs.
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10
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Moschetto S, Bolognesi M, Prescimone F, Brucale M, Mezzi A, Ortolani L, Caporali M, Pingue P, Serrano-Ruiz M, Pisignano D, Peruzzini M, Persano L, Toffanin S. Large-Area Oxidized Phosphorene Nanoflakes Obtained by Electrospray for Energy-Harvesting Applications. ACS APPLIED NANO MATERIALS 2021; 4:3476-3485. [PMID: 35874274 PMCID: PMC9301623 DOI: 10.1021/acsanm.0c03465] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Indexed: 06/15/2023]
Abstract
Bidimensional (2D) materials are nowadays being developed as outstanding candidates for electronic and optoelectronic components and devices. Targeted applications include sensing, energy conversion, and storage. Phosphorene is one of the most promising systems in this context, but its high reactivity under atmospheric conditions and its small-area/lab-scale deposition techniques have hampered the introduction of this material in real-world applications so far. However, phosphorene oxides in the form of low-dimensional structures (2D PO x ) should behave as an electroresponsive material according to recent theoretical studies. In the present work, we introduce electrospraying for the deposition of stoichiometric and large-area 2D PO x nanoflakes starting from a suspension of liquid-phase-exfoliated phosphorene. We obtained 2D PO x nanostructures with a mean surface area two orders of magnitude larger than phosphorene structures obtained with standard mechanical and liquid exfoliation techniques. X-ray spectroscopy and high-resolution electron microscopy confirmed the P2O5-like crystallographic structure of the electrosprayed flakes. Finally, we experimentally demonstrated for the first time the electromechanical responsivity of the 2D P2O5 nanoflakes, through piezoresponse force microscopy (PFM). This work sheds light on the possible implementation of phosphorus oxide-based 2D nanomaterials in the value chain of fabrication and engineering of devices, which might be easily scaled up for energy-harvesting/conversion applications.
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Affiliation(s)
- Salvatore Moschetto
- Istituto
per lo Studio dei Materiali Nanostrutturati (ISMN)—Consiglio
Nazionale delle Ricerche (CNR), Via P. Gobetti 101, 40129 Bologna, Italy
| | - Margherita Bolognesi
- Istituto
per lo Studio dei Materiali Nanostrutturati (ISMN)—Consiglio
Nazionale delle Ricerche (CNR), Via P. Gobetti 101, 40129 Bologna, Italy
| | - Federico Prescimone
- Istituto
per lo Studio dei Materiali Nanostrutturati (ISMN)—Consiglio
Nazionale delle Ricerche (CNR), Via P. Gobetti 101, 40129 Bologna, Italy
| | - Marco Brucale
- Istituto
per lo Studio dei Materiali Nanostrutturati (ISMN)—Consiglio
Nazionale delle Ricerche (CNR), Via P. Gobetti 101, 40129 Bologna, Italy
| | - Alessio Mezzi
- Istituto
per lo Studio dei Materiali Nanostrutturati (ISMN)—Consiglio
Nazionale delle Ricerche (CNR), P.O.
Box 10, Monterotondo Scalo, I-00016 Rome, Italy
| | - Luca Ortolani
- Istituto
per la microelettronica e microsistemi (IMM)—Consiglio Nazionale
delle Ricerche (CNR), Via P. Gobetti 101, 40129 Bologna, Italy
| | - Maria Caporali
- Istituto
di Chimica dei Composti Organometallici (ICCOM)—Consiglio Nazionale
delle Ricerche (CNR), Via Madonna del Piano 10, 50019 Sesto Fiorentino, Florence, Italy
| | - Pasqualantonio Pingue
- Laboratorio
NEST, Scuola Normale Superiore and Istituto
Nanoscienze—Consiglio Nazionale delle Ricerche (CNR), Piazza San Silvestro 12, I-56127 Pisa, Italy
| | - Manuel Serrano-Ruiz
- Istituto
di Chimica dei Composti Organometallici (ICCOM)—Consiglio Nazionale
delle Ricerche (CNR), Via Madonna del Piano 10, 50019 Sesto Fiorentino, Florence, Italy
| | - Dario Pisignano
- Laboratorio
NEST, Scuola Normale Superiore and Istituto
Nanoscienze—Consiglio Nazionale delle Ricerche (CNR), Piazza San Silvestro 12, I-56127 Pisa, Italy
- Dipartimento
di Fisica, Università di Pisa, Largo B. Pontecorvo 3, I-56127 Pisa, Italy
| | - Maurizio Peruzzini
- Istituto
di Chimica dei Composti Organometallici (ICCOM)—Consiglio Nazionale
delle Ricerche (CNR), Via Madonna del Piano 10, 50019 Sesto Fiorentino, Florence, Italy
| | - Luana Persano
- Laboratorio
NEST, Scuola Normale Superiore and Istituto
Nanoscienze—Consiglio Nazionale delle Ricerche (CNR), Piazza San Silvestro 12, I-56127 Pisa, Italy
| | - Stefano Toffanin
- Istituto
per lo Studio dei Materiali Nanostrutturati (ISMN)—Consiglio
Nazionale delle Ricerche (CNR), Via P. Gobetti 101, 40129 Bologna, Italy
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Lv L, Yu J, Hu M, Yin S, Zhuge F, Ma Y, Zhai T. Design and tailoring of two-dimensional Schottky, PN and tunnelling junctions for electronics and optoelectronics. NANOSCALE 2021; 13:6713-6751. [PMID: 33885475 DOI: 10.1039/d1nr00318f] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/12/2023]
Abstract
Owing to their superior carrier mobility, strong light-matter interactions, and flexibility at the atomically thin thickness, two-dimensional (2D) materials are attracting wide interest for application in electronic and optoelectronic devices, including rectifying diodes, transistors, memory, photodetectors, and light-emitting diodes. At the heart of these devices, Schottky, PN, and tunneling junctions are playing an essential role in defining device function. Intriguingly, the ultrathin thickness and unique van der Waals (vdW) interlayer coupling in 2D materials has rendered enormous opportunities for the design and tailoring of various 2D junctions, e.g. using Lego-like hetero-stacking, surface decoration, and field-effect modulation methods. Such flexibility has led to marvelous breakthroughs during the exploration of 2D electronics and optoelectronic devices. To advance further, it is imperative to provide an overview of existing strategies for the engineering of various 2D junctions for their integration in the future. Thus, in this review, we provide a comprehensive survey of previous efforts toward 2D Schottky, PN, and tunneling junctions, and the functional devices built from them. Though these junctions exhibit similar configurations, distinct strategies have been developed for their optimal figures of merit based on their working principles and functional purposes.
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Affiliation(s)
- Liang Lv
- State Key Laboratory of Materials Processing and Die & Mould Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, 430074, China.
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