Design and numerical simulations of W-diamond transmission target for distributed x-ray sources

Design and optimization of thin-film tungsten (W)-diamond target for multi-pixel X-ray sources

BACKGROUND

Emerging multi-pixel X-ray source technology enables new designs for X-ray imaging systems. The power of multi-pixel X-ray sources with a fixed anode is limited by focal spot power density.

PURPOSE

The purpose of this study is to optimize the W-diamond target and predict its performance in multi-pixel X-ray sources.

METHODS

X-ray intensity and energy deposition in the W-diamond target with different thicknesses of tungsten film and incident electron energies was calculated with the Geant4 Monte Carlo toolkit. COMSOL Multiphysics software was used to analyze the transient and stationary heat transfer in the thin-film W-diamond target. The maximum tube power and X-ray output intensity were predicted for both transmission and reflection target configurations.

RESULTS

The maximum focal spot power density was limited by either the graphitization of the diamond substrate or the melting point of the W target. With optimal W-target thickness, the maximum transmission X-ray intensities are about 40%-50% higher than the maximum reflection intensities. Thin-film W-diamond targets allow four to five times more maximum power input and produce six to seven times higher transmission X-ray intensity in continuous mode compared with conventional reflection W thick targets. Depending on the focal spot size, reducing the X-ray pulse duration can further enhance the tube power.

CONCLUSIONS

Multi-pixel X-ray sources using this W-diamond target design can produce significantly higher X-ray output than traditional thick tungsten targets without major modification of the tube design.

Review of high energy x-ray computed tomography for non-destructive dimensional metrology of large metallic advanced manufactured components

Advanced manufacturing technologies, led by additive manufacturing, have undergone significant growth in recent years. These technologies enable engineers to design parts with reduced weight while maintaining structural and functional integrity. In particular, metal additive manufacturing parts are increasingly used in application areas such as aerospace, where a failure of a mission-critical part can have dire safety consequences. Therefore, the quality of these components is extremely important. A critical aspect of quality control is dimensional evaluation, where measurements provide quantitative results that are traceable to the standard unit of length, the metre. Dimensional measurements allow designers, manufacturers and users to check product conformity against engineering drawings and enable the same quality standard to be used across the supply chain nationally and internationally. However, there is a lack of development of measurement techniques that provide non-destructive dimensional measurements beyond common non-destructive evaluation focused on defect detection. X-ray computed tomography (XCT) technology has great potential to be used as a non-destructive dimensional evaluation technology. However, technology development is behind the demand and growth for advanced manufactured parts. Both the size and the value of advanced manufactured parts have grown significantly in recent years, leading to new requirements of dimensional measurement technologies. This paper is a cross-disciplinary review of state-of-the-art non-destructive dimensional measuring techniques relevant to advanced manufacturing of metallic parts at larger length scales, especially the use of high energy XCT with source energy of greater than 400 kV to address the need in measuring large advanced manufactured parts. Technologies considered as potential high energy x-ray generators include both conventional x-ray tubes, linear accelerators, and alternative technologies such as inverse Compton scattering sources, synchrotron sources and laser-driven plasma sources. Their technology advances and challenges are elaborated on. The paper also outlines the development of XCT for dimensional metrology and future needs.

Quantitative analysis of a micro array anode structured target for hard x-ray grating interferometry

Talbot-Lau interferometry (TLI) provides additional contrast modes for x-ray imaging that are complementary to conventional absorption radiography. TLI is particularly interesting because it is one of the few practical methods for realizing phase contrast with x-rays that is compatible with large-spot high power x-ray sources. A novel micro array anode structured target (MAAST) x-ray source offers several advantages for TLI over the conventional combination of an extended x-ray source coupled with an absorption grating including higher flux and larger field of view, and these advantages become more pronounced for x-ray energies in excess of 30 keV. A Monte Carlo simulation was performed to determine the optimal parameters for a MAAST source for use with TLI. It was found that the both spatial distribution of x-ray production and the number of x-ray produced in the MAAST have a strong dependence on the incidence angle of the electron beam.