Effects of finite probe size on self-affine roughness measurements

Accessibility of the surface fractal dimension during film growth

Fractal properties on self-affine surfaces of films growing under nonequilibrium conditions are important in understanding the corresponding universality class. However, measurement of the surface fractal dimension has been intensively investigated and is still very problematic. In this work, we report the behavior of the effective fractal dimension in the context of film growth involving lattice models believed to belong to the Kardar-Parisi-Zhang (KPZ) universality class. Our results, which are presented for growth in a d-dimensional substrate (d=1,2) and use the three-point sinuosity (TPS) method, show universal scaling of the measure M, which is defined in terms of discretization of the Laplacian operator applied to the height of the film surface, M=t^{δ}g[Θ], where t is the time, g[Θ] is a scale function, δ=2β, Θ≡τt^{-1/z}, β, and z are the KPZ growth and dynamical exponents, respectively, and τ is a spatial scale length used to compute M. Importantly, we show that the effective fractal dimensions are consistent with the expected KPZ dimensions for d=1,2, if Θ≲0.3, which include a thin film regime for the extraction of the fractal dimension. This establishes the scale limits in which the TPS method can be used to accurately extract effective fractal dimensions that are consistent with those expected for the corresponding universality class. As a consequence, for the steady state, which is inaccessible to experimentalists studying film growth, the TPS method provided effective fractal dimension consistent with the KPZ ones for almost all possible τ, i.e., 1≲τ<L/2, where L is the lateral size of the substrate on which the deposit is grown. In the growth of thin films, the true fractal dimension can be observed in a narrow range of τ, the upper limit of which is of the same order of magnitude as the correlation length of the surface, indicating the limits of self-affinity of a surface in an experimentally accessible regime. This upper limit was comparatively lower for the Higuchi method or the height-difference correlation function. Scaling corrections for the measure M and the height-difference correlation function are studied analytically and compared for the Edwards-Wilkinson class at d=1, yielding similar accuracy for both methods. Importantly, we extend our discussion to a model representing diffusion-dominated growth of films and find that the TPS method achieves the corresponding fractal dimension only at steady state and in a narrow range of the scale length, compared to that found for the KPZ class.

Friction Behavior of Rough Surfaces on the Basis of Contact Mechanics: A Review and Prospects

Contact and friction are closely related as friction cannot happen without contact. They are widely used in mechanical engineering, traffic, and other fields. The real contact surface is not completely smooth, but it is made up of a series of tiny contact asperities as viewed in the micro-scale. This is just the complexity of the contact and friction behaviors of rough surfaces: the overall mechanical behavior is the result of all asperities which are involved during the contact. Due to the multiplicity of surface topography, the complexity of contact scale, and the nonlinearity of the constitutive material, there are still many open topics in the research of contact and friction behavior of rough surfaces. Based on the perspective of the macroscopic and micro-nano scale contact mechanics, this review gives a brief overview of friction for the latest developments and points out the existing issues and opportunities for future studies.

Roughness and Scaling Properties of Oxide Glass Surfaces at the Nanoscale

Using atomistic computer simulations we determine the roughness and topographical features of melt-formed (MS) and fracture surfaces (FS) of oxide glasses. We find that the topography of the MS is described well by the frozen capillary wave theory. The FS are significant rougher than the MS and depend strongly on glass composition. The height-height correlation function for the FS shows an unexpected logarithmic dependence on distance, in contrast to the power law found in experiments. We unravel the crucial role of spatial resolution on surface measurements and conclude that on length scales less than 10 nm FS are not self-affine fractals.

Shear-Induced Anisotropy in Rough Elastomer Contact

True contact between randomly rough solids consists of myriad individual microjunctions. While their total area controls the adhesive friction force of the interface, other macroscopic features, including viscoelastic friction, wear, stiffness, and electric resistance, also strongly depend on the size and shape of individual microjunctions. We show that, in rough elastomer contacts, the shape of microjunctions significantly varies as a function of the shear force applied to the interface. This process leads to a growth of anisotropy of the overall contact interface, which saturates in the macroscopic sliding regime. We show that smooth sphere-plane contacts have the same shear-induced anisotropic behavior as individual microjunctions, with a common scaling law over 4 orders of magnitude in the initial area. We discuss the physical origin of the observations in light of a fracture-based adhesive contact mechanics model, described in the companion article, which captures the smooth sphere-plane measurements. Our results shed light on a generic, overlooked source of anisotropy in rough elastic contacts, not taken into account in current rough contact mechanics models.

Local roughness exponent in the nonlinear molecular-beam-epitaxy universality class in one dimension

We report local roughness exponents, α_{loc}, for three interface growth models in one dimension which are believed to belong to the nonlinear molecular-beam-epitaxy (nMBE) universality class represented by the Villain-Lais-Das Sarma (VLDS) stochastic equation. We applied an optimum detrended fluctuation analysis (ODFA) [Luis et al., Phys. Rev. E 95, 042801 (2017)2470-004510.1103/PhysRevE.95.042801] and compared the outcomes with standard detrending methods. We observe in all investigated models that ODFA outperforms the standard methods providing exponents in the narrow interval α_{loc}^{}∈[0.96,0.98] quantitatively consistent with two-loop renormalization group predictions for the VLDS equation. In particular, these exponent values are calculated for the Clarke-Vvdensky and Das Sarma-Tamborenea models characterized by very strong corrections to the scaling, for which large deviations of these values had been reported. Our results strongly support the absence of anomalous scaling in the nMBE universality class and the existence of corrections in the form α_{loc}^{}=1-ε of the one-loop renormalization group analysis of the VLDS equation.

Statistics of the separation between sliding rigid rough surfaces: Simulations and extreme value theory approach

When a rigid rough solid slides on a rigid rough surface, it experiences a random motion in the direction normal to the average contact plane. Here, through simulations of the separation at single-point contact between self-affine topographies, we characterize the statistical and spectral properties of this normal motion. In particular, its rms amplitude is much smaller than that of the equivalent roughness of the two topographies and depends on the ratio of the slider's lateral size over a characteristic wavelength of the topography. In addition, due to the nonlinearity of the sliding contact process, the normal motion's spectrum contains wavelengths smaller than the smallest wavelength present in the underlying topographies. We show that the statistical properties of the normal motion's amplitude are well captured by a simple analytic model based on the extreme value theory framework, extending its applicability to sliding-contact-related topics.

Anisotropic Superattenuation of Capillary Waves on Driven Glass Interfaces

Metrological atomic force microscopy measurements are performed on the silica glass interfaces of photonic band-gap fibers and hollow capillaries. The freezing of attenuated out-of-equilibrium capillary waves during the drawing process is shown to result in a reduced surface roughness. The roughness attenuation with respect to the expected thermodynamical limit is determined to vary with the drawing stress following a power law. A striking anisotropic character of the height correlation is observed: glass surfaces thus retain a structural record of the direction of the flow to which the liquid was submitted.

Optimal detrended fluctuation analysis as a tool for the determination of the roughness exponent of the mounded surfaces

We present an optimal detrended fluctuation analysis (DFA) and apply it to evaluate the local roughness exponent in nonequilibrium surface growth models with mounded morphology. Our method consists in analyzing the height fluctuations computing the shortest distance of each point of the profile to a detrending curve that fits the surface within the investigated interval. We compare the optimal DFA (ODFA) with both the standard DFA and nondetrended analysis. We validate the ODFA method considering a one-dimensional model in the Kardar-Parisi-Zhang universality class starting from a mounded initial condition. We applied the methods to the Clarke-Vvedensky (CV) model in 2+1 dimensions with thermally activated surface diffusion and absence of step barriers. It is expected that this model belongs to the nonlinear molecular beam epitaxy (nMBE) universality class. However, an explicit observation of the roughness exponent in agreement with the nMBE class was still missing. The effective roughness exponent obtained with ODFA agrees with the value expected for the nMBE class, whereas using the other methods it does not agree. We also characterize the transient anomalous scaling of the CV model and obtained that the corresponding exponent is in agreement with the value reported for other nMBE models with weaker corrections to the scaling.

The role of Hurst exponent on cold field electron emission from conducting materials: from electric field distribution to Fowler-Nordheim plots

This work considers the effects of the Hurst exponent (H) on the local electric field distribution and the slope of the Fowler-Nordheim (FN) plot when considering the cold field electron emission properties of rough Large-Area Conducting Field Emitter Surfaces (LACFESs). A LACFES is represented by a self-affine Weierstrass-Mandelbrot function in a given spatial direction. For 0.1 ≤ H < 0.5, the local electric field distribution exhibits two clear exponential regimes. Moreover, a scaling between the macroscopic current density () and the characteristic kernel current density (), , with an H-dependent exponent , has been found. This feature, which is less pronounced (but not absent) in the range where more smooth surfaces have been found (), is a consequence of the dependency between the area efficiency of emission of a LACFES and the macroscopic electric field, which is often neglected in the interpretation of cold field electron emission experiments. Considering the recent developments in orthodox field emission theory, we show that the exponent must be considered when calculating the slope characterization parameter (SCP) and thus provides a relevant method of more precisely extracting the characteristic field enhancement factor from the slope of the FN plot.

Effect of the porosity on the fracture surface roughness of sintered materials: from anisotropic to isotropic self-affine scaling

To unravel how the microstructure affects the fracture surface roughness in heterogeneous brittle solids like rocks or ceramics, we characterized the roughness statistics of postmortem fracture surfaces in homemade materials of adjustable microstructure length scale and porosity, obtained by sintering monodisperse polystyrene beads. Beyond the characteristic size of disorder, the roughness profiles are found to exhibit self-affine scaling features evolving with porosity. Starting from a null value and increasing the porosity, we quantitatively modify the self-affine scaling properties from anisotropic (at low porosity) to isotropic (for porosity >10%).

Systematic analysis of Persson's contact mechanics theory of randomly rough elastic surfaces

We systematically check explicit and implicit assumptions of Persson's contact mechanics theory. It casts the evolution of the pressure distribution Pr(p) with increasing resolution of surface roughness as a diffusive process, in which resolution plays the role of time. The tested key assumptions of the theory are: (a) the diffusion coefficient is independent of pressure p, (b) the diffusion process is drift-free at any value of p, (c) the point p = 0 acts as an absorbing barrier, i.e., once a point falls out of contact, it never re-enters again, (d) the Fourier component of the elastic energy is only populated if the appropriate wave vector is resolved, and (e) it no longer changes when even smaller wavelengths are resolved. Using high-resolution numerical simulations, we quantify deviations from these approximations and find quite significant discrepancies in some cases. For example, the drift becomes substantial for small values of p, which typically represent points in real space close to a contact line. On the other hand, there is a significant flux of points re-entering contact. These and other identified deviations cancel each other to a large degree, resulting in an overall excellent description for contact area, contact geometry, and gap distribution functions. Similar fortuitous error cancellations cannot be guaranteed under different circumstances, for instance when investigating rubber friction. The results of the simulations may provide guidelines for a systematic improvement of the theory.

Nanoscale contact-radius determination by spectral analysis of polymer roughness images

In spite of the long history of atomic force microscopy (AFM) imaging of soft materials such as polymers, little is known about the detailed effect of a finite tip size and applied force on the imaging performance on such materials. Here we exploit the defined scaling of roughness amplitudes on amorphous polymer films to determine the transfer function imposed by the imaging tip. The finite indentation of the nanometer-scale tip into the comparatively soft polymer surface leads to a finite contact area, which in turn effectively acts as a moving average filter for the surface roughness. In the power spectral density (PSD), this leads to an attenuation of the roughness amplitudes related to the Airy pattern known from light diffraction of a circular aperture. This transfer function is affected by the roughness-induced local modulation of the tip height and contact area, which is studied by performing simulations of the polymer roughness and the imaging process. We find that for typical polymer parameters and sharp tips the contact radius of the tip-sample contact can be recovered from the roughness spectrum. We experimentally verify and demonstrate the method by measuring the nanoscale contact radius as a function of applied load and travel distance on a highly cross-linked model polymer. The data are consistent with the Johnson-Kendall-Roberts (JKR) contact model and verifies its applicability at the nanometer scale. Using the model, quantitative values of the elastic sample parameters can be determined.

Effect of the local morphology in the field emission properties of conducting polymer surfaces

In this work, we present systematic theoretical evidence of a relationship between the point local roughness exponent (PLRE) (which quantifies the heterogeneity of an irregular surface) and the cold field emission properties (indicated by the local current density and the macroscopic current density) of real polyaniline (PANI) surfaces, considered nowadays as very good candidates in the design of field emission devices. The latter are obtained from atomic force microscopy data. The electric field and potential are calculated in a region bounded by the rough PANI surface and a distant plane, both boundaries held at distinct potential values. We numerically solve Laplace's equation subject to appropriate Dirichlet's condition. Our results show that local roughness reveals the presence of specific sharp emitting spots with a smooth geometry, which are the main ones responsible (but not the only) for the emission efficiency of such surfaces for larger deposition times. Moreover, we have found, with a proper choice of a scale interval encompassing the experimentally measurable average grain length, a highly structured dependence of local current density on PLRE, considering different ticks of PANI surfaces.

Evidence of deep water penetration in silica during stress corrosion fracture

We measure the thickness of the heavy water layer trapped under the stress corrosion fracture surface of silica using neutron reflectivity experiments. We show that the penetration depth is 65-85   Å, suggesting the presence of a damaged zone of ∼100   Å extending ahead of the crack tip during its propagation. This estimate of the size of the damaged zone is compatible with other recent results.