Growth in a restricted solid-on-solid model

Kardar-Parisi-Zhang growth in ɛ dimensions and beyond

We examine anew the relationship of directed polymers in random media on traditional hypercubic versus hierarchical lattices, with the goal of understanding the dimensionality dependence of the essential scaling index β at the heart of the Kardar-Parisi-Zhang universality class. A seemingly accurate, but entirely empirical, ansatz due to Perlsman and Schwartz, proposed many years ago, can be put in proper context by anchoring the connection between these distinct lattice types at vanishing dimensionality. We graft together complementary perturbative field-theoretic and nonperturbative real-space renormalization group tools to establish the necessary connection, thereby elucidating the central mystery underlying the ansatz's uncanny apparent success, but also revealing its intrinsic limitations. Furthermore, we perform an extensive Euler integration of the KPZ equation in 3+1 dimensions which, bolstered by a separate directed polymer simulation, allows us an estimate for the critical exponent β_{3+1}^{KPZ}=0.1845(4) that greatly improves upon all previous Monte Carlo calculations in this regard and rules out the Perlsman-Schwartz value, 0.1882^{+}, in that dimension. Finally, leveraging this hybrid RG partnership permits us a versatile, more potent, tool to explore the general KPZ problem across dimensions, as well as a conjecture for its key critical exponent, β=1/2-0.22967ɛ, as ɛ→0, testable in a three-loop calculation.

Thickness-Dependent Relative Dielectric Constant of Organic Ultrathin Films

In formulas employed for analysis of organic electronic devices, the relative dielectric constant value of the semiconductor organic films is often assumed rather than measured, even though it is a fundamental parameter for a correct interpretation. This is particularly true for ultrathin films made of discrete molecular layers. In this work, Spectroscopy Ellipsometry and Scanning Capacitance Microscopy were used to study thin films made of N,N'-bis(n-octyl)-x:y,dicyanoperylene-3,4 : 9,10-bis(dicarboximide). The relative dielectric constant presents a non-monotonic trend with thickness: it is equal to 2.1 for one molecular layer, saturating at 3.2 for increasing thickness. This maximum value, equivalent to the bulk one, occurs when the coverage is in between the third to the fourth layer. In this range, the growth switches from a Frank-Van der Merwe (2D growth) to a Volmer-Weber mode (3D growth); in addition, the molecular configuration assumes a bent/distorted geometry with respect to the initial edge-on one. These results establish a morphological dependence of the dielectric constant, especially in the vicinity of the substrate interface, that disappears at a certain distance from it.

Bifractality in the one-dimensional Wolf-Villain model

We introduce a multifractal optimal detrended fluctuation analysis to study the scaling properties of the one-dimensional Wolf-Villain (WV) model for surface growth. This model produces coarsened surface morphologies for long timescales (up to 10^{9} monolayers) and its universality class remains an open problem. Our results for the multifractal exponent τ(q) reveal an effective local roughness exponent consistent with a transient given by the molecular beam epitaxy (MBE) growth regime and Edwards-Wilkinson (EW) universality class for negative and positive q values, respectively. Therefore, although the results corroborate that long-wavelength fluctuations belong to the EW class in the hydrodynamic limit, as conjectured in the recent literature, a bifractal signature of the WV model with an MBE regime at short wavelengths was observed.

Finite-size and finite-time scaling for kinetic rough interfaces

We consider discrete models of kinetic rough interfaces that exhibit space-time scale invariance in height-height correlation. We use the generic scaling theory of Ramasco et al. [Phys. Rev. Lett. 84, 2199 (2000)0031-900710.1103/PhysRevLett.84.2199] to confirm that the dynamical structure factor of the height profile can uniquely characterize the underlying dynamics. We apply both finite-size and finite-time scaling methods that systematically allow an estimation of the critical exponents and the scaling functions, eventually establishing the universality class accurately. The finite-size scaling analysis offers an alternative way to characterize the anomalous rough interfaces. As an illustration, we investigate a class of self-organized interface models in random media with extremal dynamics. The isotropic version shows a faceted pattern and belongs to the same universality class (as shown numerically) as the Sneppen model (version A). We also examine an anisotropic version of the Sneppen model and suggest that the model belongs to the universality class of the tensionless Kardar-Parisi-Zhang (tKPZ) equation in one dimension.

Dimensional crossover in Kardar-Parisi-Zhang growth

Two-dimensional (2D) Kardar-Parisi-Zhang (KPZ) growth is usually investigated on substrates of lateral sizes L_{x}=L_{y}, so that L_{x} and the correlation length (ξ) are the only relevant lengths determining the scaling behavior. However, in cylindrical geometry, as well as in flat rectangular substrates L_{x}≠L_{y} and, thus, the surfaces can become correlated in a single direction, when ξ∼L_{x}≪L_{y}. From extensive simulations of several KPZ models, we demonstrate that this yields a dimensional crossover in their dynamics, with the roughness scaling as W∼t^{β_{2D}} for t≪t_{c} and W∼t^{β_{1D}} for t≫t_{c}, where t_{c}∼L_{x}^{1/z_{2D}}. The height distributions (HDs) also cross over from the 2D flat (cylindrical) HD to the asymptotic Tracy-Widom Gaussian orthogonal ensemble (Gaussian unitary ensemble) distribution. Moreover, 2D to one-dimensional (1D) crossovers are found also in the asymptotic growth velocity and in the steady-state regime of flat systems, where a family of universal HDs exists, interpolating between the 2D and 1D ones as L_{y}/L_{x} increases. Importantly, the crossover scalings are fully determined and indicate a possible way to solve 2D KPZ models.

One-point height fluctuations and two-point correlators of (2+1) cylindrical KPZ systems

While the one-point height distributions (HDs) and two-point covariances of (2+1) Kardar-Parisi-Zhang (KPZ) systems have been investigated in several recent works for flat and spherical geometries, for the cylindrical one the HD was analyzed for few models and nothing is known about the spatial and temporal covariances. Here, we report results for these quantities, obtained from extensive numerical simulations of discrete KPZ models, for three different setups yielding cylindrical growth. Beyond demonstrating the universality of the HD and covariances, our results reveal other interesting features of this geometry. For example, the spatial covariances measured along the longitudinal and azimuthal directions are different, with the former being quite similar to the curve for flat (2+1) KPZ systems, while the latter resembles the Airy_{2} covariance of circular (1+1) KPZ interfaces. We also argue (and present numerical evidence) that, in general, the rescaled temporal covariance A(t/t_{0}) decays asymptotically as A(x)∼x^{-λ[over ¯]} with an exponent λ[over ¯]=β+d^{*}/z, where d^{*} is the number of interface sides kept fixed during the growth (being d^{*}=1 for the systems analyzed here). Overall, these results complete the picture of the main statistics for the (2+1) KPZ class.

Accessibility of the surface fractal dimension during film growth

Fractal properties on self-affine surfaces of films growing under nonequilibrium conditions are important in understanding the corresponding universality class. However, measurement of the surface fractal dimension has been intensively investigated and is still very problematic. In this work, we report the behavior of the effective fractal dimension in the context of film growth involving lattice models believed to belong to the Kardar-Parisi-Zhang (KPZ) universality class. Our results, which are presented for growth in a d-dimensional substrate (d=1,2) and use the three-point sinuosity (TPS) method, show universal scaling of the measure M, which is defined in terms of discretization of the Laplacian operator applied to the height of the film surface, M=t^{δ}g[Θ], where t is the time, g[Θ] is a scale function, δ=2β, Θ≡τt^{-1/z}, β, and z are the KPZ growth and dynamical exponents, respectively, and τ is a spatial scale length used to compute M. Importantly, we show that the effective fractal dimensions are consistent with the expected KPZ dimensions for d=1,2, if Θ≲0.3, which include a thin film regime for the extraction of the fractal dimension. This establishes the scale limits in which the TPS method can be used to accurately extract effective fractal dimensions that are consistent with those expected for the corresponding universality class. As a consequence, for the steady state, which is inaccessible to experimentalists studying film growth, the TPS method provided effective fractal dimension consistent with the KPZ ones for almost all possible τ, i.e., 1≲τ<L/2, where L is the lateral size of the substrate on which the deposit is grown. In the growth of thin films, the true fractal dimension can be observed in a narrow range of τ, the upper limit of which is of the same order of magnitude as the correlation length of the surface, indicating the limits of self-affinity of a surface in an experimentally accessible regime. This upper limit was comparatively lower for the Higuchi method or the height-difference correlation function. Scaling corrections for the measure M and the height-difference correlation function are studied analytically and compared for the Edwards-Wilkinson class at d=1, yielding similar accuracy for both methods. Importantly, we extend our discussion to a model representing diffusion-dominated growth of films and find that the TPS method achieves the corresponding fractal dimension only at steady state and in a narrow range of the scale length, compared to that found for the KPZ class.

Kardar-Parisi-Zhang Physics and Phase Transition in a Classical Single Random Walker under Continuous Measurement

We introduce and study a new model consisting of a single classical random walker undergoing continuous monitoring at rate γ on a discrete lattice. Although such a continuous measurement cannot affect physical observables, it has a nontrivial effect on the probability distribution of the random walker. At small γ, we show analytically that the time evolution of the latter can be mapped to the stochastic heat equation. In this limit, the width of the log-probability thus follows a Family-Vicsek scaling law, N^{α}f(t/N^{α/β}), with roughness and growth exponents corresponding to the Kardar-Parisi-Zhang (KPZ) universality class, i.e., α_{KPZ}^{1D}=1/2 and β_{KPZ}^{1D}=1/3, respectively. When γ is increased outside this regime, we find numerically in 1D a crossover from the KPZ class to a new universality class characterized by exponents α_{M}^{1D}≈1 and β_{M}^{1D}≈1.4. In 3D, varying γ beyond a critical value γ_{M}^{c} leads to a phase transition from a smooth phase that we identify as the Edwards-Wilkinson class to a new universality class with α_{M}^{3D}≈1.

Kardar-Parisi-Zhang universality class in (d+1)-dimensions

The determination of the exact exponents of the KPZ class in any substrate dimension d is one of the most important open issues in Statistical Physics. Based on the behavior of the dimensional variation of some exact exponent differences for other growth equations, I find here that the KPZ growth exponents (related to the temporal scaling of the fluctuations) are given by β_{d}=7/8d+13. These exponents present an excellent agreement with the most accurate estimates for them in the literature. Moreover, they are confirmed here through extensive Monte Carlo simulations of discrete growth models and real-space renormalization group (RG) calculations for directed polymers in random media (DPRM), up to d=15. The left-tail exponents of the probability density functions for the DPRM energy provide another striking verification of the analytical result above.

Morphologies and dynamics of free surfaces of crystals composed of active particles

Active matter exhibits various collective motions and nonequilibrium phases, such as crystals; however, their surface properties have been poorly explored. Here, we use Brownian dynamics simulations to investigate the surface morphology and dynamics of two-dimensional active crystals during and after growth. For crystal growth on a substrate, the position and roughness of the crystal surface reach steady states at different times. In the steady state, the surface exhibits superdiffusive behaviour at the short time, and the roughness is insensitive to the roughening process and particle activity. We observe two-stage and three-stage surface roughening at different Péclet numbers. The result of dynamic scaling analysis shows that the surface is similar to anomalous roughening, which is distinct from the normal roughening typically found in conventional passive systems. Capillary wave theory for a thermal equilibrium system can describe the active surface fluctuations only in the long-wavelength regime, indicating that active particles mainly drive the surface out of equilibrium locally. These similarities and differences between the active and passive crystal surfaces are essential for understanding active crystals and interfaces.

Transition between growth of dense and porous films: theory of dual-layer SEI

The formation of passivating films is a common aging phenomenon, for example in weathering of rocks, silicon, and metals. In many cases, a dual-layer structure with a dense inner and a porous outer layer emerges. However, the origin of this dual-layer growth is so far not fully understood. In this work, a continuum model is developed, which describes the morphology evolution of the solid-electrolyte interphase (SEI) in lithium-ion batteries. Transport through the SEI and a growth reaction governed by the SEI surface energies are modelled. In agreement with experiments, this theory predicts that SEI grows initially as a dense film and subsequently as a porous layer. This dynamic phase transition is driven by the slowing down of electron transport as the film thickens. Thereby, the model offers a universal explanation for the emergence of dual-layer structures in passivating films.

Height distributions in interface growth: The role of the averaging process

Height distributions (HDs) are key quantities to uncover universality and geometry-dependence in evolving interfaces. To quantitatively characterize HDs, one uses adimensional ratios of their first central moments (m_{n}) or cumulants (κ_{n}), especially the skewness S and kurtosis K, whose accurate estimate demands an averaging over all L^{d} points of the height profile at a given time, in translation-invariant interfaces, and over N independent samples. One way of doing this is by calculating m_{n}(t) [or κ_{n}(t)] for each sample and then carrying out an average of them for the N interfaces, with S and K being calculated only at the end. Another approach consists in directly calculating the ratios for each interface and, then, averaging the N values. It turns out, however, that S and K for the growth regime HDs display strong finite-size and -time effects when estimated from these "interface statistics," as already observed in some previous works and clearly shown here, through extensive simulations of several discrete growth models belonging to the EW and KPZ classes on one- and two-dimensional substrates of sizes L=const. and L∼t. Importantly, I demonstrate that with "1-point statistics," i.e., by calculating m_{n}(t) [or κ_{n}(t)] once for all NL^{d} heights together, these corrections become very weak, so that S and K attain values very close to the asymptotic ones already at short times and for small L's. However, I find that this "1-point" (1-pt) approach fails in uncovering the universality of the HDs in the steady-state regime (SSR) of systems whose average height, h[over ¯], is a fluctuating variable. In fact, as demonstrated here, in this regime the 1-pt height evolves as h(t)=h[over ¯](t)+s_{λ}A^{1/2}L^{α}ζ+⋯-where P(ζ) is the underlying SSR HD-and the fluctuations in h[over ¯] yield S_{1-pt}∼t^{-1/2} and K_{1-pt}∼t^{-1}. Nonetheless, by analyzing P(h-h[over ¯]), the cumulants of P(ζ) can be accurately determined. I also show that different, but universal, asymptotic values for S and K (related, so, to different HDs) can be found from the "interface statistics" in the SSR. This reveals the importance of employing the various complementary approaches to reliably determine the universality class of a given system through its different HDs.

Crossover from BKT-rough to KPZ-rough surfaces for interface-limited crystal growth/recession

The crossover from a Berezinskii-Kosterlitz-Thouless (BKT) rough surface to a Kardar-Parisi-Zhang (KPZ) rough surface on a vicinal surface is studied using the Monte Carlo method in the non-equilibrium steady state in order to address discrepancies between theoretical results and experiments. The model used is a restricted solid-on-solid model with a discrete Hamiltonian without surface or volume diffusion (interface limited growth/recession). The temperature, driving force for growth, system size, and surface slope dependences of the surface width are calculated for vicinal surfaces tilted between the (001) and (111) surfaces. The surface velocity, kinetic coefficient of the surface, and mean height of the locally merged steps are also calculated. In contrast to the accepted theory for (2 + 1) surfaces, we found that the crossover point from a BKT (logarithmic) rough surface to a KPZ (algebraic) rough surface is different from the kinetic roughening point for the (001) surface. The driving force for crystal growth was found to be a relevant parameter for determining whether the system is in the BKT class or the KPZ class. It was also determined that ad-atoms, ad-holes, islands, and negative-islands block surface fluctuations, which contributes to making a BKT-rough surface.

Universality and crossover behavior of single-step growth models in 1+1 and 2+1 dimensions

We study the kinetic roughening of the single-step (SS) growth model with a tunable parameter p in 1+1 and 2+1 dimensions by performing extensive numerical simulations. We show that there exists a very slow crossover from an intermediate regime dominated by the Edwards-Wilkinson class to an asymptotic regime dominated by the Kardar-Parisi-Zhang (KPZ) class for any p<1/2. We also identify the crossover time, the nonlinear coupling constant, and some nonuniversal parameters in the KPZ equation as a function p. The effective nonuniversal parameters are continuously decreasing with p but not in a linear fashion. Our results provide complete and conclusive evidence that the SS model for p≠1/2 belongs to the KPZ universality class in 2+1 dimensions.

Kinetic roughening of the urban skyline

We analyze the morphology of the modern urban skyline in terms of its roughness properties. This is facilitated by a database of 10^{7} building heights in cities throughout the Netherlands which allows us to compute the asymptotic height difference correlation function in each city. We find that in cities for which the height correlations display power-law scaling as a function of distance between the buildings, the corresponding roughness exponents are commensurate to the Edwards-Wilkinson and Kardar-Parisi-Zhang equations for kinetic roughening. Based on analogy to discrete deposition models, we argue that these two limiting classes emerge because of possible height restriction rules for buildings in some cities.

Feedback control of surface roughness in a one-dimensional Kardar-Parisi-Zhang growth process

Control of generically scale-invariant systems, i.e., targeting specific cooperative features in nonlinear stochastic interacting systems with many degrees of freedom subject to strong fluctuations and correlations that are characterized by power laws, remains an important open problem. We study the control of surface roughness during a growth process described by the Kardar-Parisi-Zhang (KPZ) equation in (1+1) dimensions. We achieve the saturation of the mean surface roughness to a prescribed value using nonlinear feedback control. Numerical integration is performed by means of the pseudospectral method, and the results are used to investigate the coupling effects of controlled (linear) and uncontrolled (nonlinear) KPZ dynamics during the control process. While the intermediate time kinetics is governed by KPZ scaling, at later times a linear regime prevails, namely the relaxation toward the desired surface roughness. The temporal crossover region between these two distinct regimes displays intriguing scaling behavior that is characterized by nontrivial exponents and involves the number of controlled Fourier modes. Due to the control, the height probability distribution becomes negatively skewed, which affects the value of the saturation width.

Modeling of nonequilibrium surface growth by a limited-mobility model with distributed diffusion length

Kinetic Monte Carlo (KMC) simulations are a well-established numerical tool to investigate the time-dependent surface morphology in molecular beam epitaxy experiments. In parallel, simplified approaches such as limited mobility (LM) models characterized by a fixed diffusion length have been studied. Here we investigate an extended LM model to gain deeper insight into the role of diffusional processes concerning the growth morphology. Our model is based on the stochastic transition rules of the Das Sarma-Tamborena model but differs from the latter via a variable diffusion length. A first guess for this length can be extracted from the saturation value of the mean-squared displacement calculated from short KMC simulations. Comparing the resulting surface morphologies in the sub- and multilayer growth regime to those obtained from KMC simulations, we find deviations which can be cured by adding fluctuations to the diffusion length. This mimics the stochastic nature of particle diffusion on a substrate, an aspect which is usually neglected in LM models. We propose to add fluctuations to the diffusion length by choosing this quantity for each adsorbed particle from a Gaussian distribution, where the variance of the distribution serves as a fitting parameter. We show that the diffusional fluctuations have a huge impact on cluster properties during submonolayer growth as well as on the surface profile in the high coverage regime. The analysis of the surface morphologies on one- and two-dimensional substrates during sub- and multilayer growth shows that the LM model can produce structures that are indistinguishable to the ones from KMC simulations at arbitrary growth conditions.

Catalystlike role of impurities in speeding layer-by-layer growth

Molecular self-assembly is usually done at low supersaturation, leading to low rates of growth, in order to allow time for binding mistakes to anneal. However, such conditions can lead to prohibitively long assembly times where growth proceeds by the slow nucleation of successive layers. Here we use a lattice model of molecular self-assembly to show that growth in this regime can be sped up by impurities, which lower the free-energy cost of layer nucleation. Under certain conditions impurities behave almost as a catalyst in that they are present at high concentration at the surface of the assembling structure, but at low concentration in the bulk of the assembled structure. Extrapolation of our numerics using simple analytic arguments suggests that this mechanism can reduce growth times by orders of magnitude in parameter regimes applicable to molecular systems.

Faceted patterns and anomalous surface roughening driven by long-range temporally correlated noise

We investigate Kardar-Parisi-Zhang (KPZ) surface growth in the presence of power-law temporally correlated noise. By means of extensive numerical simulations of models in the KPZ universality class we find that, as the noise correlator index increases above some threshold value, the surface exhibits anomalous kinetic roughening of the type described by the generic scaling theory of Ramasco et al. [Phys. Rev. Lett. 84, 2199 (2000)PRLTAO0031-900710.1103/PhysRevLett.84.2199]. Remarkably, as the driving noise temporal correlations increase, the surface develops a characteristic pattern of macroscopic facets that completely dominates the dynamics in the long time limit. We argue that standard scaling fails to capture the behavior of KPZ subject to long-range temporally correlated noise. These phenomena are not not described by the existing theoretical approaches, including renormalization group and self-consistent approaches.

Multi-facets of kinetic roughening of interfaces

In this review, the authors are going to explore the intriguing aspects of kinetic roughening of interfaces. Interface roughness dynamics connected with various physical processes have been studied through novel microscopic models in connection with experiments. The statistical properties of such rough interfaces appearing in wide range of physical systems are observed to belong to different universality classes characterized by the scaling exponents. With the advancement of characterization techniques, the scaling exponents of thin-film surface (or the morphological evolution of amorphous surfaces eroded by ion bombardment) are easily computed even in situ during the growing (erosion) conditions. The relevant key physical parameters during the dynamics crucially control the overall scaling behaviour as well as the scaling exponents. The non-universal nature of scaling exponents is emphasized on the variations of the physical parameters in experimental studies and also in theoretical models. Overall, this review containing both theoretical and experimental results will unfold some novel features of surface morphology and its evolution and shed important directions to build an appropriate theoretical framework to explain the observations in systematic and consistent experiments.

Circular Kardar-Parisi-Zhang interfaces evolving out of the plane

Circular KPZ interfaces spreading radially in the plane have Gaussian unitary ensemble (GUE) Tracy-Widom (TW) height distribution (HD) and Airy_{2} spatial covariance, but what are their statistics if they evolve on the surface of a different background space, such as a bowl, a mountain, or any surface of revolution? To give an answer to this, we report here extensive numerical analyses of several one-dimensional KPZ models on substrates whose size enlarges as 〈L(t)〉=L_{0}+ωt^{γ}, while their mean height 〈h〉 increases as usual [〈h〉∼t]. We show that the competition between the L enlargement and the correlation length (ξ≃ct^{1/z}) plays a key role in the asymptotic statistics of the interfaces. While systems with γ>1/z have HDs given by GUE and the interface width increasing as w∼t^{β}, for γ<1/z the HDs are Gaussian, in a correlated regime where w∼t^{αγ}. For the special case γ=1/z, a continuous class of distributions exists, which interpolate between Gaussian (for small ω/c) and GUE (for ω/c≫1). Interestingly, the HD seems to agree with the Gaussian symplectic ensemble (GSE) TW distribution for ω/c≈10. Despite the GUE HDs for γ>1/z, the spatial covariances present a strong dependence on the parameters ω and γ, agreeing with Airy_{2} only for ω≫1, for a given γ, or when γ=1, for a fixed ω. These results considerably generalize our knowledge on 1D KPZ systems, unveiling the importance of the background space on their statistics.

Anomalous one-dimensional fluctuations of a simple two-dimensional random walk in a large-deviation regime

The following question is the subject of our work: could a two-dimensional (2D) random path pushed by some constraints to an improbable "large-deviation regime" possess extreme statistics with one-dimensional (1D) Kardar-Parisi-Zhang (KPZ) fluctuations? The answer is positive, though nonuniversal, since the fluctuations depend on the underlying geometry. We consider in detail two examples of 2D systems for which imposed external constraints force the underlying stationary stochastic process to stay in an atypical regime with anomalous statistics. The first example deals with the fluctuations of a stretched 2D random walk above a semicircle or a triangle. In the second example we consider a 2D biased random walk along a channel with forbidden voids of circular and triangular shapes. In both cases we are interested in the dependence of a typical span 〈d(t)〉∼t^{γ} of the trajectory of t steps above the top of the semicircle or the triangle. We show that γ=1/3, i.e., 〈d(t)〉 shares the KPZ statistics for the semicircle, while γ=0 for the triangle. We propose heuristic derivations of scaling exponents γ for different geometries, justify them by explicit analytic computations, and compare with numeric simulations. For practical purposes, our results demonstrate that the geometry of voids in a channel might have a crucial impact on the width of the boundary layer and, thus, on the heat transfer in the channel.

Random deposition with a power-law noise model: Multiaffine analysis

We study the random deposition model with power-law distributed noise and rare-event dominated fluctuation. In this model instead of particles with unit sizes, rods with variable lengths are deposited onto the substrate. The length of each rod is chosen from a power-law distribution P(l)∼l^{-(μ+1)}, and the site at which each rod is deposited is chosen randomly. The results show that for μ<μ_{c}=3 the log-log diagram of roughness, W(t), versus deposition time, t, increases as a step function, where the roughness in each interval acts as W_{loc}(t)≈t^{β_{loc}}. The local growth exponent, β_{loc}, is zero for μ=1. By increasing the μ exponent, the value of β_{loc} is increased. It tends to the growth exponent of the random distribution model with Gaussian noise, β=1/2, at μ_{c}=3. The fractal analysis of the height fluctuations for this model was performed by multifractal detrended fluctuation analysis algorithm. The results show multiaffinity behavior for the height fluctuations at μ<μ_{c} and the multiaffinity strength is greater for smaller values of the μ exponent.

Width Scaling of an Interface Constrained by a Membrane

We investigate the shape of a growing interface in the presence of an impenetrable moving membrane. The two distinct geometrical arrangements of the interface and membrane, obtained by placing the membrane behind or ahead of the interface, are not symmetrically related. On the basis of numerical results and an exact calculation, we argue that these two arrangements represent two distinct universality classes for interfacial growth: while the well-established Kardar-Parisi-Zhang (KPZ) growth is obtained in the "ahead" arrangement, we find an arrested KPZ growth with a smaller roughness exponent in the "behind" arrangement. This suggests that the surface properties of growing cell membranes and expanding bacterial colonies, for example, are fundamentally distinct.

Sinc noise for the Kardar-Parisi-Zhang equation

In this paper we study the one-dimensional Kardar-Parisi-Zhang (KPZ) equation with correlated noise by field-theoretic dynamic renormalization-group techniques. We focus on spatially correlated noise where the correlations are characterized by a sinc profile in Fourier space with a certain correlation length ξ. The influence of this correlation length on the dynamics of the KPZ equation is analyzed. It is found that its large-scale behavior is controlled by the standard KPZ fixed point, i.e., in this limit the KPZ system forced by sinc noise with arbitrarily large but finite correlation length ξ behaves as if it were excited by pure white noise. A similar result has been found by Mathey et al. [S. Mathey et al., Phys. Rev. E 95, 032117 (2017)2470-004510.1103/PhysRevE.95.032117] for a spatial noise correlation of Gaussian type (∼e^{-x^{2}/2ξ^{2}}), using a different method. These two findings together suggest that the KPZ dynamics is universal with respect to the exact noise structure, provided the noise correlation length ξ is finite.

Kardar-Parisi-Zhang growth on one-dimensional decreasing substrates

Recent experimental works on one-dimensional (1D) circular Kardar-Parisi-Zhang (KPZ) systems whose radii decrease in time have reported controversial conclusions about the statistics of their interfaces. Motivated by this, here we investigate several one-dimensional KPZ models on substrates whose size changes in time as L(t)=L_{0}+ωt, focusing on the case ω<0. From extensive numerical simulations, we show that for L_{0}≫1 there exists a transient regime in which the statistics is consistent with that of flat KPZ systems (the ω=0 case), for both ω<0 and ω>0. Actually, for a given model, L_{0} and |ω|, we observe that a difference between ingrowing (ω<0) and outgrowing (ω>0) systems arises only at long times (t∼t_{c}=L_{0}/|ω|), when the expanding surfaces cross over to the statistics of curved KPZ systems, whereas the shrinking ones become completely correlated. A generalization of the Family-Vicsek scaling for the roughness of ingrowing interfaces is presented. Our results demonstrate that a transient flat statistics is a general feature of systems starting with large initial sizes, regardless of their curvature. This is consistent with their recent observation in ingrowing turbulent liquid crystal interfaces, but it is in contrast with the apparent observation of curved statistics in colloidal deposition at the edge of evaporating drops. A possible explanation for this last result, as a consequence of the very small number of monolayers analyzed in this experiment, is given. This is illustrated in a competitive growth model presenting a few-monolayer transient and an asymptotic behavior consistent, respectively, with the curved and flat statistics.

Interface collisions

We provide a theoretical framework to analyze the properties of frontal collisions of two growing interfaces considering different short-range interactions between them. Due to their roughness, the collision events spread in time and form rough domain boundaries, which defines collision interfaces in time and space. We show that statistical properties of such interfaces depend on the kinetics of the growing interfaces before collision, but are independent of the details of their interaction and of their fluctuations during the collision. Those properties exhibit dynamic scaling with exponents related to the growth kinetics, but their distributions may be nonuniversal. Our results are supported by simulations of lattice models with irreversible dynamics and local interactions. Relations to first passage processes are discussed and a possible application to grain-boundary formation in two-dimensional materials is suggested.

Radial restricted solid-on-solid and etching interface-growth models

An approach to generate radial interfaces is presented. A radial network recursively obtained is used to implement discrete model rules designed originally for the investigation in flat substrates. I used the restricted solid-on-solid and etching models as to test the proposed scheme. The results indicate the Kardar, Parisi, and Zhang conjecture is completely verified leading to a good agreement between the interface radius fluctuation distribution and the Gaussian unitary ensemble. The evolution of the radius agrees well with the generalized conjecture, and the two-point correlation function exhibits also a good agreement with the covariance of the Airy_{2} process. The approach can be used to investigate radial interfaces evolution for many other classes of universality.

Simulations of Co-GISAXS during kinetic roughening of growth surfaces

The recent development of surface growth studies using X-ray photon correlation spectroscopy in a grazing-incidence small-angle X-ray scattering (Co-GISAXS) geometry enables the investigation of dynamical processes during kinetic roughening in greater detail than was previously possible. In order to investigate the Co-GISAXS behavior expected from existing growth models, calculations and (2+1)-dimension simulations of linear Kuramoto-Sivashinsky and non-linear Kardar-Parisi-Zhang surface growth equations are presented which analyze the temporal correlation functions of the height-height structure factor. Calculations of the GISAXS intensity auto-correlation functions are also performed within the Born/distorted-wave Born approximation for comparison with the scaling behavior of the height-height structure factor and its correlation functions.

Effects of film growth kinetics on grain coarsening and grain shape

We study models of grain nucleation and coarsening during the deposition of a thin film using numerical simulations and scaling approaches. The incorporation of new particles in the film is determined by lattice growth models in three different universality classes, with no effect of the grain structure. The first model of grain coarsening is similar to that proposed by Saito and Omura [Phys. Rev. E 84, 021601 (2011)PLEEE81539-375510.1103/PhysRevE.84.021601], in which nucleation occurs only at the substrate, and the grain boundary evolution at the film surface is determined by a probabilistic competition of neighboring grains. The surface grain density has a power-law decay, with an exponent related to the dynamical exponent of the underlying growth kinetics, and the average radius of gyration scales with the film thickness with the same exponent. This model is extended by allowing nucleation of new grains during the deposition, with constant but small rates. The surface grain density crosses over from the initial power law decay to a saturation; at the crossover, the time, grain mass, and surface grain density are estimated as a function of the nucleation rate. The distributions of grain mass, height, and radius of gyration show remarkable power law decays, similar to other systems with coarsening and particle injection, with exponents also related to the dynamical exponent. The scaling of the radius of gyration with the height h relative to the base of the grain show clearly different exponents in growth dominated by surface tension and growth dominated by surface diffusion; thus it may be interesting for investigating the effects of kinetic roughening on grain morphology. In growth dominated by surface diffusion, the increase of grain size with temperature is observed.

Zero-temperature directed polymer in random potential in 4+1 dimensions

Zero-temperature directed polymer in random potential in 4+1 dimensions is described. The fluctuation ΔE(t) of the lowest energy of the polymer varies as t^{β} with β=0.159±0.007 for polymer length t and ΔE follows ΔE(L)∼L^{α} at saturation with α=0.275±0.009, where L is the system size. The dynamic exponent z≈1.73 is obtained from z=α/β. The estimated values of the exponents satisfy the scaling relation α+z=2 very well. We also monitor the end to end distance of the polymer and obtain z independently. Our results show that the upper critical dimension of the Kardar-Parisi-Zhang equation is higher than d=4+1 dimensions.

Universality of (2+1)-dimensional restricted solid-on-solid models

Extensive dynamical simulations of restricted solid-on-solid models in D=2+1 dimensions have been done using parallel multisurface algorithms implemented on graphics cards. Numerical evidence is presented that these models exhibit Kardar-Parisi-Zhang surface growth scaling, irrespective of the step heights N. We show that by increasing N the corrections to scaling increase, thus smaller step-sized models describe better the asymptotic, long-wave-scaling behavior.

Keldysh field theory for driven open quantum systems

Recent experimental developments in diverse areas-ranging from cold atomic gases to light-driven semiconductors to microcavity arrays-move systems into the focus which are located on the interface of quantum optics, many-body physics and statistical mechanics. They share in common that coherent and driven-dissipative quantum dynamics occur on an equal footing, creating genuine non-equilibrium scenarios without immediate counterpart in equilibrium condensed matter physics. This concerns both their non-thermal stationary states and their many-body time evolution. It is a challenge to theory to identify novel instances of universal emergent macroscopic phenomena, which are tied unambiguously and in an observable way to the microscopic drive conditions. In this review, we discuss some recent results in this direction. Moreover, we provide a systematic introduction to the open system Keldysh functional integral approach, which is the proper technical tool to accomplish a merger of quantum optics and many-body physics, and leverages the power of modern quantum field theory to driven open quantum systems.

Probability distributions for directed polymers in random media with correlated noise

The probability distribution for the free energy of directed polymers in random media (DPRM) with uncorrelated noise in d=1+1 dimensions satisfies the Tracy-Widom distribution. We inquire if and how this universal distribution is modified in the presence of spatially correlated noise. The width of the distribution scales as the DPRM length to an exponent β, in good (but not full) agreement with previous renormalization group and numerical results. The scaled probability is well described by the Tracy-Widom form for uncorrelated noise, but becomes symmetric with increasing correlation exponent. We thus find a class of distributions that continuously interpolates between Tracy-Widom and Gaussian forms.

Scaling, cumulant ratios, and height distribution of ballistic deposition in 3+1 and 4+1 dimensions

We investigate the origin of the scaling corrections in ballistic deposition models in high dimensions using the method proposed by Alves et al. [Phys. Rev. E 90, 052405 (2014)PLEEE81539-375510.1103/PhysRevE.90.052405] in d=2+1 dimensions, where the intrinsic width associated with the fluctuations of the height increments during the deposition processes is explicitly taken into account. In the present work, we show that this concept holds for d=3+1 and 4+1 dimensions. We have found that growth and roughness exponents and dimensionless cumulant ratios are in agreement with other models, presenting small finite-time corrections to the scaling, that in principle belong to the Kardar-Parisi-Zhang (KPZ) universality class in both d=3+1 and 4+1. Our results constitute further evidence that the upper critical dimension of the KPZ class, if it exists, is larger than 4.

Width and extremal height distributions of fluctuating interfaces with window boundary conditions

We present a detailed study of squared local roughness (SLRDs) and local extremal height distributions (LEHDs), calculated in windows of lateral size l, for interfaces in several universality classes, in substrate dimensions d_{s}=1 and 2. We show that their cumulants follow a Family-Vicsek-type scaling, and, at early times, when ξ≪l (ξ is the correlation length), the rescaled SLRDs are given by log-normal distributions, with their nth cumulant scaling as (ξ/l)^{(n-1)d_{s}}. This gives rise to an interesting temporal scaling for such cumulants as 〈w_{n}〉_{c}∼t^{γ_{n}}, with γ_{n}=2nβ+(n-1)d_{s}/z=[2n+(n-1)d_{s}/α]β. This scaling is analytically proved for the Edwards-Wilkinson (EW) and random deposition interfaces and numerically confirmed for other classes. In general, it is featured by small corrections, and, thus, it yields exponents γ_{n} (and, consequently, α,β and z) in good agreement with their respective universality class. Thus, it is a useful framework for numerical and experimental investigations, where it is usually hard to estimate the dynamic z and mainly the (global) roughness α exponents. The stationary (for ξ≫l) SLRDs and LEHDs of the Kardar-Parisi-Zhang (KPZ) class are also investigated, and, for some models, strong finite-size corrections are found. However, we demonstrate that good evidence of their universality can be obtained through successive extrapolations of their cumulant ratios for long times and large l. We also show that SLRDs and LEHDs are the same for flat and curved KPZ interfaces.

Surface growth on percolation networks by a conserved-noise restricted solid-on-solid growth model

Surface growth by the conserved-noise restricted solid-on-solid model is investigated on diluted lattices, i.e., on percolation networks that are embedded in two spatial dimensions. The growth exponent β and the roughness exponent α are defined, respectively, by the mean-square surface width via W(2)(t)∼t(2β) and the mean-square saturated width via W(sat)(2)(L)∼L(2α), where L is the system size. These are measured on both an infinite network and a backbone network and the results are compared with power-counting predictions obtained using the fractional Langevin equation. While the Monte Carlo results on deterministic fractal substrates show excellent agreement with the predictions [D. H. Kim and J. M. Kim, Phys. Rev. E 84, 011105 (2011)], the results on critical percolation networks deviate by 8%-12% from these predictions.

Numerical estimate of the Kardar-Parisi-Zhang universality class in (2+1) dimensions

We study the restricted solid on solid model for surface growth in spatial dimension d=2 by means of a multisurface coding technique that allows one to produce a large number of samples in the stationary regime in a reasonable computational time. Thanks to (i) a careful finite-size scaling analysis of the critical exponents and (ii) the accurate estimate of the first three moments of the height fluctuations, we can quantify the wandering exponent with unprecedented precision: χ(d=2)=0.3869(4). This figure is incompatible with the long-standing conjecture due to Kim and Koesterlitz that hypothesized χ(d=2)=2/5.

Kinetic roughening and porosity scaling in film growth with subsurface lateral aggregation

We study surface and bulk properties of porous films produced by a model in which particles incide perpendicularly to a substrate, interact with deposited neighbors in its trajectory, and aggregate laterally with probability of order a at each position. The model generalizes ballisticlike models by allowing attachment to particles below the outer surface. For small values of a, a crossover from uncorrelated deposition (UD) to correlated growth is observed. Simulations are performed in 1+1 and 2+1 dimensions. Extrapolation of effective exponents and comparison of roughness distributions confirm Kardar-Parisi-Zhang roughening of the outer surface for a>0. A scaling approach for small a predicts crossover times as a(-2/3) and local height fluctuations as a(-1/3) at the crossover, independent of substrate dimension. These relations are different from all previously studied models with crossovers from UD to correlated growth due to subsurface aggregation, which reduces scaling exponents. The same approach predicts the porosity and average pore height scaling as a(1/3) and a(-1/3), respectively, in good agreement with simulation results in 1+1 and 2+1 dimensions. These results may be useful for modeling samples with desired porosity and long pores.

Generalized model for solid-on-solid interface growth

We present a probabilistic cellular automaton (PCA) model to study solid-on-solid interface growth in which the transition rules depend on the local morphology of the profile obtained from the interface representation of the PCA. We show that the model is able to reproduce a wide range of patterns whose critical roughening exponents are associated to different universality classes, including random deposition, Edwards-Wilkinson, and Kardar-Parisi-Zhang. By means of the growth exponent method, we consider a particular set of the model parameters to build the two-dimensional phase diagram corresponding to a planar cut of the higher dimensional parameter space. A strong indication of phase transition between different universality classes can be observed, evincing different regimes of deposition, from layer-by-layer to Volmer-Weber and Stransk-Krastanov-like modes. We expect that this model can be useful to predict the morphological properties of interfaces obtained at different surface deposition problems, since it allows us to simulate several experimental situations by setting the values of the specific transition probabilities in a very simple and direct way.

Skewness in (1+1)-dimensional Kardar-Parisi-Zhang-type growth

We use the (1+1)-dimensional Kardar-Parisi-Zhang equation driven by a Gaussian white noise and employ the dynamic renormalization-group of Yakhot and Orszag without rescaling [J. Sci. Comput. 1, 3 (1986)]. Hence we calculate the second- and third-order moments of height distribution using the diagrammatic method in the large-scale and long-time limits. The moments so calculated lead to the value S=0.3237 for the skewness. This value is comparable with numerical and experimental estimates.

Nonuniversal effects in mixing correlated-growth processes with randomness: interplay between bulk morphology and surface roughening

To construct continuum stochastic growth equations for competitive nonequilibrium surface-growth processes of the type RD+X that mixes random deposition (RD) with a correlated-growth process X, we use a simplex decomposition of the height field. A distinction between growth processes X that do and do not create voids in the bulk leads to the definition of the effective probability p(eff) of the process X that is a measurable property of the bulk morphology and depends on the activation probability p of X in the competitive process RD+X. The bulk morphology is reflected in the surface roughening via nonuniversal prefactors in the universal scaling of the surface width that scales in p(eff). The equation and the resulting scaling are derived for X in either a Kardar-Parisi-Zhang or Edwards-Wilkinson universality class in (1+1) dimensions and are illustrated by an example of X being a ballistic deposition. We obtain full data collapse on its corresponding universal scaling function for all p∈(0;1]. We outline the generalizations to (1+n) dimensions and to many-component competitive growth processes.

Origins of scaling corrections in ballistic growth models

We study the ballistic deposition and the grain deposition models on two-dimensional substrates. Using the Kardar-Parisi-Zhang (KPZ) ansatz for height fluctuations, we show that the main contribution to the intrinsic width, which causes strong corrections to the scaling, comes from the fluctuations in the height increments along deposition events. Accounting for this correction in the scaling analysis, we obtain scaling exponents in excellent agreement with the KPZ class. We also propose a method to suppress these corrections, which consists in dividing the surface in bins of size ɛ and using only the maximal height inside each bin to do the statistics. Again, scaling exponents in remarkable agreement with the KPZ class are found. The binning method allows the accurate determination of the height distributions of the ballistic models in both growth and steady-state regimes, providing the universal underlying fluctuations foreseen for KPZ class in 2 + 1 dimensions. Our results provide complete and conclusive evidences that the ballistic model belongs to the KPZ universality class in 2+1 dimensions. Potential applications of the methods developed here, in both numerics and experiments, are discussed.

Universality of fluctuations in the Kardar-Parisi-Zhang class in high dimensions and its upper critical dimension

We show that the theoretical machinery developed for the Kardar-Parisi-Zhang (KPZ) class in low dimensions is obeyed by the restricted solid-on-solid model for substrates with dimensions up to d=6. Analyzing different restriction conditions, we show that the height distributions of the interface are universal for all investigated dimensions. It means that fluctuations are not negligible and, consequently, the system is still below the upper critical dimension at d=6. The extrapolation of the data to dimensions d≥7 predicts that the upper critical dimension of the KPZ class is infinite.

Parallel discrete-event simulation schemes with heterogeneous processing elements

To understand the effects of nonidentical processing elements (PEs) on parallel discrete-event simulation (PDES) schemes, two stochastic growth models, the restricted solid-on-solid (RSOS) model and the Family model, are investigated by simulations. The RSOS model is the model for the PDES scheme governed by the Kardar-Parisi-Zhang equation (KPZ scheme). The Family model is the model for the scheme governed by the Edwards-Wilkinson equation (EW scheme). Two kinds of distributions for nonidentical PEs are considered. In the first kind computing capacities of PEs are not much different, whereas in the second kind the capacities are extremely widespread. The KPZ scheme on the complex networks shows the synchronizability and scalability regardless of the kinds of PEs. The EW scheme never shows the synchronizability for the random configuration of PEs of the first kind. However, by regularizing the arrangement of PEs of the first kind, the EW scheme is made to show the synchronizability. In contrast, EW scheme never shows the synchronizability for any configuration of PEs of the second kind.

Relaxation after a change in the interface growth dynamics

The global effects of sudden changes in the interface growth dynamics are studied using models of the Edwards-Wilkinson (EW) and Kardar-Parisi-Zhang (KPZ) classes during their growth regimes in dimensions d=1 and d=2. Scaling arguments and simulation results are combined to predict the relaxation of the difference in the roughness of the perturbed and the unperturbed interfaces, ΔW^{2}∼s{c}t{-γ}, where s is the time of the change and t>s is the observation time after that event. The previous analytical solution for the EW-EW changes is reviewed and numerically discussed in the context of lattice models, with possible decays with γ=3/2 and γ=1/2. Assuming the dominant contribution to ΔW{2} to be predicted from a time shift in the final growth dynamics, the scaling of KPZ-KPZ changes with γ=1-2β and c=2β is predicted, where β is the growth exponent. Good agreement with simulation results in d=1 and d=2 is observed. A relation with the relaxation of a local autoresponse function in d=1 cannot be discarded, but very different exponents are shown in d=2. We also consider changes between different dynamics, with the KPZ-EW as a special case in which a faster growth, with dynamical exponent z_{i}, changes to a slower one, with exponent z. A scaling approach predicts a crossover time t_{c}∼s{z/z_{i}}≫s and ΔW{2}∼s{c}F(t/t_{c}), with the decay exponent γ=1/2 of the EW class. This rules out the simplified time shift hypothesis in d=2 dimensions. These results help to understand the remarkable differences in EW smoothing of correlated and uncorrelated surfaces, and the approach may be extended to sudden changes between other growth dynamics.

Aging of the (2+1)-dimensional Kardar-Parisi-Zhang model

Extended dynamical simulations have been performed on a (2+1)-dimensional driven dimer lattice-gas model to estimate aging properties. The autocorrelation and the autoresponse functions are determined and the corresponding scaling exponents are tabulated. Since this model can be mapped onto the (2+1)-dimensional Kardar-Parisi-Zhang surface growth model, our results contribute to the understanding of the universality class of that basic system.