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A Review of X-ray Microcalorimeters Based on Superconducting Transition Edge Sensors for Astrophysics and Particle Physics. APPLIED SCIENCES-BASEL 2021. [DOI: 10.3390/app11093793] [Citation(s) in RCA: 14] [Impact Index Per Article: 4.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
Abstract
The state-of-the-art technology of X-ray microcalorimeters based on superconducting transition-edge sensors (TESs), for applications in astrophysics and particle physics, is reviewed. We will show the advance in understanding the detector physics and describe the recent breakthroughs in the TES design that are opening the way towards the fabrication and the read-out of very large arrays of pixels with unprecedented energy resolution. The most challenging low temperature instruments for space- and ground-base experiments will be described.
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Jaeckel FT, Ambarish CV, Dai H, Liu S, McCammon D, McPheron M, Nelms KL, Roy A, Stueber HR, Bandler SR, Chervenak JA, Sakai K, Smith SJ. Calibration and Testing of Small High-Resolution Transition Edge Sensor Microcalorimeters with Optical Photons. IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY : A PUBLICATION OF THE IEEE SUPERCONDUCTIVITY COMMITTEE 2021; 1:1. [PMID: 33531792 PMCID: PMC7849770 DOI: 10.1109/tasc.2021.3053506] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/12/2023]
Abstract
Pulses of narrow line-width optical photons can be used to calibrate and test sub-2 eV full-width at halfmaximum (FWHM) energy resolution transition-edge sensor (TES) microcalorimeters at low energies (< 1 keV), where it is very challenging to obtain X-ray calibration lines comparable to (or narrower than) the detector resolution. This scheme depends on the ability to resolve the number of 3 eV photons in each pulse, which we have recently demonstrated up to photon numbers of about 300. At LTD-18 we showed preliminary results obtained with this technique on a 0.25 eV baseline resolution TES microcalorimeter designed for the ultra-high-resolution subarray of the Lynx mission. The line-shape was well described by a simple Gaussian. However, the difficulty of delivering photons to the small 46 μm square absorbers resulted in a large thermal crosstalk signal, whose random nature is expected to rapidly degrade the observed energy resolution towards higher photon numbers/energies. We have since improved the coupling between the optical fiber and the TES absorber and report here our current results.
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Affiliation(s)
- Felix T Jaeckel
- Department of Physics, University of Wisconsin-Madison, Madison, WI 53706 USA
| | - C V Ambarish
- Department of Physics, University of Wisconsin-Madison, Madison, WI 53706 USA
| | - Haoran Dai
- Department of Physics, University of Wisconsin-Madison, Madison, WI 53706 USA
| | - Shukai Liu
- Department of Physics, University of Wisconsin-Madison, Madison, WI 53706 USA
| | - Dan McCammon
- Department of Physics, University of Wisconsin-Madison, Madison, WI 53706 USA
| | - Mari McPheron
- Department of Physics, University of Wisconsin-Madison, Madison, WI 53706 USA
| | - Kari L Nelms
- Department of Physics, University of Wisconsin-Madison, Madison, WI 53706 USA
| | - Avirup Roy
- Department of Physics, University of Wisconsin-Madison, Madison, WI 53706 USA
| | - Haley R Stueber
- Department of Physics, University of Wisconsin-Madison, Madison, WI 53706 USA
| | | | | | - Kazuhiro Sakai
- NASA Goddard Space Flight Center, Greenbelt, MD 20771, USA
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Xu X, Rajteri M, Li J, Zhang S, Chen J, Monticone E, Zhong Q, Gao H, Li W, Li X, Li Q, Zhong Y, Cao W, Wang S, Gao Y, Liu Z, Wang X. Influence of the Interface Composition to the Superconductivity of Ti/PdAu Films. NANOMATERIALS 2020; 11:nano11010039. [PMID: 33375754 PMCID: PMC7824721 DOI: 10.3390/nano11010039] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 11/29/2020] [Revised: 12/22/2020] [Accepted: 12/22/2020] [Indexed: 11/26/2022]
Abstract
In this work, the interface composition of the superconducting Ti/PdAu bilayer is tuned by an annealing process in N2 from 100 to 500 °C to control the superconducting transition temperature (Tc). This Ti-PdAu composition layer is characterized with a high-resolution transmission electron microscopy (HRTEM) and energy-dispersive spectrometer (EDS) to show the infiltration process. The surface topography, electrical, and cryogenic properties are also shown. The inter-infiltration of Ti and PdAu induced by the thermal treatments generates an intermixed layer at the interface of the bilayer film. Due to the enforced proximity effect by the annealing process, the Tc of Ti (55 nm)/PdAu (60 nm) bilayer thin films is tuned from an initial value of 243 to 111 mK which is a temperature that is suitable for the application as the function unit of a superconducting transition edge sensor.
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Affiliation(s)
- Xiaolong Xu
- National Institute of Metrology (NIM), Beijing 100029, China; (X.X.); (J.C.); (Q.Z.); (H.G.); (W.L.); (X.L.); (Q.L.); (Y.Z.); (W.C.); (S.W.); (Y.G.); (Z.L.)
| | - Mauro Rajteri
- Istituto Nazionale di Ricerca Metrologica (INRiM), 10135 Torino, Italy; (M.R.); (E.M.)
| | - Jinjin Li
- National Institute of Metrology (NIM), Beijing 100029, China; (X.X.); (J.C.); (Q.Z.); (H.G.); (W.L.); (X.L.); (Q.L.); (Y.Z.); (W.C.); (S.W.); (Y.G.); (Z.L.)
- Correspondence: (J.L.); (X.W.); Tel.: +86-10-6452-6134 (J.L.); +86-10-6452-4555 (X.W.)
| | - Shuo Zhang
- Center for Transformative Science, ShanghaiTech University, Shanghai 201210, China;
| | - Jian Chen
- National Institute of Metrology (NIM), Beijing 100029, China; (X.X.); (J.C.); (Q.Z.); (H.G.); (W.L.); (X.L.); (Q.L.); (Y.Z.); (W.C.); (S.W.); (Y.G.); (Z.L.)
| | - Eugenio Monticone
- Istituto Nazionale di Ricerca Metrologica (INRiM), 10135 Torino, Italy; (M.R.); (E.M.)
| | - Qing Zhong
- National Institute of Metrology (NIM), Beijing 100029, China; (X.X.); (J.C.); (Q.Z.); (H.G.); (W.L.); (X.L.); (Q.L.); (Y.Z.); (W.C.); (S.W.); (Y.G.); (Z.L.)
| | - Huifang Gao
- National Institute of Metrology (NIM), Beijing 100029, China; (X.X.); (J.C.); (Q.Z.); (H.G.); (W.L.); (X.L.); (Q.L.); (Y.Z.); (W.C.); (S.W.); (Y.G.); (Z.L.)
| | - Wei Li
- National Institute of Metrology (NIM), Beijing 100029, China; (X.X.); (J.C.); (Q.Z.); (H.G.); (W.L.); (X.L.); (Q.L.); (Y.Z.); (W.C.); (S.W.); (Y.G.); (Z.L.)
| | - Xu Li
- National Institute of Metrology (NIM), Beijing 100029, China; (X.X.); (J.C.); (Q.Z.); (H.G.); (W.L.); (X.L.); (Q.L.); (Y.Z.); (W.C.); (S.W.); (Y.G.); (Z.L.)
| | - Qi Li
- National Institute of Metrology (NIM), Beijing 100029, China; (X.X.); (J.C.); (Q.Z.); (H.G.); (W.L.); (X.L.); (Q.L.); (Y.Z.); (W.C.); (S.W.); (Y.G.); (Z.L.)
| | - Yuan Zhong
- National Institute of Metrology (NIM), Beijing 100029, China; (X.X.); (J.C.); (Q.Z.); (H.G.); (W.L.); (X.L.); (Q.L.); (Y.Z.); (W.C.); (S.W.); (Y.G.); (Z.L.)
| | - Wenhui Cao
- National Institute of Metrology (NIM), Beijing 100029, China; (X.X.); (J.C.); (Q.Z.); (H.G.); (W.L.); (X.L.); (Q.L.); (Y.Z.); (W.C.); (S.W.); (Y.G.); (Z.L.)
| | - Shijian Wang
- National Institute of Metrology (NIM), Beijing 100029, China; (X.X.); (J.C.); (Q.Z.); (H.G.); (W.L.); (X.L.); (Q.L.); (Y.Z.); (W.C.); (S.W.); (Y.G.); (Z.L.)
| | - Ying Gao
- National Institute of Metrology (NIM), Beijing 100029, China; (X.X.); (J.C.); (Q.Z.); (H.G.); (W.L.); (X.L.); (Q.L.); (Y.Z.); (W.C.); (S.W.); (Y.G.); (Z.L.)
| | - Zheng Liu
- National Institute of Metrology (NIM), Beijing 100029, China; (X.X.); (J.C.); (Q.Z.); (H.G.); (W.L.); (X.L.); (Q.L.); (Y.Z.); (W.C.); (S.W.); (Y.G.); (Z.L.)
| | - Xueshen Wang
- National Institute of Metrology (NIM), Beijing 100029, China; (X.X.); (J.C.); (Q.Z.); (H.G.); (W.L.); (X.L.); (Q.L.); (Y.Z.); (W.C.); (S.W.); (Y.G.); (Z.L.)
- Correspondence: (J.L.); (X.W.); Tel.: +86-10-6452-6134 (J.L.); +86-10-6452-4555 (X.W.)
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