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Number Cited by Other Article(s)
1
Moksnes MR, Hansen AF, Wolford BN, Thomas LF, Rasheed H, Simić A, Bhatta L, Brantsæter AL, Surakka I, Zhou W, Magnus P, Njølstad PR, Andreassen OA, Syversen T, Zheng J, Fritsche LG, Evans DM, Warrington NM, Nøst TH, Åsvold BO, Flaten TP, Willer CJ, Hveem K, Brumpton BM. A genome-wide association study provides insights into the genetic etiology of 57 essential and non-essential trace elements in humans. Commun Biol 2024;7:432. [PMID: 38594418 PMCID: PMC11004147 DOI: 10.1038/s42003-024-06101-z] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/09/2023] [Accepted: 03/22/2024] [Indexed: 04/11/2024]  Open
2
Tsai WH, Su CK. 4D-Printed Elution-Peak-Guided Dual-Responsive Monolithic Packing for the Solid-Phase Extraction of Metal Ions. Anal Chem 2024;96:4469-4478. [PMID: 38380612 PMCID: PMC10955517 DOI: 10.1021/acs.analchem.3c04961] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/02/2023] [Revised: 02/06/2024] [Accepted: 02/08/2024] [Indexed: 02/22/2024]
3
Klouda J, Fassbender ME, Mocko V. A combined inorganic-organic titanium-44/scandium-44g radiochemical generator. J Chromatogr A 2023;1711:464438. [PMID: 37857154 DOI: 10.1016/j.chroma.2023.464438] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/15/2023] [Revised: 10/05/2023] [Accepted: 10/06/2023] [Indexed: 10/21/2023]
4
Scatigno C, Zanetti M, Rudić S, Senesi R, Andreani C, Gorini G, Fernandez-Alonso F. Hydrogen Detection Limits and Instrument Sensitivity of High-Resolution Broadband Neutron Spectrometers. Anal Chem 2022;94:5023-5028. [PMID: 35298136 DOI: 10.1021/acs.analchem.1c04949] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
5
Recent advances in laser-induced breakdown spectroscopy quantification: From fundamental understanding to data processing. Trends Analyt Chem 2021. [DOI: 10.1016/j.trac.2021.116385] [Citation(s) in RCA: 31] [Impact Index Per Article: 10.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/20/2022]
6
Takeuchi T, McQuillan AJ, Shard A, Russell AE, Hibbert DB. Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020). PURE APPL CHEM 2020. [DOI: 10.1515/pac-2019-0404] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/15/2022]
7
Giménez-Gómez P, Baldi A, Ayora C, Fernández-Sánchez C. Automated Determination of As(III) in Waters with an Electrochemical Sensor Integrated into a Modular Microfluidic System. ACS Sens 2019;4:3156-3165. [PMID: 31657207 DOI: 10.1021/acssensors.9b01286] [Citation(s) in RCA: 14] [Impact Index Per Article: 2.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
8
Hofmann S, Liu Y, Jian W, Kang H, Wang J. Depth resolution in sputter profiling revisited. SURF INTERFACE ANAL 2016. [DOI: 10.1002/sia.6039] [Citation(s) in RCA: 16] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/08/2022]
9
Hofmann S. Sputter depth profiling: past, present, and future. SURF INTERFACE ANAL 2014. [DOI: 10.1002/sia.5489] [Citation(s) in RCA: 20] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]
10
Parsons C, Margui Grabulosa E, Pili E, Floor GH, Roman-Ross G, Charlet L. Quantification of trace arsenic in soils by field-portable X-ray fluorescence spectrometry: considerations for sample preparation and measurement conditions. JOURNAL OF HAZARDOUS MATERIALS 2013;262:1213-22. [PMID: 22819961 DOI: 10.1016/j.jhazmat.2012.07.001] [Citation(s) in RCA: 25] [Impact Index Per Article: 2.3] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/18/2011] [Revised: 06/25/2012] [Accepted: 07/02/2012] [Indexed: 05/22/2023]
11
Microalgae dual-head biosensors for selective detection of herbicides with fiber-optic luminescent O2 transduction. Biosens Bioelectron 2013;54:484-91. [PMID: 24316451 DOI: 10.1016/j.bios.2013.10.062] [Citation(s) in RCA: 19] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/02/2013] [Revised: 10/29/2013] [Accepted: 10/30/2013] [Indexed: 11/21/2022]
12
Peterson G, Bai J, Nagaraja TG, Narayanan S. Diagnostic microarray for human and animal bacterial diseases and their virulence and antimicrobial resistance genes. J Microbiol Methods 2009;80:223-30. [PMID: 20035807 DOI: 10.1016/j.mimet.2009.12.010] [Citation(s) in RCA: 15] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/04/2009] [Revised: 12/04/2009] [Accepted: 12/15/2009] [Indexed: 11/29/2022]
13
Dargel R, Heinemeyer F, Köntges M, Vogt J, Vogt C. Detection of trace impurities in Cu(In, Ga)Se2 thin film solar cells by laser ablation ICP-MS. Mikrochim Acta 2009. [DOI: 10.1007/s00604-008-0131-1] [Citation(s) in RCA: 14] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/24/2022]
14
Applications of surface analysis in materials science and technology. ACTA ACUST UNITED AC 2004. [DOI: 10.1007/bf00499263] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/26/2022]
15
Hofmann S. Sputter-depth profiling for thin-film analysis. PHILOSOPHICAL TRANSACTIONS. SERIES A, MATHEMATICAL, PHYSICAL, AND ENGINEERING SCIENCES 2004;362:55-75. [PMID: 15306276 DOI: 10.1098/rsta.2003.1304] [Citation(s) in RCA: 13] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/24/2023]
16
Hofmann S. Advances in sputter depth profiling using AES. SURF INTERFACE ANAL 2003. [DOI: 10.1002/sia.1574] [Citation(s) in RCA: 22] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
17
Hofmann S. From depth resolution to depth resolution function: refinement of the concept for delta layers, single layers and multilayers. SURF INTERFACE ANAL 1999. [DOI: 10.1002/(sici)1096-9918(199909)27:9<825::aid-sia638>3.0.co;2-d] [Citation(s) in RCA: 65] [Impact Index Per Article: 2.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/12/2022]
18
Yoshihara K, Moon DW, Fujita D, Kim KJ, Kajiwara K. GaAs/AlAs superlattice as a proposed new reference material for sputter depth profiling. SURF INTERFACE ANAL 1993. [DOI: 10.1002/sia.740201306] [Citation(s) in RCA: 23] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
19
Seah MP. VAMAS surface chemical analysis technical working party: An update for 1988. SURF INTERFACE ANAL 1989. [DOI: 10.1002/sia.740140619] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/08/2022]
20
Powell CJ. The development of standards for surface analysis. SURF INTERFACE ANAL 1988. [DOI: 10.1002/sia.740110113] [Citation(s) in RCA: 15] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
21
Grasserbauer M, Stingeder G, Pötzl H, Guerrero E. Analytical science for the development of microelectronic devices. ACTA ACUST UNITED AC 1986. [DOI: 10.1007/bf00470757] [Citation(s) in RCA: 18] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
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