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For: Ansuinelli P, Coene WMJ, Urbach HP. Improved ptychographic inspection of EUV reticles via inclusion of prior information. Appl Opt 2020;59:5937-5947. [PMID: 32672737 DOI: 10.1364/ao.395446] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/16/2020] [Accepted: 06/09/2020] [Indexed: 06/11/2023]
Number Cited by Other Article(s)
1
Carulla M, Barten R, Baruffaldi F, Bergamaschi A, Borghi G, Boscardin M, Brückner M, Butcher TA, Centis Vignali M, Dinapoli R, Ebner S, Ficorella F, Fröjdh E, Greiffenberg D, Hammad Ali O, Hasanaj S, Heymes J, Hinger V, King T, Kozlowski P, Lopez Cuenca C, Mezza D, Moustakas K, Mozzanica A, Paternoster G, Paton KA, Ronchin S, Ruder C, Schmitt B, Sieberer P, Thattil D, Vogelsang K, Xie X, Zhang J. Quantum Efficiency Measurement and Modeling of Silicon Sensors Optimized for Soft X-ray Detection. SENSORS (BASEL, SWITZERLAND) 2024;24:942. [PMID: 38339659 PMCID: PMC10856868 DOI: 10.3390/s24030942] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/30/2023] [Revised: 01/19/2024] [Accepted: 01/22/2024] [Indexed: 02/12/2024]
2
Eschen W, Liu C, Penagos Molina DS, Klas R, Limpert J, Rothhardt J. High-speed and wide-field nanoscale table-top ptychographic EUV imaging and beam characterization with a sCMOS detector. OPTICS EXPRESS 2023;31:14212-14224. [PMID: 37157290 DOI: 10.1364/oe.485779] [Citation(s) in RCA: 1] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/10/2023]
3
Zayko S, Kfir O, Heigl M, Lohmann M, Sivis M, Albrecht M, Ropers C. Ultrafast high-harmonic nanoscopy of magnetization dynamics. Nat Commun 2021;12:6337. [PMID: 34732725 PMCID: PMC8566501 DOI: 10.1038/s41467-021-26594-0] [Citation(s) in RCA: 6] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/17/2020] [Accepted: 08/10/2021] [Indexed: 11/25/2022]  Open
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