Long-term operation of surface high-harmonic generation from relativistic oscillating mirrors using a spooling tape

High-harmonic generation from a flat liquid-sheet plasma mirror

High-harmonic radiation can be generated when an ultra-intense laser beam is reflected from an over-dense plasma, known as a plasma mirror. It is considered a promising technique for generating intense attosecond pulses in the extreme ultraviolet and X-ray wavelength ranges. However, a solid target used for the formation of the over-dense plasma is completely damaged by the interaction. Thus, it is challenging to use a solid target for applications such as time-resolved studies and attosecond streaking experiments that require a large amount of data. Here we demonstrate that high-harmonic radiation can be continuously generated from a liquid plasma mirror in both the coherent wake emission and relativistic oscillating mirror regimes. These results will pave the way for the development of bright, stable, and high-repetition-rate attosecond light sources, which can greatly benefit the study of ultrafast laser-matter interactions.

Circularly polarized extreme ultraviolet high harmonic generation in graphene

Circularly polarized extreme ultraviolet (XUV) radiation is highly interesting for investigation of chirality-sensitive light-matter interactions. Recent breakthroughs have enabled the generation of such light sources via high harmonic generation (HHG) from rare gases. There is a growing interest in extending HHG medium from gases to solids, especially to 2D materials, as they hold great promise to develop ultra-compact solid-state photonic devices and provide insights into electronic properties of the materials themselves. However, so far reported, HHG in graphene driven by terahertz to mid-infrared fields generates only low harmonic orders, and no harmonics driven by circularly polarized lasers have been reported. Here, using first-principles simulations within a time-dependent density-functional theory framework, we show that it is possible to generate HHG extending to the XUV spectral region in monolayer extended graphene excited by near-infrared lasers. Moreover, we demonstrate that a single circularly polarized driver is enough to ensure HHG in graphene with circular polarization. The corresponding spectra reflect the six-fold rotational symmetry of the graphene crystal. Extending HHG in graphene to the XUV spectral regime and realizing circular polarization represent an important step toward the development of novel nanoscale attosecond photonic devices and numerous applications, such as spectroscopic investigation and nanoscale imaging of ultrafast chiral and spin dynamics in graphene and other 2D materials.

Nanometer resolution optical coherence tomography using broad bandwidth XUV and soft x-ray radiation

Optical coherence tomography (OCT) is a non-invasive technique for cross-sectional imaging. It is particularly advantageous for applications where conventional microscopy is not able to image deeper layers of samples in a reasonable time, e.g. in fast moving, deeper lying structures. However, at infrared and optical wavelengths, which are commonly used, the axial resolution of OCT is limited to about 1 μm, even if the bandwidth of the light covers a wide spectral range. Here, we present extreme ultraviolet coherence tomography (XCT) and thus introduce a new technique for non-invasive cross-sectional imaging of nanometer structures. XCT exploits the nanometerscale coherence lengths corresponding to the spectral transmission windows of, e.g., silicon samples. The axial resolution of coherence tomography is thus improved from micrometers to a few nanometers. Tomographic imaging with an axial resolution better than 18 nm is demonstrated for layer-type nanostructures buried in a silicon substrate. Using wavelengths in the water transmission window, nanometer-scale layers of platinum are retrieved with a resolution better than 8 nm. XCT as a nondestructive method for sub-surface tomographic imaging holds promise for several applications in semiconductor metrology and imaging in the water window.