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Li T, Kahnt M, Sheppard TL, Yang R, Falch KV, Zvagelsky R, Villanueva-Perez P, Wegener M, Lyubomirskiy M. X-Ray Multibeam Ptychography at up to 20 keV: Nano-Lithography Enhances X-Ray Nano-Imaging. ADVANCED SCIENCE (WEINHEIM, BADEN-WURTTEMBERG, GERMANY) 2024:e2310075. [PMID: 38922762 DOI: 10.1002/advs.202310075] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/22/2023] [Revised: 05/24/2024] [Indexed: 06/28/2024]
Abstract
Hard X-rays are needed for non-destructive nano-imaging of solid matter. Synchrotron radiation facilities (SRF) provide the highest-quality images with single-digit nm resolution using advanced techniques such as X-ray ptychography. However, the resolution or field of view is ultimately constrained by the available coherent flux. To address this, the beam's incoherent fraction can be exploited using multiple parallel beams in an X-ray multibeam ptychography (MBP) approach. This expands the domain of X-ray ptychography to larger samples or more rapid measurements. Both qualities favor the study of complex composite or functional samples, such as catalysts, energy materials, or electronic devices. The challenge of performing ptychography at high energy and with many parallel beams must be overcome to extract the full advantages for extended samples while minimizing beam attenuation. Here, that challenge is overcome by creating a lens array using cutting-edge laser printing technology and applying it to perform scanning with MBP with up to 12 beams and at photon energies of 13 and 20 keV. This exceeds the measurement limits of conventional hard X-ray ptychography without compromising image quality for various samples: Siemens star test pattern, Ni/Al2O3 catalyst, microchip, and gold nano-crystal clusters.
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Affiliation(s)
- Tang Li
- Centre for X-ray and Nano Science CXNS, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany
| | - Maik Kahnt
- MAX IV Laboratory, Lund University, Box 118, Lund, 221 00, Sweden
| | - Thomas L Sheppard
- Karlsruhe Institute of Technology, Institute for Chemical Technology and Polymer Chemistry, Engesserstr. 20, 76131, Karlsruhe, Germany
- Leipzig University, Institute of Chemical Technology, Linnéstr. 3, 04103, Leipzig, Germany
| | - Runqing Yang
- Division of Synchrotron Radiation Research and NanoLund, Department of Physics, Lund University, Lund, 22100, Sweden
| | - Ken V Falch
- Centre for X-ray and Nano Science CXNS, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany
| | - Roman Zvagelsky
- Karlsruher Institut für Technologie, Institut für Angewandte Physik, Wolfgang-Gaede-Straße 1, D-76131, Karlsruhe, Germany
| | - Pablo Villanueva-Perez
- Division of Synchrotron Radiation Research and NanoLund, Department of Physics, Lund University, Lund, 22100, Sweden
| | - Martin Wegener
- Karlsruher Institut für Technologie, Institut für Angewandte Physik, Wolfgang-Gaede-Straße 1, D-76131, Karlsruhe, Germany
| | - Mikhail Lyubomirskiy
- Centre for X-ray and Nano Science CXNS, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany
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Brooks NJ, Wang B, Binnie I, Tanksalvala M, Esashi Y, Knobloch JL, Nguyen QLD, McBennett B, Jenkins NW, Gui G, Zhang Z, Kapteyn HC, Murnane MM, Bevis CS. Temporal and spectral multiplexing for EUV multibeam ptychography with a high harmonic light source. OPTICS EXPRESS 2022; 30:30331-30346. [PMID: 36242139 DOI: 10.1364/oe.458955] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/21/2022] [Accepted: 07/13/2022] [Indexed: 06/16/2023]
Abstract
We demonstrate temporally multiplexed multibeam ptychography implemented for the first time in the EUV, by using a high harmonic based light source. This allows for simultaneous imaging of different sample areas, or of the same area at different times or incidence angles. Furthermore, we show that this technique is compatible with wavelength multiplexing for multibeam spectroscopic imaging, taking full advantage of the temporal and spectral characteristics of high harmonic light sources. This technique enables increased data throughput using a simple experimental implementation and with high photon efficiency.
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3
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Yatabe K, Takayama Y. Phase retrieval based on a total-variation-regularized Poisson model for X-ray ptychographic imaging of low-contrast objects. J Appl Crystallogr 2022. [DOI: 10.1107/s1600576722005234] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022] Open
Abstract
Hard X-ray ptychography has become an indispensable tool for observing the microscopic structure of a thick specimen. It measures diffraction patterns by scanning an X-ray beam and visualizes the complex-valued refractive index of the specimen by a computational reconstruction called phase retrieval. The quality of imaging is dependent on the used phase-retrieval algorithm, especially when the intensity of the diffraction patterns in the high-spatial-frequency range is low and/or when the spatial overlap of the illumination area is small. In this paper, a phase-retrieval algorithm, AMPAM, based on the Poisson model and total variation (TV) is proposed. It applies alternating minimization using primal-dual splitting and gradient-descent algorithms to compute the result without matrix inversion. The imaging capability of the proposed algorithm from low-dose and/or sparsely scanned data was investigated by numerical simulations. The proposed algorithm was compared with ADPr, which is the state-of-the-art algorithm based on the TV-regularized Poisson model. The results indicated that AMPAM can provide good-quality images with a computational cost 7–11 times less than ADPr. In addition, ink toner and macroporous silica particles were imaged at SPring-8 BL24XU to confirm the applicability of the algorithm to actual measurements.
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Lyubomirskiy M, Wittwer F, Kahnt M, Koch F, Kubec A, Falch KV, Garrevoet J, Seyrich M, David C, Schroer CG. Multi-beam X-ray ptychography using coded probes for rapid non-destructive high resolution imaging of extended samples. Sci Rep 2022; 12:6203. [PMID: 35418587 PMCID: PMC9008058 DOI: 10.1038/s41598-022-09466-5] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/10/2021] [Accepted: 03/21/2022] [Indexed: 11/22/2022] Open
Abstract
Imaging large areas of a sample non-destructively and with high resolution is of great interest for both science and industry. For scanning coherent X-ray diffraction microscopy, i. e., ptychography, the achievable scan area at a given spatial resolution is limited by the coherent photon flux of modern X-ray sources. Multibeam X-ray ptychography can improve the scanning speed by scanning the sample with several parallel mutually incoherent beams, e. g., generated by illuminating multiple focusing optics in parallel by a partially coherent beam. The main difficulty with this scheme is the robust separation of the superimposed signals from the different beams, especially when the beams and the illuminated sample areas are quite similar. We overcome this difficulty by encoding each of the probing beams with its own X-ray phase plate. This helps the algorithm to robustly reconstruct the multibeam data. We compare the coded multibeam scans to uncoded multibeam and single beam scans, demonstrating the enhanced performance on a microchip sample with regular and repeating structures.
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Affiliation(s)
- Mikhail Lyubomirskiy
- Center for X-ray and Nano Science CXNS, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany.
| | - Felix Wittwer
- Center for X-ray and Nano Science CXNS, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany.,Department Physik, Universität Hamburg, Luruper Chaussee 149, 22761, Hamburg, Germany.,NERSC, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA
| | - Maik Kahnt
- MAX IV Laboratory, Lund University, Box 118, 221 00, Lund, Sweden
| | - Frieder Koch
- Paul-Scherrer-Institut (PSI), Forschungsstr. 111, 5232, Villigen, Switzerland.,GSI Helmholtzzentrum für Schwerionenforschung GmbH, Planckstr. 1, 64291, Darmstadt, Germany
| | - Adam Kubec
- Paul-Scherrer-Institut (PSI), Forschungsstr. 111, 5232, Villigen, Switzerland.,XRnanotech GmbH, Forschungsstr. 111,ODRA 117, 5232, Villigen, Switzerland
| | - Ken Vidar Falch
- Center for X-ray and Nano Science CXNS, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany
| | - Jan Garrevoet
- Center for X-ray and Nano Science CXNS, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany
| | - Martin Seyrich
- Center for X-ray and Nano Science CXNS, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany.,Department Physik, Universität Hamburg, Luruper Chaussee 149, 22761, Hamburg, Germany
| | - Christian David
- Paul-Scherrer-Institut (PSI), Forschungsstr. 111, 5232, Villigen, Switzerland
| | - Christian G Schroer
- Center for X-ray and Nano Science CXNS, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany.,Department Physik, Universität Hamburg, Luruper Chaussee 149, 22761, Hamburg, Germany.,Helmholtz Imaging Platform, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany
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Abstract
Abstract
Methods of coherent X-ray diffraction imaging of the spatial structure of noncrystalline objects and nanocrystals (nanostructures) are considered. Particular attention is paid to the methods of scanning-based coherent diffraction imaging (ptychography), visualization based on coherent surface scattering with application of correlation spectroscopy approaches, and specific features of visualization using X-ray free-electron laser radiation. The corresponding data in the literature are analyzed to demonstrate the state of the art of the methods of coherent diffraction imaging and fields of their application.
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Batey DJ, Van Assche F, Vanheule S, Boone MN, Parnell AJ, Mykhaylyk OO, Rau C, Cipiccia S. X-Ray Ptychography with a Laboratory Source. PHYSICAL REVIEW LETTERS 2021; 126:193902. [PMID: 34047586 DOI: 10.1103/physrevlett.126.193902] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/05/2021] [Revised: 03/19/2021] [Accepted: 04/08/2021] [Indexed: 06/12/2023]
Abstract
X-ray ptychography has revolutionized nanoscale phase contrast imaging at large-scale synchrotron sources in recent years. We present here the first successful demonstration of the technique in a small-scale laboratory setting. An experiment was conducted with a liquid metal-jet x-ray source and a single photon-counting detector with a high spectral resolution. The experiment used a spot size of 5 μm to produce a ptychographic phase image of a Siemens star test pattern with a submicron spatial resolution. The result and methodology presented show how high-resolution phase contrast imaging can now be performed at small-scale laboratory sources worldwide.
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Affiliation(s)
- Darren J Batey
- Diamond Light Source, Harwell Science and Innovation Campus, Fermi Avenue, Didcot OX11 0DE, United Kingdom
| | - Frederic Van Assche
- UGCT-RP, Department of Physics and Astronomy, Ghent University, Ghent 9000, Belgium
| | - Sander Vanheule
- UGCT-RP, Department of Physics and Astronomy, Ghent University, Ghent 9000, Belgium
| | - Matthieu N Boone
- UGCT-RP, Department of Physics and Astronomy, Ghent University, Ghent 9000, Belgium
| | - Andrew J Parnell
- Department of Physics and Astronomy, University of Sheffield, Sheffield S3 7RH, United Kingdom
| | - Oleksandr O Mykhaylyk
- Soft Matter Analytical Laboratory, Department of Chemistry, University of Sheffield, Sheffield S3 7HF, United Kingdom
| | - Christoph Rau
- Diamond Light Source, Harwell Science and Innovation Campus, Fermi Avenue, Didcot OX11 0DE, United Kingdom
| | - Silvia Cipiccia
- Diamond Light Source, Harwell Science and Innovation Campus, Fermi Avenue, Didcot OX11 0DE, United Kingdom
- Department of Medical Physics and Biomedical Engineering, University College London, London WC1E 6BT, United Kingdom
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7
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Hagemann J, Vassholz M, Hoeppe H, Osterhoff M, Rosselló JM, Mettin R, Seiboth F, Schropp A, Möller J, Hallmann J, Kim C, Scholz M, Boesenberg U, Schaffer R, Zozulya A, Lu W, Shayduk R, Madsen A, Schroer CG, Salditt T. Single-pulse phase-contrast imaging at free-electron lasers in the hard X-ray regime. JOURNAL OF SYNCHROTRON RADIATION 2021; 28:52-63. [PMID: 33399552 PMCID: PMC7842230 DOI: 10.1107/s160057752001557x] [Citation(s) in RCA: 17] [Impact Index Per Article: 5.7] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/04/2020] [Accepted: 11/24/2020] [Indexed: 05/31/2023]
Abstract
X-ray free-electron lasers (XFELs) have opened up unprecedented opportunities for time-resolved nano-scale imaging with X-rays. Near-field propagation-based imaging, and in particular near-field holography (NFH) in its high-resolution implementation in cone-beam geometry, can offer full-field views of a specimen's dynamics captured by single XFEL pulses. To exploit this capability, for example in optical-pump/X-ray-probe imaging schemes, the stochastic nature of the self-amplified spontaneous emission pulses, i.e. the dynamics of the beam itself, presents a major challenge. In this work, a concept is presented to address the fluctuating illumination wavefronts by sampling the configuration space of SASE pulses before an actual recording, followed by a principal component analysis. This scheme is implemented at the MID (Materials Imaging and Dynamics) instrument of the European XFEL and time-resolved NFH is performed using aberration-corrected nano-focusing compound refractive lenses. Specifically, the dynamics of a micro-fluidic water-jet, which is commonly used as sample delivery system at XFELs, is imaged. The jet exhibits rich dynamics of droplet formation in the break-up regime. Moreover, pump-probe imaging is demonstrated using an infrared pulsed laser to induce cavitation and explosion of the jet.
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Affiliation(s)
- Johannes Hagemann
- Deutsches Elektronen Synchrotron – DESY, Notkestraße 85, 22607 Hamburg, Germany
| | - Malte Vassholz
- Institute for X-ray Physics, University of Göttingen, Friedrich-Hund-Platz 1, 37077 Göttingen, Germany
| | - Hannes Hoeppe
- Institute for X-ray Physics, University of Göttingen, Friedrich-Hund-Platz 1, 37077 Göttingen, Germany
| | - Markus Osterhoff
- Institute for X-ray Physics, University of Göttingen, Friedrich-Hund-Platz 1, 37077 Göttingen, Germany
| | - Juan M. Rosselló
- Third Institute of Physics, University of Göttingen, Friedrich-Hund-Platz 1, 37077 Göttingen, Germany
| | - Robert Mettin
- Third Institute of Physics, University of Göttingen, Friedrich-Hund-Platz 1, 37077 Göttingen, Germany
| | - Frank Seiboth
- Deutsches Elektronen Synchrotron – DESY, Notkestraße 85, 22607 Hamburg, Germany
| | - Andreas Schropp
- Deutsches Elektronen Synchrotron – DESY, Notkestraße 85, 22607 Hamburg, Germany
| | - Johannes Möller
- European X-ray Free-Electron Laser Facility, Holzkoppel 4, 22869 Schenefeld, Germany
| | - Jörg Hallmann
- European X-ray Free-Electron Laser Facility, Holzkoppel 4, 22869 Schenefeld, Germany
| | - Chan Kim
- European X-ray Free-Electron Laser Facility, Holzkoppel 4, 22869 Schenefeld, Germany
| | - Markus Scholz
- European X-ray Free-Electron Laser Facility, Holzkoppel 4, 22869 Schenefeld, Germany
| | - Ulrike Boesenberg
- European X-ray Free-Electron Laser Facility, Holzkoppel 4, 22869 Schenefeld, Germany
| | - Robert Schaffer
- European X-ray Free-Electron Laser Facility, Holzkoppel 4, 22869 Schenefeld, Germany
| | - Alexey Zozulya
- European X-ray Free-Electron Laser Facility, Holzkoppel 4, 22869 Schenefeld, Germany
| | - Wei Lu
- European X-ray Free-Electron Laser Facility, Holzkoppel 4, 22869 Schenefeld, Germany
| | - Roman Shayduk
- European X-ray Free-Electron Laser Facility, Holzkoppel 4, 22869 Schenefeld, Germany
| | - Anders Madsen
- European X-ray Free-Electron Laser Facility, Holzkoppel 4, 22869 Schenefeld, Germany
| | - Christian G. Schroer
- Deutsches Elektronen Synchrotron – DESY, Notkestraße 85, 22607 Hamburg, Germany
- Department Physik, Universität Hamburg, Luruper Chaussee 149, 22761 Hamburg, Germany
| | - Tim Salditt
- Institute for X-ray Physics, University of Göttingen, Friedrich-Hund-Platz 1, 37077 Göttingen, Germany
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Yao Y, Jiang Y, Klug JA, Wojcik M, Maxey ER, Sirica NS, Roehrig C, Cai Z, Vogt S, Lai B, Deng J. Multi-beam X-ray ptychography for high-throughput coherent diffraction imaging. Sci Rep 2020; 10:19550. [PMID: 33177558 PMCID: PMC7658249 DOI: 10.1038/s41598-020-76412-8] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/05/2020] [Accepted: 10/21/2020] [Indexed: 11/09/2022] Open
Abstract
X-ray ptychography is a rapidly developing coherent diffraction imaging technique that provides nanoscale resolution on extended field-of-view. However, the requirement of coherence and the scanning mechanism limit the throughput of ptychographic imaging. In this paper, we propose X-ray ptychography using multiple illuminations instead of single illumination in conventional ptychography. Multiple locations of the sample are simultaneously imaged by spatially separated X-ray beams, therefore, the obtained field-of-view in one scan can be enlarged by a factor equal to the number of illuminations. We have demonstrated this technique experimentally using two X-ray beams focused by a house-made Fresnel zone plate array. Two areas of the object and corresponding double illuminations were successfully reconstructed from diffraction patterns acquired in one scan, with image quality similar with those obtained by conventional single-beam ptychography in sequence. Multi-beam ptychography approach increases the imaging speed, providing an efficient way for high-resolution imaging of large extended specimens.
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Affiliation(s)
- Yudong Yao
- Advanced Photon Source, Argonne National Laboratory, Lemont, IL, 60439, USA
| | - Yi Jiang
- Advanced Photon Source, Argonne National Laboratory, Lemont, IL, 60439, USA
| | - Jeffrey A Klug
- Advanced Photon Source, Argonne National Laboratory, Lemont, IL, 60439, USA
| | - Michael Wojcik
- Advanced Photon Source, Argonne National Laboratory, Lemont, IL, 60439, USA
| | - Evan R Maxey
- Advanced Photon Source, Argonne National Laboratory, Lemont, IL, 60439, USA
| | - Nicholas S Sirica
- Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, NM, 87545, USA
| | - Christian Roehrig
- Advanced Photon Source, Argonne National Laboratory, Lemont, IL, 60439, USA
| | - Zhonghou Cai
- Advanced Photon Source, Argonne National Laboratory, Lemont, IL, 60439, USA
| | - Stefan Vogt
- Advanced Photon Source, Argonne National Laboratory, Lemont, IL, 60439, USA
| | - Barry Lai
- Advanced Photon Source, Argonne National Laboratory, Lemont, IL, 60439, USA
| | - Junjing Deng
- Advanced Photon Source, Argonne National Laboratory, Lemont, IL, 60439, USA.
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