Direct 2D spatial-coherence determination using the Fourier-analysis method: multi-parameter characterization of the P04 beamline at PETRA III

Two-dimensional spatial coherence measurement of X-ray sources using aperture array mask

Fourth-generation synchrotron radiation delivers x-ray sources with unprecedented coherence and brilliance, which enables the development of many advanced coherent techniques taking advantage of the inherent high coherence of the x-ray beams. Simple and accurate measurement of two-dimensional (2D) coherence is of utmost importance for the applications of these coherent experimental techniques. Here, we propose a novel approach based on diffraction of aperture array mask (AAM) to obtain accurate 2D spatial coherence with a single-shot measurement. We utilize a coherent mode decomposition algorithm to simulate the diffraction of AAM illuminated by Gaussian-Schell model beam and demonstrate that spatial coherence function of the incident light beam can be accurately and robustly retrieved. We expect that this new approach will be applied into transverse coherence measurements for the new-generation synchrotron radiation source and relevant coherent experimental techniques.

Quantitative Element-Sensitive Analysis of Individual Nanoobjects

A reliable and quantitative material analysis is crucial for assessing new technological processes, especially to facilitate a quantitative understanding of advanced material properties at the nanoscale. To this end, X-ray fluorescence microscopy techniques can offer an element-sensitive and non-destructive tool for the investigation of a wide range of nanotechnological materials. Since X-ray radiation provides information depths of up to the microscale, even stratified or buried arrangements are easily accessible without invasive sample preparation. However, in terms of the quantification capabilities, these approaches are usually restricted to a qualitative or semi-quantitative analysis at the nanoscale. Relying on comparable reference nanomaterials is often not straightforward or impossible because the development of innovative nanomaterials has proven to be more fast-paced than any development process for appropriate reference materials. The present work corroborates that a traceable quantification of individual nanoobjects can be realized by means of an X-ray fluorescence microscope when utilizing rather conventional but well-calibrated instrumentation instead of reference materials. As a proof of concept, the total number of atoms forming a germanium nanoobject is quantified using soft X-ray radiation. Furthermore, complementary dimensional parameters of such objects are reconstructed.

The PERCIVAL detector: first user experiments

The PERCIVAL detector is a CMOS imager designed for the soft X-ray regime at photon sources. Although still in its final development phase, it has recently seen its first user experiments: ptychography at a free-electron laser, holographic imaging at a storage ring and preliminary tests on X-ray photon correlation spectroscopy. The detector performed remarkably well in terms of spatial resolution achievable in the sample plane, owing to its small pixel size, large active area and very large dynamic range; but also in terms of its frame rate, which is significantly faster than traditional CCDs. In particular, it is the combination of these features which makes PERCIVAL an attractive option for soft X-ray science.

Reference shape effects on Fourier transform holography

Soft-x-ray holography which utilizes an optics mask fabricated in direct contact with the sample, is a widely applied x-ray microscopy method, in particular, for investigating magnetic samples. The optics mask splits the x-ray beam into a reference wave and a wave to illuminate the sample. The reconstruction quality in such a Fourier-transform holography experiment depends primarily on the characteristics of the reference wave, typically emerging from a small, high-aspect-ratio pinhole in the mask. In this paper, we study two commonly used reference geometries and investigate how their 3D structure affects the reconstruction within an x-ray Fourier holography experiment. Insight into these effects is obtained by imaging the exit waves from reference pinholes via high-resolution coherent diffraction imaging combined with three-dimensional multislice simulations of the x-ray propagation through the reference pinhole. The results were used to simulate Fourier-transform holography experiments to determine the spatial resolution and precise location of the reconstruction plane for different reference geometries. Based on our findings, we discuss the properties of the reference pinholes with view on application in soft-x-ray holography experiments.

Photoelectron circular dichroism in angle-resolved photoemission from liquid fenchone

We present an experimental X-ray photoelectron circular dichroism (PECD) study of liquid fenchone at the C 1s edge. A novel setup to enable PECD measurements on a liquid microjet [Malerz et al., Rev. Sci. Instrum., 2022, 93, 015101] was used. For the C 1s line assigned to fenchone's carbonyl carbon, a non-vanishing asymmetry is found in the intensity of photoelectron spectra acquired under a fixed angle in the backward-scattering plane. This experiment paves the way towards an innovative probe of the chirality of organic/biological molecules in aqueous solution.

We present the first X-ray photoelectron circular dichroism (PECD) study from a liquid phase sample, exemplified for liquid fenchone at the C 1s edge.

Enabling time-resolved 2D spatial-coherence measurements using the Fourier-analysis method with an integrated curved-grating beam monitor

Direct 2D spatial-coherence measurements are increasingly gaining importance at synchrotron beamlines, especially due to present and future upgrades of synchrotron facilities to diffraction-limited storage rings. We present a method to determine the 2D spatial coherence of synchrotron radiation in a direct and particularly simple way by using the Fourier-analysis method in conjunction with curved gratings. Direct photon-beam monitoring provided by a curved grating circumvents the otherwise necessary separate determination of the illuminating intensity distribution required for the Fourier-analysis method. Hence, combining these two methods allows for time-resolved spatial-coherence measurements. As a consequence, spatial-coherence degradation effects caused by beamline optics vibrations, which is one of the key issues of state-of-the-art X-ray imaging and scattering beamlines, can be identified and analyzed.