Beam-quality measurement of a focused high-order harmonic beam

Atom probe tomography using an extreme ultraviolet trigger pulse

Atom probe tomography (APT) is a powerful materials characterization technique capable of measuring the isotopically resolved three-dimensional (3D) structure of nanoscale specimens with atomic resolution. Modern APT instrumentation most often uses an optical pulse to trigger field ion evaporation-most commonly, the second or third harmonic of a Nd laser is utilized (∼λ = 532 nm or λ = 355 nm). Herein, we describe an APT instrument that utilizes ultrafast extreme ultraviolet (EUV) optical pulses to trigger field ion emission. The EUV light is generated via a commercially available high harmonic generation system based on a noble-gas-filled capillary. The centroid of the EUV spectrum is tunable from around 25 eV (λ = 50 nm) to 45 eV (λ = 28 nm), dependent on the identity of the gas in the capillary (Xe, Kr, or Ar). EUV pulses are delivered to the APT analysis chamber via a vacuum beamline that was optimized to maximize photon flux at the APT specimen apex while minimizing complexity. We describe the design of the beamline in detail, including the various compromises involved. We characterize the spectrum of the EUV light and its evolution as it propagates through the various optical elements. The EUV focus spot size is measured at the APT specimen plane, and the effects of misalignment are simulated and discussed. The long-term stability of the EUV source has been demonstrated for more than a year. Finally, APT mass spectra are shown, demonstrating the instrument's ability to successfully trigger field ion emission from semiconductors (Si, GaN) and insulating materials (Al2O3).

Time-Resolved ESCA: a Novel Probe for Chemical Dynamics

Electron spectroscopy for chemical analysis (ESCA) is a well established tool for quantitative studies of the composition and the chemical environment of molecular systems. Recent developments in the generation and utilization of ultrashort X-ray pulses now add the dimension of time to this technique and will expand the possibilities of femtochemistry in terms of chemical selectivity, quality of information, and temporal resolution. The properties and capabilities of various X-ray pulse sources are discussed, along with their prospects for dynamical studies. Examples of time-resolved electron spectroscopy are presented in the femtosecond (1 fs = 10−15 s) as well as the attosecond (1 as = 10−18 s) regime, the latter marking the current ultimate limit for the time-resolution in pump-probe experiments.

Submicrometer-resolution in situ imaging of the focus pattern of a soft x-ray laser by color center formation in LiF crystal

We demonstrate high quality, single-shot in situ imaging of the focused Ag x-ray laser (XRL) at 13.9 nm with 700 nm spatial resolution by color center formation in LiF. The flux and intensity for the color center formation in LiF are evaluated from the experimental data. Comparisons with previous reports show that the threshold x-ray flux for the color center formation in LiF for the 13.9 nm, 7 ps Ag XRL is 3 orders of magnitude less than that with the 46.9 nm, 2 ns capillary discharge Ar XRL.

1 J/pulse Q-switched 2 microm solid-state laser

Q-switched output of 1.1 J/pulse at a 2.053 microm wavelength has been achieved in a diode-pumped Ho: Tm: LuLF laser with a side-pumped rod configuration in a master-oscillator-power-amplifier (MOPA) architecture. This is the first time to our knowledge that a 2 microm laser has broken the joule per pulse barrier for Q-switched operation. The total system efficiency reaches 5% and 6.2% for single- and double-pulse operation, respectively. The system produces an excellent 1.4 times transform-limited beam quality.

Imaging and quality assessment of high-harmonic focal spots

We present a direct method of studying the focusability of an intense, short-pulse extreme-ultraviolet (XUV) beam obtained by high-harmonic generation. We perform near-field imaging of the focal spot of five high-harmonic orders strongly focused by a broadband toroidal mirror. To visualize the focal spot directly, we image the fluorescence induced by an XUV beam on a cerium-doped YAG crystal on a visible CCD camera. We can thus measure the harmonic spot size on a single image, together with the Strehl ratio, to evaluate the quality of focusing. Such techniques should become instrumental in optimizing the focusing conditions and reaching intensities required for exploring attosecond nonlinear optics in the XUV range.

Generation and focusing of submilliwatt-average-power 50-nm pulses by the fifth harmonic of a KrF laser

We demonstrate generation and focusing of 49.7-nm pulses with an average power of 0.1 mW at 200 Hz and with a pulse energy of >1 microJ at 10 Hz by the fifth harmonic of a femtosecond KrF laser. The fifth harmonic is selected and focused with a concave Sc/Si multilayer mirror to a diameter of 2microm, resulting in a peak intensity of 0.5 TW/cm(2), which will make extreme-ultraviolet nonlinear optics feasible. A novel single-shot linear in situ method of spot-size measurement by use of self-trapped exciton luminescence is also demonstrated.

Focusing of a tabletop soft-x-ray laser beam and laser ablation

We focused the beam of a high-repetition-rate capillary-discharge tabletop laser operating at a wavelength of 46.9 nm, using a spherical Si/Sc multilayer mirror. The energy densities significantly exceeded the thresholds for the ablation of metals. Single-shot laser ablation patterns were used in combination with ray-tracing computations to characterize the focused beam. The radiation intensity within the 2-mum -diameter central region of the focal spot was estimated to be approximately 10(11)W/cm(2), with a corresponding energy density of ~100 J/cm(2).