Imaging and quality assessment of high-harmonic focal spots

Atom probe tomography using an extreme ultraviolet trigger pulse

Atom probe tomography (APT) is a powerful materials characterization technique capable of measuring the isotopically resolved three-dimensional (3D) structure of nanoscale specimens with atomic resolution. Modern APT instrumentation most often uses an optical pulse to trigger field ion evaporation-most commonly, the second or third harmonic of a Nd laser is utilized (∼λ = 532 nm or λ = 355 nm). Herein, we describe an APT instrument that utilizes ultrafast extreme ultraviolet (EUV) optical pulses to trigger field ion emission. The EUV light is generated via a commercially available high harmonic generation system based on a noble-gas-filled capillary. The centroid of the EUV spectrum is tunable from around 25 eV (λ = 50 nm) to 45 eV (λ = 28 nm), dependent on the identity of the gas in the capillary (Xe, Kr, or Ar). EUV pulses are delivered to the APT analysis chamber via a vacuum beamline that was optimized to maximize photon flux at the APT specimen apex while minimizing complexity. We describe the design of the beamline in detail, including the various compromises involved. We characterize the spectrum of the EUV light and its evolution as it propagates through the various optical elements. The EUV focus spot size is measured at the APT specimen plane, and the effects of misalignment are simulated and discussed. The long-term stability of the EUV source has been demonstrated for more than a year. Finally, APT mass spectra are shown, demonstrating the instrument's ability to successfully trigger field ion emission from semiconductors (Si, GaN) and insulating materials (Al2O3).

An Easy Technique for Focus Characterization and Optimization of XUV and Soft X-ray Pulses

For many applications of extreme ultraviolet (XUV) and X-ray pulses, a small focus size is crucial to reach the required intensity or spatial resolution. In this article, we present a simple way to characterize an XUV focus with a resolution of 1.85 µm. Furthermore, this technique was applied for the measurement and optimization of the focus of an ellipsoidal mirror for photon energies ranging from 18 to 150 eV generated by high-order harmonics. We envisage a broad range of applications of this approach with sub-micrometer resolution from high-harmonic sources via synchrotrons to free-electron lasers.

Spectral filtering of high-order harmonics via optics-free focusing

Controlling the wavefront of an extreme ultraviolet (XUV) high-order harmonic beam during the generation process offers the capability of modifying the beam properties without resorting to any XUV optics. By characterizing the XUV intensity profile and wavefront, we quantitatively retrieve both the size and the position of the waist of each harmonic generated in an argon jet. We show that optics-free focusing can occur under specific generating conditions leading to XUV focii of micrometer size. We also demonstrate that each focus is located at distinct longitudinal positions. Using this remarkable XUV wavefront control combined with near focus spatial selection, we experimentally demonstrate efficient and adjustable spectral filtering of the XUV beam, along with a strong rejection of the fundamental beam, without using any XUV optics. The experimental results are compared with simulations providing the impact of the filtering on the temporal profile of the XUV field. It shows that the attosecond structure is preserved and that the beam is more homogeneous after the filtering, thereby reducing the longitudinal focii shift. This is a major step to achieve high XUV intensity and probing ultrafast processes with an improved resolution.

Single-shot extreme-ultraviolet wavefront measurements of high-order harmonics

We perform wavefront measurements of high-order harmonics using an extreme-ultraviolet (XUV) Hartmann sensor and study how their spatial properties vary with different generation parameters, such as pressure in the nonlinear medium, fundamental pulse energy and duration as well as beam size. In some conditions, excellent wavefront quality (up to λ/11) was obtained. The high throughput of the intense XUV beamline at the Lund Laser Centre allows us to perform single-shot measurements of both the full harmonic beam generated in argon and individual harmonics selected by multilayer mirrors. We theoretically analyze the relationship between the spatial properties of the fundamental and those of the generated high-order harmonics, thus gaining insight into the fundamental mechanisms involved in high-order harmonic generation (HHG).

Harmonium: A pulse preserving source of monochromatic extreme ultraviolet (30-110 eV) radiation for ultrafast photoelectron spectroscopy of liquids

A tuneable repetition rate extreme ultraviolet source (Harmonium) for time resolved photoelectron spectroscopy of liquids is presented. High harmonic generation produces 30-110 eV photons, with fluxes ranging from ∼2 × 10(11) photons/s at 36 eV to ∼2 × 10(8) photons/s at 100 eV. Four different gratings in a time-preserving grating monochromator provide either high energy resolution (0.2 eV) or high temporal resolution (40 fs) between 30 and 110 eV. Laser assisted photoemission was used to measure the temporal response of the system. Vibrational progressions in gas phase water were measured demonstrating the ∼0.2 eV energy resolution.

Micro-focusing of attosecond pulses by grazing-incidence toroidal mirrors

The design of optical systems for micro-focusing of extreme-ultraviolet (XUV) attosecond pulses through grazing-incidence toroidal mirrors is presented. Aim of the proposed configuration is to provide a micro-focused image through a high demagnification of the XUV source with the following characteristics: i) almost negligible aberrations; ii) long exit arm to easily accommodate at the output the experimental setups required for the applications of the focused attosecond pulses; iii) possibility to have an intermediate region where the XUV beam is collimated, in order to insert a plane split-mirror for the generation of two XUV pulse replicas to be used in a XUV-pump/XUV-probe setup. We present the analytical and numerical study of two optical configurations characterized by two sections based on the use of toroidal mirrors. The first section provides a demagnified image of the source in an intermediate focus that is free from defocusing but has a large coma aberration. The second section consists of a relay mirror that is mounted in Z-shaped geometry with respect to the previous one, in order to give a stigmatic image with a coma that is opposite to that provided by the first section. An example is provided to demonstrate the capability to achieve spot sizes in the 5-15 μm range with a demagnification higher than 10 in a compact envelope.

Phase-dependent above-barrier ionization of excited-state electrons

The carrier-envelope phase (CEP)-dependent above-barrier ionization (ABI) has been investigated in order to probe the bound-state electron dynamics. It is found that when the system is initially prepared in the excited state, the ionization yield asymmetry between left and right sides can occur both in low-energy and high-energy parts of the photoelectron spectra. Moreover, in electron momentum map, a new interference effect along the direction perpendicular to the laser polarization is found. We show that this interference is related to the competition among different excited states. The interference effect is dependent on CEPs of few-cycle probe pulses, which can be used to trace the superposition information and control the electron wave packet of low excited states.

Submicrometer-resolution in situ imaging of the focus pattern of a soft x-ray laser by color center formation in LiF crystal

We demonstrate high quality, single-shot in situ imaging of the focused Ag x-ray laser (XRL) at 13.9 nm with 700 nm spatial resolution by color center formation in LiF. The flux and intensity for the color center formation in LiF are evaluated from the experimental data. Comparisons with previous reports show that the threshold x-ray flux for the color center formation in LiF for the 13.9 nm, 7 ps Ag XRL is 3 orders of magnitude less than that with the 46.9 nm, 2 ns capillary discharge Ar XRL.

Focusing multiple high-order harmonics in the extreme-ultraviolet and soft-x-ray regions by a platinum-coated ellipsoidal mirror

The focusability of multiple high-order harmonics in the extreme-ultraviolet and soft-x-ray regions is described, together with the design and performance of the ellipsoidal mirror used for this purpose. The mirror focuses intense coherent light in the spectral-region from 25 to 40 nm into a 2.4 microm spot size with a focused peak intensity of 6 x 10(13) W/cm2. The focal images indicate that a good beam profile is obtained with a near-Gaussian distribution and a beam quality factor (M2 value) as low as 2.4.

Focusing coherent soft-x-ray radiation to a micrometer spot size with an intensity of 10(14) W/cm2

We investigate the focusability of intense coherent soft-x-ray radiation generated by high-order harmonic conversion. The 27th-harmonic wave at 29.6 nm is focused by an off-axis parabolic mirror with a SiC/Mg multilayer coating. Focal-spot images are observed from the visible fluorescence induced by the soft-x-ray photons on a Ce:YAG scintillator. We demonstrate focusing of the soft-x-ray beam to a 1-microm spot size with a peak intensity of 1 x 10(14) W/cm2, which is to our knowledge the highest ever reported in the soft-x-ray region.