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Zhang X, Zhang X, Zhang Z, Zhang T, Xu X, Tang F, Yang J, Wang J, Jiang H, Duan Z, Wei Y, Gong Y, Zhang H, Li P, Hu M. Time-Domain-Filtered Terahertz Nanoscopy of Intrinsic Light-Matter Interactions. NANO LETTERS 2024; 24:15008-15015. [PMID: 39546347 DOI: 10.1021/acs.nanolett.4c03715] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/17/2024]
Abstract
Terahertz (THz) technology holds great potential across diverse applications, including biosensing and information communications, but conventional far-field techniques are limited by diffraction. Near-field optical microscopy overcomes this barrier through a sharp tip that concentrates incident THz waves into nanometric volumes, detecting scattered near-field to reveal nanoscale optical properties. However, owing to the large THz wavelengths, resonant surface waves arising on the tip and cantilever obscure the intrinsic response. Here we combine near-field microscopy with THz time-domain spectroscopy and implement time-domain filtering with an elongated cantilever to eliminate this artifact, achieving intrinsic nanospectroscopy and nanoimaging. By applying this technique, we distinguish and characterize historical pigments of an ancient sculpture, such as vermilion and red lead, on the nanoscale. We also unravel deep-subwavelength localized resonance modes in THz optical antennas, demonstrating capabilities for THz nanophotonics. Our work advances THz nanoimaging and nanospectroscopy techniques to probe intrinsic nanoscale THz light-matter interactions.
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Affiliation(s)
- Xiaoqiuyan Zhang
- Terahertz Research Center, School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 610054, China
- Key Laboratory of Terahertz Technology, Ministry of Education, Chengdu, 610054, China
| | - Xin Zhang
- Wuhan National Laboratory for Optoelectronics, School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, 430074, China
- Optics Valley Laboratory, Hubei, 430074, China
- Hubei Optical Fundamental Research Center, Wuhan, 430074, China
| | - Zhuocheng Zhang
- Terahertz Research Center, School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 610054, China
- Key Laboratory of Terahertz Technology, Ministry of Education, Chengdu, 610054, China
| | - Tianyu Zhang
- Terahertz Research Center, School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 610054, China
- Key Laboratory of Terahertz Technology, Ministry of Education, Chengdu, 610054, China
| | - Xingxing Xu
- Terahertz Research Center, School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 610054, China
- Key Laboratory of Terahertz Technology, Ministry of Education, Chengdu, 610054, China
| | - Fu Tang
- Terahertz Research Center, School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 610054, China
- Key Laboratory of Terahertz Technology, Ministry of Education, Chengdu, 610054, China
| | - Jing Yang
- Department of Archaeology, Cultural Heritage and Museology, School of Art and Archaeology, Zhejiang University, Hangzhou, 310028, China
- Laboratory of Art and Archaeology Image, Zhejiang University, Hangzhou, Zhejiang 310028, China
| | - Jiakun Wang
- Department of Archaeology, Cultural Heritage and Museology, School of Art and Archaeology, Zhejiang University, Hangzhou, 310028, China
- Laboratory of Art and Archaeology Image, Zhejiang University, Hangzhou, Zhejiang 310028, China
| | - Hui Jiang
- School of Computer Science and Engineering (School of Cyber Security), University of Electronic Science and Technology of China, Chengdu, 610054, China
| | - Zhaoyun Duan
- Terahertz Research Center, School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 610054, China
- Key Laboratory of Terahertz Technology, Ministry of Education, Chengdu, 610054, China
| | - Yanyu Wei
- Terahertz Research Center, School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 610054, China
- Key Laboratory of Terahertz Technology, Ministry of Education, Chengdu, 610054, China
| | - Yubin Gong
- Terahertz Research Center, School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 610054, China
- Key Laboratory of Terahertz Technology, Ministry of Education, Chengdu, 610054, China
| | - Hui Zhang
- Department of Archaeology, Cultural Heritage and Museology, School of Art and Archaeology, Zhejiang University, Hangzhou, 310028, China
- Laboratory of Art and Archaeology Image, Zhejiang University, Hangzhou, Zhejiang 310028, China
| | - Peining Li
- Wuhan National Laboratory for Optoelectronics, School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, 430074, China
- Optics Valley Laboratory, Hubei, 430074, China
- Hubei Optical Fundamental Research Center, Wuhan, 430074, China
| | - Min Hu
- Terahertz Research Center, School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, 610054, China
- Key Laboratory of Terahertz Technology, Ministry of Education, Chengdu, 610054, China
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Vitalone RA, S Jessen B, Jing R, Rizzo DJ, Xu S, Hsieh V, Cothrine M, Mandrus DG, Wehmeier L, Carr GL, Bisogni V, Dean CR, Hone JC, Liu M, Weinstein MI, Fogler MM, Basov DN. Charge Transfer Plasmonics in Bespoke Graphene/α-RuCl 3 Cavities. ACS NANO 2024; 18:29648-29657. [PMID: 39423174 DOI: 10.1021/acsnano.4c08441] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 10/21/2024]
Abstract
Surface plasmon polaritons (SPPs) provide a window into the nano-optical, electrodynamic response of their host material and its dielectric environment. Graphene/α-RuCl3 serves as an ideal model system for imaging SPPs since the large work function difference between these two layers facilitates charge transfer that hole dopes graphene with n ∼ 1013 cm-2 free carriers. In this work, we study the emergent THz response of graphene/α-RuCl3 heterostructures using our home-built cryogenic scanning near-field optical microscope. Using phase-resolved imaging, we clearly observe long wavelength, heavily damped THz SPPs in a series of variable-size graphene cavities. From this, we extract the plasmonic wavelength and scattering rate in the graphene/α-RuCl3 heterostructures. We determine that the measured plasmon wavelength and electronic scattering rate match our heterostructures' theoretically predicted values. Our results demonstrate that shaping graphene into bespoke cavity structures enables observation and quantification of SPPs in heavily doped graphene that are largely not addressable with other experimental techniques. Moreover, the manifest lack of metallicity observed in the adjacent doped α-RuCl3 layer provides significant constraints on the nature of the interfacial charge transfer in this 2D heterostructure.
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Affiliation(s)
- Rocco A Vitalone
- Department of Physics, Columbia University, 1150 Amsterdam Avenue, New York, New York 10027, United States
| | - Bjarke S Jessen
- Department of Physics, Columbia University, 1150 Amsterdam Avenue, New York, New York 10027, United States
| | - Ran Jing
- Department of Physics, Stony Brook University, Stony Brook, New York 11794, United States
| | - Daniel J Rizzo
- Department of Physics, Columbia University, 1150 Amsterdam Avenue, New York, New York 10027, United States
| | - Suheng Xu
- Department of Physics, Columbia University, 1150 Amsterdam Avenue, New York, New York 10027, United States
| | - Valerie Hsieh
- Department of Physics, Columbia University, 1150 Amsterdam Avenue, New York, New York 10027, United States
| | - Matthew Cothrine
- Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996, United States
| | - David G Mandrus
- Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996, United States
- Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States
| | - Lukas Wehmeier
- National Synchrotron Light Source II, Brookhaven National Laboratory, Uptown, New York 11973, United States
| | - G Lawrence Carr
- National Synchrotron Light Source II, Brookhaven National Laboratory, Uptown, New York 11973, United States
| | - Valentina Bisogni
- National Synchrotron Light Source II, Brookhaven National Laboratory, Uptown, New York 11973, United States
| | - Cory R Dean
- Department of Physics, Columbia University, 1150 Amsterdam Avenue, New York, New York 10027, United States
| | - James C Hone
- Department of Mechanical Engineering, Columbia University, New York, New York 10027, United States
| | - Mengkun Liu
- National Synchrotron Light Source II, Brookhaven National Laboratory, Uptown, New York 11973, United States
- Department of Physics, Stony Brook University, Stony Brook, New York 11794, United States
| | - Michael I Weinstein
- Department of Applied Physics and Applied Mathematics, Columbia University, New York, New York 10027, United States
- Department of Mathematics, Columbia University, New York, New York 10027, United States
| | - Michael M Fogler
- Department of Physics, University of California, La Jolla, San Diego, California 92093, United States
| | - D N Basov
- Department of Physics, Columbia University, 1150 Amsterdam Avenue, New York, New York 10027, United States
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Guo X, He X, Degnan Z, Chiu CC, Donose BC, Bertling K, Fedorov A, Rakić AD, Jacobson P. Terahertz nanospectroscopy of plasmon polaritons for the evaluation of doping in quantum devices. NANOPHOTONICS (BERLIN, GERMANY) 2023; 12:1865-1875. [PMID: 39635138 PMCID: PMC11614332 DOI: 10.1515/nanoph-2023-0064] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 01/30/2023] [Accepted: 03/22/2023] [Indexed: 12/07/2024]
Abstract
Terahertz (THz) waves are a highly sensitive probe of free carrier concentrations in semiconducting materials. However, most experiments operate in the far-field, which precludes the observation of nanoscale features that affect the material response. Here, we demonstrate the use of nanoscale THz plasmon polaritons as an indicator of surface quality in prototypical quantum devices properties. Using THz near-field hyperspectral measurements, we observe polaritonic features in doped silicon near a metal-semiconductor interface. The presence of the THz surface plasmon polariton indicates the existence of a thin film doped layer on the device. Using a multilayer extraction procedure utilising vector calibration, we quantitatively probe the doped surface layer and determine its thickness and complex permittivity. The recovered multilayer characteristics match the dielectric conditions necessary to support the THz surface plasmon polariton. Applying these findings to superconducting resonators, we show that etching of this doped layer leads to an increase of the quality factor as determined by cryogenic measurements. This study demonstrates that THz scattering-type scanning near-field optical microscopy (s-SNOM) is a promising diagnostic tool for characterization of surface dielectric properties of quantum devices.
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Affiliation(s)
- Xiao Guo
- School of Information Technology and Electrical Engineering, The University of Queensland, St Lucia, Brisbane, 4072, QLD, Australia
| | - Xin He
- School of Mathematics and Physics, The University of Queensland, St Lucia, Brisbane, 4072, QLD, Australia
- ARC Centre of Excellence for Engineered Quantum Systems, St Lucia, Brisbane, 4072, QLD, Australia
| | - Zachary Degnan
- School of Mathematics and Physics, The University of Queensland, St Lucia, Brisbane, 4072, QLD, Australia
- ARC Centre of Excellence for Engineered Quantum Systems, St Lucia, Brisbane, 4072, QLD, Australia
| | - Chun-Ching Chiu
- School of Mathematics and Physics, The University of Queensland, St Lucia, Brisbane, 4072, QLD, Australia
- ARC Centre of Excellence for Engineered Quantum Systems, St Lucia, Brisbane, 4072, QLD, Australia
| | - Bogdan C. Donose
- School of Information Technology and Electrical Engineering, The University of Queensland, St Lucia, Brisbane, 4072, QLD, Australia
| | - Karl Bertling
- School of Information Technology and Electrical Engineering, The University of Queensland, St Lucia, Brisbane, 4072, QLD, Australia
| | - Arkady Fedorov
- School of Mathematics and Physics, The University of Queensland, St Lucia, Brisbane, 4072, QLD, Australia
- ARC Centre of Excellence for Engineered Quantum Systems, St Lucia, Brisbane, 4072, QLD, Australia
| | - Aleksandar D. Rakić
- School of Information Technology and Electrical Engineering, The University of Queensland, St Lucia, Brisbane, 4072, QLD, Australia
| | - Peter Jacobson
- School of Mathematics and Physics, The University of Queensland, St Lucia, Brisbane, 4072, QLD, Australia
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4
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Pizzuto A, Ma P, Mittleman DM. Near-field terahertz nonlinear optics with blue light. LIGHT, SCIENCE & APPLICATIONS 2023; 12:96. [PMID: 37072386 PMCID: PMC10113216 DOI: 10.1038/s41377-023-01137-y] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 09/08/2022] [Revised: 02/15/2023] [Accepted: 03/20/2023] [Indexed: 05/03/2023]
Abstract
The coupling of terahertz optical techniques to scattering-type scanning near-field microscopy (s-SNOM) has recently emerged as a valuable new paradigm for probing the properties of semiconductors and other materials on the nanoscale. Researchers have demonstrated a family of related techniques, including terahertz nanoscopy (elastic scattering, based on linear optics), time-resolved methods, and nanoscale terahertz emission spectroscopy. However, as with nearly all examples of s-SNOM since the technique's inception in the mid-1990s, the wavelength of the optical source coupled to the near-field tip is long, usually at energies of 2.5 eV or less. Challenges in coupling of shorter wavelengths (i.e., blue light) to the nanotip has greatly inhibited the study of nanoscale phenomena in wide bandgap materials such as Si and GaN. Here, we describe the first experimental demonstration of s-SNOM using blue light. With femtosecond pulses at 410 nm, we generate terahertz pulses directly from bulk silicon, spatially resolved with nanoscale resolution, and show that these signals provide spectroscopic information that cannot be obtained using near-infrared excitation. We develop a new theoretical framework to account for this nonlinear interaction, which enables accurate extraction of material parameters. This work establishes a new realm of possibilities for the study of technologically relevant wide-bandgap materials using s-SNOM methods.
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Affiliation(s)
- Angela Pizzuto
- Department of Physics, Brown University, Providence, RI 02912, USA.
| | - Pingchuan Ma
- School of Engineering, Brown University, Providence, RI 02912, USA
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Chen M, de Oliveira TVAG, Ilyakov I, Nörenberg T, Kuschewski F, Deinert JC, Awari N, Ponomaryov A, Kuntzsch M, Kehr SC, Eng LM, Gensch M, Kovalev S. Terahertz-slicing - an all-optical synchronization for 4 th generation light sources. OPTICS EXPRESS 2022; 30:26955-26966. [PMID: 36236877 DOI: 10.1364/oe.454908] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/03/2022] [Accepted: 06/01/2022] [Indexed: 06/16/2023]
Abstract
A conceptually new approach to synchronizing accelerator-based light sources and external laser systems is presented. The concept is based on utilizing a sufficiently intense accelerator-based single-cycle terahertz pulse to slice a thereby intrinsically synchronized femtosecond-level part of a longer picosecond laser pulse in an electro-optic crystal. A precise synchronization of the order of 10 fs is demonstrated, allowing for real-time lock-in amplifier signal demodulation. We demonstrate successful operation of the concept with three benchmark experiments using a 4th generation accelerator-based terahertz light source, i.e. (i) far-field terahertz time-domain spectroscopy, (ii) terahertz high harmonic generation spectroscopy, and (iii) terahertz scattering-type scanning near-field optical microscopy.
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6
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Tollkühn M, Ritter PJ, Schilling M, Hampel B. THz microscope for three-dimensional imaging with superconducting Josephson junctions. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2022; 93:043708. [PMID: 35489904 DOI: 10.1063/5.0084207] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/04/2022] [Accepted: 04/03/2022] [Indexed: 06/14/2023]
Abstract
Superconducting Josephson junctions have a wide range of applications ranging from quantum computing to voltage standards, and they may also be employed as versatile sensors for high-frequency radiation and magnetic fields. In this work, we present a unique measurement setup utilizing a single Josephson junction on a cantilever for high-resolution spatial measurements of spectroscopically resolved THz and microwave field distributions. This THz microscope can be utilized to measure power and frequency of electromagnetic radiation from ∼1 GHz to 5 THz. It may also be used to measure static magnetic fields and provide topological scans of samples. The samples can be both actively radiating or passively irradiated at either room temperature or cryogenic temperatures. We review the measurement setup of the THz microscope and describe the evaluation of its measurement data to achieve three-dimensional visualizations of the field distributions. The diverse capabilities of this unique tool are demonstrated by its different measurement modes with measurements of field distributions at 20 GHz and 1.4 THz, spectroscopically resolved THz measurements, and magnetic field measurements.
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Affiliation(s)
- M Tollkühn
- Institut für Elektrische Messtechnik und Grundlagen der Elektrotechnik, TU Braunschweig, 38106 Braunschweig, Germany
| | - P J Ritter
- Institut für Elektrische Messtechnik und Grundlagen der Elektrotechnik, TU Braunschweig, 38106 Braunschweig, Germany
| | - M Schilling
- Institut für Elektrische Messtechnik und Grundlagen der Elektrotechnik, TU Braunschweig, 38106 Braunschweig, Germany
| | - B Hampel
- Institut für Elektrische Messtechnik und Grundlagen der Elektrotechnik, TU Braunschweig, 38106 Braunschweig, Germany
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Conrad G, Casper CB, Ritchie ET, Atkin JM. Quantitative modeling of near-field interactions incorporating polaritonic and electrostatic effects. OPTICS EXPRESS 2022; 30:11619-11632. [PMID: 35473102 DOI: 10.1364/oe.442305] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/02/2021] [Accepted: 02/19/2022] [Indexed: 06/14/2023]
Abstract
As scattering-scanning near-field optical microscopy (s-SNOM) continues to grow in prominence, there has been great interest in modeling the near-field light-matter interaction to better predict experimental results. Both analytical and numerical models have been developed to describe the near-field response, but thus far models have not incorporated the full range of phenomena accessible. Here, we present a finite element model (FEM), capable of incorporating the complex physical and spatial phenomena that s-SNOM has proved able to probe. First, we use electromagnetic FEM to simulate the multipolar response of the tip and illustrate the impact of strong coupling on signal demodulation. We then leverage the multiphysics advantage of FEM to study the electrostatic effect of metallic tips on semiconductors, finding that THz s-SNOM studies are most impacted by this tip-induced band-bending. Our model is computationally inexpensive and can be tailored to specific nanostructured systems and geometries of interest.
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Chen X, Yao Z, Sun Z, Stanciu SG, Basov DN, Hillenbrand R, Liu M. Rapid simulations of hyperspectral near-field images of three-dimensional heterogeneous surfaces - part II. OPTICS EXPRESS 2022; 30:11228-11242. [PMID: 35473071 DOI: 10.1364/oe.452949] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/05/2022] [Accepted: 02/11/2022] [Indexed: 06/14/2023]
Abstract
The modeling of the near-field interaction in the scattering-type scanning near-field optical microscope (s-SNOM) is rapidly advancing, although an accurate yet versatile modeling framework that can be easily adapted to various complex situations is still lacking. In this work, we propose a time-efficient numerical scheme in the quasi-electrostatic limit to capture the tip-sample interaction in the near field. This method considers an extended tip geometry, which is a significant advantage compared to the previously reported method based on the point-dipole approximation. Using this formalism, we investigate, among others, nontrivial questions such as uniaxial and biaxial anisotropy in the near-field interaction, the relationship between various experimental parameters (e.g. tip radius, tapping amplitude, etc.), and the tip-dependent spatial resolution. The demonstrated method further sheds light on the understanding of the contrast mechanism in s-SNOM imaging and spectroscopy, while also representing a valuable platform for future quantitative analysis of the experimental observations.
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