1
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Gu H, Zhang T, Wang Y, Zhou T, Chen H. 2D compounds with heterolayered architecture for infrared photodetectors. Chem Sci 2024:d4sc03428g. [PMID: 39328196 PMCID: PMC11423492 DOI: 10.1039/d4sc03428g] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/25/2024] [Accepted: 09/07/2024] [Indexed: 09/28/2024] Open
Abstract
Compounds with heterolayered architecture, as a family of two-dimensional (2D) materials, are composed of alternating positive and negative layers. Their physical properties are determined not only by the charged constituents, but also by the interaction between the two layers. This kind of material has been widely used for superconductivity, thermoelectricity, energy storage, etc. In recent years, heterolayered compounds have been found as an encouraging choice for infrared photodetectors with high sensitivity, fast response, and remarkable reliability. In this review, we summarize the research progress of heterolayered materials for infrared photodetectors. A simple development history of the materials with three-dimensional (3D) or 2D structures, which are suitable for infrared photodetectors, is introduced firstly. Then, we compare the differences between van der Waals layered 2D materials and heterolayered 2D cousins and explain the advantages of heterolayered 2D compounds. Finally, we present our perspective on the future direction of heterolayered 2D materials as an emerging class of materials for infrared photodetectors.
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Affiliation(s)
- Hao Gu
- State Key Laboratory for Modification of Chemical Fibers and Polymer Materials, Institute of Functional Materials, College of Materials Science and Engineering, Donghua University Shanghai 201620 China
| | - Tianshuo Zhang
- State Key Laboratory for Modification of Chemical Fibers and Polymer Materials, Institute of Functional Materials, College of Materials Science and Engineering, Donghua University Shanghai 201620 China
| | - Yunluo Wang
- State Key Laboratory for Modification of Chemical Fibers and Polymer Materials, Institute of Functional Materials, College of Materials Science and Engineering, Donghua University Shanghai 201620 China
| | - Tianrui Zhou
- State Key Laboratory for Modification of Chemical Fibers and Polymer Materials, Institute of Functional Materials, College of Materials Science and Engineering, Donghua University Shanghai 201620 China
| | - Haijie Chen
- State Key Laboratory for Modification of Chemical Fibers and Polymer Materials, Institute of Functional Materials, College of Materials Science and Engineering, Donghua University Shanghai 201620 China
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Wu G, Wan Y, Wang Z, Hu X, Zeng J, Zhang Y, Wang J. Contactless integrated photonic probes: fundamentals, characteristics, and applications. FRONTIERS OF OPTOELECTRONICS 2024; 17:26. [PMID: 39098865 PMCID: PMC11298509 DOI: 10.1007/s12200-024-00127-1] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/14/2024] [Accepted: 06/26/2024] [Indexed: 08/06/2024]
Abstract
On-chip optical power monitors are indispensable for functional implementation and stabilization of large-scale and complex photonic integrated circuits (PICs). Traditional on-chip optical monitoring is implemented by tapping a small portion of optical power from the waveguide, which leads to significant loss. Due to its advantages like non-invasive nature, miniaturization, and complementary metal-oxide-semiconductor (CMOS) process compatibility, a transparent monitor named the contactless integrated photonic probe (CLIPP), has been attracting great attention in recent years. The CLIPP indirectly monitors the optical power in the waveguide by detecting the conductance variation of the local optical waveguide caused by the surface state absorption (SSA) effect. In this review, we first introduce the fundamentals of the CLIPP including the concept, the equivalent electric model and the impedance read-out method, and then summarize some characteristics of the CLIPP. Finally, the functional applications of the CLIPP on the identification and feedback control of optical signal are discussed, followed by a brief outlook on the prospects of the CLIPP.
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Affiliation(s)
- Guangze Wu
- Wuhan National Laboratory for Optoelectronics and School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, 430074, China
- Optics Valley Laboratory, Wuhan, 430074, China
| | - Yuanjian Wan
- Wuhan National Laboratory for Optoelectronics and School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, 430074, China
- Optics Valley Laboratory, Wuhan, 430074, China
| | - Zhao Wang
- School of Precision Instrument and Optoelectronic Engineering, Tianjin University, Tianjin, 300072, China
- Key Laboratory of Optoelectronic Information Science and Technology, Ministry of Education, Tianjin, 300072, China
| | - Xiaolong Hu
- School of Precision Instrument and Optoelectronic Engineering, Tianjin University, Tianjin, 300072, China
- Key Laboratory of Optoelectronic Information Science and Technology, Ministry of Education, Tianjin, 300072, China
| | - Jinwei Zeng
- Wuhan National Laboratory for Optoelectronics and School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, 430074, China
- Optics Valley Laboratory, Wuhan, 430074, China
| | - Yu Zhang
- Wuhan National Laboratory for Optoelectronics and School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, 430074, China
- Optics Valley Laboratory, Wuhan, 430074, China
| | - Jian Wang
- Wuhan National Laboratory for Optoelectronics and School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, 430074, China.
- Optics Valley Laboratory, Wuhan, 430074, China.
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3
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Zhang Z, Yan J, You J, Zhu Y, Wang L, Zhong Z, Jiang Z. Near-infrared detection based on the excitation of hot electrons in Au/Si microcone array. NANOTECHNOLOGY 2024; 35:405201. [PMID: 38991504 DOI: 10.1088/1361-6528/ad61f1] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/16/2024] [Accepted: 07/11/2024] [Indexed: 07/13/2024]
Abstract
Although the photoresponse cut-off wavelength of Si is about 1100 nm due to the Si bandgap energy, the internal photoemission effect (IPE) of the Au/Si junction in Schottky detector can extend the absorption wavelength, which makes it a promising candidate for the Si-based infrared detector. However, due to low light absorption, low photon-electron interaction, and poor electron injection efficiency, the near-infrared light detection efficiency of the Schottky detector is still insufficient. The synergistic effect of Si nano/microstructures with a strong light trapping effect and nanoscale Au films with surface plasmon enhanced absorption may provide an effective solution for improving the detection efficiency. In this paper, a large-area periodic Si microcone array covered by an Au film has successfully been fabricated by one-time dry etching based on the mature polystyrene microspheres lithography technique and vacuum thermal deposition, and its properties for hot electron-based near infrared photodetection are investigated. Optical measurements show that the 20 nm-thick Au covered Si microcone array exhibits a low reflectance and a strong absorption (about 85%) in wide wavelength range (900-2500 nm), and the detection responsivity can reach a value as high as 17.1 and 7.0 mA W-1at 1200 and 1310 nm under the front illumination, and 35.9 mA W-1at 1310 nm under the back illumination respectively. Three-dimensional finite difference time domain (3D-FDTD) simulation results show that the enhanced local electric field in the Au layer distributes near the air/Au interface under the front illumination and close to the Au/Si interface under the back illumination. The back illumination favors the injection of photo-generated hot electrons in Au layer into Si, which can explain the higher responsivity under the back illumination. Our research is expected to promote the practical application of Schottky photodetectors to Si-compatible near infrared photodetectors.
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Affiliation(s)
- Zhifang Zhang
- State Key Laboratory of Surface Physics and Department of Physics, Fudan University, Shanghai 200438, People's Republic of China
| | - Jia Yan
- State Key Laboratory of Surface Physics and Department of Physics, Fudan University, Shanghai 200438, People's Republic of China
| | - Jie You
- Wide Bandgap Semiconductor Technology Disciplines State Key Laboratory, School of Microelectronics, Xidian University, Xi'an 710071, People's Republic of China
| | - Yanyan Zhu
- College of Mathematics and Physics, Shanghai University of Electric Power, Shanghai 200090, People's Republic of China
| | - Liming Wang
- Wide Bandgap Semiconductor Technology Disciplines State Key Laboratory, School of Microelectronics, Xidian University, Xi'an 710071, People's Republic of China
| | - Zhenyang Zhong
- State Key Laboratory of Surface Physics and Department of Physics, Fudan University, Shanghai 200438, People's Republic of China
| | - Zuimin Jiang
- State Key Laboratory of Surface Physics and Department of Physics, Fudan University, Shanghai 200438, People's Republic of China
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Ghaderi A, Sabbaghzadeh J, Dejam L, Behzadi Pour G, Moghimi E, Matos RS, da Fonseca Filho HD, Țălu Ș, Salehi Shayegan A, Aval LF, Astani Doudaran M, Sari A, Solaymani S. Nanoscale morphology, optical dynamics and gas sensor of porous silicon. Sci Rep 2024; 14:3677. [PMID: 38355956 PMCID: PMC10866982 DOI: 10.1038/s41598-024-54336-x] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/17/2023] [Accepted: 02/12/2024] [Indexed: 02/16/2024] Open
Abstract
We investigated the multifaceted gas sensing properties of porous silicon thin films electrodeposited onto (100) oriented P-type silicon wafers substrates. Our investigation delves into morphological, optical properties, and sensing capabilities, aiming to optimize their use as efficient gas sensors. Morphological analysis revealed the development of unique surfaces with distinct characteristics compared to untreated sample, yielding substantially rougher yet flat surfaces, corroborated by Minkowski Functionals analysis. Fractal mathematics exploration emphasized that despite increased roughness, HF/ethanol-treated surfaces exhibit flatter attributes compared to untreated Si sample. Optical approaches established a correlation between increased porosity and elevated localized states and defects, influencing the Urbach energy value. This contributed to a reduction in steepness values, attributed to heightened dislocations and structural disturbances, while the transconductance parameter decreases. Simultaneously, porosity enhances the strength of electron‒phonon interaction. The porous silicon thin films were further tested as effective gas sensors for CO2 and O2 vapors at room temperature, displaying notable changes in electrical resistance with varying concentrations. These findings bring a comprehensive exploration of some important characteristics of porous silicon surfaces and established their potential for advanced industrial applications.
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Affiliation(s)
- Atefeh Ghaderi
- Quantum Technologies Research Center (QTRC), Science and Research Branch, Islamic Azad University, Tehran, Iran
| | - Jamshid Sabbaghzadeh
- Quantum Technologies Research Center (QTRC), Science and Research Branch, Islamic Azad University, Tehran, Iran
| | - Laya Dejam
- Quantum Technologies Research Center (QTRC), Science and Research Branch, Islamic Azad University, Tehran, Iran
- Department of Physics, Islamic Azad University, West Tehran Branch, Tehran, Iran
| | - Ghobad Behzadi Pour
- Quantum Technologies Research Center (QTRC), Science and Research Branch, Islamic Azad University, Tehran, Iran
- Department of Physics, East Tehran Branch, Islamic Azad University, Tehran, 18661-13118, Iran
| | - Emad Moghimi
- Faculty of Physics, Kharazmi University, Tehran, Iran
| | - Robert S Matos
- Amazonian Materials Group, Physics Department, Federal University of Amapá-UNIFAP, Macapá, Amapá, Brazil
| | - Henrique Duarte da Fonseca Filho
- Laboratory of Synthesis of Nanomaterials and Nanoscopy, Physics Department, Federal University of Amazonas-UFAM, Manaus, Amazonas, Brazil
| | - Ștefan Țălu
- The Directorate of Research, Development and Innovation Management (DMCDI), The Technical University of Cluj-Napoca, Constantin Daicoviciu Street, No. 15, Cluj-Napoca, 400020, Cluj County, Romania
| | - Amirhossein Salehi Shayegan
- Quantum Technologies Research Center (QTRC), Science and Research Branch, Islamic Azad University, Tehran, Iran
| | - Leila Fekri Aval
- Quantum Technologies Research Center (QTRC), Science and Research Branch, Islamic Azad University, Tehran, Iran
| | - Mahdi Astani Doudaran
- Quantum Technologies Research Center (QTRC), Science and Research Branch, Islamic Azad University, Tehran, Iran
| | - Amirhossein Sari
- Quantum Technologies Research Center (QTRC), Science and Research Branch, Islamic Azad University, Tehran, Iran
| | - Shahram Solaymani
- Quantum Technologies Research Center (QTRC), Science and Research Branch, Islamic Azad University, Tehran, Iran.
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5
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Katiyar AK, Hoang AT, Xu D, Hong J, Kim BJ, Ji S, Ahn JH. 2D Materials in Flexible Electronics: Recent Advances and Future Prospectives. Chem Rev 2024; 124:318-419. [PMID: 38055207 DOI: 10.1021/acs.chemrev.3c00302] [Citation(s) in RCA: 1] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/07/2023]
Abstract
Flexible electronics have recently gained considerable attention due to their potential to provide new and innovative solutions to a wide range of challenges in various electronic fields. These electronics require specific material properties and performance because they need to be integrated into a variety of surfaces or folded and rolled for newly formatted electronics. Two-dimensional (2D) materials have emerged as promising candidates for flexible electronics due to their unique mechanical, electrical, and optical properties, as well as their compatibility with other materials, enabling the creation of various flexible electronic devices. This article provides a comprehensive review of the progress made in developing flexible electronic devices using 2D materials. In addition, it highlights the key aspects of materials, scalable material production, and device fabrication processes for flexible applications, along with important examples of demonstrations that achieved breakthroughs in various flexible and wearable electronic applications. Finally, we discuss the opportunities, current challenges, potential solutions, and future investigative directions about this field.
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Affiliation(s)
- Ajit Kumar Katiyar
- School of Electrical and Electronic Engineering, Yonsei University, Seoul 03722, Republic of Korea
| | - Anh Tuan Hoang
- School of Electrical and Electronic Engineering, Yonsei University, Seoul 03722, Republic of Korea
| | - Duo Xu
- School of Electrical and Electronic Engineering, Yonsei University, Seoul 03722, Republic of Korea
| | - Juyeong Hong
- School of Electrical and Electronic Engineering, Yonsei University, Seoul 03722, Republic of Korea
| | - Beom Jin Kim
- School of Electrical and Electronic Engineering, Yonsei University, Seoul 03722, Republic of Korea
| | - Seunghyeon Ji
- School of Electrical and Electronic Engineering, Yonsei University, Seoul 03722, Republic of Korea
| | - Jong-Hyun Ahn
- School of Electrical and Electronic Engineering, Yonsei University, Seoul 03722, Republic of Korea
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Wu B, Zhang Z, Zheng Z, Cai T, You C, Liu C, Li X, Wang Y, Wang J, Li H, Song E, Cui J, Huang G, Mei Y. Self-Rolled-Up Ultrathin Single-Crystalline Silicon Nanomembranes for On-Chip Tubular Polarization Photodetectors. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2023; 35:e2306715. [PMID: 37721970 DOI: 10.1002/adma.202306715] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/09/2023] [Revised: 09/09/2023] [Indexed: 09/20/2023]
Abstract
Freestanding single-crystalline nanomembranes and their assembly have broad application potential in photodetectors for integrated chips. However, the release and self-assembly process of single-crystalline semiconductor nanomembranes still remains a great challenge in on-chip processing and functional integration, and photodetectors based on nanomembrane always suffer from limited absorption of nanoscale thickness. Here, a non-destructive releasing and rolling process is employed to prepare tubular photodetectors based on freestanding single-crystalline Si nanomembranes. Spontaneous release and self-assembly are achieved by residual strain introduced by lattice mismatch at the epitaxial interface of Si and Ge, and the intrinsic stress and strain distributions in self-rolled-up Si nanomembranes are analyzed experimentally and computationally. The advantages of light trapping and wide-angle optical coupling are realized by tubular geometry. This Si microtube device achieves reliable Ohmic contact and exhibits a photoresponsivity of over 330 mA W-1 , a response time of 370 µs, and a light incident detection angle range of over 120°. Furthermore, the microtubular structure shows a distinct polarization angle-dependent light absorption, with a dichroic ratio of 1.24 achieved at 940 nm. The proposed Si-based microtubes provide new possibilities for the construction of multifunctional chips for integrated circuit ecosystems in the More than Moore era.
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Affiliation(s)
- Binmin Wu
- Department of Materials Science & State Key Laboratory of ASIC and Systems, Fudan University, Shanghai, 200438, P. R. China
| | - Ziyu Zhang
- Department of Materials Science & State Key Laboratory of ASIC and Systems, Fudan University, Shanghai, 200438, P. R. China
| | - Zhi Zheng
- Department of Materials Science & State Key Laboratory of ASIC and Systems, Fudan University, Shanghai, 200438, P. R. China
| | - Tianjun Cai
- Department of Materials Science & State Key Laboratory of ASIC and Systems, Fudan University, Shanghai, 200438, P. R. China
| | - Chunyu You
- Department of Materials Science & State Key Laboratory of ASIC and Systems, Fudan University, Shanghai, 200438, P. R. China
| | - Chang Liu
- Department of Materials Science & State Key Laboratory of ASIC and Systems, Fudan University, Shanghai, 200438, P. R. China
| | - Xing Li
- Department of Materials Science & State Key Laboratory of ASIC and Systems, Fudan University, Shanghai, 200438, P. R. China
| | - Yang Wang
- Department of Materials Science & State Key Laboratory of ASIC and Systems, Fudan University, Shanghai, 200438, P. R. China
| | - Jinlong Wang
- Department of Materials Science & State Key Laboratory of ASIC and Systems, Fudan University, Shanghai, 200438, P. R. China
| | - Hongbin Li
- Department of Materials Science & State Key Laboratory of ASIC and Systems, Fudan University, Shanghai, 200438, P. R. China
| | - Enming Song
- Yiwu Research Institute of Fudan University, Yiwu, 322000, P. R. China
- International Institute of Intelligent Nanorobots and Nanosystems, Fudan University, Shanghai, 200438, P. R. China
- Shanghai Frontiers Science Research Base of Intelligent Optoelectronics and Perception, Institute of Optoelectronics, Fudan University, Shanghai, 200438, P. R. China
| | - Jizhai Cui
- Department of Materials Science & State Key Laboratory of ASIC and Systems, Fudan University, Shanghai, 200438, P. R. China
- Yiwu Research Institute of Fudan University, Yiwu, 322000, P. R. China
- International Institute of Intelligent Nanorobots and Nanosystems, Fudan University, Shanghai, 200438, P. R. China
| | - Gaoshan Huang
- Department of Materials Science & State Key Laboratory of ASIC and Systems, Fudan University, Shanghai, 200438, P. R. China
- Yiwu Research Institute of Fudan University, Yiwu, 322000, P. R. China
- International Institute of Intelligent Nanorobots and Nanosystems, Fudan University, Shanghai, 200438, P. R. China
| | - Yongfeng Mei
- Department of Materials Science & State Key Laboratory of ASIC and Systems, Fudan University, Shanghai, 200438, P. R. China
- Yiwu Research Institute of Fudan University, Yiwu, 322000, P. R. China
- International Institute of Intelligent Nanorobots and Nanosystems, Fudan University, Shanghai, 200438, P. R. China
- Shanghai Frontiers Science Research Base of Intelligent Optoelectronics and Perception, Institute of Optoelectronics, Fudan University, Shanghai, 200438, P. R. China
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7
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Wang S, Huang W, Tian J, Peng J, Cao J. A near-infrared photodetector based on carbon nanotube transistors exhibits ultra-low dark current through field-modulated charge carrier transport. Phys Chem Chem Phys 2023; 25:26991-26998. [PMID: 37667819 DOI: 10.1039/d3cp01497e] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 09/06/2023]
Abstract
Near-infrared photodetectors (NIR PDs) are devices that convert infrared light signals, which are widely used in military and civilian applications, into electrical signals. However, a common problem associated with PDs is a high dark current. Interestingly, gate voltage can regulate carrier migration in the channels. In this study, a PbS quantum dot heterojunction combined with a carbon nanotube (CNT) field effect transistor (FET) is designed and described. Significantly, this NIR PD achieves field-modulated carrier transport in a CNT transistor, in which the dark current is effectively regulated by the gate voltage. In this PD, an ultra-low dark current of 8 pA is obtained by gate voltage regulation. Moreover, the device shows a fast response speed of 6.5 ms and a high normalized detectivity of 4.75 × 1011 Jones at 0.085 W cm-2 power density and -0.2 V bias voltage. Overall, this work details a novel strategy for the fabrication of a PD with an ultra-low dark current based on a FET.
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Affiliation(s)
- Sheng Wang
- Hunan Key Laboratory of Micro-Nano Energy Materials and Devices, Laboratory for Quantum Engineering and Micro-Nano Energy Technology, School of Physics and Optoelectronic, Xiangtan University, Xiangtan, Hunan 411105, China.
- Hunan Institute of Advanced Sensing and Information Technology, Xiangtan 411105, China
| | - Wuhua Huang
- Hunan Key Laboratory of Micro-Nano Energy Materials and Devices, Laboratory for Quantum Engineering and Micro-Nano Energy Technology, School of Physics and Optoelectronic, Xiangtan University, Xiangtan, Hunan 411105, China.
- Guangxi Zhuang Autonomous Region Institute of Metrology & Test, 530200, China
| | - Junlong Tian
- Hunan Key Laboratory of Micro-Nano Energy Materials and Devices, Laboratory for Quantum Engineering and Micro-Nano Energy Technology, School of Physics and Optoelectronic, Xiangtan University, Xiangtan, Hunan 411105, China.
- Department of Electronic Science, College of Big Data and Information Engineering, Guizhou University, Guiyang 550025, China
| | - Jie Peng
- Hunan Key Laboratory of Micro-Nano Energy Materials and Devices, Laboratory for Quantum Engineering and Micro-Nano Energy Technology, School of Physics and Optoelectronic, Xiangtan University, Xiangtan, Hunan 411105, China.
| | - Juexian Cao
- Hunan Key Laboratory of Micro-Nano Energy Materials and Devices, Laboratory for Quantum Engineering and Micro-Nano Energy Technology, School of Physics and Optoelectronic, Xiangtan University, Xiangtan, Hunan 411105, China.
- Hunan Institute of Advanced Sensing and Information Technology, Xiangtan 411105, China
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8
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Meng Y, Zhong H, Xu Z, He T, Kim JS, Han S, Kim S, Park S, Shen Y, Gong M, Xiao Q, Bae SH. Functionalizing nanophotonic structures with 2D van der Waals materials. NANOSCALE HORIZONS 2023; 8:1345-1365. [PMID: 37608742 DOI: 10.1039/d3nh00246b] [Citation(s) in RCA: 4] [Impact Index Per Article: 4.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 08/24/2023]
Abstract
The integration of two-dimensional (2D) van der Waals materials with nanostructures has triggered a wide spectrum of optical and optoelectronic applications. Photonic structures of conventional materials typically lack efficient reconfigurability or multifunctionality. Atomically thin 2D materials can thus generate new functionality and reconfigurability for a well-established library of photonic structures such as integrated waveguides, optical fibers, photonic crystals, and metasurfaces, to name a few. Meanwhile, the interaction between light and van der Waals materials can be drastically enhanced as well by leveraging micro-cavities or resonators with high optical confinement. The unique van der Waals surfaces of the 2D materials enable handiness in transfer and mixing with various prefabricated photonic templates with high degrees of freedom, functionalizing as the optical gain, modulation, sensing, or plasmonic media for diverse applications. Here, we review recent advances in synergizing 2D materials to nanophotonic structures for prototyping novel functionality or performance enhancements. Challenges in scalable 2D materials preparations and transfer, as well as emerging opportunities in integrating van der Waals building blocks beyond 2D materials are also discussed.
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Affiliation(s)
- Yuan Meng
- Department of Mechanical Engineering and Materials Science, Washington University in St. Louis, St. Louis, MO, USA.
| | - Hongkun Zhong
- State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing, China.
| | - Zhihao Xu
- Institute of Materials Science and Engineering, Washington University in St. Louis, St. Louis, MO, USA
| | - Tiantian He
- State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing, China.
| | - Justin S Kim
- Institute of Materials Science and Engineering, Washington University in St. Louis, St. Louis, MO, USA
| | - Sangmoon Han
- Department of Mechanical Engineering and Materials Science, Washington University in St. Louis, St. Louis, MO, USA.
| | - Sunok Kim
- Department of Mechanical Engineering and Materials Science, Washington University in St. Louis, St. Louis, MO, USA.
| | - Seoungwoong Park
- Institute of Materials Science and Engineering, Washington University in St. Louis, St. Louis, MO, USA
| | - Yijie Shen
- Division of Physics and Applied Physics, School of Physical and Mathematical Sciences, Nanyang Technological University, Singapore, Singapore
- Optoelectronics Research Centre, University of Southampton, Southampton, UK
| | - Mali Gong
- State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing, China.
| | - Qirong Xiao
- State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing, China.
| | - Sang-Hoon Bae
- Department of Mechanical Engineering and Materials Science, Washington University in St. Louis, St. Louis, MO, USA.
- Institute of Materials Science and Engineering, Washington University in St. Louis, St. Louis, MO, USA
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9
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Shaikh MS, Wen S, Catuneanu MT, Wang M, Erbe A, Prucnal S, Rebohle L, Zhou S, Jamshidi K, Helm M, Berencén Y. On-chip lateral Si:Te PIN photodiodes for room-temperature detection in the telecom optical wavelength bands. OPTICS EXPRESS 2023; 31:26451-26462. [PMID: 37710506 DOI: 10.1364/oe.494463] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/28/2023] [Accepted: 06/15/2023] [Indexed: 09/16/2023]
Abstract
Photonic integrated circuits require photodetectors that operate at room temperature with sensitivity at telecom wavelengths and are suitable for integration with planar complementary-metal-oxide-semiconductor (CMOS) technology. Silicon hyperdoped with deep-level impurities is a promising material for silicon infrared detectors because of its strong room-temperature photoresponse in the short-wavelength infrared region caused by the creation of an impurity band within the silicon band gap. In this work, we present the first experimental demonstration of lateral Te-hyperdoped Si PIN photodetectors operating at room temperature in the optical telecom bands. We provide a detailed description of the fabrication process, working principle, and performance of the photodiodes, including their key figure of merits. Our results are promising for the integration of active and passive photonic elements on a single Si chip, leveraging the advantages of planar CMOS technology.
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10
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Su ZC, Lin CF. Overcoming the Fermi-Level Pinning Effect in the Nanoscale Metal and Silicon Interface. NANOMATERIALS (BASEL, SWITZERLAND) 2023; 13:2193. [PMID: 37570511 PMCID: PMC10420943 DOI: 10.3390/nano13152193] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/26/2023] [Revised: 07/17/2023] [Accepted: 07/26/2023] [Indexed: 08/13/2023]
Abstract
Silicon-based photodetectors are attractive as low-cost and environmentally friendly optical sensors. Also, their compatibility with complementary metal-oxide-semiconductor (CMOS) technology is advantageous for the development of silicon photonics systems. However, extending optical responsivity of silicon-based photodetectors to the mid-infrared (mid-IR) wavelength range remains challenging. In developing mid-IR infrared Schottky detectors, nanoscale metals are critical. Nonetheless, one key factor is the Fermi-level pinning effect at the metal/silicon interface and the presence of metal-induced gap states (MIGS). Here, we demonstrate the utilization of the passivated surface layer on semiconductor materials as an insulating material in metal-insulator-semiconductor (MIS) contacts to mitigate the Fermi-level pinning effect. The removal of Fermi-level pinning effectively reduces the Schottky barrier height by 12.5% to 16%. The demonstrated devices exhibit a high responsivity of up to 234 μA/W at a wavelength of 2 μm, 48.2 μA/W at 3 μm, and 1.75 μA/W at 6 μm. The corresponding detectivities at 2 and 3 μm are 1.17 × 108 cm Hz1/2 W-1 and 2.41 × 107 cm Hz1/2 W-1, respectively. The expanded sensing wavelength range contributes to the application development of future silicon photonics integration platforms.
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Affiliation(s)
- Zih-Chun Su
- Graduate Institute of Photonics and Optoelectronics, National Taiwan University, Taipei 10617, Taiwan;
| | - Ching-Fuh Lin
- Graduate Institute of Photonics and Optoelectronics, National Taiwan University, Taipei 10617, Taiwan;
- Graduate Institute of Electronics Engineering, National Taiwan University, Taipei 10617, Taiwan
- Department of Electrical Engineering, National Taiwan University, Taipei 10617, Taiwan
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11
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Dai X, Wu L, Liu K, Ma F, Yang Y, Yu L, Sun J, Lu M. A Silicon Sub-Bandgap Near-Infrared Photodetector with High Detectivity Based on Textured Si/Au Nanoparticle Schottky Junctions Covered with Graphene Film. SENSORS (BASEL, SWITZERLAND) 2023; 23:6184. [PMID: 37448033 DOI: 10.3390/s23136184] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/23/2023] [Revised: 06/30/2023] [Accepted: 07/04/2023] [Indexed: 07/15/2023]
Abstract
We present a straightforward approach to develop a high-detectivity silicon (Si) sub-bandgap near-infrared (NIR) photodetector (PD) based on textured Si/Au nanoparticle (NP) Schottky junctions coated with graphene film. This is a photovoltaic-type PD that operates at 0 V bias. The texturing of Si is to trap light for NIR absorption enhancement, and Schottky junctions facilitate sub-bandgap NIR absorption and internal photoemission. Both Au NPs and the texturing of Si were made in self-organized processes. Graphene offers additional pathways for hot electron transport and to increase photocurrent. Under 1319 nm illumination at room temperature, a responsivity of 3.9 mA/W and detectivity of 7.2 × 1010 cm × (Hz)1/2/W were obtained. Additionally, at -60 °C, the detectivity increased to 1.5 × 1011 cm × (Hz)1/2/W, with the dark current density reduced and responsivity unchanged. The result of this work demonstrates a facile method to create high-performance Si sub-bandgap NIR PDs for promising applications at ambient temperatures.
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Affiliation(s)
- Xiyuan Dai
- Department of Optical Science and Engineering, and Shanghai Ultra-Precision Optical Manufacturing Engineering Center, Fudan University, Shanghai 200433, China
| | - Li Wu
- Department of Optical Science and Engineering, and Shanghai Ultra-Precision Optical Manufacturing Engineering Center, Fudan University, Shanghai 200433, China
| | - Kaixin Liu
- Department of Optical Science and Engineering, and Shanghai Ultra-Precision Optical Manufacturing Engineering Center, Fudan University, Shanghai 200433, China
| | - Fengyang Ma
- Department of Optical Science and Engineering, and Shanghai Ultra-Precision Optical Manufacturing Engineering Center, Fudan University, Shanghai 200433, China
| | - Yanru Yang
- Department of Optical Science and Engineering, and Shanghai Ultra-Precision Optical Manufacturing Engineering Center, Fudan University, Shanghai 200433, China
| | - Liang Yu
- Department of Optical Science and Engineering, and Shanghai Ultra-Precision Optical Manufacturing Engineering Center, Fudan University, Shanghai 200433, China
| | - Jian Sun
- Department of Optical Science and Engineering, and Shanghai Ultra-Precision Optical Manufacturing Engineering Center, Fudan University, Shanghai 200433, China
- Yiwu Research Institute, Fudan University, Yiwu 322000, China
| | - Ming Lu
- Department of Optical Science and Engineering, and Shanghai Ultra-Precision Optical Manufacturing Engineering Center, Fudan University, Shanghai 200433, China
- Yiwu Research Institute, Fudan University, Yiwu 322000, China
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12
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Wen Z, Zhang Z, Zhang K, Li J, Shi H, Li M, Hou Y, Xue M, Zhang Z. Large-Scale Wideband Light-Trapping Black Silicon Textured by Laser Inducing Assisted with Laser Cleaning in Ambient Air. NANOMATERIALS (BASEL, SWITZERLAND) 2022; 12:1772. [PMID: 35630993 PMCID: PMC9142894 DOI: 10.3390/nano12101772] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 04/11/2022] [Revised: 05/20/2022] [Accepted: 05/20/2022] [Indexed: 02/06/2023]
Abstract
Black silicon, which is an attractive material due to its optical properties, is prepared mainly by laser inducing in an SF6 atmosphere. Considering the effect of SF6 gas on the environment and human health, here we propose an efficient, economical, and green approach to process large-scale black silicon. In the wavelength range of 0.3-2.5 µm, the role of air could replace SF6 gas to texture black silicon by laser inducing with appropriate processing parameters. Then, to extend the working window of its excellent light-trapping status, laser-plasma shockwave cleaning was introduced to eliminate the deposition and improve the structures and morphology. The results revealed that the micro-nano structures became higher, denser, and more uniform with increasing cleaning times and deteriorating cleaning velocity, which compensated for the role of S atoms from the ambient SF6. Moreover, absorptance above 85% in the wavelength range of 0.3-15 µm was realized using our method. The effect of scanning pitch between adjacent rows on large-scale black silicon was also discussed. Our method realized the ultrahigh absorptance of large-scale black silicon fabricated in air from visible to mid-infrared, which is of significance in the field of optoelectronic devices.
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Affiliation(s)
- Zhidong Wen
- Microelectronics Instruments and Equipment R & D Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China; (Z.W.); (Z.Z.); (K.Z.); (H.S.); (M.L.); (M.X.)
- School of Integrated Circuits, University of Chinese Academy of Sciences, No. 19 (A) Yuquan Road, Beijing 100049, China
| | - Zhe Zhang
- Microelectronics Instruments and Equipment R & D Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China; (Z.W.); (Z.Z.); (K.Z.); (H.S.); (M.L.); (M.X.)
- School of Integrated Circuits, University of Chinese Academy of Sciences, No. 19 (A) Yuquan Road, Beijing 100049, China
| | - Kunpeng Zhang
- Microelectronics Instruments and Equipment R & D Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China; (Z.W.); (Z.Z.); (K.Z.); (H.S.); (M.L.); (M.X.)
| | - Jiafa Li
- Focal Plane Division, The 11th Research Institute of China Electronics Technology Corporation, Beijing 100846, China;
| | - Haiyan Shi
- Microelectronics Instruments and Equipment R & D Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China; (Z.W.); (Z.Z.); (K.Z.); (H.S.); (M.L.); (M.X.)
| | - Man Li
- Microelectronics Instruments and Equipment R & D Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China; (Z.W.); (Z.Z.); (K.Z.); (H.S.); (M.L.); (M.X.)
| | - Yu Hou
- Microelectronics Instruments and Equipment R & D Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China; (Z.W.); (Z.Z.); (K.Z.); (H.S.); (M.L.); (M.X.)
| | - Mei Xue
- Microelectronics Instruments and Equipment R & D Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China; (Z.W.); (Z.Z.); (K.Z.); (H.S.); (M.L.); (M.X.)
| | - Zichen Zhang
- Microelectronics Instruments and Equipment R & D Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China; (Z.W.); (Z.Z.); (K.Z.); (H.S.); (M.L.); (M.X.)
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13
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Fan Z, Cui D, Zhang Z, Zhao Z, Chen H, Fan Y, Li P, Zhang Z, Xue C, Yan S. Recent Progress of Black Silicon: From Fabrications to Applications. NANOMATERIALS 2020; 11:nano11010041. [PMID: 33375303 PMCID: PMC7823726 DOI: 10.3390/nano11010041] [Citation(s) in RCA: 20] [Impact Index Per Article: 5.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 11/19/2020] [Revised: 12/23/2020] [Accepted: 12/23/2020] [Indexed: 01/08/2023]
Abstract
Since black silicon was discovered by coincidence, the special material was explored for many amazing material characteristics in optical, surface topography, and so on. Because of the material property, black silicon is applied in many spheres of a photodetector, photovoltaic cell, photo-electrocatalysis, antibacterial surfaces, and sensors. With the development of fabrication technology, black silicon has expanded in more and more applications and has become a research hotspot. Herein, this review systematically summarizes the fabricating method of black silicon, including nanosecond or femtosecond laser irradiation, metal-assisted chemical etching (MACE), reactive ion etching (RIE), wet chemical etching, electrochemical method, and plasma immersion ion implantation (PIII) methods. In addition, this review focuses on the progress in multiple black silicon applications in the past 10 years. Finally, the prospect of black silicon fabricating and various applications are outlined.
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Affiliation(s)
- Zheng Fan
- Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China; (Z.F.); (D.C.); (Z.Z.); (Z.Z.); (H.C.); (Y.F.); (P.L.); (Z.Z.)
| | - Danfeng Cui
- Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China; (Z.F.); (D.C.); (Z.Z.); (Z.Z.); (H.C.); (Y.F.); (P.L.); (Z.Z.)
| | - Zengxing Zhang
- Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China; (Z.F.); (D.C.); (Z.Z.); (Z.Z.); (H.C.); (Y.F.); (P.L.); (Z.Z.)
| | - Zhou Zhao
- Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China; (Z.F.); (D.C.); (Z.Z.); (Z.Z.); (H.C.); (Y.F.); (P.L.); (Z.Z.)
| | - Hongmei Chen
- Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China; (Z.F.); (D.C.); (Z.Z.); (Z.Z.); (H.C.); (Y.F.); (P.L.); (Z.Z.)
| | - Yanyun Fan
- Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China; (Z.F.); (D.C.); (Z.Z.); (Z.Z.); (H.C.); (Y.F.); (P.L.); (Z.Z.)
| | - Penglu Li
- Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China; (Z.F.); (D.C.); (Z.Z.); (Z.Z.); (H.C.); (Y.F.); (P.L.); (Z.Z.)
| | - Zhidong Zhang
- Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China; (Z.F.); (D.C.); (Z.Z.); (Z.Z.); (H.C.); (Y.F.); (P.L.); (Z.Z.)
| | - Chenyang Xue
- Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China; (Z.F.); (D.C.); (Z.Z.); (Z.Z.); (H.C.); (Y.F.); (P.L.); (Z.Z.)
- Correspondence: (C.X.); (S.Y.)
| | - Shubin Yan
- The School of Electrical Engineering, Zhejiang University of Water Resources and Electric Power, Hangzhou 310018, China
- Zhejiang-Belarus Joint Laboratory of Intelligent Equipment and System for Water Conservancy and Hydropower Safety Monitoring, Zhejiang University of Water Resources and Electric Power, Hangzhou 310018, China
- Correspondence: (C.X.); (S.Y.)
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14
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Kim J, Park JY, Park YJ, Park SY, Lee MS, Koo C. A portable and high-sensitivity optical sensing system for detecting fluorescently labeled enterohaemorrhagic Escherichia coli Shiga toxin 2B-subunit. PLoS One 2020; 15:e0236043. [PMID: 32673369 PMCID: PMC7365435 DOI: 10.1371/journal.pone.0236043] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [MESH Headings] [Grants] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/04/2020] [Accepted: 06/28/2020] [Indexed: 11/18/2022] Open
Abstract
We developed a stand-alone, real-time optical detection device capable of reading fluorescence intensities from cell samples with high sensitivity and precision, for use as a portable fluorescent sensor for sensing fluorescently labeled enterohemorrhagic Escherichia coli (EHEC) Shiga toxins (Stxs). In general, the signal intensity from the fluorescently labeled Stxs was weak due to the small number of molecules bound to each cell. To address this technical challenge, we used a highly sensitive light detector (photomultiplier tube: PMT) to measure fluorescence, and designed a portable optical housing to align optical parts precisely; the housing itself was fabricated on a 3D printer. In addition, an electric circuit that amplified PMT output was designed and integrated into the system. The system shows the toxin concentration in the sample on a liquid crystal display (LCD), and a microcontroller circuit is used to read PMT output, process data, and display results. In contrast to other portable fluorescent detectors, the system works alone, without any peripheral computer or additional apparatus; its total size is about 17 × 13 × 9 cm3, and it weighs about 770 g. The detection limit was 0.01 ppm of Alexa Fluor 488 in PBS, which is ten thousand times lower than those of other smartphone-based systems and sufficiently sensitive for use with a portable optical detector. We used the portable real-time optical sensing system to detect Alexa Fluor 488–tagged Stx2B-subunits bound to monocytic THP-1 cells expressing the toxin receptor globotriaosylceramide (Gb3). The device did not detect a signal from Gb3-negative PD36 cells, indicating that it was capable of specifically detecting Stxs bound to cells expressing the toxin receptor. Following the development of a rapid and autonomous method for fluorescently tagging cells in food samples, the optical detection system described here could be used for direct detection of Shiga toxins in food in the field.
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Affiliation(s)
- Jeongtae Kim
- Department of Electronics and Control Engineering, Hanbat National University, Daejeon, Republic of Korea
| | - Jun-Young Park
- Environmental Diseases Research Center, Korea Research Institute of Bioscience and Biotechnology, Daejeon, Republic of Korea
| | - Young-Jun Park
- Environmental Diseases Research Center, Korea Research Institute of Bioscience and Biotechnology, Daejeon, Republic of Korea
- Department of Biomolecular Science, KRIBB School of Bioscience, Korea University of Science and Technology (UST), Daejeon, Republic of Korea
| | - Seo-Young Park
- Environmental Diseases Research Center, Korea Research Institute of Bioscience and Biotechnology, Daejeon, Republic of Korea
| | - Moo-Seung Lee
- Environmental Diseases Research Center, Korea Research Institute of Bioscience and Biotechnology, Daejeon, Republic of Korea
- Department of Biomolecular Science, KRIBB School of Bioscience, Korea University of Science and Technology (UST), Daejeon, Republic of Korea
- * E-mail: (MSL); (CK)
| | - Chiwan Koo
- Department of Electronics and Control Engineering, Hanbat National University, Daejeon, Republic of Korea
- * E-mail: (MSL); (CK)
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15
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Chen J, Shan Y, Wang Q, Zhu J, Liu R. P-type laser-doped WSe 2/MoTe 2 van der Waals heterostructure photodetector. NANOTECHNOLOGY 2020; 31:295201. [PMID: 32268302 DOI: 10.1088/1361-6528/ab87cd] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
Van der Waals heterostructures (vdWHs) based on two-dimensional (2D) materials are being studied extensively for their prospective applications in photodetectors. As the pristine WSe2/MoTe2 heterostructure is a type I (straddling gap) structure, it cannot be used as a photovoltaic device theoretically, although both WSe2 and MoTe2 have excellent photoelectric properties. The Fermi level of p-doped WSe2 is close to its valence band. The p-doped WSe2/MoTe2 heterostructure can perform as a photovoltaic device because a built-in electric field appears at the interface between MoTe2 and p-doped WSe2. Here, a 633 nm laser was used for scanning the surface of WSe2 in order to obtain the p-doped WSe2. x-ray photoelectron spectroscopy (XPS) and electrical measurements verified that p-type doping in WSe2 is produced through laser treatment. The p-type doping in WSe2 includes substoichiometric WOx and nonstoichiometric WSex. A photovoltaic device using p-doped WSe2 and MoTe2 was successfully fabricated. The band structure, light-matter reactions, and carrier-transport in the p-doped WSe2/MoTe2 heterojunction were analyzed. The results showed that this photodetector has an on/off ratio of ≈104, dark current of ≈1 pA, and response time of 72 μs under the illumination of 633 nm laser at zero bias (V ds = 0 V). The proposed p-doping method may provide a new approach to improve the performance of nanoscale optoelectronic devices.
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Affiliation(s)
- J Chen
- State Key Laboratory of ASIC & System, School of Information Science and Technology, Fudan University, Shanghai 200433, People's Republic of China. These authors contributed equally to this work
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16
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Tang B, Hou L, Sun M, Lv F, Liao J, Ji W, Chen Q. UV-SWIR broad range photodetectors made from few-layer α-In 2Se 3 nanosheets. NANOSCALE 2019; 11:12817-12828. [PMID: 31180398 DOI: 10.1039/c9nr03077h] [Citation(s) in RCA: 21] [Impact Index Per Article: 4.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/09/2023]
Abstract
Photodetectors are very important for many applications. However, inexpensive infrared photodetectors with high performance at room temperature are still rare. Furthermore, it is still a great challenge to realize on-chip wide-spectrum detection by using conventional photodetectors. van der Waals semiconductors are promising for high performance optoelectronic devices. Here, we report broad range photodetectors made from few-layer α-In2Se3 nanosheets. The photodetectors show response in an unexpected broad range from ultraviolet (325 nm) to short-wavelength infrared (1800 nm) at room temperature. The optical response in the long wavelengths beyond the bandgap is attributed to oxygen absorption and oxygen-associated selenium defects in In2Se3, supported by theoretical simulation and controlled experiments. High responses to 700 nm and 1550 nm lasers are demonstrated on the same In2Se3 device. The stability of In2Se3 under the atmosphere at room temperature and the low power consumption of the devices make the In2Se3 photodetectors promising for optoelectronic applications.
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Affiliation(s)
- Bin Tang
- Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University, Beijing 100871, China. and Academy for Advanced Interdisciplinary Studies, Peking University, Beijing 100871, China
| | - Linfang Hou
- Beijing Key Laboratory of Optoelectronic Functional Materials & Micro-Nano Devices and Department of Physics, Renmin University of China, Beijing 100872, China.
| | - Mei Sun
- Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University, Beijing 100871, China.
| | - Fengjiao Lv
- Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University, Beijing 100871, China.
| | - Jianhui Liao
- Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University, Beijing 100871, China.
| | - Wei Ji
- Beijing Key Laboratory of Optoelectronic Functional Materials & Micro-Nano Devices and Department of Physics, Renmin University of China, Beijing 100872, China.
| | - Qing Chen
- Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University, Beijing 100871, China.
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17
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Shinde SL, Ishii S, Nagao T. Sub-Band Gap Photodetection from the Titanium Nitride/Germanium Heterostructure. ACS APPLIED MATERIALS & INTERFACES 2019; 11:21965-21972. [PMID: 31056897 DOI: 10.1021/acsami.9b01372] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/09/2023]
Abstract
Photoexcited hot carriers through nonradiative decay offer new opportunities for harnessing longer wavelength light. Here, we have demonstrated a hot-carrier-mediated sub-band gap photodetection in germanium-based planar heterojunction devices. The planar samples that form in situ germanium/titanium nitride (Ge/TiN) interfaces are fabricated by the dc sputtering technique, and the generation of photocurrent by near-infrared (NIR) light illumination is confirmed up to 2600 nm, well exceeding the absorption limit of Ge. The photocurrent obtained with nickel contacts is 3 orders larger than that obtained without metal contacts or with gold contacts in similar structures. The specific detectivity ( D*) value for the TiN/Ge photodetector is obtained to be 6.32 × 105 Jones at the sub-band gap excitation wavelength of 2000 nm without applying any bias. The superior performances of our device are attributed to the broad absorption of the TiN, the plasmonic hot carrier transfer from the TiN to Ge, and built-in potential of the TiN/Ge non-Ohmic junction, which allows efficient separation of photoexcited electron-hole pairs. Our results further support the use of TiN, which is robust and cost-effective, as an alternative to metals for NIR photodetection and photovoltaics when it forms a heterostructure with Ge.
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Affiliation(s)
- Satish Laxman Shinde
- International Center for Materials Nanoarchitectonics (MANA) , National Institute for Materials Science (NIMS) , Tsukuba , Ibaraki 305-0044 , Japan
| | - Satoshi Ishii
- International Center for Materials Nanoarchitectonics (MANA) , National Institute for Materials Science (NIMS) , Tsukuba , Ibaraki 305-0044 , Japan
| | - Tadaaki Nagao
- International Center for Materials Nanoarchitectonics (MANA) , National Institute for Materials Science (NIMS) , Tsukuba , Ibaraki 305-0044 , Japan
- Department of Condensed Matter Physics Graduate School of Science , Hokkaido University , Sapporo 060-0810 , Japan
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18
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Liang Q, Wang Q, Zhang Q, Wei J, Lim SX, Zhu R, Hu J, Wei W, Lee C, Sow C, Zhang W, Wee ATS. High-Performance, Room Temperature, Ultra-Broadband Photodetectors Based on Air-Stable PdSe 2. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2019; 31:e1807609. [PMID: 31025440 DOI: 10.1002/adma.201807609] [Citation(s) in RCA: 101] [Impact Index Per Article: 20.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/24/2018] [Revised: 03/31/2019] [Indexed: 05/12/2023]
Abstract
Photodetection over a broad spectral range is crucial for optoelectronic applications such as sensing, imaging, and communication. Herein, a high-performance ultra-broadband photodetector based on PdSe2 with unique pentagonal atomic structure is reported. The photodetector responds from visible to mid-infrared range (up to ≈4.05 µm), and operates stably in ambient and at room temperature. It promises improved applications compared to conventional mid-infrared photodetectors. The highest responsivity and external quantum efficiency achieved are 708 A W-1 and 82 700%, respectively, at the wavelength of 1064 nm. Efficient optical absorption beyond 8 µm is observed, indicating that the photodetection range can extend to longer than 4.05 µm. Owing to the low crystalline symmetry of layered PdSe2 , anisotropic properties of the photodetectors are observed. This emerging material shows potential for future infrared optoelectronics and novel devices in which anisotropic properties are desirable.
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Affiliation(s)
- Qijie Liang
- SZU-NUS Collaborative Innovation Center for Optoelectronic Science and Technology, International Collaborative Laboratory of 2D Materials for Optoelectronics Science and Technology of Ministry of Education, College of Optoelectronic Engineering, Shenzhen University, Shenzhen, 518060, P. R. China
- Department of Physics, National University of Singapore, 2 Science Drive 3, Singapore, 117551, Singapore
| | - Qixing Wang
- Department of Physics, National University of Singapore, 2 Science Drive 3, Singapore, 117551, Singapore
| | - Qian Zhang
- Department of Materials Science and Engineering, National University of Singapore, Singapore, 117574, Singapore
| | - Jingxuan Wei
- Department of Electrical and Computer Engineering, National University of, Singapore, 117583, Singapore
| | - Sharon Xiaodai Lim
- Department of Physics, National University of Singapore, 2 Science Drive 3, Singapore, 117551, Singapore
| | - Rui Zhu
- Department of Physics, National University of Singapore, 2 Science Drive 3, Singapore, 117551, Singapore
| | - Junxiong Hu
- Department of Physics, National University of Singapore, 2 Science Drive 3, Singapore, 117551, Singapore
| | - Wei Wei
- Department of Electrical and Computer Engineering, National University of, Singapore, 117583, Singapore
| | - Chengkuo Lee
- Department of Electrical and Computer Engineering, National University of, Singapore, 117583, Singapore
| | - ChorngHaur Sow
- Department of Physics, National University of Singapore, 2 Science Drive 3, Singapore, 117551, Singapore
- Centre for Advanced 2D Materials, National University of Singapore, Block S14, 6 Science Drive 2, Singapore, 117546, Singapore
| | - Wenjing Zhang
- SZU-NUS Collaborative Innovation Center for Optoelectronic Science and Technology, International Collaborative Laboratory of 2D Materials for Optoelectronics Science and Technology of Ministry of Education, College of Optoelectronic Engineering, Shenzhen University, Shenzhen, 518060, P. R. China
| | - Andrew Thye Shen Wee
- Department of Physics, National University of Singapore, 2 Science Drive 3, Singapore, 117551, Singapore
- Centre for Advanced 2D Materials, National University of Singapore, Block S14, 6 Science Drive 2, Singapore, 117546, Singapore
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19
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Hu F, Dai XY, Zhou ZQ, Kong XY, Sun SL, Zhang RJ, Wang SY, Lu M, Sun J. Black silicon Schottky photodetector in sub-bandgap near-infrared regime. OPTICS EXPRESS 2019; 27:3161-3168. [PMID: 30732341 DOI: 10.1364/oe.27.003161] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/15/2018] [Accepted: 01/06/2019] [Indexed: 06/09/2023]
Abstract
Sub-bandgap near-infrared silicon (Si) photodetectors are key elements in integrated Si photonics. We demonstrate such a Si photodetector based on a black Si (b-Si)/Ag nanoparticles (Ag-NPs) Schottky junction. This photodetector synergistically employs the mechanisms of inner photoemission, light-trapping, and surface-plasmon-enhanced absorption to efficiently absorb the sub-bandgap light and generate a photocurrent. The b-Si/Ag-NPs sample was prepared by means of wet chemical etching. Compared to those of a planar-Si/Ag thin-film Schottky photodetector, the responsivities of the b-Si/Ag-NPs photodetector were greatly enhanced, being 0.277 and 0.226 mA/W at a reversely biased voltage of 3 V for 1319- and 1550-nm light, respectively.
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20
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Kim W, Arpiainen S, Xue H, Soikkeli M, Qi M, Sun Z, Lipsanen H, Chaves FA, Jiménez D, Prunnila M. Photoresponse of Graphene-Gated Graphene-GaSe Heterojunction Devices. ACS APPLIED NANO MATERIALS 2018; 1:3895-3902. [PMID: 30259010 PMCID: PMC6150651 DOI: 10.1021/acsanm.8b00684] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/25/2018] [Accepted: 07/31/2018] [Indexed: 05/13/2023]
Abstract
Because of their extraordinary physical properties, low-dimensional materials including graphene and gallium selenide (GaSe) are promising for future electronic and optoelectronic applications, particularly in transparent-flexible photodetectors. Currently, the photodetectors working at the near-infrared spectral range are highly indispensable in optical communications. However, the current photodetector architectures are typically complex, and it is normally difficult to control the architecture parameters. Here, we report graphene-GaSe heterojunction-based field-effect transistors with broadband photodetection from 730-1550 nm. Chemical-vapor-deposited graphene was employed as transparent gate and contact electrodes with tunable resistance, which enables effective photocurrent generation in the heterojunctions. The photoresponsivity was shown from 10 to 0.05 mA/W in the near-infrared region under the gate control. To understand behavior of the transistor, we analyzed the results via simulation performed using a model for the gate-tunable graphene-semiconductor heterojunction where possible Fermi level pinning effect is considered.
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Affiliation(s)
- Wonjae Kim
- VTT
Technical Research Center of Finland Ltd., P.O. Box 1000, FI-02044 VTT, Finland
| | - Sanna Arpiainen
- VTT
Technical Research Center of Finland Ltd., P.O. Box 1000, FI-02044 VTT, Finland
- E-mail:
| | - Hui Xue
- Department
of Electronics and Nanoengineering, Aalto
University, Tietotie 3, Espoo 02150, Finland
| | - Miika Soikkeli
- VTT
Technical Research Center of Finland Ltd., P.O. Box 1000, FI-02044 VTT, Finland
| | - Mei Qi
- Department
of Electronics and Nanoengineering, Aalto
University, Tietotie 3, Espoo 02150, Finland
| | - Zhipei Sun
- Department
of Electronics and Nanoengineering, Aalto
University, Tietotie 3, Espoo 02150, Finland
- QTF
Centre of Excellence, Department of Applied Physics, Aalto University, Aalto FI-00076, Finland
| | - Harri Lipsanen
- Department
of Electronics and Nanoengineering, Aalto
University, Tietotie 3, Espoo 02150, Finland
| | - Ferney A. Chaves
- Department
d’Enginyeria Electrònica, Escola d’Enginyeria, Universitat Autònoma de Barcelona, Campus UAB, Bellaterra E-08193, Spain
| | - David Jiménez
- Department
d’Enginyeria Electrònica, Escola d’Enginyeria, Universitat Autònoma de Barcelona, Campus UAB, Bellaterra E-08193, Spain
| | - Mika Prunnila
- VTT
Technical Research Center of Finland Ltd., P.O. Box 1000, FI-02044 VTT, Finland
- QTF
Centre of Excellence, Department of Applied Physics, Aalto University, Aalto FI-00076, Finland
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21
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Chen Y, Wang X, Wu G, Wang Z, Fang H, Lin T, Sun S, Shen H, Hu W, Wang J, Sun J, Meng X, Chu J. High-Performance Photovoltaic Detector Based on MoTe 2 /MoS 2 Van der Waals Heterostructure. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2018; 14:1703293. [PMID: 29356363 DOI: 10.1002/smll.201703293] [Citation(s) in RCA: 86] [Impact Index Per Article: 14.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/23/2017] [Revised: 11/10/2017] [Indexed: 05/18/2023]
Abstract
Van der Waals heterostructures based on 2D layered materials have received wide attention for their multiple applications in optoelectronic devices, such as solar cells, light-emitting devices, and photodiodes. In this work, high-performance photovoltaic photodetectors based on MoTe2 /MoS2 vertical heterojunctions are demonstrated by exfoliating-restacking approach. The fundamental electric properties and band structures of the junction are revealed and analyzed. It is shown that this kind of photodetectors can operate under zero bias with high on/off ratio (>105 ) and ultralow dark current (≈3 pA). Moreover, a fast response time of 60 µs and high photoresponsivity of 46 mA W-1 are also attained at room temperature. The junctions based on 2D materials are expected to constitute the ultimate functional elements of nanoscale electronic and optoelectronic applications.
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Affiliation(s)
- Yan Chen
- State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083, China
- University of Chinese Academy of Sciences, 19 Yuquan Road, Beijing, 100049, China
| | - Xudong Wang
- State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083, China
| | - Guangjian Wu
- State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083, China
| | - Zhen Wang
- State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083, China
- University of Chinese Academy of Sciences, 19 Yuquan Road, Beijing, 100049, China
| | - Hehai Fang
- State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083, China
- University of Chinese Academy of Sciences, 19 Yuquan Road, Beijing, 100049, China
| | - Tie Lin
- State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083, China
| | - Shuo Sun
- State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083, China
| | - Hong Shen
- State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083, China
| | - Weida Hu
- State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083, China
| | - Jianlu Wang
- State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083, China
| | - Jinglan Sun
- State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083, China
| | - Xiangjian Meng
- State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083, China
| | - Junhao Chu
- State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083, China
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22
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Wang J, Fang H, Wang X, Chen X, Lu W, Hu W. Recent Progress on Localized Field Enhanced Two-dimensional Material Photodetectors from Ultraviolet-Visible to Infrared. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2017; 13. [PMID: 28597486 DOI: 10.1002/smll.201700894] [Citation(s) in RCA: 86] [Impact Index Per Article: 12.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/19/2017] [Revised: 04/18/2017] [Indexed: 05/06/2023]
Abstract
Two-dimensional (2D) materials have drawn tremendous attention in recent years. Being atomically thin, stacked with van der Waals force and free of surface chemical dangling bonds, 2D materials exhibit several distinct physical properties. To date, 2D materials include graphene, transition metal dichalcogenides (TMDS), black phosphorus, black P(1-x) Asx , boron nitride (BN) and so forth. Owing to their various bandgaps, 2D materials have been utilized for photonics and optoelectronics. Photodetectors based on 2D materials with different structures and detection mechanisms have been established and present excellent performance. In this Review, localized field enhanced 2D material photodetectors (2DPDs) are introduced with sensitivity over the spectrum from ultraviolet, visible to infrared in the sight of the influence of device structure on photodetector performance instead of directly illustrating the detection mechanisms. Six types of localized fields are summarized. They are: ferroelectric field, photogating electric field, floating gate induced electrostatic field, interlayer built-in field, localized optical field, and photo-induced temperature gradient field, respectively. These localized fields are proved to effectively promote the detection ability of 2DPDs by suppressing background noise, enhancing optical absorption, improving electron-hole separation efficiency, amplifying photoelectric gain and/or extending the detection range.
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Affiliation(s)
- Jianlu Wang
- National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yutian Road, Shanghai, 200083, China
| | - Hehai Fang
- National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yutian Road, Shanghai, 200083, China
- University of Chinese Academy of Sciences, 19 Yuquan Road, Beijing, 100049, China
| | - Xudong Wang
- National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yutian Road, Shanghai, 200083, China
| | - Xiaoshuang Chen
- National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yutian Road, Shanghai, 200083, China
- University of Chinese Academy of Sciences, 19 Yuquan Road, Beijing, 100049, China
| | - Wei Lu
- National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yutian Road, Shanghai, 200083, China
- University of Chinese Academy of Sciences, 19 Yuquan Road, Beijing, 100049, China
| | - Weida Hu
- National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yutian Road, Shanghai, 200083, China
- University of Chinese Academy of Sciences, 19 Yuquan Road, Beijing, 100049, China
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23
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Qi Z, Zhai Y, Wen L, Wang Q, Chen Q, Iqbal S, Chen G, Xu J, Tu Y. Au nanoparticle-decorated silicon pyramids for plasmon-enhanced hot electron near-infrared photodetection. NANOTECHNOLOGY 2017; 28:275202. [PMID: 28531089 DOI: 10.1088/1361-6528/aa74a3] [Citation(s) in RCA: 21] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
Abstract
The heterojunction between metal and silicon (Si) is an attractive route to extend the response of Si-based photodiodes into the near-infrared (NIR) region, so-called Schottky barrier diodes. Photons absorbed into a metallic nanostructure excite the surface plasmon resonances (SPRs), which can be damped non-radiatively through the creation of hot electrons. Unfortunately, the quantum efficiency of hot electron detectors remains low due to low optical absorption and poor electron injection efficiency. In this study, we propose an efficient and low-cost plasmonic hot electron NIR photodetector based on a Au nanoparticle (Au NP)-decorated Si pyramid Schottky junction. The large-area and lithography-free photodetector is realized by using an anisotropic chemical wet etching and rapid thermal annealing (RTA) of a thin Au film. We experimentally demonstrate that these hot electron detectors have broad photoresponsivity spectra in the NIR region of 1200-1475 nm, with a low dark current on the order of 10-5 A cm-2. The observed responsivities enable these devices to be competitive with other reported Si-based NIR hot electron photodetectors using perfectly periodic nanostructures. The improved performance is attributed to the pyramid surface which can enhance light trapping and the localized electric field, and the nano-sized Au NPs which are beneficial for the tunneling of hot electrons. The simple and large-area preparation processes make them suitable for large-scale thermophotovoltaic cell and low-cost NIR detection applications.
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Affiliation(s)
- Zhiyang Qi
- Joint International Research Laboratory of Information Display and Visualization, School of Electronic Science and Engineering, Southeast University, Nanjing 210096, People's Republic of China
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24
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Sun H, Xiao J, Zhu S, Hu Y, Feng G, Zhuang J, Zhao L. Crystallinity and Sub-Band Gap Absorption of Femtosecond-Laser Hyperdoped Silicon Formed in Different N-Containing Gas Mixtures. MATERIALS 2017; 10:ma10040351. [PMID: 28772709 PMCID: PMC5506947 DOI: 10.3390/ma10040351] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 02/09/2017] [Revised: 03/20/2017] [Accepted: 03/24/2017] [Indexed: 11/16/2022]
Abstract
Femtosecond (fs)-laser hyperdoped silicon has aroused great interest for applications in infrared photodetectors due to its special properties. Crystallinity and optical absorption influenced by co-hyperdoped nitrogen in surface microstructured silicon, prepared by fs-laser irradiation in gas mixture of SF6/NF3 and SF6/N2 were investigated. In both gas mixtures, nitrogen and sulfur were incorporated at average concentrations above 1019 atoms/cm3 in the 20–400 nm surface layer. Different crystallinity and optical absorption properties were observed for samples microstructured in the two gas mixtures. For samples prepared in SF6/N2, crystallinity and light absorption properties were similar to samples formed in SF6. Significant differences were observed amongst samples formed in SF6/NF3, which possess higher crystallinity and strong sub-band gap absorption. The differing crystallinity and light absorption rates between the two types of nitrogen co-hyperdoped silicon were attributed to different nitrogen configurations in the doped layer. This was induced by fs-laser irradiating silicon in the two N-containing gas mixtures.
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Affiliation(s)
- Haibin Sun
- Collaborative Innovation Center of Advanced Microstructures, State Key Laboratory of Surface Physics and Department of Physics, Fudan University, Shanghai 200433, China.
| | - Jiamin Xiao
- Department of Optical Science and Engineering, Fudan University, Shanghai 200433, China.
| | - Suwan Zhu
- Collaborative Innovation Center of Advanced Microstructures, State Key Laboratory of Surface Physics and Department of Physics, Fudan University, Shanghai 200433, China.
| | - Yue Hu
- Department of Optical Science and Engineering, Fudan University, Shanghai 200433, China.
| | - Guojin Feng
- Spectrophotometry Laboratory, National Institute of Metrology, Beijing 100013, China.
| | - Jun Zhuang
- Department of Optical Science and Engineering, Fudan University, Shanghai 200433, China.
| | - Li Zhao
- Collaborative Innovation Center of Advanced Microstructures, State Key Laboratory of Surface Physics and Department of Physics, Fudan University, Shanghai 200433, China.
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25
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Siampour H, Dan Y. Si nanowire phototransistors at telecommunication wavelengths by plasmon-enhanced two-photon absorption. OPTICS EXPRESS 2016; 24:4601-4609. [PMID: 29092288 DOI: 10.1364/oe.24.004601] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/07/2023]
Abstract
The on-chip integration of optical waveguides with complementary metal-oxide-semiconductor (CMOS) transistors is the next generation technology for high-speed communications. The advance of such a technology requires a high-performance photodetector operating at communication wavelengths. However, silicon does not absorb photons at communication wavelengths because of its relatively large bandgap. Growing high quality small bandgap semiconductors on top of silicon is challenging due to lattice mismatch. An all silicon photonic CMOS technology is an attractive option. Here, we demonstrate a high-performance silicon phototransistor that operates at the communication wavelengths by two-photon absorption effect. To turn silicon into a light absorptive material at communication wavelengths, we have designed a sophisticated plasmonic antenna structure to increases the intensity of light in the silicon nanowire by 5 orders of magnitude. At the high light intensity, the light absorption in silicon is dominated by the two-photon absorption effect. The generated photocurrent is further amplified by the Si nanowire phototransistor, a section of which is doped to be a core-shell pn junction. Simulation results indicate that the device can achieve a responsivity of 2.4×104 A/W and a 3-dB bandwidth over 300 GHz. Successful development of such a device is important for the next generation high-speed communication technology.
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26
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Hosseinnia AH, Atabaki AH, Eftekhar AA, Adibi A. High-quality silicon on silicon nitride integrated optical platform with an octave-spanning adiabatic interlayer coupler. OPTICS EXPRESS 2015; 23:30297-30307. [PMID: 26698509 DOI: 10.1364/oe.23.030297] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/05/2023]
Abstract
Hybrid nanophotonic platforms based on three-dimensional integration of different photonic materials are emerging as promising ecosystems for the optoelectronic device fabrication. In order to benefit from key features of both silicon (Si) and silicon nitride (SiN) on a single chip, we have developed a wafer-scale hybrid photonic platform based on the integration of a thin crystalline Si layer on top of a thin SiN layer with an ultra-thin oxide buffer layer. A complete optical path in the hybrid platform is demonstrated by coupling light back and forth between nanophotonic devices in Si and SiN layers. Using an adiabatic tapered coupling method, a record-low interlayer coupling-loss of 0.02 dB is achieved at 1550 nm telecommunication wavelength window. We also demonstrate high-Q resonators on the hybrid material platform with intrinsic Q's as high as 3 × 10(6) for a 60 μm-radius microring resonator, which is (to the best of our knowledge) the highest Q observed for a micro-resonator on a hybrid Si/SiN platform.
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27
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Light-induced metal-like surface of silicon photonic waveguides. Nat Commun 2015; 6:8182. [PMID: 26359202 PMCID: PMC4579594 DOI: 10.1038/ncomms9182] [Citation(s) in RCA: 25] [Impact Index Per Article: 2.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/13/2015] [Accepted: 07/28/2015] [Indexed: 11/10/2022] Open
Abstract
The surface of a material may exhibit physical phenomena that do not occur in the bulk of the material itself. For this reason, the behaviour of nanoscale devices is expected to be conditioned, or even dominated, by the nature of their surface. Here, we show that in silicon photonic nanowaveguides, massive surface carrier generation is induced by light travelling in the waveguide, because of natural surface-state absorption at the core/cladding interface. At the typical light intensity used in linear applications, this effect makes the surface of the waveguide behave as a metal-like frame. A twofold impact is observed on the waveguide performance: the surface electric conductivity dominates over that of bulk silicon and an additional optical absorption mechanism arises, that we named surface free-carrier absorption. These results, applying to generic semiconductor photonic technologies, unveil the real picture of optical nanowaveguides that needs to be considered in the design of any integrated optoelectronic device. On the nanoscale materials exhibit surface phenomena that do not occur in the bulk. Here, Grillanda et al. demonstrate that the surface of silicon photonic waveguides change according to the intensity of the light propagating in the waveguide, underlining considerations in design of integrated optoelectronic devices.
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28
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Zhu H, Zhou L, Yang R, Li X, Chen J. Enhanced near-infrared photodetection with avalanche gain in silicon microdisk resonators integrated with p-n diodes. OPTICS LETTERS 2014; 39:4525-4528. [PMID: 25078219 DOI: 10.1364/ol.39.004525] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/03/2023]
Abstract
We investigate the photocurrent generation by two-photon absorption effect in silicon microdisk resonators integrated with p-n diodes. The photocurrent is quite dependent on the p-n junction position with respect to the whispering gallery mode. Avalanche gain increases significantly when the bias exceeds -19 V, leading to considerable enhancement of photocurrent. At -22 V bias with on-chip optical power of 44.7 μW, the responsivity exceeds 1 A/W with an avalanche gain of 188 while the dark current is more than 50 times lower than the photocurrent.
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29
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Zhou L, Zhu H, Zhang H, Chen J. Photoconductive effect on p-i-p micro-heaters integrated in silicon microring resonators. OPTICS EXPRESS 2014; 22:2141-2149. [PMID: 24515224 DOI: 10.1364/oe.22.002141] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/03/2023]
Abstract
We study the photoconductive effect of a p-i-p micro-heater integrated in a microring resonator. Due to the surface state absorption (SSA) and two photon absorption (TPA) of optical wave around 1550 nm, free carriers are generated in the silicon waveguide, leading to the modulation of silicon conductivity and thus the current flowing through it. The current-voltage (I-V) response of the p-i-p diode is dependent on the bias voltage and can be divided into ohmic-law regime and space-charge-limited regime. The resonance peak current is more sensitive to optical power in the ohmic-law regime. Such a phenomenon can also be utilized to monitor the optical power in the waveguide.
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30
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Mailoa JP, Akey AJ, Simmons CB, Hutchinson D, Mathews J, Sullivan JT, Recht D, Winkler MT, Williams JS, Warrender JM, Persans PD, Aziz MJ, Buonassisi T. Room-temperature sub-band gap optoelectronic response of hyperdoped silicon. Nat Commun 2014; 5:3011. [DOI: 10.1038/ncomms4011] [Citation(s) in RCA: 164] [Impact Index Per Article: 16.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/18/2013] [Accepted: 11/26/2013] [Indexed: 12/27/2022] Open
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31
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Wang X, Tian W, Liao M, Bando Y, Golberg D. Recent advances in solution-processed inorganic nanofilm photodetectors. Chem Soc Rev 2014; 43:1400-22. [DOI: 10.1039/c3cs60348b] [Citation(s) in RCA: 126] [Impact Index Per Article: 12.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/23/2022]
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32
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Casalino M, Iodice M, Sirleto L, Rendina I, Coppola G. Asymmetric MSM sub-bandgap all-silicon photodetector with low dark current. OPTICS EXPRESS 2013; 21:28072-28082. [PMID: 24514321 DOI: 10.1364/oe.21.028072] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/03/2023]
Abstract
Design, fabrication, and characterization of an asymmetric metal-semiconductor-metal photodetector, based on internal photoemission effect and integrated into a silicon-on-insulator waveguide, are reported. For this photodetector, a responsivity of 4.5 mA/W has been measured at 1550 nm, making it suitable for power monitoring applications. Because the absorbing metal is deposited strictly around the vertical output facet of the waveguide, a very small contact area of about 3 µm2 is obtained and a transit-time-limited bandwidth of about 1 GHz is demonstrated. Taking advantage of this small area and electrode asymmetry, a significant reduction in the dark current (2.2 nA at -21 V) is achieved. Interestingly, applying reverse voltage, the photodetector is able to tune its cut-off wavelength, extending its range of application into the MID infrared regime.
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33
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34
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Berini P, Olivieri A, Chen C. Thin Au surface plasmon waveguide Schottky detectors on p-Si. NANOTECHNOLOGY 2012; 23:444011. [PMID: 23080540 DOI: 10.1088/0957-4484/23/44/444011] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/27/2023]
Abstract
Surface plasmon sub-bandgap Schottky detectors based on an asymmetric Au stripe waveguide on p-Si are investigated theoretically and experimentally at free-space wavelengths of λ(0) = 1310 and 1550 nm. Au on p-Si produces a low Schottky barrier (0.33 eV), which improves the internal quantum efficiency. Thick and thin Au stripes are compared, with the latter increasing the hot hole emission probability relative to the former, and thus also improving the internal quantum efficiency. Two excitation schemes are considered: end facet illumination which launches surface plasmons on the detector, and top illumination which does not. Both schemes are implemented using a piezoelectric positioner that is programmed to scan the detection area in steps of 100-200 nm, thus enabling the acquisition of high-resolution photocurrent maps. The surface plasmon detectors yield a responsivity of ~1 mA W(-1), ~2× larger than the same detectors under top illumination, due to the absorption of surface plasmons. We compare the measurements with theoretical results for both excitation schemes and estimate the hot hole attenuation length in our Au stripes to be ~23 nm.
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Affiliation(s)
- Pierre Berini
- School of Electrical Engineering and Computer Science, University of Ottawa, 800 King Edward Avenue, Ottawa, Canada.
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35
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Casalino M, Coppola G, Iodice M, Rendina I, Sirleto L. Critically coupled silicon Fabry-Perot photodetectors based on the internal photoemission effect at 1550 nm. OPTICS EXPRESS 2012; 20:12599-12609. [PMID: 22714247 DOI: 10.1364/oe.20.012599] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/01/2023]
Abstract
In this paper, design, fabrication and characterization of an all-silicon photodetector (PD) at 1550 nm, have been reported. Our device is a surface-illuminated PD constituted by a Fabry-Perot microcavity incorporating a Cu/p-Si Schottky diode. Its absorption mechanism, based on the internal photoemission effect (IPE), has been enhanced by critical coupling condition. Our experimental findings prove a peak responsivity of 0.063 mA/W, which is the highest value obtained in a surface-illuminated IPE-based Si PD around 1550 nm. Finally, device capacitance measurements have been carried out demonstrating a capacitance < 5 pF which has the potential for GHz operation subject to a reduction of the series resistance of the ohmic contact.
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Affiliation(s)
- Maurizio Casalino
- Istituto per la Microelettronica e Microsistemi (IMM) - Consiglio Nazionale delle Ricerche – Sez, Napoli, Italy.
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