Single-Shot Imaging of Two-Wavelength Spatial Phase-Shifting Interferometry

Single-shot spatial light interference microscopy for dynamic monitoring of membrane fluctuations

Single-shot spatial light interference microscopy (SS-SLIM) with a pair of non-polarizing beam splitters is proposed for substantially enhancing the speed and efficiency of conventional SLIM systems. Traditional methods are limited by the need for multiple-frame serial modulation and acquisition by spatial light modulators and detectors. Our approach integrates non-polarizing beam splitters to simultaneously capture four phase-shifted intensity images, increasing the imaging speed by at least fourfold while maintaining high quality. This capability is crucial for effectively monitoring the dynamic fluctuations of red blood cell membranes. Furthermore, the potential applications of the SS-SLIM system in biomedical research are demonstrated, particularly in scenarios requiring high temporal resolution and label-free imaging.

Dynamic deformation measurement with 2-frame phase-shifting speckle interferometry based on speckle statistics and wavefront multiplexing

Phase-shifting speckle interferometry could achieve full-field deformation measurement of rough surfaces. To meet the dynamic requirement and further improve the accuracy, a two-step synchronous phase-shifting measurement system is established based on the polarization-sensitive phase modulation ability of a liquid crystal spatial light modulator; by multiplexing the reference wavefront, an accurate phase shift is generated between two independent recording channels, and a common-path self-reference vortex interference structure is built for precise spatial registration. Meanwhile, according to the speckle statistical principle, a novel two-frame phase-shifting algorithm as well as a two-step spatial registration strategy is presented to strengthen the robustness of intensity and position differences caused by spatial-multiplexing; thereby, accurate transient deformation can be directly obtained from phase-shifting speckle interferograms recorded before and after deformation. The effectiveness and accuracy of the proposal are validated from the out-of-plane deformation measurement experiment by comparing with the traditional two-step and four-step phase-shifting methods. The dynamic ability is exhibited through reconstructing mechanical and thermal deformations across various application scenarios.

Advances in Digital Holographic Interferometry

Holographic interferometry is a well-established field of science and optical engineering. It has a half-century history of successful implementation as the solution to numerous technical tasks and problems. However, fast progress in digital and computer holography has promoted it to a new level of possibilities and has opened brand new fields of its application. In this review paper, we consider some such new techniques and applications.

High-resolution single-shot phase-shifting interference microscopy using deep neural network for quantitative phase imaging of biological samples

White light phase-shifting interference microscopy (WL-PSIM) is a prominent technique for high-resolution quantitative phase imaging (QPI) of industrial and biological specimens. However, multiple interferograms with accurate phase-shifts are essentially required in WL-PSIM for measuring the accurate phase of the object. Here, we present single-shot phase-shifting interferometric techniques for accurate phase measurement using filtered white light (520±36 nm) phase-shifting interference microscopy (F-WL-PSIM) and deep neural network (DNN). The methods are incorporated by training the DNN to generate (a) four phase-shifted frames and (b) direct phase from a single interferogram. The training of network is performed on two different samples i.e., optical waveguide and MG63 osteosarcoma cells. Further, performance of F-WL-PSIM+DNN framework is validated by comparing the phase map extracted from network generated and experimentally recorded interferograms. The current approach can further strengthen QPI techniques for high-resolution phase recovery using a single frame for different biomedical applications.

Motionless Polarizing Structured Illumination Microscopy

In this investigation, we propose a motionless polarizing structured illumination microscopy as an axially sectioning and reflective-type device to measure the 3D surface profiles of specimens. Based on the spatial phase-shifting technique to obtain the visibility of the illumination pattern. Instead of using a grid, a Wollaston prism is used to generate the light pattern by the stable interference of two beams. As the polarization states of two beams are orthogonal with each other, a polarization pixelated CMOS camera can simultaneously obtain four phase-shifted patterns with the beams after passing through a quarter wave plate based on the spatial phase-shifting technique with polarization. In addition, a focus tunable lens is used to eliminate a mechanical moving part for the axial scanning of the specimen. In the experimental result, a step height sample and a concave mirror were measured with 0.05 µm and 0.2 mm repeatabilities of step height and the radius of curvature, respectively.

Development of a Compound Speckle Interferometer for Precision Three-Degree-of-Freedom Displacement Measurement

In this study, a compound speckle interferometer for measuring three-degree-of-freedom (3-DOF) displacement is proposed. The system, which combines heterodyne interferometry, speckle interferometry and beam splitting techniques, can perform precision 3-DOF displacement measurements, while still having the advantages of high resolution and a relatively simple configuration. The incorporation of speckle interferometry allows for non-contact displacement measurements by detecting the phase of the speckle interference pattern formed from the convergence of laser beams on the measured rough surface. Experiments were conducted to verify the measurement capabilities of the system, and the results show that the proposed system has excellent measurement capabilities suitable for future real-world applications.

Swept-Source-Based Chromatic Confocal Microscopy

Chromatic confocal microscopy (CCM) has been intensively developed because it can exhibit effective focal position scanning based on the axial chromatic aberration of broadband light reflected from a target. To improve the imaging speed of three-dimensional (3D) surface profiling, we have proposed the novel concept of swept-source-based CCM (SS-CCM) and investigated the usefulness of the corresponding imaging system. Compared to conventional CCM based on a broadband light source and a spectrometer, a swept-source in the proposed SS-CCM generates light with a narrower linewidth for higher intensity, and a single photodetector employed in the system exhibits a fast and sensitive response by immediately obtaining spectrally encoded depth from a chromatic dispersive lens array. Results of the experiments conducted to test the proposed SS-CCM system indicate that the system exhibits an axial chromatic focal distance range of approximately 360 μm for the 770-820 nm swept wavelength range. Moreover, high-speed surface profiling images of a cover glass and coin were successfully obtained with a short measurement time of 5 ms at a single position.

Unambiguous measurement range and error tolerance in dual-wavelength interferometry

In dual or multiwavelength interferometry, the traditional equivalent wavelength method is widely used for phase recovery to enlarge the unambiguous measurement range (UMR). In fact, however, this method ignores information of size and sign (positive or negative) of single wavelength wrapped phases, and the extension of the UMR is not sufficient. For the reflective measurement, the largest UMR of the dual or multiwavelength interferometry is half of the least-common multiple (LCM) of single wavelengths, called the LCM effective wavelength, which is often several times the equivalent wavelength. But why do we often use the equivalent wavelength and seldom use the larger UMR in practice? Existing research reveals that the actual UMR is related to the measurement error of single-wavelength-wrapped phases, and half of the LCM effective wavelength is only the theoretical value. But how do errors affect the UMR? We think the quantitative analysis and description are lacking. In this paper, we continue to study this problem, analyze it in a graphical method, and give quantitative descriptions. The simulation experiments are carried out and verify our analysis.