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Wang F, Xiao Z, Liu Z, Zhang C, Liu L, Yin P, Xiang W. High-precise determination of the drought and cold resistance of forage seeds using terahertz time-domain spectroscopy. SPECTROCHIMICA ACTA. PART A, MOLECULAR AND BIOMOLECULAR SPECTROSCOPY 2025; 330:125747. [PMID: 39827819 DOI: 10.1016/j.saa.2025.125747] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/02/2024] [Revised: 12/25/2024] [Accepted: 01/11/2025] [Indexed: 01/22/2025]
Abstract
Owing to the complicated geographical locations and climates, cultivation and selection of forage seeds are challenging. For the first time, we qualitatively distinguished the drought and cold resistance of forage seeds with the time domain and refractive index spectra using terahertz (THz) time-domain spectroscopy. A multilayer structure propagation (MSP) model was developed based on the effective medium and light transport theory to reveal the underlying biological mechanisms of drought and cold resistance of forage seeds. The proposed MSP model accurately explained the behavior of the THz waves transmitted through the forage seeds, with a high accuracy rate of 94.433%. The impact of THz wave transmission was influenced by the presence of various biological components in the alfalfa seeds, particularly protein and carbohydrate. More interestingly, the cold and drought resistance of forage seeds can be effectively differentiated with the ratio of the thickness-dependent argument parameter (Ψ) of protein and carbohydrate components. The obtained results offered important insights into the interaction mechanism between THz wave and forage seeds, and proposed a promising MSP model in the screening process for selecting high-quality forage seeds based on their stress resistance characteristics.
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Affiliation(s)
- Fang Wang
- Beijing Key Laboratory of Optical Detection Technology for Oil and Gas, Basic Research Center for Energy Interdisciplinary, China University of Petroleum (Beijing), Beijing 102249 China
| | - Ziwei Xiao
- Beijing Key Laboratory of Optical Detection Technology for Oil and Gas, Basic Research Center for Energy Interdisciplinary, China University of Petroleum (Beijing), Beijing 102249 China
| | - Zilong Liu
- Beijing Key Laboratory of Optical Detection Technology for Oil and Gas, Basic Research Center for Energy Interdisciplinary, China University of Petroleum (Beijing), Beijing 102249 China.
| | - Chunhong Zhang
- Beijing Key Laboratory of Optical Detection Technology for Oil and Gas, Basic Research Center for Energy Interdisciplinary, China University of Petroleum (Beijing), Beijing 102249 China.
| | - Lemeng Liu
- Institute of Grassland Research, Chinese Academy of Agricultural Sciences, Huhhot, Inner Mongolia 010020, China
| | - Panpan Yin
- Beijing Key Laboratory of Optical Detection Technology for Oil and Gas, Basic Research Center for Energy Interdisciplinary, China University of Petroleum (Beijing), Beijing 102249 China
| | - Wenfeng Xiang
- Inner Mongolia Grassland Station, Huhhot, Inner Mongolia 010020, China.
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Xu K, Harris ZB, Vahey P, Arbab MH. THz Polarimetric Imaging of Carbon Fiber-Reinforced Composites Using the Portable Handled Spectral Reflection (PHASR) Scanner. SENSORS (BASEL, SWITZERLAND) 2024; 24:7467. [PMID: 39686004 DOI: 10.3390/s24237467] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/28/2024] [Revised: 11/11/2024] [Accepted: 11/18/2024] [Indexed: 12/18/2024]
Abstract
Recent advancements in novel fiber-coupled and portable terahertz (THz) spectroscopic imaging technology have accelerated applications in nondestructive testing (NDT). Although the polarization information of THz waves can play a critical role in material characterization, there are few demonstrations of polarization-resolved THz imaging as an NDT modality due to the deficiency of such polarimetric imaging devices. In this paper, we have inspected industrial carbon fiber composites using a portable and handheld imaging scanner in which the THz polarizations of two orthogonal channels are simultaneously captured by two photoconductive antennas. We observed significant polarimetric differences between the two-channel images of the same sample and the resulting THz Stokes vectors, which are attributed to the anisotropic conductivity of carbon fiber composites. Using both polarimetric channels, we can visualize the superficial and underlying interfaces of the first laminate. These results pave the way for the future applications of THz polarimetry to the assessment of coatings or surface quality on carbon fiber-reinforced substrates.
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Affiliation(s)
- Kuangyi Xu
- Department of Biomedical Engineering, Stony Brook University, Stony Brook, NY 11794, USA
| | - Zachery B Harris
- Department of Biomedical Engineering, Stony Brook University, Stony Brook, NY 11794, USA
| | - Paul Vahey
- Boeing Research & Technology, Seattle, WA 98108, USA
| | - M Hassan Arbab
- Department of Biomedical Engineering, Stony Brook University, Stony Brook, NY 11794, USA
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Lu G, Wang J, Zhou R, Xie Z, Yuan Y, Huang L, Yeow JTW. Terahertz communication: detection and signal processing. NANOTECHNOLOGY 2024; 35:352002. [PMID: 38768574 DOI: 10.1088/1361-6528/ad4dad] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/28/2023] [Accepted: 05/20/2024] [Indexed: 05/22/2024]
Abstract
The development of 6 G networks has promoted related research based on terahertz communication. As submillimeter radiation, signal transportation via terahertz waves has several superior properties, including non-ionizing and easy penetration of non-metallic materials. This paper provides an overview of different terahertz detectors based on various mechanisms. Additionally, the detailed fabrication process, structural design, and the improvement strategies are summarized. Following that, it is essential and necessary to prevent the practical signal from noise, and methods such as wavelet transform, UM-MIMO and decoding have been introduced. This paper highlights the detection process of the terahertz wave system and signal processing after the collection of signal data.
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Affiliation(s)
- Guanxuan Lu
- Advanced Micro-/Nano- Devices Lab, Department of Systems Design Engineering, University of Waterloo, Waterloo, ON N2L 3G1, Canada
| | - Jiaqi Wang
- Advanced Micro-/Nano- Devices Lab, Department of Systems Design Engineering, University of Waterloo, Waterloo, ON N2L 3G1, Canada
| | - Rui Zhou
- Advanced Micro-/Nano- Devices Lab, Department of Systems Design Engineering, University of Waterloo, Waterloo, ON N2L 3G1, Canada
| | - Zhemiao Xie
- Advanced Micro-/Nano- Devices Lab, Department of Systems Design Engineering, University of Waterloo, Waterloo, ON N2L 3G1, Canada
| | - Yifei Yuan
- Advanced Micro-/Nano- Devices Lab, Department of Systems Design Engineering, University of Waterloo, Waterloo, ON N2L 3G1, Canada
| | - Lin Huang
- Advanced Micro-/Nano- Devices Lab, Department of Systems Design Engineering, University of Waterloo, Waterloo, ON N2L 3G1, Canada
| | - John T W Yeow
- Advanced Micro-/Nano- Devices Lab, Department of Systems Design Engineering, University of Waterloo, Waterloo, ON N2L 3G1, Canada
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Bauer M, Friederich F. Terahertz and Millimeter Wave Sensing and Applications. SENSORS (BASEL, SWITZERLAND) 2022; 22:9693. [PMID: 36560062 PMCID: PMC9786721 DOI: 10.3390/s22249693] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/02/2022] [Accepted: 12/08/2022] [Indexed: 06/17/2023]
Abstract
The field of terahertz and millimeter wave science and technology has evolved in recent years into an area attracting a lot of attention from all sides of science, industry, and the public [...].
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Khani ME, Osman OB, Harris ZB, Chen A, Zhou JW, Singer AJ, Arbab MH. Accurate and early prediction of the wound healing outcome of burn injuries using the wavelet Shannon entropy of terahertz time-domain waveforms. JOURNAL OF BIOMEDICAL OPTICS 2022; 27:JBO-220119GR. [PMID: 36348509 PMCID: PMC9641274 DOI: 10.1117/1.jbo.27.11.116001] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/27/2022] [Accepted: 10/14/2022] [Indexed: 05/06/2023]
Abstract
Significance Severe burn injuries cause significant hypermetabolic alterations that are highly dynamic, hard to predict, and require acute and critical care. The clinical assessments of the severity of burn injuries are highly subjective and have consistently been reported to be inaccurate. Therefore, the utilization of other imaging modalities is crucial to reaching an objective and accurate burn assessment modality. Aim We describe a non-invasive technique using terahertz time-domain spectroscopy (THz-TDS) and the wavelet packet Shannon entropy to automatically estimate the burn depth and predict the wound healing outcome of thermal burn injuries. Approach We created 40 burn injuries of different severity grades in two porcine models using scald and contact methods of infliction. We used our THz portable handheld spectral reflection (PHASR) scanner to obtain the in vivo THz-TDS images. We used the energy to Shannon entropy ratio of the wavelet packet coefficients of the THz-TDS waveforms on day 0 to create supervised support vector machine (SVM) classification models. Histological assessments of the burn biopsies serve as the ground truth. Results We achieved an accuracy rate of 94.7% in predicting the wound healing outcome, as determined by histological measurement of the re-epithelialization rate on day 28 post-burn induction, using the THz-TDS measurements obtained on day 0. Furthermore, we report the accuracy rates of 89%, 87.1%, and 87.6% in automatic diagnosis of the superficial partial-thickness, deep partial-thickness, and full-thickness burns, respectively, using a multiclass SVM model. Conclusions The THz PHASR scanner promises a robust, high-speed, and accurate diagnostic modality to improve the clinical triage of burns and their management.
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Affiliation(s)
- Mahmoud E. Khani
- Stony Brook University, Department of Biomedical Engineering, Stony Brook, New York, United States
| | - Omar B. Osman
- Stony Brook University, Department of Biomedical Engineering, Stony Brook, New York, United States
| | - Zachery B. Harris
- Stony Brook University, Department of Biomedical Engineering, Stony Brook, New York, United States
| | - Andrew Chen
- Stony Brook University, Department of Biomedical Engineering, Stony Brook, New York, United States
| | - Juin W. Zhou
- Stony Brook University, Department of Biomedical Engineering, Stony Brook, New York, United States
| | - Adam J. Singer
- Renaissance School of Medicine at Stony Brook University, Department of Emergency Medicine, Stony Brook, New York, United States
| | - Mohammad Hassan Arbab
- Stony Brook University, Department of Biomedical Engineering, Stony Brook, New York, United States
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Abautret Y, Coquillat D, Lequime M, Zerrad M, Amra C. Analysis of the multilayer organization of a sunflower leaf during dehydration with terahertz time-domain spectroscopy. OPTICS EXPRESS 2022; 30:37971-37979. [PMID: 36258389 DOI: 10.1364/oe.463228] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/10/2022] [Accepted: 08/03/2022] [Indexed: 06/16/2023]
Abstract
We apply reverse engineering techniques (RET) to analyze the dehydration process of a sunflower leaf with terahertz time-domain spectroscopy. The multilayer structure of the leaf is extracted with accuracy during the entire process. Time variations of thickness and the complex index are emphasized for all leaf layers (2 cuticules, 2 epiderms, and 2 mesophylls). The global thickness of the sunflower leaf is reduced by up to 40% of its initial value.
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Jelila YD, Pamuła W. Detection of Tram Wheel Faults Using MEMS-Based Sensors. SENSORS (BASEL, SWITZERLAND) 2022; 22:6373. [PMID: 36080832 PMCID: PMC9459982 DOI: 10.3390/s22176373] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 08/01/2022] [Revised: 08/15/2022] [Accepted: 08/22/2022] [Indexed: 06/15/2023]
Abstract
Micro-electromechanical-systems (MEMS) based sensors are used for monitoring the state of machines in condition-based maintenance tasks. This approach is applied at tram depots for the purpose of identifying faulty wheels on trams in order to eliminate defective trams at the entry or dispatch gates. The application of MEMS-based sensors for the detection of wheel faults is the focus of this study. A method for processing of the collected sensor data is developed. It is based on assessing the energy of vibrations at different frequency bands. Maximal Overlap Discrete Wavelet Packet Transform (MODWPT) is used for obtaining a description of the sensor data. The task of finding the energy threshold for detecting faulty wheels, frequency band and parameters of MODWPT which most distinctly distinguish the wheels is the goal of the method. The weighted difference (DW) between the extreme values of energy in a frequency band for normal and faulty wheels is proposed as the measure of the ability to distinguish the wheels. The search for the solution is formulated as a discrete optimisation problem of maximising this measure. Both the simulation and experimental results indicate that faulty wheels have greater vibration energy than normal wheels. The properties of this approach are discussed and evaluated.
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Affiliation(s)
- Yohanis Dabesa Jelila
- Department of Transport Systems, Traffic Engineering and Logistics, Faculty of Transport and Aviation Engineering, Silesian University of Technology, 40-019 Katowice, Poland
- Faculty of Mechanical Engineering, Jimma Institute of Technology, Jimma University, Jimma P.O. Box 378, Ethiopia
| | - Wiesław Pamuła
- Department of Transport Systems, Traffic Engineering and Logistics, Faculty of Transport and Aviation Engineering, Silesian University of Technology, 40-019 Katowice, Poland
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Xiong W, Li L, Ren J, Gu J, Zhang D, Xue J. Terahertz Multiple Echoes Correction and Non-Destructive Testing Based on Improved Wavelet Multi-Scale Analysis. SENSORS (BASEL, SWITZERLAND) 2022; 22:3477. [PMID: 35591167 PMCID: PMC9103443 DOI: 10.3390/s22093477] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 04/10/2022] [Revised: 04/26/2022] [Accepted: 04/29/2022] [Indexed: 06/15/2023]
Abstract
During terahertz (THz) non-destructive testing (NDT), multiple echoes from the sample interface reflection signals are mixed with the detection signals, resulting in signal distortion and affecting the accuracy of the THz NDT results. Combined with the frequency property of multiple echoes, an improved wavelet multi-scale analysis is put forth in this paper to correct multiple echoes, allowing the maximum retention of detailed signal information in contrast with the existing echo correction methods. The results showed that the improved wavelet multi-scale analysis enhanced the continuity and smoothness of the image at least twice in testing adhesive layer thickness, prevented missing judgments and misjudgments in identifying characteristic defects, and ensured accurate detection results. Hence, it is of great significance for evaluating the THz NDT results.
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Affiliation(s)
- Weihua Xiong
- School of Optoelectronics Engineering, Changchun University of Science and Technology, Changchun 130000, China; (W.X.); (J.R.); (J.G.); (D.Z.); (J.X.)
- Key Laboratory of Optoelectronic Measurement and Control and Optical Information Transmission Technology, Ministry of Education, School of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun 130022, China
- Zhongshan Research Institute, Changchun University of Science and Technology, Zhongshan 528403, China
| | - Lijuan Li
- School of Optoelectronics Engineering, Changchun University of Science and Technology, Changchun 130000, China; (W.X.); (J.R.); (J.G.); (D.Z.); (J.X.)
- Key Laboratory of Optoelectronic Measurement and Control and Optical Information Transmission Technology, Ministry of Education, School of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun 130022, China
- Zhongshan Research Institute, Changchun University of Science and Technology, Zhongshan 528403, China
| | - Jiaojiao Ren
- School of Optoelectronics Engineering, Changchun University of Science and Technology, Changchun 130000, China; (W.X.); (J.R.); (J.G.); (D.Z.); (J.X.)
- Key Laboratory of Optoelectronic Measurement and Control and Optical Information Transmission Technology, Ministry of Education, School of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun 130022, China
- Zhongshan Research Institute, Changchun University of Science and Technology, Zhongshan 528403, China
| | - Jian Gu
- School of Optoelectronics Engineering, Changchun University of Science and Technology, Changchun 130000, China; (W.X.); (J.R.); (J.G.); (D.Z.); (J.X.)
- Key Laboratory of Optoelectronic Measurement and Control and Optical Information Transmission Technology, Ministry of Education, School of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun 130022, China
- Zhongshan Research Institute, Changchun University of Science and Technology, Zhongshan 528403, China
| | - Dandan Zhang
- School of Optoelectronics Engineering, Changchun University of Science and Technology, Changchun 130000, China; (W.X.); (J.R.); (J.G.); (D.Z.); (J.X.)
- Key Laboratory of Optoelectronic Measurement and Control and Optical Information Transmission Technology, Ministry of Education, School of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun 130022, China
- Zhongshan Research Institute, Changchun University of Science and Technology, Zhongshan 528403, China
| | - Junwen Xue
- School of Optoelectronics Engineering, Changchun University of Science and Technology, Changchun 130000, China; (W.X.); (J.R.); (J.G.); (D.Z.); (J.X.)
- Key Laboratory of Optoelectronic Measurement and Control and Optical Information Transmission Technology, Ministry of Education, School of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun 130022, China
- Zhongshan Research Institute, Changchun University of Science and Technology, Zhongshan 528403, China
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