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Tabean S, Mousley M, Pauly C, De Castro O, Serralta E, Klingner N, Mücklich F, Hlawacek G, Wirtz T, Eswara S. Quantitative nanoscale imaging using transmission He ion channelling contrast: Proof-of-concept and application to study isolated crystalline defects. Ultramicroscopy 2022; 233:113439. [PMID: 34915290 DOI: 10.1016/j.ultramic.2021.113439] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/22/2021] [Revised: 11/19/2021] [Accepted: 11/27/2021] [Indexed: 01/20/2023]
Abstract
A newly developed microscope prototype, namely npSCOPE, consisting of a Gas Field Ion Source (GFIS) column and a position sensitive Delay-line Detector (DLD) was used to perform Scanning Transmission Ion Microscopy (STIM) using keV He+ ions. One experiment used 25 keV ions and a second experiment used 30 keV ions. STIM imaging of a 50 nm thick free-standing gold membrane exhibited excellent contrast due to ion channelling and revealed rich microstructural features including isolated nanoscale twin bands which matched well with the contrast in the conventional ion-induced Secondary Electron (SE) imaging mode. Transmission Kikuchi Diffraction (TKD) and Backscattered Electron (BSE) imaging were performed on the same areas to correlate and confirm the microstructural features observed in STIM. Monte Carlo simulations of the ion and electron trajectories were performed with parameters similar to the experimental conditions to derive insights related to beam broadening and its effect in the degradation of transmission image resolution. For the experimental conditions used, STIM imaging showed a lateral resolution close to30 nm. Dark twin bands in bright grains as well as bright twin bands in dark grains were observed in STIM. Some of the twin bands were invisible in STIM. For the specific experimental conditions used, the ion transmission efficiency across a particular twin band was found to decrease by a factor of 2.8. Surprisingly, some grains showed contrast reversal when the Field of View (FOV) was changed indicating the sensitivity of the channelling contrast to even small changes in illumination conditions. These observations are discussed using ion channelling conditions and crystallographic orientations of the grains and twin bands. This study demonstrates for the first time the potential of STIM imaging using keV He+ ions to quantitatively investigate channelling in nanoscale structures including isolated crystalline defects.
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Affiliation(s)
- Saba Tabean
- Advanced Instrumentation for Nano-Analytics (AINA), Luxembourg Institute of Science and Technology (LIST), Materials Research and Technology Department, 41, rue du Brill, L-4422, Belvaux, Luxembourg; University of Luxembourg, 2 Avenue de l'Université, Esch-sur-Alzette L-4365, Luxembourg
| | - Michael Mousley
- Advanced Instrumentation for Nano-Analytics (AINA), Luxembourg Institute of Science and Technology (LIST), Materials Research and Technology Department, 41, rue du Brill, L-4422, Belvaux, Luxembourg
| | - Christoph Pauly
- Functional Materials, Department of Materials Science, Saarland University, D-66123, Saarbrücken, Germany
| | - Olivier De Castro
- Advanced Instrumentation for Nano-Analytics (AINA), Luxembourg Institute of Science and Technology (LIST), Materials Research and Technology Department, 41, rue du Brill, L-4422, Belvaux, Luxembourg
| | - Eduardo Serralta
- Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf, Bautzner Landstr. 400, D-01328 Dresden, Germany; Technische Universität Dresden, Dresden D-01069, Germany
| | - Nico Klingner
- Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf, Bautzner Landstr. 400, D-01328 Dresden, Germany
| | - Frank Mücklich
- Functional Materials, Department of Materials Science, Saarland University, D-66123, Saarbrücken, Germany
| | - Gregor Hlawacek
- Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf, Bautzner Landstr. 400, D-01328 Dresden, Germany
| | - Tom Wirtz
- Advanced Instrumentation for Nano-Analytics (AINA), Luxembourg Institute of Science and Technology (LIST), Materials Research and Technology Department, 41, rue du Brill, L-4422, Belvaux, Luxembourg
| | - Santhana Eswara
- Advanced Instrumentation for Nano-Analytics (AINA), Luxembourg Institute of Science and Technology (LIST), Materials Research and Technology Department, 41, rue du Brill, L-4422, Belvaux, Luxembourg
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Audinot JN, Philipp P, De Castro O, Biesemeier A, Hoang QH, Wirtz T. Highest resolution chemical imaging based on secondary ion mass spectrometry performed on the helium ion microscope. REPORTS ON PROGRESS IN PHYSICS. PHYSICAL SOCIETY (GREAT BRITAIN) 2021; 84:105901. [PMID: 34404033 DOI: 10.1088/1361-6633/ac1e32] [Citation(s) in RCA: 8] [Impact Index Per Article: 2.7] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/08/2020] [Accepted: 08/17/2021] [Indexed: 06/13/2023]
Abstract
This paper is a review on the combination between Helium Ion Microscopy (HIM) and Secondary Ion Mass Spectrometry (SIMS), which is a recently developed technique that is of particular relevance in the context of the quest for high-resolution high-sensitivity nano-analytical solutions. We start by giving an overview on the HIM-SIMS concept and the underlying fundamental principles of both HIM and SIMS. We then present and discuss instrumental aspects of the HIM and SIMS techniques, highlighting the advantage of the integrated HIM-SIMS instrument. We give an overview on the performance characteristics of the HIM-SIMS technique, which is capable of producing elemental SIMS maps with lateral resolution below 20 nm, approaching the physical resolution limits, while maintaining a sub-nanometric resolution in the secondary electron microscopy mode. In addition, we showcase different strategies and methods allowing to take profit of both capabilities of the HIM-SIMS instrument (high-resolution imaging using secondary electrons and mass filtered secondary sons) in a correlative approach. Since its development HIM-SIMS has been successfully applied to a large variety of scientific and technological topics. Here, we will present and summarise recent applications of nanoscale imaging in materials research, life sciences and geology.
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Affiliation(s)
- Jean-Nicolas Audinot
- Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), 41 rue du Brill, L-4422 Belvaux, Luxembourg
| | - Patrick Philipp
- Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), 41 rue du Brill, L-4422 Belvaux, Luxembourg
| | - Olivier De Castro
- Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), 41 rue du Brill, L-4422 Belvaux, Luxembourg
| | - Antje Biesemeier
- Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), 41 rue du Brill, L-4422 Belvaux, Luxembourg
| | - Quang Hung Hoang
- Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), 41 rue du Brill, L-4422 Belvaux, Luxembourg
| | - Tom Wirtz
- Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), 41 rue du Brill, L-4422 Belvaux, Luxembourg
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Schmidt M, Byrne JM, Maasilta IJ. Bio-imaging with the helium-ion microscope: A review. BEILSTEIN JOURNAL OF NANOTECHNOLOGY 2021; 12:1-23. [PMID: 33489663 PMCID: PMC7801799 DOI: 10.3762/bjnano.12.1] [Citation(s) in RCA: 9] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/10/2020] [Accepted: 11/26/2020] [Indexed: 06/01/2023]
Abstract
Scanning helium-ion microscopy (HIM) is an imaging technique with sub-nanometre resolution and is a powerful tool to resolve some of the tiniest structures in biology. In many aspects, the HIM resembles a field-emission scanning electron microscope (FE-SEM), but the use of helium ions rather than electrons provides several advantages, including higher surface sensitivity, larger depth of field, and a straightforward charge-compensating electron flood gun, which enables imaging of non-conductive samples, rendering HIM a promising high-resolution imaging technique for biological samples. Starting with studies focused on medical research, the last decade has seen some particularly spectacular high-resolution images in studies focused on plants, microbiology, virology, and geomicrobiology. However, HIM is not just an imaging technique. The ability to use the instrument for milling biological objects as small as viruses offers unique opportunities which are not possible with more conventional focused ion beams, such as gallium. Several pioneering technical developments, such as methods to couple secondary ion mass spectrometry (SIMS) or ionoluminescence with the HIM, also offer the possibility for new and exciting research on biological materials. In this review, we present a comprehensive overview of almost all currently published literature which has demonstrated the application of HIM for imaging of biological specimens. We also discuss some technical features of this unique type of instrument and highlight some of the new advances which will likely become more widely used in the years to come.
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Affiliation(s)
- Matthias Schmidt
- Helmholtz-Centre for Environmental Research GmbH - UFZ, Permoserstraße 15, 04318 Leipzig, Germany
| | - James M Byrne
- School of Earth Sciences, University of Bristol, Wills Memorial Building, Queens Road, Bristol BS8 1RJ, United Kingdom
| | - Ilari J Maasilta
- Nanoscience Center, Department of Physics, University of Jyväskylä, P.O. Box 35, FI-40014 Jyväskylä, Finland
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Mousley M, Möller W, Philipp P, Hlawacek G, Wirtz T, Eswara S. Structural and chemical evolution of Au-silica core-shell nanoparticles during 20 keV helium ion irradiation: a comparison between experiment and simulation. Sci Rep 2020; 10:12058. [PMID: 32694558 PMCID: PMC7374165 DOI: 10.1038/s41598-020-68955-7] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/30/2020] [Accepted: 06/26/2020] [Indexed: 11/29/2022] Open
Abstract
Au-silica core–shell nanoparticles have been irradiated with 20 keV He+ ions up to a maximum fluence of 4.7 × 1017 ions/cm2. The nanoscale structural and crystallographic evolution induced by He+ ion irradiation was followed at various stages using Transmission Electron Microscopy (TEM). During irradiation satellite Au clusters are formed around the main Au core, which remained crystalline even after the maximum He+ ion fluence. The spherical silica shell deformed into a hemisphere due to He+ ion irradiation. Three dimensional Monte-Carlo simulations, based on the binary collision approximation, have been performed on stacked infinite layers and an individual particle. The stacked layers results show that the He+ beam interacts with most of the nanoparticle and Au migrates in the direction of beam incidence agreeing with experimental findings. The individual particle results match the experiment in terms of the volume which is sputtered away however additional mechanisms, not included in the simulations, are present in the experiment during the satellite formation and silica shell deformation. These results show the ability for 20 keV He+ ions to be used for the modification of nanostructures. Furthermore, these results contribute to a quantitative understanding of the dynamic evolution of materials observed using microscopy techniques based on He+ ions.
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Affiliation(s)
- M Mousley
- Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology, 41, rue du Brill, 4422, Belvaux, Luxembourg.
| | - W Möller
- Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf e.V., Bautzner Landstr. 400, 01328, Dresden, Germany
| | - P Philipp
- Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology, 41, rue du Brill, 4422, Belvaux, Luxembourg
| | - G Hlawacek
- Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf e.V., Bautzner Landstr. 400, 01328, Dresden, Germany
| | - T Wirtz
- Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology, 41, rue du Brill, 4422, Belvaux, Luxembourg
| | - S Eswara
- Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology, 41, rue du Brill, 4422, Belvaux, Luxembourg
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Holeňák R, Lohmann S, Primetzhofer D. Contrast modes in a 3D ion transmission approach at keV energies. Ultramicroscopy 2020; 217:113051. [PMID: 32615322 DOI: 10.1016/j.ultramic.2020.113051] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/17/2020] [Revised: 06/09/2020] [Accepted: 06/15/2020] [Indexed: 10/24/2022]
Abstract
We present options for visualizing contrast maps in 3D ion transmission experiments. Simultaneous measurement of angular distributions and flight time of ions transmitted through self-supporting, single-crystalline silicon foils allows for mapping of intensity and different energy loss moments. The transmitted projectiles were detected mainly for random beam-sample orientation using pulsed beams of He ions and protons with incident energies 50 and 200 keV. Differences in contrast, observed when varying the projectile type and energy, can be attributed to sample nuclear and electronic structure and bear witness to impact parameter dependent energy loss processes. Our results provide a base for interpretation of data obtained in prospective transmission studies when for example using a helium ion microscope.
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Affiliation(s)
- R Holeňák
- Department of Physics and Astronomy, Uppsala University, Box 516, 751 20 Uppsala, Sweden.
| | - S Lohmann
- Department of Physics and Astronomy, Uppsala University, Box 516, 751 20 Uppsala, Sweden
| | - D Primetzhofer
- Department of Physics and Astronomy, Uppsala University, Box 516, 751 20 Uppsala, Sweden
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Ahmad I, Jan R, Khan HU, Hussain A, Khan SA. Imaging, deposition, and self-assembly of CTAB stabilized gold nanostructures. SN APPLIED SCIENCES 2020. [DOI: 10.1007/s42452-020-2888-8] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022] Open
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