Peak forces and lateral resolution in amplitude modulation force microscopy in liquid

Potential-dependent superlubricity of stainless steel and Au(111) using a water-in-surface-active ionic liquid mixture

HYPOTHESIS

The friction and interfacial nanostructure of a water-in-surface-active ionic liquid mixture, 1.6 M 1-butyl-3-methylimidazolium 1,4-bis-2-ethylhexylsulfosuccinate ([BMIm][AOT]), can be tuned by applying potential on Au(111) and stainless steel.

EXPERIMENTAL

Atomic force microscopy (AFM) was used to examine the friction and interfacial nanostructure of 1.6 M [BMIm][AOT] on Au(111) and stainless steel at different potentials.

FINDINGS

Superlubricity (vanishing friction) is observed for both surfaces at OCP+1.0 V up to a surface-dependent critical normal force due to [AOT]- bilayers adsorbing strongly to the positively charged surface thus allowing AFM tip to slide over solution-facing hydrated anion charged groups. High-resolution AFM imaging reveals ripple-like features within near-surface layers, with the smallest amplitudes at OCP+1 V, indicating the highest structural stability and resistance to thermal fluctuations due to highly ordered boundary [AOT]- bilayers templating robust near-surface layers. Exceeding the critical normal force at OCP+1.0 V causes the AFM tip to penetrate the hydrated [AOT]- layer and slide over alkyl chains, increasing friction. At OCP and OCP-1.0 V, higher friction correlates with more pronounced ripples, attributed to the rougher templating [BMIm]+ boundary layer. Kinetic experiments show that switching from OCP-1.0 V to OCP+1.0 V achieves superlubricity within 15 s, enabling real-time friction control.

Assessing the Stability of Biological Fibrils by Molecular-Scale Simulations

The nanomechanical characterization of several biological fibrils that are the result of protein aggregation via molecular dynamics simulation is nowadays feasible, and together with atomic force microscopy experiments has widened our understanding of the forces in the regime of pN-nN and system sizes of about hundreds of nanometers. Several methodologies have been developed to achieve this target, and they range from the atomistic representation via molecular force fields to coarse-grained strategies that provide comparable results with experiments in a systematic way. In this chapter, we discuss several methodologies for the calculation of mechanical parameters, such as the elastic constants of relevant biological systems. They are presented together with details about parameterization and current limitations. Then, we discuss some of the applications of such methodologies for the description of bacterial filament and β-amyloid systems. Finally, the latest lines of development are discussed.

Simulation of Subnanometer Contrast in Dynamic Atomic Force Microscopy of Hydrophilic Alkanethiol Self-Assembled Monolayers in Water

Atomic resolution imaging of surfaces in liquid environments using atomic force microscopy (AFM) is challenging in terms of both reproducibility and measurement interpretation. To understand the origins of these challenges, we used molecular dynamics simulations of AFM on hydrophilic self-assembled monolayers (SAMs) in water. The force on the model AFM tip was calculated as a function of lateral and vertical position relative to the SAM surface. The contributions of the water and SAMs to the overall force were analyzed, and the former was correlated to the water density distribution. Then, dynamic AFM was modeled by oscillating the tip at a driving amplitude. It was found that the contrast between amplitudes at different lateral positions on the surface was dependent on the vertical position of the tip. Lastly, amplitude maps were produced for two vertical positions at constant height, and the ability to capture atomic resolution was related to the force on the tip. These results offer an explanation for the observed instability in atomic scale imaging using AFM and more generally provide insight into the contrast mechanisms of surface images obtained in liquid environments.

Subsurface imaging of flexible circuits via contact resonance atomic force microscopy

Subsurface imaging of Au circuit structures embedded in poly(methyl methacrylate) (PMMA) thin films with a cover thickness ranging from 52 to 653 nm was carried out by using contact resonance atomic force microscopy (CR-AFM). The mechanical difference of the embedded metal layer leads to an obvious CR-AFM frequency shift and therefore its unambiguous differentiation from the polymer matrix. The contact stiffness contrast, determined from the tracked frequency images, was employed for quantitative evaluation. The influence of various parameter settings and sample properties was systematically investigated by combining experimental results with theoretical analysis from finite element simulations. The results show that imaging with a softer cantilever and a lower eigenmode will improve the subsurface contrast. The experimental results and theoretical calculations provide a guide to optimizing parameter settings for the nondestructive diagnosis of flexible circuits. Defect detection of the embedded circuit pattern was also carried out, which indicates the capability of imaging tiny subsurface structures smaller than 100 nm by using CR-AFM.

Scaling law to determine peak forces in tapping-mode AFM experiments on finite elastic soft matter systems

Analytical equations to estimate the peak force will facilitate the interpretation and the planning of amplitude-modulation force microscopy (tapping mode) experiments. A closed-form analytical equation to estimate the tip-sample peak forces while imaging soft materials in liquid environment and within an elastic deformation regime has been deduced. We have combined a multivariate regression method with input from the virial-dissipation equations and Tatara's bidimensional deformation contact mechanics model. The equation enables to estimate the peak force based on the tapping mode observables, probe characteristics and the material properties of the sample. The accuracy of the equation has been verified by comparing it to numerical simulations for the archetypical operating conditions to image soft matter with high spatial resolution in tapping-mode AFM.

Nanoscale imaging of the growth and division of bacterial cells on planar substrates with the atomic force microscope

With the use of the atomic force microscope (AFM), the Nanomicrobiology field has advanced drastically. Due to the complexity of imaging living bacterial processes in their natural growing environments, improvements have come to a standstill. Here we show the in situ nanoscale imaging of the growth and division of single bacterial cells on planar substrates with the atomic force microscope. To achieve this, we minimized the lateral shear forces responsible for the detachment of weakly adsorbed bacteria on planar substrates with the use of the so called dynamic jumping mode with very soft cantilever probes. With this approach, gentle imaging conditions can be maintained for long periods of time, enabling the continuous imaging of the bacterial cell growth and division, even on planar substrates. Present results offer the possibility to observe living processes of untrapped bacteria weakly attached to planar substrates.

Dynamic force microscopy simulator (dForce): A tool for planning and understanding tapping and bimodal AFM experiments

We present a simulation environment, dForce, which can be used for a better understanding of dynamic force microscopy experiments. The simulator presents the cantilever-tip dynamics for two dynamic AFM methods, tapping mode AFM and bimodal AFM. It can be applied for a wide variety of experimental situations in air or liquid. The code provides all the variables and parameters relevant in those modes, for example, the instantaneous deflection and tip-surface force, velocity, virial, dissipated energy, sample deformation and peak force as a function of time or distance. The simulator includes a variety of interactions and contact mechanics models to describe AFM experiments including: van der Waals, Hertz, DMT, JKR, bottom effect cone correction, linear viscoelastic forces or the standard linear solid viscoelastic model. We have compared two numerical integration methods to select the one that offers optimal accuracy and speed. The graphical user interface has been designed to facilitate the navigation of non-experts in simulations. Finally, the accuracy of dForce has been tested against numerical simulations performed during the last 18 years.