Analytical expressions for spreading resistance in lossy media and their application to the calibration of scanning microwave microscopy

This paper presents the analytical derivation of spreading resistance expressions for diverse geometries of a conducting probe submerged in a lossy medium. Resulting equations can be used to calibrate scanning impedance/scanning microwave microscopes operating in liquid. The expressions are systematically validated through numerical and experimental methods for the calibration of an inverted Scanning Microwave Microscope (iSMM) when operating in a lossy saline medium, such as Dulbecco's Modified Eagle Medium (DMEM), a widely used medium for supporting the growth of biological cells. The calibration process within DMEM plays an important role in the quantitative local evaluation of electromagnetic properties of biological samples under physiological conditions. Additionally, measurements are performed in distilled water for comparative analysis.

Fabrication of Ultra-Sharp Tips by Dynamic Chemical Etching Process for Scanning Near-Field Microwave Microscopy

This work details an effective dynamic chemical etching technique to fabricate ultra-sharp tips for Scanning Near-Field Microwave Microscopy (SNMM). The protruded cylindrical part of the inner conductor in a commercial SMA (Sub Miniature A) coaxial connector is tapered by a dynamic chemical etching process using ferric chloride. The technique is optimized to fabricate ultra-sharp probe tips with controllable shapes and tapered down to have a radius of tip apex around ∼1 μm. The detailed optimization facilitated the fabrication of reproducible high-quality probes suitable for non-contact SNMM operation. A simple analytical model is also presented to better describe the dynamics of the tip formation. The near-field characteristics of the tips are evaluated by finite element method (FEM) based electromagnetic simulations and the performance of the probes has been validated experimentally by means of imaging a metal-dielectric sample using the in-house scanning near-field microwave microscopy system.

Nanoscale Characterization of Graphene Oxide-Based Epoxy Nanocomposite Using Inverted Scanning Microwave Microscopy

Scanning microwave microscopy (SMM) is a novel metrological tool that advances the quantitative, nanometric, high-frequency, electrical characterization of a broad range of materials of technological importance. In this work, we report an inverted near-field scanning microwave microscopy (iSMM) investigation of a graphene oxide-based epoxy nanocomposite material at a nanoscopic level. The high-resolution spatial mapping of local conductance provides a quantitative analysis of the sample's electrical properties. In particular, the electrical conductivity in the order of ∼10-1 S/m as well as the mapping of the dielectric constant with a value of ∼4.7 ± 0.2 are reported and validated by the full-wave electromagnetic modeling of the tip-sample interaction.