Reference Citation Analysis: Find an Article, Find a Category, Find a Journal, Find a Scholar

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D. Karpuzov

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He A, Xu S, Foroughi-Abari A, Karpuzov D. Depth profiling of NbxO/W multilayers: effect of primary ion beam species (O2+, Ar+ and Cs+). SURF INTERFACE ANAL 2012. [DOI: 10.1002/sia.4849] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]

Karpuzov D, He A, Xu S. Metal clustering during depth profiling of thin films. SURF INTERFACE ANAL 2006. [DOI: 10.1002/sia.2292] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]

He A, Karpuzov D, Xu S. Ink identification by time-of-flight secondary ion mass spectroscopy. SURF INTERFACE ANAL 2006. [DOI: 10.1002/sia.2246] [Citation(s) in RCA: 16] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]

Krastev V, Marinova T, Karpuzov D, Kalitzova M, Vitali G, Rossi M. XPS study of laser-annealed ion-implanted GaAs. SURF INTERFACE ANAL 1993. [DOI: 10.1002/sia.740201205] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/08/2022]